A fakra wire harness error code testing device and method

Abstract

The application discloses a FAKRA wire harness error code testing device and method, and relates to the technical field of error code testing.The method comprises the following steps: test preparation, basic electrical test, limit plug test, vibration test, stability test and test result analysis.The initial error code rate of the FAKRA wire harness to be tested is tested by using an error code tester after the calibration of the testing equipment, limit plug tests are conducted on the connectors at both ends and the mating connectors, then the vibration test is conducted and the simulation degree of the vibration test is evaluated to determine whether to conduct vibration simulation optimization, then the fluctuation of the error code rate is monitored in the test period to determine whether to take clock optimization measures, and finally all the test data is collected, so that the stability of the error code test is ensured, and the problem that the simulation degree of the vibration test is not high enough and the simulation quality is unstable in the prior art, which leads to the decrease of the error code test accuracy is solved.

Description

A FAKRA wire harness bit error testing device and method Technical Field

[0001] This invention relates to the field of bit error rate testing technology, and in particular to a FAKRA wire harness bit error rate testing device and method. Background Technology

[0002] To ensure stable, safe, and accurate data communication for vehicles in extreme environments and over a 10-year lifespan, thereby mitigating safety risks caused by communication errors in autonomous driving, ADAS (Advanced Driver Assistance Systems), or vehicle control systems, bit error rate testing (BERT) in the automotive industry has much higher safety and reliability requirements. Its importance far exceeds that of ordinary consumer electronics or communication equipment, and bit error rate testing is also an important component of automotive-grade certification.

[0003] For example, Chinese invention patent CN109217921B discloses a bit error rate testing device and method, including: a user terminal, a control module, a detection module, a clock crystal oscillator module, a signal shaping module, and an optical module; the user terminal is used to send operation commands to the detection module through the control module; the clock crystal oscillator module is used to generate a first reference clock or an Nth reference clock; the detection module is used to start system initialization according to the first reference clock, the system defaults to starting the first working mode, and performs a first bit error rate test or an Nth bit error rate test according to the operation command, and sends the corresponding pseudo-random code sequence to the optical module; it is also used to receive the running results sent by the optical module and collect bit error data; the optical module is used to receive the pseudo-random code sequence, run it, and then send the running results to the detection module.

[0004] For example, Chinese invention patent CN117674984B discloses an optical module bit error rate testing device and its testing method, comprising: a test base, a bit error rate testing component detachably connected to the base, the bit error rate testing component being configured with a test socket opened along the insertion / removal direction, the test socket being used for inserting an optical module; a first heat dissipation component or a thermal shock seat detachably connected to the outside of the test base; and a display unit detachably connected to the test base, the display unit being electrically connected to a conversion socket, the conversion socket being electrically connected to the bit error rate testing component; when the test base is connected to the first heat dissipation component and the display unit, bit error rate testing can be performed directly through the conversion socket and the display unit.

[0005] FAKRA wiring harnesses are a widely used wiring harness interface standard in the automotive industry. Their application stems primarily from the automotive industry's demand for efficient, reliable, and standardized wiring harness connection systems. With the continuous development of automotive technology, automotive electronic systems are becoming increasingly complex, placing higher demands on signal transmission speed, stability, and reliability. Traditional wiring harness connection systems often suffer from large size, low transmission efficiency, and susceptibility to interference, making it difficult to meet the needs of the modern automotive industry. The emergence of FAKRA wiring harnesses has precisely solved these problems. It adopts a high-precision connector standard, resulting in a smaller size, higher transmission speed, and better electrical performance. Testing is typically based on characteristic impedance testing, insertion loss testing, return loss testing, and crosstalk testing. This has led to the widespread application of FAKRA wiring harnesses in automotive electronic systems, such as connections between sensors, actuators, and controllers, as well as the implementation of advanced functions in multimedia systems and advanced driver assistance systems.

[0006] In existing technologies, to ensure the connection quality of FAKRA wiring harness interfaces in automotive industrial scenarios, devices for bit error rate testing of FAKRA wiring harnesses have been designed, along with corresponding testing methods. Traditional FAKRA wiring harness bit error rate testing employs a linear process of "equipment calibration, baseline BERT testing, independent loading of temperature vibration insertion and extraction stress, phased measurement of bit errors, and report output." Equipment calibration primarily ensures the equipment is error-free and the connections at both ends of the wiring harness are reliable. This includes using a bit error rate meter for self-testing and calibration, setting the test rate (e.g., 1.5Gbps / 3Gbps / 6Gbps), and setting the signal code pattern (e.g., PRBS7 / PRBS15). / PRBS31), calibrate the output and receiver impedances of the bit error rate analyzer, and confirm that the test environment meets the temperature and humidity requirements; when performing baseline BERT testing, connect both ends of the FAKRA harness to the TX (Transmitter) and RX (Receiver) of the bit error rate analyzer, and perform initial BERT measurements under standard temperature and humidity conditions and without external interference to test the bit error rate of the harness under ideal operating conditions; finally, output a report, including BERT test values, test pass and fail judgments, bit error rate changes under environmental conditions such as vibration and temperature, connector appearance inspection, and harness impedance consistency measurement results.

[0007] The above-mentioned technology has at least the following technical problems:

[0008] On the one hand, current high-frequency transmission performance tests for FAKRA only include static tests such as characteristic impedance testing, insertion loss testing, return loss testing, and crosstalk testing. These tests can only indirectly estimate the actual communication quality of the FAKRA harness through high-frequency parameters, and cannot directly detect the number of bits and packet loss rate during actual signal transmission. Moreover, there is no vibration environment during the test, which does not conform to the actual use of vehicles.

[0009] On the other hand, when estimating the transmission quality of FAKRA wiring harnesses using their high-frequency performance static parameters, the test samples for static testing are all installed and mated in a well-equipped laboratory environment. This does not take into account the installation deviation of connectors being inserted at an angle on the vehicle assembly line, nor does it consider the stability of the test under long-term testing conditions. Furthermore, the vehicle body is always accompanied by vibration during actual vehicle use. Therefore, the static testing environment does not match the actual vehicle use environment. Moreover, the existing technology lacks a control mechanism for simulation accuracy, resulting in insufficient simulation accuracy and unstable simulation quality in vibration testing. Summary of the Invention

[0010] To address the technical problems of insufficient simulation accuracy and unstable simulation quality in existing vibration testing technologies, this invention provides a FAKRA wiring harness bit error rate testing device and method. The technical solution is as follows:

[0011] On the one hand, a method for testing the bit error rate (BER) of a FAKRA harness is provided. This method is implemented by a FAKRA harness BER testing device and includes: Step 1, calibrating the testing equipment; Step 2, testing the initial BER of the FAKRA harness under test using a BER meter under set temperature and humidity conditions; Step 3, performing extreme insertion and removal tests on the connectors and mating connectors at both ends of the FAKRA harness under test; Step 4, conducting vibration tests using a vibration table and evaluating the simulation accuracy of the vibration test to determine whether vibration simulation optimization is needed to improve the simulation accuracy; Step 5, monitoring the fluctuation of the BER during the test period to determine whether corresponding clock optimization measures should be taken; Step 6, collecting all test data and evaluating whether the BER performance of the FAKRA harness under test meets the test requirements.

[0012] On the other hand, a FAKRA wiring harness bit error rate testing device is provided. This device is used to implement a FAKRA wiring harness bit error rate testing method. The device includes: a bit error rate tester, a vibration table, a left-side board-end connector, a left-side wire-end connector, a mating connector, a right-side wire-end connector, a right-side board-end connector, and a FAKRA wiring harness under test. The two ends of the bit error rate tester are electrically connected to the left-side board-end connector. A vibration table for testing is provided on one side of the bit error rate tester, and the left-side board-end connector, the left-side wire-end connector, the FAKRA wiring harness under test, the mating connector, the right-side wire-end connector, and the right-side board-end connector are all fixedly connected to the vibration table. The left-side board-end connector is fixedly connected to the left-side wire-end connector, and the left-side wire-end connector is connected to the FAKRA wiring harness under test. One end of the FAKRA wiring harness under test is connected to the mating connector, and the other end is fixedly connected to the right-side wire-end connector. The other end of the right-side wire-end connector is fixedly connected to the right-side board-end connector.

[0013] The beneficial effects of the technical solutions provided by the embodiments of the present invention include at least the following:

[0014] 1. By calibrating the testing equipment, a reliable baseline is established for subsequent bit error rate (BER) changes, avoiding misjudgments caused by BER drift. Then, under set temperature and humidity conditions, the initial BER of the FAKRA harness under test is tested using a BER meter. This helps ensure the stability of the harness transmission performance in the absence of external interference. Next, extreme insertion and extraction tests are performed on the connectors and mating connectors at both ends of the FAKRA harness under test. This helps to detect intermittent BER issues caused by contact wear or loosening in advance. Finally, vibration testing is conducted using a vibration table, and the simulation accuracy of the vibration test is evaluated to determine whether vibration simulation optimization is needed to improve the simulation accuracy. This ensures the simulation accuracy of the vibration test and solves the problem that traditional vibration testing often focuses on physical damage or changes in contact resistance, while neglecting other aspects. The system addresses the real-time impact of slight vibration on the bit error rate of high-speed signals, ensuring that test results more accurately reflect the bit error characteristics under actual vehicle vibration conditions. Next, the fluctuation of the bit error rate is monitored throughout the test cycle to determine whether corresponding clock optimization measures should be taken. The system also observes and records the trend of bit error rate changes during the test, ensuring the stability of bit error rate fluctuations. This helps avoid potential drift of the internal clock or sampling circuit after long-term instrument operation, which could lead to fluctuations in bit error rate data. This, in turn, improves the reliability and consistency of long-term continuous test data. Finally, all test data is collected to evaluate whether the bit error performance of the FAKRA harness under test meets the test requirements. A traceable data reporting system is established, improving the accuracy of testing the data transmission performance of the FAKRA harness.

[0015] 2. The adjustment weight is obtained by accumulating the simulation evaluation adjustment weights corresponding to the simulation degree evaluation indicators that fail the judgment. This not only quantifies the importance of different simulation degree indicators, but also realizes automated weight allocation and optimization decision-making, which helps to improve adjustment efficiency and consistency. Then, the product of the adjustment weight and the set maximum optimization degree value is recorded as the actual adjustment ratio. The sensor sampling frequency is compensated and adjusted according to the actual adjustment ratio, which makes up for the lack of a unified adjustment scale and feedback closed loop in the existing technology, and ensures the consistency of vibration input and response. If the simulation degree judgment result is unqualified after vibration simulation optimization, the preset test personnel are prompted to conduct segmented testing. This solves the existing problem of difficulty in correcting high-frequency simulation distortion and helps to improve the simulation accuracy and data authenticity of the bit error rate in the high-frequency band.

[0016] 3. By performing bit error rate (BER) testing on the FAKRA harness under test based on a set test cycle, it is possible to more accurately assess the BER stability of the harness under continuous vibration and record the BER change trend during the test. This simulates the long-term working state of the FAKRA harness under test in actual use, thereby evaluating the long-term stability and reliability of the FAKRA harness under test. This overcomes the shortcomings of traditional test cycles, such as short cycles and lack of long-term representativeness. Furthermore, within the test cycle, the BER test fluctuation evaluation value is obtained based on the BER data fluctuation evaluation parameters, which more accurately quantifies the BER change amplitude during the test cycle, solving the problem that traditional tests can only observe the BER. The instantaneous changes in bit rate cannot form a quantitative judgment standard, nor can they automatically trigger stability judgment. However, by comparing it with the bit error rate test fluctuation threshold, if the bit error rate test fluctuation assessment value is greater than the bit error rate test fluctuation threshold, corresponding test optimization measures are taken. Otherwise, the bit error rate fluctuation change is judged to determine whether to take test prevention measures to prevent abnormal bit error rate fluctuations during stability testing. This fills the gap of the lack of active feedback mechanism in existing tests and solves the problem that only post-event analysis can be performed after an anomaly is discovered, and dynamic optimization cannot be performed during the test. It not only realizes closed-loop control and real-time self-correction of bit error rate testing, but also improves the accuracy and data integrity of long-term continuous testing.

[0017] 4. This invention directly detects the bit loss rate during actual signal transmission in real time, directly reflecting the true performance status of the FAKRA harness. This improves upon the previous method of indirectly evaluating actual transmission performance by testing high-frequency parameters of the FAKRA harness, thereby enhancing the accuracy of FAKRA harness data transmission performance testing. Furthermore, this invention adds an extreme insertion and removal test, making the assembly of the harness under test closer to the assembly conditions in a vehicle factory final assembly, improving the simulation degree and accuracy of the test. At the same time, this invention adds a vibration environment, making the working environment of the harness under test more consistent with the actual operating environment of a vehicle, further improving the simulation degree and accuracy of the test. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 is a flowchart illustrating a FAKRA harness bit error rate testing method provided in an embodiment of the present invention;

[0020] Figure 2 is a schematic diagram of the direction of the extreme insertion and extraction test provided in an embodiment of the present invention;

[0021] Figure 3 is a schematic diagram of the direction of the extreme insertion and extraction test provided in an embodiment of the present invention;

[0022] Figure 4 is a schematic diagram of the direction of the extreme insertion and extraction test provided in an embodiment of the present invention;

[0023] Figure 5 is a schematic diagram of the direction of the extreme insertion and extraction test provided in an embodiment of the present invention;

[0024] Figure 6 is a schematic diagram of the vibration simulation optimization process provided in the embodiment of the present invention;

[0025] Figure 7 is a schematic diagram of the process for monitoring bit error rate fluctuations provided in an embodiment of the present invention;

[0026] Figure 8 is a block diagram of a FAKRA wire harness error test device provided in an embodiment of the present invention.

[0027] In the diagram: 1. Error detector; 2. Vibration table; 3. Left side board connector; 4. Left side wire connector; 5. Mating connector; 6. Right side wire connector; 7. Right side board connector; 8. FAKRA harness under test. Detailed Implementation

[0028] The technical solution of the present invention will now be described with reference to the accompanying drawings.

[0029] In embodiments of the present invention, words such as "exemplarily," "for example," etc., are used to indicate that something is an example, illustration, or description. Any embodiment or design described as "exemplary" in the present invention should not be construed as being more preferred or advantageous than other embodiments or designs. Specifically, the use of the word "exemplary" is intended to present the concept in a concrete manner. Furthermore, in embodiments of the present invention, the meaning expressed by "and / or" can be both, or either one.

[0030] In the embodiments of this invention, the terms "image" and "picture" may sometimes be used interchangeably. It should be noted that, without emphasizing the distinction between them, they convey the same meaning. Similarly, the terms "of," "corresponding (relevant)," and "corresponding" may sometimes be used interchangeably. It should be noted that, without emphasizing the distinction between them, they convey the same meaning.

[0031] In this embodiment of the invention, sometimes a subscript such as W1 may be written in a non-subscript form such as W1. When the difference is not emphasized, the meaning they express is the same.

[0032] To make the technical problems, technical solutions and advantages of the present invention clearer, a detailed description will be given below in conjunction with the accompanying drawings and specific embodiments.

[0033] This invention provides a FAKRA harness bit error rate testing device and method. Figure 1 shows a flowchart of a FAKRA harness bit error rate testing method provided by this invention. The processing flow of this method may include the following steps:

[0034] Step 1, pre-test preparation, is used to calibrate the test equipment.

[0035] Step two, basic electrical testing, is used to test the initial bit error rate of the FAKRA harness under test using a bit error rate meter under set temperature and humidity conditions, to ensure that the transmission performance of the harness is stable in the absence of other external interference.

[0036] Step 3, Limit Insertion and Removal Test, is used to perform limit insertion and removal tests on the connectors and mating connectors at both ends of the FAKRA harness under test.

[0037] Step four, vibration testing, involves conducting vibration tests using a vibration table and evaluating the simulation accuracy of the vibration test to determine whether vibration simulation optimization is needed to improve the simulation accuracy, thereby ensuring the simulation accuracy of the vibration test.

[0038] Step 5, stability testing, involves monitoring the fluctuations in the bit error rate during the testing period to determine whether corresponding clock optimization measures should be taken, and observing and recording the trend of bit error rate changes during the testing process to ensure the stability of bit error rate fluctuations.

[0039] Step six, test result analysis, is used to collect all test data and evaluate whether the bit error rate performance of the FAKRA harness under test meets the test requirements.

[0040] In this embodiment, the overall testing process formed by the above steps can systematically verify the bit error rate performance and reliability of the FAKRA harness under test in multiple dimensions. First, the pre-test preparation and equipment calibration in step one help ensure that the test environment and instrument accuracy are under control, providing a more accurate and repeatable basis for subsequent tests. Step two, by conducting an initial bit error rate test under set temperature and humidity, can establish a performance benchmark for the harness under no external interference, making any subsequent changes in bit error rate traceable. Step three, the extreme insertion and extraction test, helps to verify whether the connector terminals, locking structure, and mating connectors can still maintain stable transmission performance after mechanical wear, improving the performance of the harness. Step four, combining vibration table testing and vibration simulation evaluation, verifies the actual response of the wiring harness in typical vehicle vibration environments and allows for optimization based on simulation results, helping to avoid misjudgments caused by inconsistencies between vibration conditions and actual operating conditions. Step five, through continuous monitoring of bit error rate fluctuations and combined with clock optimization strategies, effectively identifies problems that are difficult to capture in traditional testing, such as instantaneous bit errors and intermittent failures, ensuring more comprehensive and stable test conclusions. Finally, through unified data analysis in step six, a comprehensive evaluation of the overall bit error rate performance of the wiring harness under multiple operating conditions is achieved, ensuring the reliability of the test results and providing a scientific basis for judging the quality of the wiring harness.

[0041] It should be explained that calibrating the test equipment includes calibrating the bit error rate tester, checking the vibration table, preparing the wiring harness, and setting the parameters.

[0042] Calibrate the bit error rate tester to ensure its accuracy and precision. Check the vibration table to check its operating status and ensure it can work according to the set parameters. Prepare the wire harness to prepare the FAKRA wire harness to be tested, including the connectors at both ends of the wire harness and the mating connector in the middle, and ensure that the appearance and size of the wire harness and connectors meet the test requirements. Set the parameters to set the vibration parameters according to the test requirements to simulate the vibration conditions in actual use.

[0043] The initial bit error rate of the FAKRA harness under test is tested using a bit error rate meter. The test also includes testing the key electrical parameters of the FAKRA harness under test to evaluate its electrical performance. The key electrical parameters include contact resistance, insertion loss, and return loss.

[0044] It should be explained that the set temperature and humidity conditions are generally normal temperature and humidity conditions. The normal temperature range is generally 20℃~25℃, and the normal humidity range is generally 40%RH~70%RH.

[0045] The extreme insertion and removal test refers to the extreme insertion and removal test performed by a pre-set operator on the connectors and mating connectors at both ends of the FAKRA harness under test. The specific operation is as follows: extreme angled insertion and removal are performed in a preset number of different directions for a preset number of times, and the bit error rate of the FAKRA harness under test is tested using a bit error rate tester after each insertion and removal. The preset number is generally set in advance by a pre-set tester, such as five times, and the different directions include extreme angled insertion and removal in four directions within the range of 3° to 5° up, down, left and right.

[0046] Figures 2-5 show schematic diagrams of the direction of the extreme insertion and removal test provided in the embodiments of the present invention. Specifically, they are schematic diagrams of the direction of the interface test at the left-side connector 4, mating connector 5, and right-side connector 6 in Figure 8. Figure 8 is a top-down view. Taking the left-side connector 4 in Figure 8 as an example, Figure 2, schematic diagram 1 of the direction of the extreme insertion and removal test provided in the embodiments of the present invention, is a schematic diagram of the insertion and removal test direction between the male connector of the board end and the female connector of the left-side connector 4 from a frontal view. The specific test direction is the oblique insertion and removal test direction within the range of 3° to 5° between the male connector of the board end and the female connector of the left-side connector 4 from a frontal view. Similarly, Figure 3, schematic diagram 2 of the direction of the extreme insertion and removal test provided in the embodiments of the present invention, is a schematic diagram of the insertion and removal test direction between the male connector of the board end and the female connector of the left-side connector 4 from a top-down view. The specific test direction is the insertion and removal test direction between the male connector of the board end and the female connector of the left-side connector 4 from a top-down view. The insertion and removal test directions between the female and male connectors of the wire-end connector 4 form an inverted V-shape within a range of 3° to 5°. Figure 4, a schematic diagram of the extreme insertion and removal test direction provided in this embodiment of the invention, is a schematic diagram of the insertion and removal test direction between the male connector of the board end and the female connector of the left wire-end connector 4 from a frontal view. Specifically, the test direction is the insertion and removal test direction between the male connector of the board end and the female connector of the left wire-end connector 4 from a frontal view, forming an inverted V-shape within a range of 3° to 5°. Figure 5, a schematic diagram of the extreme insertion and removal test direction provided in this embodiment of the invention, is a schematic diagram of the insertion and removal test direction between the male connector of the board end and the female connector of the left wire-end connector 4 from a top view. Specifically, the test direction is the insertion and removal test direction between the male connector of the board end and the female connector of the left wire-end connector 4 from a top view, forming a positive V-shape within a range of 3° to 5°. Similarly, the insertion and removal test direction between the right wire-end connector 6 and the male connector of the board end is the same.

[0047] Furthermore, the simulation accuracy of the vibration test is evaluated to determine whether vibration simulation optimization is necessary to improve the accuracy. The specific process is as follows:

[0048] Set the vibration parameters of the left-side plate connector, left-side wire connector, FAKRA harness under test, mating connector, right-side wire connector, and right-side plate connector, which are fixedly connected to the vibration table, according to the specified test level.

[0049] During the vibration process, a bit error rate tester is used to perform bit error rate testing. During the vibration test, the real-time acquired simulation accuracy evaluation indicators and extracted reference indicator thresholds are used to determine the simulation accuracy compliance. The results of the compliance determination are either "compliant" or "uncompliant." An uncompliant result indicates that the numerical relationship between the simulation accuracy evaluation indicator and the corresponding reference indicator threshold does not meet the set judgment conditions; otherwise, the result is "compliant." If the result is uncompliant, corresponding vibration simulation optimization is performed; otherwise, no additional processing is performed. The simulation accuracy evaluation indicators include PSD matching degree, total energy, peak acceleration, and coherence.

[0050] Specifically, PSD matching degree measures the consistency between the simulated vibration PSD curve (i.e., power spectral density curve) and the measured PSD curve, usually reflected by the relative error of the curves. The higher the PSD matching degree, the closer the simulation test is to the actual working condition. Total energy represents the total energy of the vibration signal, reflecting the overall level of vibration intensity during the test or simulation process, and is usually characterized by the PSD integral calculated by the analysis software. Peak acceleration represents the maximum acceleration value of the vibration within the test period, which is a key indicator for assessing the impact degree and reflects the extreme load of the vibration. It is often used for safety margin analysis, such as judging the mechanical reliability of electronic connectors or wire harnesses. Coherence reflects the degree of linear correlation between the input signal and the output signal (value range 0~1). Coherence is calculated from the cross power spectrum and autopower spectrum of the frequency domain signal, and is obtained by analyzing the cross power spectrum and autopower spectrum of the frequency domain signal. The signal undergoes a Fourier transform to convert the time-domain signal into a frequency-domain representation. Then, the autopower spectrum and cross-power spectrum are calculated: the autopower spectrum is the energy density of the signal at various frequencies, usually obtained using the Fourier transform of the autocorrelation function; the cross-power spectrum is obtained by multiplying and averaging the results of the Fourier transforms of the two signals. In practical applications, to reduce the impact of noise on spectrum estimation, the Welch method is often used to estimate the power spectrum. The Welch method divides the signal into multiple overlapping window functions (usually Hanning windows or rectangular windows), then performs a Fourier transform on the signal within each window function, and finally averages the results of all windows. After calculating the autopower spectrum and cross-power spectrum, the coherence is calculated by substituting the square of the absolute value of the cross-power spectrum into the product of the autopower spectrum.

[0051] It should be added that the reference index thresholds are extracted from a preset database, which are generally preset by the testers based on experience rules and stored in the preset database for later retrieval. The judgment conditions include: PSD matching degree is greater than the PSD matching degree threshold; total energy is less than the total energy deviation threshold; the absolute value of the difference between the peak acceleration and the value 1 is the peak acceleration deviation, and the peak acceleration deviation is lower than the peak acceleration deviation threshold; coherence is greater than the coherence threshold. When the number of simulation evaluation indicators exceeding the preset number set by the testers meets the judgment conditions, it is considered qualified; otherwise, it is unqualified.

[0052] In this embodiment, the vibration testing process described above enables higher precision and reliability verification of the FAKRA wiring harness under test in a real vehicle vibration environment. Simultaneous bit error rate testing during vibration allows for real-time correlation between vibration conditions and signal transmission performance. This not only captures transient bit errors caused by vibration but also identifies intermittent failures that traditional phased sampling cannot detect, thus improving the sensitivity and comprehensiveness of the test. Furthermore, by calculating simulation performance evaluation indicators such as PSD matching degree, total energy, peak acceleration, and coherence in real time and automatically determining these against preset thresholds, a high degree of consistency between vibration conditions and the target vehicle operating conditions is ensured, avoiding misjudgments or omissions due to vibration parameters deviating from real operating conditions. Moreover, when the simulation performance assessment fails, vibration simulation optimization is automatically triggered, gradually approximating the vibration input to the real vehicle environment, thereby improving the realism and repeatability of the vibration test. This process, through a closed-loop approach of "real-time monitoring, automatic determination, and target optimization," makes wiring harness vibration testing more accurate and intelligent, ensuring that bit error rate test results more accurately reflect the reliability of the wiring harness during long-term vehicle use.

[0053] Figure 6 shows a flowchart of the vibration simulation optimization process provided in this embodiment of the invention. The specific logic is as follows: read the adjustment weights of each simulation degree evaluation; accumulate the simulation evaluation adjustment weights corresponding to the simulation degree evaluation indicators with unqualified judgment results to obtain the adjustment weights; record the product of the adjustment weights and the maximum optimization degree value as the actual adjustment ratio, and adjust the sensor sampling frequency according to the actual adjustment ratio; if the simulation degree qualification judgment result is unqualified after vibration simulation optimization, prompt the preset test personnel to perform segmented testing, and at the same time use a backup high-bandwidth threshold detection circuit to sample the vibration test data; through the above process, the vibration simulation degree and error test accuracy are improved.

[0054] Furthermore, the specific process of vibration simulation optimization is as follows:

[0055] Read the various simulation evaluation adjustment weights, which include PSD matching degree adjustment weight, total energy adjustment weight, peak acceleration adjustment weight, and coherence adjustment weight.

[0056] Specifically, the simulation evaluation adjustment weights are read from the preset database. The simulation evaluation adjustment weights are used to represent the importance of each simulation evaluation index in the simulation evaluation adjustment. They are generally preset by the testers based on experience rules and historical data.

[0057] The adjustment weights are obtained by summing up the simulation evaluation adjustment weights corresponding to the simulation evaluation indicators that fail the judgment.

[0058] The product of the adjustment weight and the set maximum optimization value is recorded as the actual adjustment ratio, and the sensor sampling frequency is adjusted to compensate for the actual adjustment ratio.

[0059] It should be explained that compensation adjustment means multiplying the sensor sampling frequency by the actual adjustment ratio.

[0060] If the simulation accuracy is deemed unacceptable after vibration simulation optimization, the pre-set test personnel will be prompted to perform segmented testing. Segmented testing means testing the low-frequency and high-frequency wiring harnesses separately, while using a backup high-bandwidth threshold detection circuit to sample the vibration test data.

[0061] In this embodiment, the aforementioned simulation optimization process helps improve the consistency between vibration test conditions and actual vehicle operating conditions, making FAKRA wiring harness error rate testing more stable and accurate. By reading the simulation evaluation adjustment weights corresponding to PSD matching degree, total energy, peak acceleration, and coherence, and accumulating the weights of unqualified items, a quantitative and weighted optimization basis can be formed among different simulation indicators, making the optimization process more refined and controllable. Secondly, by multiplying the accumulated weights by the maximum optimization degree value to obtain the actual adjustment ratio, and based on this ratio, the sensor sampling frequency is compensated and adjusted. The system optimizes sampling characteristics, enabling the vibration environment to quickly approximate real-world operating conditions, thereby ensuring higher reliability of bit error rate test results. Furthermore, if the system still fails to meet standards after vibration simulation optimization, it automatically prompts for segmented testing. By separating low-frequency and high-frequency harnesses for testing and enabling a high-bandwidth threshold detection circuit, it helps avoid pseudo-failures caused by frequency coupling, ensuring that both high-frequency and low-frequency scenarios can be independently and accurately evaluated. This forms a closed-loop mechanism of "automatic diagnosis, weight calculation, proportional optimization, and segmented failure remediation," improving vibration simulation accuracy and bit error rate test precision, and making harness reliability assessment more intelligent, stable, and comprehensive.

[0062] Figure 7 illustrates the flowchart of bit error rate (BER) fluctuation monitoring provided in this embodiment of the invention. The specific logic is as follows: A BER test is performed on the FAKRA harness under test based on a set test cycle, and the BER change trend is recorded during the test. Within the test cycle, BER data fluctuation evaluation parameters are acquired in real time. A BER test fluctuation evaluation value is quantified based on the BER data fluctuation evaluation parameters and compared with a BER test fluctuation threshold. If the BER test fluctuation evaluation value is greater than the BER test fluctuation threshold, corresponding test optimization measures are taken; otherwise, a BER fluctuation change determination is performed to determine whether test prevention measures should be taken. Through the above process, the accuracy of the FAKRA harness BER test process and the reliability of the harness in long-term use are improved.

[0063] Furthermore, the fluctuation of the bit error rate is monitored during the testing period. The specific process is as follows:

[0064] The first step involves conducting continuous bit error rate (BER) tests on the FAKRA harness under test based on the set test cycle, and recording the BER trend during the test. This simulates the long-term working state of the FAKRA harness under test in actual use, thereby evaluating the long-term stability and reliability of the FAKRA harness under test.

[0065] The second step is to acquire the bit error rate data fluctuation assessment parameters in real time during the test period. The bit error rate data fluctuation assessment parameters include bit error rate, bit error count, and clock offset.

[0066] Specifically, the bit error rate and bit error count are read directly from the bit error tester, while the clock skew is obtained from the clock analyzer.

[0067] The third step is to quantify the bit error rate test fluctuation assessment value based on the bit error rate data fluctuation assessment parameters, which reflects the magnitude of the change in bit error rate during the testing process within the testing period, and compare it with the preset bit error rate test fluctuation threshold. The bit error rate test fluctuation threshold is a preset value set in advance by the testers and stored in the preset database.

[0068] It should be added that the specific acquisition of the bit error rate test fluctuation evaluation value is obtained by coupling the normalized bit error rate data fluctuation evaluation parameters with the corresponding set weights. Among them, the set weights include bit error rate weight, bit error count weight, and clock offset weight. These are all preset by the testers based on experience rules and historical data and stored in a preset database for later use.

[0069] If the bit error rate test fluctuation assessment value is greater than the bit error rate test fluctuation threshold, corresponding test optimization measures will be taken; otherwise, a bit error rate fluctuation change determination will be made to determine whether test preventive measures should be taken to prevent abnormal bit error rate fluctuations during stability testing.

[0070] In this embodiment, a long-term continuous bit error rate (BER) test is conducted on the FAKRA harness under test to simulate its long-term use in a real working environment, thereby evaluating its long-term stability and reliability. By setting an appropriate test cycle and recording the BER trend during the test, the transmission stability of the harness at different points in time is comprehensively reflected, ensuring that the test results are more representative and avoiding the lack of practical significance of short-term test results. Secondly, by quantifying the BER data fluctuation evaluation parameters and obtaining the BER test fluctuation evaluation value, and comparing it with a preset threshold, it is possible to more accurately identify whether the BER fluctuation exceeds the normal range. When the BER fluctuation exceeds the set threshold, optimization measures are automatically triggered to adjust the test conditions in a timely manner, avoiding the impact of abnormal BER fluctuations on the test results and ensuring the accuracy and stability of the test. If the fluctuation evaluation value does not exceed the standard, the BER fluctuation change is judged, and preventive measures are taken to ensure that stability problems during the test are detected and resolved in a timely manner. Furthermore, this real-time monitoring and dynamic optimization method helps to improve the accuracy of the test process and the reliability assessment capability of the harness in long-term use, and can better reflect its performance in actual applications.

[0071] Further testing and optimization measures are as follows:

[0072] The corresponding clock interval synchronization adjustment value is obtained by mapping the absolute value between the bit error rate test fluctuation assessment value and the bit error rate test fluctuation threshold.

[0073] It should be added that the difference between the bit error rate (BER) test fluctuation assessment value and the BER test fluctuation threshold is recorded as the BER test value. The BER test value is input into the BER clock adjustment set, and the corresponding clock interval synchronization adjustment value is output. The BER clock adjustment set is used to fit the mapping relationship between the BER test value and the clock interval synchronization adjustment value. The BER clock adjustment set is obtained by training on the initial dataset constructed by the logistic regression algorithm and based on the least squares criterion and the statsmodels framework. The training data used are the BER test values ​​obtained in the historical time period and the clock interval synchronization adjustment values ​​set according to empirical rules.

[0074] The clock reset interval is shortened by adjusting the clock interval synchronization value. This is done by multiplying the clock interval synchronization value and the clock reset interval to obtain the time drift optimization amount. The clock reset interval represents the time length for resynchronization and automatic positioning between the signal source and the receiver.

[0075] Time synchronization is reset based on the time drift optimization amount. When the clock reset interval is shortened to below the set minimum reset interval, the clock reset interval is restored to the initial clock reset interval, and the clock drift anomaly is promptly reported to the preset manual test terminal. The minimum reset interval is preset by the preset test personnel and stored in the preset database.

[0076] In this embodiment, the clock synchronization optimization mechanism based on bit error rate fluctuations improves the timing accuracy and bit error rate determination reliability of the FAKRA harness during stability testing. By mapping the absolute difference between the bit error rate test fluctuation evaluation value and the bit error rate fluctuation threshold to obtain the clock interval synchronization adjustment value, a quantitative correlation between bit error rate fluctuations and the clock synchronization strategy is achieved, making the clock synchronization adjustment more precise and adaptive. Secondly, by shortening the clock reset interval using this adjustment value, a time drift optimization amount can be obtained, which is used to compensate for the time drift between the signal source and the receiver in real time, thereby reducing the time drift caused by time base deviation. The resulting error rate deviation improves the accuracy and consistency of the testing process. When the reset interval is shortened to below the minimum threshold, the system will automatically restore to the initial reset interval and promptly report the anomaly to the manual testing end, enabling testers to quickly identify potential clock drift faults and avoid affecting the overall testing process due to overcompensation. This method, through a closed-loop mechanism of "error rate fluctuation perception, clock synchronization optimization, and automatic anomaly reporting," not only improves the stability of time base control but also ensures that the evaluation results of the error rate are more reliable in long-term stability testing, thereby significantly enhancing the transmission stability judgment capability of FAKRA harnesses under actual operating conditions.

[0077] Furthermore, the error rate fluctuation is assessed to determine whether preventative testing measures should be taken to proactively prevent abnormal error rate fluctuations during stability testing. The specific process is as follows:

[0078] The absolute value of the bit error rate test fluctuation assessment value and the bit error rate test fluctuation threshold is used to obtain the bit error rate fluctuation difference, which is then matched with the read bit error rate tolerance range. The bit error rate tolerance range is a preset value for testers, set according to experience rules and historical data, and stored in a preset database.

[0079] If the bit error rate fluctuation is within the bit error rate tolerance range, the test result analysis continues; otherwise, test prevention measures are taken. The specific process is as follows: perform deviation calculation based on the bit error rate fluctuation and the bit error rate tolerance range to obtain the corresponding bit error deviation value, and then perform normalization calculation on the bit error deviation value to obtain the corresponding bit error deviation degree value.

[0080] It should be explained that if the bit error rate fluctuation difference is greater than the maximum value of the bit error rate tolerance range, then the ratio of the difference between the bit error rate fluctuation difference and the maximum value of the bit error rate tolerance range to the maximum value of the bit error rate tolerance range is recorded as the bit error deviation value. If the bit error rate fluctuation difference is less than the minimum value of the bit error rate tolerance range, then the absolute value of the ratio of the difference between the bit error rate fluctuation difference and the minimum value of the bit error rate tolerance range to the minimum value of the bit error rate tolerance range is recorded as the bit error deviation value.

[0081] The error rate deviation value is compensated by multiplying it with the preset adjustment ratio set by the tester to obtain the corresponding clock reset interval preset value. The clock reset interval is then adjusted using the clock reset interval preset value.

[0082] In this embodiment, the dynamic prediction and clock adjustment mechanism based on the bit error rate fluctuation difference enables early identification and proactive prevention of potential bit error anomalies in FAKRA harness stability testing. The bit error rate fluctuation difference is obtained by performing absolute value calculations on the bit error rate test fluctuation assessment value and threshold, and then matched with the bit error rate tolerance range. This allows for the early detection of fluctuation trends before actual bit error anomalies occur, preventing sudden changes in bit error rates from causing test errors. Furthermore, by performing deviation calculations on the bit error rate fluctuation difference to obtain the bit error deviation value, and then normalizing it, bit error offsets of different magnitudes can be converted into a uniform scale of bit error deviation, which is beneficial for subsequent compensation. The control is more precise; the clock reset interval pre-adjustment is obtained by compensating the bit error deviation value with the preset adjustment ratio, so that a clear quantitative correspondence is formed between clock synchronization adjustment and bit error deviation, realizing adaptive adjustment of time base drift; by dynamically adjusting the clock reset interval through this pre-adjustment, the trend of bit error fluctuation expansion can be effectively suppressed, and the bit error rate abnormality caused by time base offset can be prevented, thus improving the timing consistency and signal judgment accuracy in long-cycle testing; this method constructs a closed-loop control mechanism from bit error fluctuation detection, deviation quantification to clock compensation adjustment, which is conducive to improving the accuracy, intelligence and robustness of bit error rate stability testing.

[0083] Furthermore, the specific steps for analyzing the test results are as follows:

[0084] First, collect all test data, including the initial bit error rate, the bit error rate after extreme insertion and removal, the bit error rate change in vibration and mechanical shock tests, the bit error rate change in environmental adaptability tests, and the results of stability tests (i.e., long-term continuous tests). Among them, long-term continuous tests are to simulate the long-term working state of the harness in actual use, and can be performed for several hours or days, such as vibration along three axes for a total of 24 hours.

[0085] It should be noted that the change in bit error rate (BER) is reflected by the ratio of the number of erroneous symbols (Ne) during transmission to the total number of symbols transmitted (Nt); the results of long-term continuous testing include pass or fail, with a BER below 10. -12 The value is considered acceptable if it is not acceptable, otherwise it is considered unacceptable. (Value 10) -12 It is usually derived from the performance requirements and technical standards of the communication system, especially for high-requirement communication applications such as satellite communication, fiber optic communication or mobile communication systems.

[0086] Then, through a multi-objective optimization algorithm, performance indicators are introduced simultaneously during the testing process, and the optimal test parameter configuration is found according to the multi-objective optimization algorithm so that all performance indicators reach the set optimal state. The performance indicators include bit error rate, transmission speed and signal attenuation.

[0087] Finally, the test data was compared and analyzed with the set standard requirements to evaluate whether the error rate performance of the FAKRA harness met the test requirements.

[0088] In this embodiment, through the aforementioned data collection and multi-objective optimization analysis process, a comprehensive, accurate, and intelligent evaluation of the bit error rate performance of the FAKRA harness is achieved. By systematically collecting initial bit error rate, bit error rate after extreme insertion / removal, bit error rate changes during vibration and mechanical shock, environmental adaptability test results, and long-term stability test data, sufficient data support is provided for the final performance evaluation. Secondly, by introducing a multi-objective optimization algorithm, and simultaneously optimizing key performance indicators such as bit error rate, transmission speed, and signal attenuation, the testing process achieves optimal matching with the actual performance of the harness, thereby improving testing efficiency and reducing... The deviations caused by manual parameter tuning are eliminated, ensuring more objective and stable test results. Furthermore, multi-objective optimization balances conflicting relationships between different indicators, enabling the harness to simultaneously achieve optimal performance across multiple metrics such as high bandwidth, low bit error rate, and low attenuation. This facilitates a more comprehensive evaluation of its applicability in high-performance communication systems. Moreover, by comparing and analyzing multi-dimensional test data with standard requirements, it is easier to accurately determine whether the FAKRA harness under test meets industry or project specifications. This method improves the comprehensiveness, intelligence, and accuracy of bit error rate performance assessment, building a more efficient technical system for harness reliability verification.

[0089] Furthermore, the specific process for evaluating whether the bit error rate performance of the FAKRA harness under test meets the test requirements is as follows:

[0090] If the bit error rate meets the test requirements, troubleshoot the FAKRA harness to identify the problem and take appropriate corrective measures.

[0091] Test data is received in real time through a data streaming processing architecture, and the test data is analyzed in real time using a set algorithm to quickly identify and report potential problems; the set algorithm includes, but is not limited to, statistical analysis, machine learning algorithms, etc.

[0092] The probability that the actual bit error rate detected by the bit error rate tester is higher than the test requirement is recorded as the statistical confidence level. If the statistical confidence level is greater than the preset confidence level, the test result is considered qualified; otherwise, the test result is considered unqualified.

[0093] It should be explained that the confidence level is obtained in the following way:

[0094] ;

[0095] Where h is the set standard value, C is the confidence level, N is the number of transmitted data bits, K is the number of bit errors, and λ is the bit error rate. The test is considered passed when the probability that the bit error rate is less than the set standard value is higher than the confidence level; conversely, the test is considered passed when the probability that the bit error rate is greater than the set standard value is higher than the confidence level.

[0096] ;

[0097] The test results are considered unsatisfactory.

[0098] In the formula, P(λ|K,N) represents the probability density function of the bit error rate λ when K errors are observed and N bits are transmitted (usually derived based on the binomial distribution or Poisson distribution). The test pass determination means that the probability that the actual bit error rate ≤ the standard value h is ≥ the confidence level C. At this time, the test is considered to have passed, that is, the confidence level that the system bit error rate meets the requirements is high enough. The test failure determination means that the probability that the actual bit error rate ≥ the standard value h is ≥ the confidence level C. At this time, the test result is considered to be unsatisfactory, and the system bit error rate may not meet the requirements.

[0099] In this embodiment, the bit error rate (BER) assessment mechanism based on real-time data analysis and statistical confidence level judgment further enhances the intelligence and diagnostic capabilities of FAKRA harness BER testing. Even when the BER meets the testing requirements, the system continues to troubleshoot the harness, helping to identify potential hidden problems such as minor contact issues, shielding attenuation trends, or performance boundary changes caused by insertion / removal fatigue. This allows the harness to receive a more comprehensive health assessment before mass production or vehicle installation, significantly improving overall reliability. Secondly, by receiving test data in real-time through a data streaming processing architecture and combining it with a set algorithm for instant analysis, the system can identify potential problems such as BER fluctuations, jitter anomalies, and eye diagram degradation at the millisecond level, avoiding the lag of traditional offline analysis and improving the response speed and diagnostic sensitivity of the testing system. This mechanism, through a closed-loop process of "real-time streaming analysis, rapid problem identification, and statistical confidence level judgment," makes BER testing more accurate, agile, and reliable, effectively improving the quality assurance capabilities of FAKRA harnesses in complex real-world application scenarios.

[0100] Figure 8 is a block diagram of a FAKRA wire harness bit error rate testing apparatus according to an exemplary embodiment, which is used in a FAKRA wire harness bit error rate testing method. Referring to Figure 4, the apparatus includes a bit error rate tester 1, a vibration table 2, a left side board-end connector 3, a left side wire-end connector 4, a mating connector 5, a right side wire-end connector 6, a right side board-end connector 7, and the FAKRA wire harness to be tested 8. Wherein:

[0101] The two ends of the error error generator 1 are electrically connected to the left board connector 3. A vibration table 2 for testing is provided on one side of the error error generator 1. The left board connector 3, the left wire connector 4, the FAKRA wire harness under test 8, the mating connector 5, the right wire connector 6, and the right board connector 7 are all fixedly connected to the vibration table 2. The left wire connector 4 is fixedly connected to the left board connector 3. The left wire connector 4 is connected to the FAKRA wire harness under test 8. One end of the FAKRA wire harness under test 8 is connected to the mating connector 5, and the other end is fixedly connected to the right wire connector 6. The other end of the right wire connector 6 is fixedly connected to the right board connector 7.

[0102] The above embodiments can be implemented, in whole or in part, by software, hardware (such as circuits), firmware, or any other combination thereof. When implemented using software, the above embodiments can be implemented, in whole or in part, as a computer program product. A computer program product includes one or more computer instructions or computer programs. When the computer instructions or computer programs are loaded or executed on a computer, all or part of the flow or function according to the embodiments of the present invention is generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. Computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., infrared, wireless, microwave, etc.) means. A computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more sets of available media. Available media can be magnetic media (e.g., floppy disks, hard disks, magnetic tapes), optical media (e.g., DVDs), or semiconductor media. Semiconductor media can be solid-state drives.

[0103] It should be understood that the term "and / or" in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. A and B can be singular or plural. Additionally, the character " / " in this article generally indicates an "or" relationship between the preceding and following related objects, but it can also represent an "and / or" relationship. Please refer to the context for a more accurate understanding.

[0104] In this invention, "at least one" means one or more, and "more than one" means two or more. "At least one of the following" or similar expressions refer to any combination of these items, including any combination of a single item or a plurality of items. For example, at least one of a, b, or c can represent: a, b, c, ab, ac, bc, or abc, where a, b, and c can be a single item or multiple items.

[0105] It should be understood that, in various embodiments of the present invention, the order of the above-mentioned process numbers does not imply the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present invention.

[0106] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0107] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working processes of the devices, apparatuses, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0108] In the embodiments provided by this invention, it should be understood that the disclosed devices, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another device, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices or units may be electrical, mechanical, or other forms.

[0109] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0110] In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0111] If a function is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, or the part that contributes to the prior art, or a part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods of the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0112] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for testing bit error rates in FAKRA harnesses, characterized in that, The specific steps of the method include: Step 1, calibrating the test equipment; Step 2, under set temperature and humidity conditions, using a bit error rate analyzer to test the initial bit error rate of the FAKRA harness under test; Step 3, performing extreme insertion and extraction tests on the connectors and mating connectors at both ends of the FAKRA harness under test; Step 4, conducting vibration tests on a vibration table and evaluating the simulation accuracy of the vibration tests to determine whether vibration simulation optimization is needed to improve the simulation accuracy; the specific process of vibration simulation optimization is as follows: reading the adjustment weights of each simulation accuracy evaluation, including PSD matching degree adjustment weight, total energy adjustment weight, peak acceleration adjustment weight, and coherence adjustment weight; and adjusting the simulation accuracy evaluation indicators that fail the judgment to improve the simulation accuracy. The corresponding simulation evaluation adjustment weights are accumulated to obtain the adjustment weight; the product of the adjustment weight and the set maximum optimization degree value is recorded as the actual adjustment ratio, and the sensor sampling frequency is compensated and adjusted according to the actual adjustment ratio; if the simulation degree qualification judgment result is unqualified after vibration simulation optimization, the preset test personnel are prompted to conduct segmented testing. The segmented testing means testing the low frequency and high frequency harnesses separately, and using a backup high bandwidth threshold detection circuit to sample the vibration test data; Step 5, monitor the fluctuation of bit error rate during the test period to determine whether to take corresponding clock optimization measures; the specific process of monitoring the fluctuation of bit error rate during the test period is as follows: based on the set The test cycle involves performing bit error rate (BER) testing on the FAKRA harness under test and recording the BER trend during the test. Within the test cycle, BER data fluctuation assessment parameters are acquired in real time, including BER, BER count, and clock skew. A BER test fluctuation assessment value, reflecting the magnitude of BER changes during the test cycle, is quantified based on these parameters and compared with a preset BER test fluctuation threshold. If the BER test fluctuation assessment value is greater than the BER test fluctuation threshold, corresponding test optimization measures are implemented; otherwise, a BER fluctuation change determination is performed to determine whether test prevention measures should be taken. The specific test optimization measures are as follows: Based on the absolute value between the bit error rate test fluctuation evaluation value and the bit error rate test fluctuation threshold, the corresponding clock interval synchronization adjustment value is obtained; the clock reset interval is shortened by the clock interval synchronization adjustment value to obtain the time drift optimization amount, where the clock reset interval represents the time length for resynchronization and automatic positioning between the signal source and the receiver; time synchronization reset is performed according to the time drift optimization amount, and when the clock reset interval is shortened to below the set minimum reset interval, the clock reset interval is restored to the initial clock reset interval, and the clock drift anomaly is reported to the preset manual test terminal; step six, collect all test data and evaluate whether the bit error rate performance of the FAKRA harness under test meets the test requirements.

2. The FAKRA harness bit error rate testing method according to claim 1, characterized in that, The calibration of the test equipment includes calibrating the bit error rate analyzer, checking the vibration table, preparing the wire harness, and setting parameters. The initial bit error rate test of the FAKRA wire harness under test using the bit error rate analyzer also includes testing the key electrical parameters of the FAKRA wire harness under test, including contact resistance, insertion loss, and return loss. The specific operation of the extreme insertion and removal test is as follows: extreme oblique removal and extreme oblique insertion are performed in a preset number of different directions for a preset number of times, and the bit error rate of the FAKRA wire harness under test is tested using the bit error rate analyzer after each insertion and removal.

3. The FAKRA harness bit error rate testing method according to claim 1, characterized in that, The process of evaluating the simulation degree of vibration testing to determine whether to optimize vibration simulation to improve the simulation degree is as follows: During vibration, a bit error rate test is performed using a bit error rate tester, and the simulation degree evaluation index and the extracted reference index threshold are used to determine the simulation degree qualification. The result of the simulation degree qualification determination includes a qualification result and a failure result. A failure result indicates that the numerical relationship between the simulation degree evaluation index and the corresponding reference index threshold does not meet the set judgment conditions. If the judgment result is unqualified, the corresponding vibration simulation optimization will be performed; otherwise, no additional processing will be performed. The simulation degree evaluation index includes PSD matching degree, total energy, peak acceleration, and coherence.

4. The FAKRA harness bit error rate testing method according to claim 1, characterized in that, The specific process for determining whether to take test prevention measures by judging the change in bit error rate fluctuation is as follows: The absolute value of the bit error rate test fluctuation assessment value and the bit error rate test fluctuation threshold is calculated to obtain the bit error rate fluctuation difference, and then matched with the read bit error rate tolerance range: If the bit error rate fluctuation difference is within the bit error rate tolerance range, the test result analysis is continued; otherwise, test prevention measures are taken. The specific process is as follows: Based on the bit error rate fluctuation difference and the bit error rate tolerance range, the deviation is calculated to obtain the corresponding bit error deviation value, and then the bit error deviation value is normalized to obtain the corresponding bit error deviation degree value. The error deviation value is compensated by the preset adjustment ratio to obtain the corresponding clock reset interval pre-adjustment amount, and the clock reset interval is adjusted by the clock reset interval pre-adjustment amount.

5. The FAKRA harness bit error rate testing method according to claim 4, characterized in that, The specific steps for analyzing the test results are as follows: collect all test data, including the initial bit error rate, the bit error rate after extreme insertion and removal, the bit error rate change in vibration and mechanical shock tests, the bit error rate change in environmental adaptability tests, and the results of stability tests; A multi-objective optimization algorithm is used to simultaneously introduce performance indicators during the testing process, and the optimal test parameter configuration is found based on the multi-objective optimization algorithm. The performance indicators include bit error rate, transmission speed, and signal attenuation. The test data is compared and analyzed with the set standard requirements to evaluate whether the bit error rate performance of the FAKRA harness meets the test requirements.

6. The FAKRA harness bit error rate testing method according to claim 1, characterized in that, The specific process for evaluating whether the bit error rate of the FAKRA harness under test meets the test requirements is as follows: if the bit error rate meets the test requirements, the FAKRA harness is troubleshooted; test data is received in real time through a data streaming processing architecture, and the test data is analyzed in real time using a set algorithm; The probability that the actual bit error rate detected by the bit error rate tester is higher than the test requirement is recorded as the statistical confidence level. If the statistical confidence level is greater than the preset confidence level, the test result is considered qualified; otherwise, the test result is considered unqualified.

7. A FAKRA harness bit error rate testing device, used to implement the FAKRA harness bit error rate testing method according to any one of claims 1-6, characterized in that, include: The test includes a bit error rate tester (1), a vibration table (2), a left-side board connector (3), a left-side wire connector (4), a mating connector (5), a right-side wire connector (6), a right-side board connector (7), and a FAKRA harness under test (8). The two ends of the bit error rate tester (1) are electrically connected to the left-side board connector (3). The vibration table (2) for testing is provided on one side of the bit error rate tester (1). The test includes the left-side board connector (3), the left-side wire connector (4), the FAKRA harness under test (8), and the mating connector (5). The right-side wire connector (6) and the right-side plate connector (7) are both fixedly connected to the vibration table (2); the left-side plate connector (3) is fixedly connected to the left-side wire connector (4), and the left-side wire connector (4) is connected to the FAKRA harness (8) to be tested; one end of the FAKRA harness (8) to be tested is connected to the mating connector (5), and the other end is fixedly connected to the right-side wire connector (6); the other end of the right-side wire connector (6) is fixedly connected to the right-side plate connector (7).

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