Electronic and electrical test equipment

By introducing vertical and inclined insertion cylinders and adjustment components into the diode testing equipment, the problems of cumbersome diode testing operations and poor adaptability are solved, realizing simple and efficient diode testing.

CN224163770UActive Publication Date: 2026-04-24王子昊
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
王子昊
Filing Date
2025-04-22
Publication Date
2026-04-24

AI Technical Summary

Technical Problem

Existing diode testing equipment is cumbersome and complex to operate, and it is difficult to adapt to the differences in pin spacing of different diode models, which limits the application scope of the testing equipment and increases costs.

Method used

An electronic and electrical testing device was designed, which uses an insertion cylinder and an adjustment component in the pin insertion component. The insertion cylinder has a vertical part and an inclined part to facilitate the insertion of diode pins, and the spacing of the insertion cylinder is adjusted by the adjustment component to adapt to different pin spacings.

Benefits of technology

It simplifies the diode insertion process, improves the versatility of the equipment and testing efficiency, and reduces testing costs.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of electronic and electrical element testing, and discloses electronic and electrical testing equipment which comprises a base and a tester, a supporting seat is fixedly connected to the top of the base, and two pin insertion parts are symmetrically arranged on the supporting seat; the pin insertion part comprises an insertion cylinder, the top end of the insertion cylinder is open, a vertical part is arranged at the upper part of the inner surface wall of the insertion cylinder, and an inclined part is arranged at the lower part of the inner surface wall of the insertion cylinder; the top end of the insertion cylinder is fixedly connected with a supporting plate, the interior of the insertion cylinder is fixedly connected with a conductive cylinder, and the conductive cylinder is connected with a tester through a test signal line; in the pin insertion part, the vertical part and the inclined part which are inserted into the cylinder body are matched with each other, the vertical part provides stable guidance, and due to the arrangement of the inclined part, the pins of the diode can be better kept in contact with the inner wall of the conductive cylinder body, and in this way, only two pins of the diode need to be correspondingly inserted into the pin insertion part, so that the production efficiency is improved. The whole operation is simple and convenient.
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Description

Technical Field

[0001] This application relates to the technical field of testing electronic and electrical components, and in particular to an electronic and electrical testing device. Background Technology

[0002] Electrical and electronic engineering encompasses two key areas: electronic technology and electrical engineering. Electronic technology focuses on electronic devices, such as semiconductor devices and integrated circuits, as well as electronic circuits, such as amplifier circuits and digital circuits, emphasizing the processing and transmission of electrical signals, commonly found in electronic products like computers and mobile phones. Electrical engineering, on the other hand, mainly revolves around the generation, transmission, distribution, and utilization of electrical energy, as well as the design, operation, and control of electrical equipment such as generators and transformers, in scenarios like power plants and transmission lines. Diodes, as common and important electrical components in electrical and electronic engineering, utilize their unidirectional conductivity to convert alternating current to direct current during rectification to power devices. They can also prevent damage from excessive voltage during limiting, Zener diodes can achieve voltage regulation, and in digital circuits, they can act as switches, assisting in digital signal processing by controlling the on and off states. They play an irreplaceable and diverse role in the field of electrical and electronic engineering, and their electrical performance needs to be tested during the diode manufacturing process.

[0003] In the prior art, patent document CN216718589U discloses a device for testing the electrical performance of a diode, comprising: a base, a pair of test seats symmetrically distributed on the base, and a pair of test blocks corresponding to the pair of test seats; wherein each pair of test seats is provided with a test connection post; each pair of test blocks is connected to a lever assembly suitable for moving the test blocks; the lever assembly is suitable for pressing the test blocks against the test seats to clamp the diode leads located between the test blocks and the test seats; and a notch suitable for embedding the body of the diode is formed between the pair of test seats, which can improve the reliability of the contact between the leads and the test seats during the diode testing process.

[0004] The following problems still exist in the existing technology:

[0005] 1. In the existing diode testing process, the diode body must first be accurately placed in the notch between a pair of test sockets, and the diode's two leads must be embedded into the arc-shaped grooves of the test sockets respectively. After placement, the operator must manually press the pressure rod. At this time, the test block connected to the pressure rod will move towards the test socket, thereby clamping the diode leads on the test socket. It usually requires multiple steps to connect the diode. This method of connecting diodes is cumbersome and inconvenient to use.

[0006] 2. Different types of diodes have different pin pitches, but existing testing equipment is usually not convenient to adjust flexibly according to the distance between the two pins of the diode. This leads to the need to frequently change the testing equipment or make complex modifications when testing diodes with different pin pitches, which increases the testing cost and time cost and limits the application range of the testing equipment. Utility Model Content

[0007] To address the problems mentioned in the background art, this application provides an electronic and electrical testing device.

[0008] The electronic and electrical testing equipment provided in this application adopts the following technical solution:

[0009] An electronic and electrical testing device includes a base and a tester. A support is fixedly connected to the top of the base, and two pin insertion components are symmetrically arranged on the support. Each pin insertion component includes an insertion cylinder with an open top. The upper part of the inner wall of the insertion cylinder has a vertical portion, and the lower part of the inner wall has an inclined portion. A support plate is fixedly connected to the top of the insertion cylinder, and a conductive cylinder is fixedly connected inside the insertion cylinder. A test signal line is provided between the conductive cylinder and the tester, and the conductive cylinder is connected to the tester through the test signal line.

[0010] Preferably, the support base is provided with an adjustment component, which includes a slide groove, a slider, a transverse threaded rod, a rotating handle, and a transverse threaded through hole.

[0011] Preferably, the slide groove is formed on the support base, and a slider is slidably connected in the slide groove. A transverse threaded through hole is formed on the slider. A transverse threaded rod is threadedly connected to the slider through the transverse threaded through hole. One end of the transverse threaded rod is rotatably connected to the inner wall of the slide groove, and the other end of the transverse threaded rod passes through the support base and is fixedly connected to a rotating handle.

[0012] Preferably, the insertion cylinder of one of the pin insertion components is fixedly connected to the support base, and the insertion cylinder of the other pin insertion component is fixedly connected to the slider.

[0013] Preferably, the inner wall of the conductive cylinder is flush with the inclined portion.

[0014] Preferably, an instrument placement platform is fixedly connected to the top of the base, and the tester is placed on the instrument placement platform.

[0015] Preferably, the conductive cylinder and the test signal line are connected by welding.

[0016] Preferably, the insertion cylinder is made of insulating plastic material, and the conductive cylinder is made of copper.

[0017] In summary, this application includes the following beneficial technical effects:

[0018] 1. The vertical and inclined parts of the insertion cylinder in the pin insertion component work together. The vertical part ensures that the diode pins can be inserted into the insertion cylinder when they are in a vertical position, making the insertion of the diode pins smoother. The vertical part provides stable guidance, and the inclined part causes the diode pins to undergo slight deformation after entering the conductive cylinder, so that the diode pins can better maintain contact with the inner wall of the conductive cylinder, preventing the diode pins from being suspended and causing poor contact, thus ensuring conductivity. In this way, you only need to insert the two pins of the diode into the pin insertion component, which is simple and convenient to operate.

[0019] 2. An adjustment component is installed on the support base. By rotating the rotating handle, the horizontal threaded rod is driven to rotate, causing the slider to move laterally in the slide groove. This adjusts the distance between the insertion cylinders in the two pin insertion components to accommodate the testing of diodes with different pin pitches, thus broadening the application range of the equipment and improving its versatility.

[0020] 3. The support plate can support the diode body and increase the support area of ​​the diode body. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the overall structure of the electronic and electrical testing equipment in this utility model;

[0022] Figure 2 This is a schematic diagram of placing the diode on an electronic and electrical testing device in this utility model;

[0023] Figure 3 This is a schematic diagram of the structure at the insertion point of the cylinder in this utility model;

[0024] Figure 4 This is a partial sectional view of the present invention.

[0025] Explanation of reference numerals in the attached drawings: 1. Pin insertion component; 101. Insertion cylinder; 1011. Vertical part; 1012. Inclined part; 102. Support plate; 103. Conductive cylinder; 104. Test signal line; 2. Adjustment component; 201. Slide groove; 202. Slider; 203. Horizontal threaded rod; 204. Rotating handle; 205. Horizontal threaded through hole; 3. Support base; 4. Base; 5. Instrument placement platform; 6. Tester. Detailed Implementation

[0026] The present application will be further described in detail below with reference to the accompanying drawings and embodiments.

[0027] Example 1

[0028] Reference Figures 1 to 4 This utility model discloses an electronic and electrical testing device, including a base 4 and a tester 6. The tester 6 can be, but is not limited to, a DC electrical performance tester of model MPT6000 from Guankui Motor Co., Ltd. A support base 3 is fixedly connected to the top of the base 4. Two pin insertion components 1 are symmetrically arranged on the support base 3. Each pin insertion component 1 includes an insertion cylinder 101 with an open top. A vertical portion 1011 is provided on the upper part of the inner wall of the insertion cylinder 101, and an inclined portion 1012 is provided on the lower part of the inner wall. A rounded arc portion is provided between the inclined portion 1012 and the vertical portion 1011, allowing the pin to... The foot can better enter the inclined part 1012 through the vertical part 1011. The top of the insertion cylinder 101 is fixedly connected to the support plate 102. The inside of the insertion cylinder 101 is fixedly connected to the conductive cylinder 103. A test signal line 104 is provided between the conductive cylinder 103 and the tester 6. The conductive cylinder 103 is connected to the tester 6 through the test signal line 104. One end of the test signal line 104 is electrically connected to the bottom end of the conductive cylinder 103, and the other end of the test signal line 104 is electrically connected to the test end of the tester 6. The top surface of the support plate 102 is flush with the top of the insertion cylinder 101. The lower parts of the two insertion cylinders 101 are symmetrically arranged in a figure-eight shape.

[0029] Furthermore, the support base 3 is provided with an adjustment component 2, which includes a slide groove 201, a slider 202, a transverse threaded rod 203, a rotating handle 204, and a transverse threaded through hole 205.

[0030] Furthermore, the inner wall of the conductive cylinder 103 is flush with the inclined portion 1012.

[0031] Furthermore, an instrument placement platform 5 is fixedly connected to the top of the base 4, and the tester 6 is placed on the instrument placement platform 5.

[0032] Furthermore, the conductive cylinder 103 and the test signal line 104 are connected by welding. The connection between the conductive cylinder 103 and the test signal line 104 by welding ensures connection stability and conductivity, avoids signal interruption during the test, ensures that the tester 6 obtains accurate electrical signals, and improves the reliability and accuracy of the test results.

[0033] Furthermore, the insertion cylinder 101 is made of insulating plastic, and the conductive cylinder 103 is made of copper or copper alloy to improve conductivity.

[0034] Example 2

[0035] Furthermore, refer to Figures 1 to 4Based on Embodiment 1, a support base 3 is fixedly connected to the top of the base 4. An adjustment component 2 is provided on the support base 3. The adjustment component 2 includes a slide groove 201, a slider 202, a transverse threaded rod 203, a rotating handle 204, and a transverse threaded through hole 205.

[0036] Furthermore, a slide 201 is formed on the support base 3, and a slider 202 is slidably connected inside the slide 201. A transverse threaded through hole 205 is formed on the slider 202. A transverse threaded rod 203 is threadedly connected to the slider 202 through the transverse threaded through hole 205. One end of the transverse threaded rod 203 is rotatably connected to the inner wall of the slide 201, and the other end of the transverse threaded rod 203 passes through the support base 3 and is fixedly connected to a rotating handle 204.

[0037] Furthermore, the insertion cylinder 101 of one of the pin insertion components 1 is fixedly connected to the support base 3, and the insertion cylinder 101 of the other pin insertion component 1 is fixedly connected to the slider 202.

[0038] Reference Figures 1 to 4 Referring to this utility model, the implementation principle of an electronic and electrical testing device is as follows:

[0039] The two leads of the diode to be tested are inserted one-to-one into the insertion cylinder 101 of the two-lead insertion component 1. During insertion, the leads slide down the vertical part 1011 on the upper part of the inner wall of the insertion cylinder 101. When they reach the lower inclined part 1012, the diode leads undergo a slight deformation under the guidance of the inclined part 1012, allowing the leads to make smoother contact with the inner wall of the conductive cylinder 103. Since the conductive cylinder 103 is connected to the tester 6 through the test signal line 104, after the leads contact the conductive cylinder 103, the tester 6 obtains the electrical signal of the diode leads through the conductive cylinder 103 and the test signal line 104, thereby testing the performance of the diode. If there is a difference in the spacing between the diode leads... When testing diode pins with different pitches, adjustments are made using adjusting component 2. Rotating the rotating handle 204 causes the transverse threaded rod 203 to rotate. Since the slider 202 is threadedly connected to the transverse threaded rod 203 through the transverse threaded through hole 205, and the slider 202 slides within the slide groove 201, the slider 202 moves laterally within the slide groove 201 when the transverse threaded rod 203 rotates. One pin insertion component 1 is fixed to the support base 3, and the other is fixed to the slider 202. Thus, the movement of the slider 202 causes one of the insertion cylinders 101 to move, thereby changing the distance between the two insertion cylinders 101 to meet the testing requirements of diodes with different pin pitches.

[0040] The above are all preferred embodiments of this application and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. An electronic and electrical testing device, comprising a base (4) and a tester (6), characterized in that: The base (4) is fixedly connected to a support seat (3) on its top, and two pin insertion parts (1) are symmetrically arranged on the support seat (3). The pin insertion component (1) includes an insertion cylinder (101), the top of the insertion cylinder (101) is open, the upper part of the inner wall of the insertion cylinder (101) is provided with a vertical part (1011), and the lower part of the inner wall of the insertion cylinder (101) is provided with an inclined part (1012). The top of the insertion cylinder (101) is fixedly connected to a support plate (102), and a conductive cylinder (103) is fixedly connected inside the insertion cylinder (101). A test signal line (104) is provided between the conductive cylinder (103) and the tester (6). The conductive cylinder (103) is connected to the tester (6) through the test signal line (104).

2. The electronic and electrical testing equipment according to claim 1, characterized in that: The support base (3) is provided with an adjustment component (2), which includes a slide groove (201), a slider (202), a transverse threaded rod (203), a rotating handle (204), and a transverse threaded through hole (205).

3. The electronic and electrical testing equipment according to claim 2, characterized in that: The slide groove (201) is opened on the support base (3). A slider (202) is slidably connected in the slide groove (201). A transverse threaded through hole (205) is opened on the slider (202). A transverse threaded rod (203) is threadedly connected to the slider (202) through the transverse threaded through hole (205). One end of the transverse threaded rod (203) is rotatably connected to the inner wall of the slide groove (201). The other end of the transverse threaded rod (203) passes through the support base (3) and is fixedly connected to a rotating handle (204).

4. The electronic and electrical testing equipment according to claim 3, characterized in that: One of the pin insertion components (1) has an insertion cylinder (101) that is fixedly connected to the support base (3), and the other pin insertion component (1) has an insertion cylinder (101) that is fixedly connected to the slider (202).

5. An electronic and electrical testing device according to claim 4, characterized in that: The inner wall of the conductive cylinder (103) is flush with the inclined portion (1012).

6. The electronic and electrical testing equipment according to claim 1, characterized in that: The base (4) is fixedly connected to the top of the instrument placement platform (5), and the tester (6) is placed on the instrument placement platform (5).

7. The electronic and electrical testing equipment according to claim 1, characterized in that: The conductive cylinder (103) and the test signal line (104) are connected by welding.

8. The electronic and electrical testing equipment according to claim 1, characterized in that: The insertion cylinder (101) is made of insulating plastic, and the conductive cylinder (103) is made of copper.