Special fixture for sample detection of X-ray diffractometer
By designing a fixture that includes a base, a limiting plate, and a support plate, the sample height can be automatically positioned, solving the problems of difficulty in clamping cylindrical samples and errors caused by manual adjustment in the existing technology, and realizing high-precision and efficient residual stress detection.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- ZHEJIANG PROVINCIAL SPECIAL EQUIP INSPECTION & RES INST
- Filing Date
- 2025-01-13
- Publication Date
- 2026-04-24
AI Technical Summary
Existing X-ray diffractometer fixtures are difficult to hold cylindrical samples effectively, and manual adjustment of sample height can cause test results to deviate, affecting detection accuracy and efficiency.
A clamp consisting of a base, a limiting plate, a support plate, and a spring was designed. The limiting plate and the support plate work together to automatically position the sample height, ensuring that the sample surface is located at the detection point without the need for laser adjustment.
It improves the detection accuracy and efficiency of cylindrical samples, reduces human error, simplifies the operation process, and is suitable for residual stress detection of square and cylindrical workpieces.
Smart Images
Figure CN224158296U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of X-ray diffraction, specifically a special fixture for sample testing in an X-ray diffractometer, used to cooperate with an X-ray diffractometer for phase analysis and residual stress testing, suitable for residual stress testing of square and cylindrical workpieces. Background Technology
[0002] X-ray diffractometers utilize the principle of diffraction to perform phase analysis and residual stress analysis on materials, and are an important tool for analyzing material structure. X-ray diffractometers are widely used in industries such as metallurgy, chemical engineering, environmental protection, energy, biomedicine, and semiconductors, and have become essential instruments in many research institutions and factory laboratories.
[0003] A typical X-ray diffractometer consists of a sealed body with a sample stage in the center for placing the sample to be tested. Two small laser sources are located on the upper left and upper right of the sample stage to help determine the height of the sample's upper surface. During phase analysis and residual stress testing, the sample height needs to be adjusted. When the stress point of the sample is aligned with the intersection of the two laser sources, the sample height on the sample stage is considered properly adjusted. During stress testing, the sample stage needs to rotate and rock. If the sample is not fixed, it will slip during testing, making it impossible to perform residual stress-related tests correctly.
[0004] The general-purpose sample clamping tools provided by the manufacturer have relatively strict requirements on the shape and size of the samples that can be clamped, making them unsuitable for cylindrical samples commonly used in residual stress testing (especially for clamping the parallel sections of tensile specimens). Furthermore, adjusting the height of the sample testing surface requires manual adjustment by the operator based on the laser point's focus. Since the visual judgment of laser point overlap is somewhat ambiguous, it can cause a certain deviation in the test results, directly affecting the residual stress test results. Utility Model Content
[0005] The purpose of this utility model is to overcome the shortcomings in the above-mentioned background technology and provide a special fixture for X-ray diffractometer sample testing. This fixture should have the characteristics of simple operation and high positioning accuracy.
[0006] The technical solution of this utility model is:
[0007] A special fixture for sample inspection in an X-ray diffractometer is characterized in that: the fixture includes a base, a limiting plate fixed to the top of the base, a support plate that is vertically positioned between the base and the limiting plate, and a spring that pushes the support plate up to clamp and fix the workpiece between the support plate and the limiting plate; the base has a detection cavity for the lifting and lowering movement of the support plate and for accommodating the workpiece, the limiting plate has a detection hole for X-ray irradiation of the workpiece, and the bottom surface of the limiting plate serves as a positioning surface for determining the highest point of the workpiece.
[0008] The top surface of the pallet is equipped with a bracket for placing workpieces; the top surface of the bracket is an arc surface that is lower in the middle and higher on both sides.
[0009] The top surface of the tray is provided with a positioning groove; the bottom surface of the bracket is provided with a positioning strip that slides in conjunction with the positioning groove; the positioning groove is parallel to the left and right side baffles of the base.
[0010] The front and rear sides of the base are open.
[0011] The detection cavity is located between the two side baffles of the base; the spring is disposed between the support plate and the bottom plate of the base.
[0012] The base has vertically extending guide grooves on both sides of the baffles; the support plate has guide blocks on both sides that slide in conjunction with the guide grooves.
[0013] The base plate has protrusions on both sides of its outer surface for installing fasteners to fix the base to the sample stage of the X-ray diffractometer.
[0014] The beneficial effects of this utility model are:
[0015] This invention is installed on the existing sample stage and can be removed when not in use without affecting the performance of the original sample stage. During use, the workpiece is placed on the bracket. Due to the limiting effect of the limiting plate, the upper surface of the workpiece is directly limited to the focal plane of the X-ray. Therefore, there is no need to adjust the height of the upper surface of the workpiece, and testing can be performed directly. Because there is no need to judge whether the sample height meets the requirements through the laser focal point, errors caused by manually judging the workpiece height are avoided, thus speeding up the testing process and improving the testing quality and efficiency.
[0016] This utility model has a simple structure, is easy to operate, and has a unique design. It can save a lot of time and energy for testing personnel. It is suitable for residual stress testing of square workpieces, but is especially suitable for residual stress testing of cylindrical workpieces. The test results will not be affected by obvious external forces during the workpiece clamping process, and it has high testing accuracy. Attached Figure Description
[0017] Figure 1 This is a cross-sectional structural diagram of the present invention from the main viewing direction.
[0018] Figure 2 This is a top view of the structure of this utility model.
[0019] Figure 3 This is a top view of the tray structure of this utility model.
[0020] Figure 4 This is a schematic diagram of the main structure of the bracket of this utility model.
[0021] Figure 5 This is a schematic diagram of an embodiment of the present invention.
[0022] Figure label:
[0023] The X-ray diffractometer includes: sample stage 1, fixture 2, base 2-1, base plate 2-1-1, baffle 2-1-2, guide groove 2-1-3, boss 2-1-4, spring 2-2, support plate 2-3, guide block 2-3-1, positioning groove 2-3-2, bracket 2-4, positioning strip 2-4-1, pressure plate 2-5, limit plate 2-7, detection hole 2-7-1, X-ray emitter 3, left red laser generator 4, right red laser generator 5, X-ray diffraction receiver 6, red light 7, X-ray 8, diffracted X-ray 9, workpiece 10, and detection cavity A. Detailed Implementation
[0024] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely for explaining the present utility model and are not intended to limit the present utility model.
[0025] like Figure 1 As shown, a special fixture for sample testing of an X-ray diffractometer includes a base 2-1, a limiting plate 2-7, a support plate 2-3, a bracket 2-4, and a spring 2-2.
[0026] The base has a U-shaped structure, including a horizontally arranged base plate 2-1-1 and two parallel side baffles 2-1-2 vertically fixed to both sides of the top surface of the base plate. The side baffles maintain a certain horizontal distance, and the space between the baffles serves as the detection cavity A. The two sides of the base plate are provided with bosses 2-1-4, which are used to install fasteners so that the base can be fixed to the sample stage of the X-ray diffractometer.
[0027] The limiting plate is horizontally mounted on top of the baffles on both sides and is pressed and fixed by the pressure plates 2-5. A detection hole 2-7-1 is provided in the center of the limiting plate, through which external radiation can enter the detection chamber to irradiate the workpiece. The detection hole is circular, but can also be other shapes, and its size can be adjusted as needed.
[0028] The bottom surface of the limiting plate serves as the positioning surface, used to determine the highest point of the workpiece. The height of the positioning surface is also the height of the upper surface of the workpiece to be tested, which is exactly the fixed height value required for workpiece inspection.
[0029] The pallet is horizontally arranged in the detection chamber and located below the limiting plate. The pallet can also move up and down in the vertical direction. A spring is set between the pallet and the base plate to push the pallet upward. The inner side of each baffle on the left and right sides is provided with two vertically extending guide grooves 2-1-3. Two guide blocks 2-3-1 are provided on both sides of the pallet to slide and cooperate with the guide grooves, so as to ensure that the pallet remains horizontal during the up and down movement.
[0030] The bracket is inserted into the top surface of the tray. The top surface of the bracket is an arc surface that is lower in the middle and higher on both sides. The cylindrical workpiece can remain stable when placed on the arc surface, avoiding slippage during inspection. The top surface of the tray is provided with a positioning groove 2-3-2, which is parallel to the side baffles. The bottom surface of the bracket is provided with a positioning strip 2-4-1 that slides with the positioning groove.
[0031] Because the front and rear sides of the base are open, pressing down on the support plate allows the support plate to separate vertically from the limiting plate, along a path perpendicular to... Figure 1 Place the bracket into the tray of the detection chamber in the direction of the positioning (so that the positioning strip is engaged in the positioning groove), and then place the workpiece into the bracket of the detection chamber in the same direction. After releasing the tray, the tray moves upward so that the workpiece is clamped and fixed between the limiting plate and the bracket, and the upper surface of the workpiece reaches the required specified height.
[0032] like Figure 5 As shown, the sample stage 1 of the X-ray diffractometer has an existing structure, which can rotate 360° horizontally and tilt 45° up, down, left, and right. This invention is located on the sample stage 1 of the X-ray diffractometer and is fixed by fasteners (screws) mounted on a boss. An X-ray emitter 3 and a left-side red laser generator 4 are arranged in the upper left of this invention, while an X-ray diffraction receiver 6 and a right-side red laser generator 5 are arranged in the upper right. The X-rays 8 emitted by the X-ray emitter generate diffracted X-rays 9 on the surface of the workpiece 10, which are received by the X-ray diffraction receiver 6 on the symmetrical opposite side, thereby testing the residual stress on the workpiece surface.
[0033] To ensure that the X-rays emitted by the X-ray emitter are received by the X-ray diffraction receiver, the height of the upper surface of the workpiece placed on the sample stage of the X-ray diffractometer should be a constant. To accurately position the upper surface of the workpiece, a red laser beam is emitted from the left and right red laser generators. When a red dot is observed on the upper surface of the workpiece, it indicates that the two red laser beams have just converged at the same point on the upper surface of the workpiece, and the height of the upper surface of the workpiece meets the requirements. When two red dots are observed on the upper surface of the workpiece, it indicates that the height of the upper surface of the workpiece is too high or too low and needs to be readjusted.
[0034] The working principle of this utility model:
[0035] When an X-ray emitter irradiates an object with a beam of X-rays, the rays are scattered by the atoms in the object. Each atom generates a scattered wave, and these waves interfere with each other to produce diffraction. The diffracted waves are received by an X-ray diffraction receiver, thus obtaining the crystal structure characteristics. The X-ray irradiation direction, the workpiece detection point, and the X-ray receiver form a fixed positional relationship. Since the positions of the X-ray generator and the X-ray diffraction receiver are relatively fixed, the placement position of the workpiece should also be fixed.
[0036] This utility model, as a special fixture, is like a mold, which can make the upper surface of the workpiece 10 to be inspected exactly at the required inspection height, without the need to repeatedly adjust the height of the upper surface of the workpiece with the assistance of a laser source.
[0037] This invention can meet the testing requirements of cylindrical workpieces within a certain diameter range. Simply place the workpiece on the bracket, and the spring will push the bracket upward so that the upper surface of the workpiece abuts against the bottom surface of the limiting plate. At this time, the workpiece is not only firmly fixed, but the upper surface of the workpiece is also located at the testing point, i.e. the X-ray focusing surface.
[0038] This fixture can also be used to inspect square workpieces. Simply remove the bracket from the tray and place the square workpiece directly on the tray. Under the action of the spring, the upper surface of the square workpiece abuts against the bottom surface of the limiting plate. At this time, the upper surface of the workpiece is exactly at the detection point.
[0039] This invention can greatly facilitate the inspection of regular cylindrical and square workpieces.
[0040] The accompanying drawings illustrate preferred embodiments of the present invention. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a thorough and complete understanding of the disclosure of the present invention.
Claims
1. A special fixture for sample testing in an X-ray diffractometer, characterized in that: The fixture includes a base (2-1), a limiting plate (2-7) fixed on the top of the base, a support plate (2-3) that can be raised and lowered between the base and the limiting plate, and a spring (2-2) that pushes the support plate up to clamp and fix the workpiece between the support plate and the limiting plate. The base is provided with a detection cavity (A) for the lifting and lowering movement of the support plate and for accommodating the workpiece. The limiting plate is provided with a detection hole (2-7-1) for X-ray irradiation of the workpiece. The bottom surface of the limiting plate serves as a positioning surface for determining the position of the highest point of the workpiece.
2. The special fixture for sample testing in an X-ray diffractometer according to claim 1, characterized in that: The top surface of the pallet is equipped with a bracket (2-4) for placing workpieces; the top surface of the bracket is an arc surface that is low in the middle and high on both sides.
3. The special fixture for X-ray diffractometer sample testing according to claim 2, characterized in that: The top surface of the tray is provided with a positioning groove (2-3-2); the bottom surface of the bracket is provided with a positioning strip (2-4-1) that slides with the positioning groove; the positioning groove is parallel to the two side baffles of the base.
4. A special fixture for sample testing in an X-ray diffractometer according to claim 1 or 3, characterized in that: The front and rear sides of the base are open.
5. A special fixture for sample testing in an X-ray diffractometer according to claim 4, characterized in that: The detection chamber is located between the two side baffles (2-1-2) of the base; the spring is located between the support plate and the bottom plate (2-1-1) of the base.
6. A special fixture for sample testing in an X-ray diffractometer according to claim 5, characterized in that: The base has vertically extending guide grooves (2-1-3) on both sides of the baffle; the support plate has guide blocks (2-3-1) on both sides that slide in cooperation with the guide grooves.
7. A special fixture for sample testing in an X-ray diffractometer according to claim 6, characterized in that: The base plate has protrusions (2-1-4) on both sides for installing fasteners to fix the base to the sample stage of the X-ray diffractometer.