Test fixture

Abstract

The utility model relates to the technical field of test auxiliary devices, in particular to a test fixture. The test fixture is electrically connected with the resistance tester, the heating mesh comprises a first conductive pin and a second conductive pin, and the test fixture comprises a base and a test assembly. The base is provided with a bearing surface for placing the heating mesh, and the bearing surface is an insulating surface; the test assembly comprises a first test end and a second test end which are connected to the base, and the distance between the first test end and the second test end is adjustable; the first test end is detachably and electrically connected with the resistance tester and the first conductive pin. The second test end is detachably and electrically connected with the resistance tester and the second conductive pin. The bearing surface can bear the heating net, and the distance between the first test end and the second test end can be adjusted according to the distance between the first conductive pin and the second conductive pin, so that the risk of deformation of the heating net can be reduced, and the risk of damage of the heating net in the resistance test process is further reduced.

Description

Technical Field

[0001] This application relates to the field of testing auxiliary device technology, and in particular to a testing fixture. Background Technology

[0002] In the field of electronic atomization technology, resistance heating atomization is currently the mainstream atomization method. The core component of the resistance heating atomizer is the heating element. Therefore, to ensure consistent flavor, the resistance of the heating element must be within the specified range before installation. This requires using a resistance tester to test the resistance of each heating element.

[0003] Currently, the resistance testing method uses a tester with two clamps, which clamp the positive and negative terminals of the heating element respectively for resistance testing. However, the positions of the clamps in the tester are not fixed. During the test, the movement of the clamps will change the relative positions of the positive and negative terminals of the heating element, making the heating element prone to deformation and damage. Utility Model Content

[0004] The purpose of this application is to provide a test fixture that solves the technical problem of easy damage to the heating mesh during resistance testing.

[0005] To achieve the above objectives, the technical solution adopted in this application embodiment is: a test fixture electrically connected to a resistance tester for testing the resistance value of the heating mesh of an electronic atomizer, wherein the heating mesh includes a first conductive pin and a second conductive pin, and the test fixture includes a base and a test component.

[0006] The base has a bearing surface for placing the heating mesh, and the bearing surface is an insulating surface; the testing assembly includes a first test terminal and a second test terminal connected to the base, and the distance between the first test terminal and the second test terminal is adjustable; wherein, one end of the first test terminal is electrically connected to the resistance tester, and the other end of the first test terminal is detachably electrically connected to the first conductive pin; one end of the second test terminal is electrically connected to the resistance tester, and the other end of the second test terminal is detachably electrically connected to the second conductive pin.

[0007] The beneficial effects of the test fixture provided in this application are as follows: Since the base has a bearing surface for placing the heating element, and the heating element placed on the bearing surface has a first conductive pin and a second conductive pin, the test assembly includes a first test terminal and a second test terminal connected to the base. One end of the first test terminal is electrically connected to a resistance tester, and the other end of the first test terminal is detachably electrically connected to the first conductive pin; one end of the second test terminal is electrically connected to the resistance tester, and the other end of the second test terminal is detachably electrically connected to the second conductive pin. This allows the resistance tester to test the resistance of the heating element, and the bearing surface can support the heating element, preventing the heating element from moving relative to the base. Because the distance between the first test terminal and the second test terminal is adjustable, the distance between the first test terminal and the second test terminal can be adjusted according to the distance between the first conductive pin and the second conductive pin on the heating element, reducing the risk of deformation of the heating element and thus reducing the risk of damage to the heating element during resistance testing.

[0008] In some embodiments, a first receiving groove is formed by recessing one side of the bearing surface of the base, the first receiving groove being used to receive the first test end and the second test end; when the heating mesh is placed on the bearing surface, the first conductive pin is attached to or inserted into the first test end, and the second conductive pin is attached to or inserted into the second test end.

[0009] In some embodiments, the first test terminal and the second test terminal have the same structure, and both the first test terminal and the second test terminal include:

[0010] A positioning part is connected to the base and housed in the first receiving groove, and the positioning part is made of insulating material;

[0011] A conductive part is connected to the positioning part. One end of the conductive part is connected to the resistance tester, and the other end of the conductive part is electrically connected to the first conductive pin or the second conductive pin.

[0012] In some embodiments, the end of the positioning part is provided with a first positioning structure, and the inner wall of the first receiving groove is provided with a plurality of second positioning structures arranged side by side. The first positioning structure and the second positioning structure are engaged and cooperated. The first test end and the second test end are engaged and cooperated with the second positioning structure of the first receiving groove through their respective first positioning structures, so as to realize the adjustment of the distance between the first test end and the second test end.

[0013] In some embodiments, the positioning part is provided with a first guide structure, and the first receiving groove is provided with a second guide structure extending in the direction of the distribution of the first test end and the second test end. The first guide structure and the second guide structure are slidably engaged and reciprocate in the direction of the distribution of the first test end and the second test end. The first test end and the second test end are slidably engaged with the second guide structure of the first receiving groove through their respective first guide structures, so as to realize the adjustment of the distance between the first test end and the second test end.

[0014] In some embodiments, the conductive portion includes a groove and a first pressing body connected to one end of the groove. The end of the groove away from the first pressing body is electrically connected to the resistance tester. The end of the groove connected to the first pressing body accommodates the first conductive pin or the second conductive pin. The first pressing body is used to press and fix the first conductive pin or the second conductive pin.

[0015] In some embodiments, one end of the conductive part is provided with a first through hole, and the end of the conductive part away from the first through hole is electrically connected to the resistance tester. The end of the conductive part with the first through hole is used to accommodate the first conductive pin or the second conductive pin. The inner diameter of the first through hole gradually increases from the end connected to the resistance tester to the end away from the resistance tester.

[0016] In some embodiments, the conductive portion includes two first elastic sheets spaced apart, the distance between the two first elastic sheets being elastically adjustable; one end of the conductive portion away from the two first elastic sheets is electrically connected to the resistance tester, and the first conductive pin or the second conductive pin is sandwiched between the two first elastic sheets.

[0017] In some embodiments, the test fixture further includes a zeroing component, which is rotatably connected to the base so that the zeroing component is close to the first test end and the second test end, thereby making the first test end and the second test end conductive.

[0018] In some embodiments, a second receiving groove is formed by recessing one side of the bearing surface of the base, and the second receiving groove is disposed adjacent to the first receiving groove; the zeroing component is received in the second receiving groove. Attached Figure Description

[0019] To more clearly illustrate the technical solutions in the embodiments of this application, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0020] Figure 1 This is a schematic diagram of the test fixture and heating mesh in one embodiment of this application;

[0021] Figure 2 yes Figure 1 The exploded view of the test fixture shown;

[0022] Figure 3 yes Figure 1 The diagram shows the structure of the test fixture reset component with the first and second test terminals connected.

[0023] Figure 4 yes Figure 2 An exploded view of the first test end in the test fixture shown.

[0024] Figure 5 This is a schematic diagram of the structure of the first test end in another embodiment of this application;

[0025] Figure 6 yes Figure 5 The diagram shows the exploded structure of the first test end;

[0026] Figure 7 This is a schematic diagram of the structure of the first test end in another embodiment of this application;

[0027] Figure 8 This is a schematic diagram of the structure of the first test end in another embodiment of this application;

[0028] Figure 9 yes Figure 8 The diagram shows the exploded structure of the first test end.

[0029] Figure label:

[0030] 1. Heating mesh; 11. First conductive pin; 12. Second conductive pin; 13. Heating mesh;

[0031] 2. Base; 21. Bearing surface; 22. First receiving slot; 221. Second positioning structure; 23. Second receiving slot;

[0032] 3. Test components; 31. First test end; 311. Positioning part; 3111. Connecting groove; 3112. First positioning structure; 312. Conductive part; 3121. Groove body; 3122. First pressing body; 3123. First wire hole; 3124. First elastic sheet; 32. Second test end; 33. First connecting wire; 34. Second connecting wire;

[0033] 4. Reset component; 41. Rotating component; 42. Conductive component. Detailed Implementation

[0034] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0035] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on or indirectly on that other component. When a component is referred to as being "connected to" another component, it can be directly connected to or indirectly connected to that other component.

[0036] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0037] In this specification, references to "one embodiment," "some embodiments," or simply "embodiment" mean that one or more embodiments of this application include a specific feature, structure, or characteristic described in connection with that embodiment. Therefore, the phrases "in one embodiment," "in some embodiments," "in other embodiments," "in still other embodiments," etc., appearing in different parts of this specification do not necessarily refer to the same embodiment, but rather mean "one or more, but not all, embodiments," unless otherwise specifically emphasized. Furthermore, in one or more embodiments, specific features, structures, or characteristics may be combined in any suitable manner.

[0038] In the field of electronic atomization technology, resistance heating atomization is currently the mainstream atomization method. The core component of the resistance heating atomizer is the heating element. Therefore, to ensure consistent flavor, the resistance of the heating element must be within the specified range before installation. This requires using a resistance tester to test the resistance of each heating element.

[0039] Currently, the resistance testing method uses a tester with two clamps, which clamp the positive and negative terminals of the heating element respectively for resistance testing. However, the positions of the clamps in the tester are not fixed. During the test, the movement of the clamps will change the relative positions of the positive and negative terminals of the heating element, making the heating element prone to deformation and damage.

[0040] In view of the above problems, this application provides a test fixture to solve the technical problem that the heating mesh is easily damaged during the resistance testing process.

[0041] To illustrate the technical solution of this application, the following description is provided in conjunction with specific accompanying drawings and embodiments.

[0042] Please refer to Figure 1 This application provides a test fixture electrically connected to a resistance tester for testing the resistance of the heating mesh 1 of an electronic atomizer. The heating mesh 1 includes a first conductive pin 11 and a second conductive pin 12. The test fixture includes a base 2 and a test component 3.

[0043] In some embodiments, the heating mesh 1 may include a plurality of first conductive pins 11 and a plurality of second conductive pins 12, and a heating mesh 13 located between adjacent first conductive pins 11 and second conductive pins 12. The first conductive pins 11 and second conductive pins are electrically connected to the two ends of the heating mesh 13 to supply power to the heating mesh 13. It is understood that the first conductive pin 11 may be one of a positive pin and a negative pin, and the second conductive pin 12 may be the other of a positive pin and a negative pin, etc., which will not be listed here.

[0044] In this embodiment, the heating mesh 1 includes two first conductive pins 11 and one second conductive pin 12, wherein the second conductive pin 12 is located between the two first conductive pins 11. The first conductive pins 11 are negative pins, and the second conductive pin 12 is a positive pin.

[0045] The base 2 has a bearing surface 21 for placing the heating mesh 1, and the bearing surface 21 is an insulating surface; the test assembly 3 includes a first test end 31 and a second test end 32 connected to the base 2, and the distance between the first test end 31 and the second test end 32 is adjustable; wherein, one end of the first test end 31 is electrically connected to a resistance tester, and the other end of the first test end 31 is detachably electrically connected to a first conductive pin 11; one end of the second test end 32 is electrically connected to a resistance tester, and the other end of the second test end 32 is detachably electrically connected to a second conductive pin 12.

[0046] Please refer to Figure 1The test assembly 3 also includes a first connecting wire 33 and a second connecting wire 34. One end of the first connecting wire 33 is electrically connected to the first test terminal 31, and the other end of the first connecting wire 33 is used to plug into the positive port of the resistance tester, so that the first test terminal 31 is electrically connected to the resistance tester. One end of the second connecting wire 34 is electrically connected to the second test terminal 32, and the other end of the second connecting wire 34 is used to plug into the negative port of the resistance tester.

[0047] When testing the resistance of the heating element 1 using the test fixture of this embodiment, the first connecting wire 33 is pre-connected to the positive port of the resistance tester, and the second connecting wire 34 is pre-connected to the negative port of the resistance tester. Then, the heating element 1 is placed on the bearing surface 21 of the base 2, and the first conductive pin 11 of the heating element 1 is electrically connected to the first test terminal 31, and the second conductive pin 12 of the heating element 1 is electrically connected to the second test terminal 32. Since the bearing surface 21 is an insulating surface, the influence of the base 2 on the resistance of the heating element 1 can be reduced. Optionally, the material used to make the base 2 can be plastic, rubber, ceramic, etc.

[0048] In the test fixture provided in this application, the base 2 has a bearing surface 21 for placing the heating mesh 1. The heating mesh 1 placed on the bearing surface 21 has a first conductive pin 11 and a second conductive pin 12. The test assembly 3 includes a first test terminal 31 and a second test terminal 32 connected to the base 2. One end of the first test terminal 31 is electrically connected to a resistance tester, and the other end of the first test terminal 31 is detachably electrically connected to the first conductive pin 11. One end of the second test terminal 32 is electrically connected to a resistance tester, and the other end of the second test terminal 32 is detachably electrically connected to the second conductive pin 12. This allows the resistance tester to test the resistance of the heating mesh 1, and the bearing surface 21 can support the heating mesh 1 to prevent the heating mesh 1 from moving relative to the base 2. Since the distance between the first test terminal 31 and the second test terminal 32 is adjustable, the distance between the first test terminal 31 and the second test terminal 32 can be adjusted according to the distance between the first conductive pin 11 and the second conductive pin 12 on the heating mesh 1. This reduces the risk of deformation of the heating mesh 1, thereby reducing the risk of damage to the heating mesh 1 during resistance testing.

[0049] Please refer to Figure 1 and Figure 2 In some embodiments, a first receiving groove 22 is formed by recessing one side of the bearing surface 21 of the base 2. The first receiving groove 22 is used to receive the first test end 31 and the second test end 32. When the heating mesh 1 is placed on the bearing surface 21, the first conductive pin 11 is attached to or inserted into the first test end 31, and the second conductive pin 12 is attached to or inserted into the second test end 32.

[0050] In the above embodiment, when the heating mesh 1 is placed on the supporting surface 21, the first conductive pin 11 and the second conductive pin 12 will be suspended above the opening of the first receiving groove 22. The first test end 31 and the second test end 32 are received in the first receiving groove 22, and both the first test end 31 and the second test end 32 are flush with or protrude from the supporting surface 21 in the orientation direction of the opening of the first receiving groove 22, so that the first conductive pin 11 can be attached to the first test end 31 and the second conductive pin 12 can be attached to the second test end 32, so that the first conductive pin 11 is electrically connected to the first test end 31 and the second conductive pin 12 is electrically connected to the second test end 32.

[0051] In the above embodiments, both the first test terminal 31 and the second test terminal 32 are provided with connection structures such as wire holes, insertion slots or snap-fit ​​slots, so that the first conductive pin 11 can be inserted into the first test terminal 31 and the second conductive pin 12 can be inserted into the second test terminal 32.

[0052] Please refer to Figure 2 In some embodiments, the first test terminal 31 and the second test terminal 32 have the same structure, and both the first test terminal 31 and the second test terminal 32 include a positioning part 311 and a conductive part 312. The positioning part 311 is connected to the base 2 and housed in the first receiving groove 22, and the positioning part 311 is made of insulating material. The conductive part 312 is connected to the positioning part 311, one end of the conductive part 312 is connected to the resistance tester, and the other end of the conductive part 312 is electrically connected to the first conductive pin 11 or the second conductive pin 12.

[0053] In the above embodiment, the conductive part 312 is made of conductive material. When the first conductive pin 11 contacts the conductive part 312, the first conductive pin 11 and the conductive part 312 can be electrically connected. When the first connecting line 33 contacts the conductive part 312, the first connecting line 33 and the conductive part 312 can be electrically connected, so that the first conductive pin 11 can be electrically connected to the first connecting line 33 through the conductive part 312.

[0054] Generally, if the first test end 31 and the second test end 32 are too small, they are inconvenient for the tester to hold, making it difficult to move them and adjust the distance between them. However, since conductive materials are expensive, making both the first test end 31 and the second test end 32 conductive would increase the cost of the test fixture. The above embodiment, by separating the first test end 31 and the second test end 32 into a connectable positioning part 311 and a conductive part 312, allows the first test end 31 and the second test end 32 to be reduced in size without decreasing their volume, thus lowering the cost of the test fixture.

[0055] Optionally, the material used to make the conductive part 312 can be metals such as copper and aluminum, or their alloys.

[0056] Please refer to Figure 4 In some embodiments, the positioning part 311 is provided with a connecting groove 3111, and the conductive part 312 is engaged in the connecting groove 3111 so as to facilitate the splicing of the positioning part 311 and the conductive part 312.

[0057] Please refer to Figure 2 In some embodiments, the end of the positioning part 311 is provided with a first positioning structure 3112, and the inner wall of the first receiving groove 22 is provided with a plurality of second positioning structures 221 arranged side by side. The first positioning structure 3112 and the second positioning structure 221 are engaged and cooperated. The first test end 31 and the second test end 32 are engaged and cooperated with the second positioning structure 221 of the first receiving groove 22 through their respective first positioning structures 3112, so as to realize the adjustment of the distance between the first test end 31 and the second test end 32.

[0058] In the above embodiment, multiple second positioning structures 221 are spaced apart in the distribution direction of the first test end 31 and the second test end 32. The first positioning structure 3112 can adjust the position of the first test end 31 and the second test end 32 by engaging with different second positioning structures 221, so as to adjust the distance between the first test end 31 and the second test end 32.

[0059] In some embodiments, the first positioning structure 3112 includes a locking block, and the second positioning structure 221 includes a locking groove extending in the depth direction of the first receiving groove 22. The locking block engages in the locking groove, thereby connecting the positioning part 311 to the base 2.

[0060] Please refer to Figure 4In the above embodiment, the first positioning structure 3112 includes two locking blocks disposed at opposite ends of the positioning part 311, and the second positioning structure 221 includes two locking slots disposed on opposite inner walls of the first receiving groove 22. The two locking blocks are respectively engaged one-to-one in the two locking slots, which can enhance the stability of the connection between the positioning part 311 and the base 2.

[0061] In some embodiments, the first positioning structure 3112 includes a slot extending in the depth direction of the first receiving groove 22, and the second positioning structure 221 includes a locking block that engages with the slot, thereby connecting the positioning part 311 to the base 2.

[0062] In the above embodiment, the first positioning structure 3112 includes two slots, which are disposed at opposite ends of the positioning part 311. The second positioning structure 221 includes two blocks, which are disposed on opposite inner walls of the first receiving groove 22. The two blocks are respectively engaged one-to-one in the two slots, which can enhance the stability of the connection between the positioning part 311 and the base 2.

[0063] In some embodiments, the positioning part 311 is provided with a first guide structure, and the first receiving groove 22 is provided with a second guide structure extending in the direction of the distribution of the first test end 31 and the second test end 32. The first guide structure and the second guide structure are slidably engaged and reciprocate in the direction of the distribution of the first test end 31 and the second test end 32. The first test end 31 and the second test end 32 are slidably engaged with the second guide structure of the first receiving groove 22 through their respective first guide structures, so as to realize the adjustment of the distance between the first test end 31 and the second test end 32.

[0064] In the above embodiment, when the first guide structure slides relative to the second guide structure, the relative position of the positioning part 311 and the base 2 can be changed so that the distance between the first test end 31 and the second test end 32 can be adjusted, and the distance between the first test end 31 and the second test end 32 can be adjusted steplessly.

[0065] In some embodiments, the first guide structure is a slider, and the second guide structure is a groove extending along the direction of the distribution of the first test end 31 and the second test end 32. When the slider slides relative to the groove, the relative position of the positioning part 311 and the base 2 can be changed, so that the distance between the first test end 31 and the second test end 32 can be adjusted.

[0066] In some embodiments, the first guide structure is a groove extending along the direction in which the first test end 31 and the second test end 32 are distributed, and the second guide structure is a slide rail extending along the direction in which the first test end 31 and the second test end 32 are distributed. When the groove slides relative to the slide rail, the relative position of the positioning part 311 and the base 2 can change, so that the distance between the first test end 31 and the second test end 32 can be adjusted.

[0067] Please refer to Figure 5 and Figure 6 In some embodiments, the conductive portion 312 includes a groove 3121 and a first pressing body 3122 connected to one end of the groove 3121. The end of the groove 3121 away from the first pressing body 3122 is electrically connected to a resistance tester. The end of the groove 3121 connected to the first pressing body 3122 receives a first conductive pin 11 or a second conductive pin 12. The first pressing body 3122 is used to press and fix the first conductive pin 11 or the second conductive pin 12.

[0068] In the above embodiment, the first pressing body 3122 is connected to the positioning part 311, and part of the first pressing body 3122 covers the opening of the groove 3121. The first conductive pin 11 or the second conductive pin 12 can be inserted into the groove 3121 through the gap between the first pressing body 3122 and the groove 3121, and the first pressing body 3122 presses and fixes the first conductive pin 11 or the second conductive pin 12. This allows the first conductive pin 11 or the second conductive pin 12 to be fixed in the groove 3121, which increases the contact area between the first conductive pin 11 or the second conductive pin 12 and the conductive part 312, and makes the connection between the first conductive pin 11 or the second conductive pin 12 and the conductive part 312 more stable.

[0069] Alternatively, in the above embodiment, the first pressing body 3122 is first removed from the positioning part 311, and the heating mesh 1 is placed on the bearing surface 21, so that the first conductive pin 11 or the second conductive pin 12 is suspended on the conductive part 312. Then, the first pressing body 3122 is connected to the positioning part 311, so that the first pressing body 3122 presses and fixes the first conductive pin 11 or the second conductive pin 12. This allows the first conductive pin 11 or the second conductive pin 12 to be fixed in the groove 3121, which can increase the contact area between the first conductive pin 11 or the second conductive pin 12 and the conductive part 312, and make the connection between the first conductive pin 11 or the second conductive pin 12 and the conductive part 312 more stable.

[0070] Optionally, the conductive part 312 may also include a second pressing body for pressing and fixing the first connecting wire 33 or the second connecting wire 34 in the groove 3121, so that the first connecting wire 33 or the second connecting wire 34 can be detachably electrically connected to the conductive part 312.

[0071] Optionally, the first connecting line 33 or the second connecting line 34 can be soldered onto the conductive part 312, so that the first connecting line 33 or the second connecting line 34 is electrically connected to the conductive part 312.

[0072] Please refer to Figure 7 In some embodiments, one end of the conductive part 312 is provided with a first wire hole 3123, and the end of the conductive part 312 away from the first wire hole 3123 is electrically connected to the resistance tester. The end of the conductive part 312 with the first wire hole 3123 is used to accommodate the first conductive pin 11 or the second conductive pin 12. The inner diameter of the first wire hole 3123 gradually increases from the end connected to the resistance tester to the end away from the resistance tester.

[0073] In the above embodiment, the first conductive pin 11 or the second conductive pin 12 can be inserted into the first through hole 3123, so that the first conductive pin 11 or the second conductive pin 12 can be electrically connected to the conductive part 312. Since the inner diameter of the first through hole 3123 gradually increases from the end connected to the resistance tester to the end away from the resistance tester, the first through hole 3123 is a tapered hole, and the first conductive pin 11 or the second conductive pin 12 can be inserted into the first through hole 3123 through the large hole of the tapered hole. With the above arrangement, it is convenient for the first conductive pin 11 or the second conductive pin 12 to be inserted into the first through hole 3123.

[0074] Optionally, the conductive part 312 may also have a second wire hole at one end away from the first wire hole 3123, and the first connecting wire 33 or the second connecting wire 34 is inserted into the second wire hole, so that the first connecting wire 33 or the second connecting wire 34 is electrically connected to the conductive part 312.

[0075] Please refer to Figure 8 and Figure 9 In some embodiments, the conductive part 312 includes two first elastic sheets 3124 spaced apart, and the distance between the two first elastic sheets 3124 can be elastically adjusted; one end of the conductive part 312 away from the two first elastic sheets 3124 is electrically connected to a resistance tester, and a first conductive pin 11 or a second conductive pin 12 is sandwiched between the two first elastic sheets 3124.

[0076] In the above embodiment, since the distance between the two first elastic pieces 3124 is elastically adjustable, when the first conductive pin 11 or the second conductive pin 12 is sandwiched between the two first elastic pieces 3124, the two first elastic members are driven to move away from each other, so that the first conductive pin 11 or the second conductive pin 12 can be placed between the two first elastic pieces 3124. Then, the two first elastic members rebound and clamp the first conductive pin 11 or the second conductive pin 12. The first conductive pin 11 or the second conductive pin 12 is sandwiched between the two first elastic pieces 3124, so that the first conductive pin 11 or the second conductive pin 12 can be electrically connected to the conductive part 312.

[0077] Optionally, the conductive part 312 may also have two second elastic sheets at one end away from the first elastic sheet 3124, the distance between the two second elastic sheets can be flexibly adjusted, and the first connecting line 33 or the second connecting line 34 is sandwiched between the two second elastic sheets.

[0078] Please refer to Figure 1 and Figure 3 In some embodiments, the test fixture further includes a zeroing component 4, which is rotatably connected to the base 2 so that the zeroing component 4 is close to the first test end 31 and the second test end 32, so that the first test end 31 and the second test end 32 are connected.

[0079] With the first connecting wire 33 plugged into the positive port of the resistance tester and the second connecting wire 34 plugged into the negative port of the resistance tester, rotate the zeroing component 4 so that the zeroing component 4 contacts the conductive part 312 in the first test terminal 31 and the conductive part 312 in the second test terminal 32 respectively, so that the conductive parts 312 in the first test terminal 31 and the conductive parts 312 in the second test terminal 32 are connected through the zeroing component 4. At this time, the resistance tester displays the sum of the resistance of the conductive part 312 in the first test terminal 31, the resistance of the conductive part 312 in the second test terminal 32, the resistance of the first connecting wire 33 and the resistance of the second connecting wire 34. Then adjust the resistance tester so that the resistance displayed by the resistance tester is zero to achieve the zeroing work before testing. After that, rotate the zeroing component 4 so that the zeroing component 4 is away from the first test terminal 31 and the second test terminal 32. Then place the heating mesh 1 on the bearing surface 21 of the base 2, and electrically connect the first conductive pin 11 of the heating mesh 1 to the first test terminal 31, and electrically connect the second conductive pin 12 of the heating mesh 1 to the second test terminal 32. At this time, the resistance displayed by the resistance tester is the resistance of the heating mesh 1.

[0080] The reset component 4 includes a rotating member 41 and a conductive member 42. The rotating member 41 is rotatably mounted on the base 2, and the conductive member 42 is mounted on the rotating member 41. The rotating member 41 is made of insulating material, and the conductive member 42 is made of conductive material. The rotating member 41 can rotate relative to the base 2, causing the conductive member 42 to move above the first test terminal 31 and the second test terminal 32, so that the conductive member 42 contacts the conductive portion 312 in the first test terminal 31 and the conductive portion 312 in the second test terminal 32, respectively, so that the conductive portion 312 in the first test terminal 31 and the conductive portion 312 in the second test terminal 32 are connected through the conductive member 42. This configuration reduces the cost of the reset component 4.

[0081] Please refer to Figure 3 In some embodiments, a second receiving groove 23 is formed by recessing one side of the bearing surface 21 of the base 2, and the second receiving groove 23 is disposed adjacent to the first receiving groove 22; the reset component 4 is received in the second receiving groove 23.

[0082] When testing the resistance of the heating element 1, the zeroing component 4 is housed in the second receiving slot 23 to prevent the heating element 1 from contacting the zeroing component 4, thereby preventing the heating element 1 from short-circuiting.

[0083] In a direction perpendicular to the rotation axis of the zeroing component 4, the first receiving groove 22 and the second receiving groove 23 are spaced apart. When the zeroing component 4 is received in the second receiving groove 23, the surface of the conductive element 42 facing away from the rotating element 41 faces the opening of the second receiving groove 23, and the conductive element 42 is received in the second receiving groove 23 to prevent the heating mesh 1 placed on the bearing surface 21 from contacting the conductive element 42. The rotating element 41 drives the conductive element 42 to rotate, so that the surface of the conductive element 42 facing away from the rotating element 41 faces the opening of the first receiving groove 22, so that the conductive element 42 can contact the first test terminal 31 and the second test terminal 32.

[0084] The above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application, and should all be included within the protection scope of this application.

Claims

1. A test fixture electrically connected to a resistance tester for testing the resistance of a heating element in an electronic atomizer, wherein the heating element includes a first conductive pin and a second conductive pin, characterized in that, include: The base has a bearing surface for placing the heating mesh, and the bearing surface is an insulating surface; The test component includes a first test terminal and a second test terminal connected to the base, and the distance between the first test terminal and the second test terminal is adjustable; Wherein, one end of the first test terminal is electrically connected to the resistance tester, and the other end of the first test terminal is detachably electrically connected to the first conductive pin; one end of the second test terminal is electrically connected to the resistance tester, and the other end of the second test terminal is detachably electrically connected to the second conductive pin.

2. The test fixture according to claim 1, characterized in that, The base has a recessed first receiving groove on one side of the bearing surface, which is used to receive the first test end and the second test end. When the heating mesh is placed on the bearing surface, the first conductive pin is attached to or inserted into the first test end, and the second conductive pin is attached to or inserted into the second test end.

3. The test fixture according to claim 2, characterized in that, The first test terminal and the second test terminal have the same structure, and both the first test terminal and the second test terminal include: A positioning part is connected to the base and housed in the first receiving groove, and the positioning part is made of insulating material; A conductive part is connected to the positioning part. One end of the conductive part is connected to the resistance tester, and the other end of the conductive part is electrically connected to the first conductive pin or the second conductive pin.

4. The test fixture according to claim 3, characterized in that, The end of the positioning part is provided with a first positioning structure, and the inner wall of the first receiving groove is provided with a plurality of second positioning structures arranged side by side. The first positioning structure and the second positioning structure are engaged and cooperated. The first test end and the second test end are engaged and cooperated with the second positioning structure of the first receiving groove through their respective first positioning structures, so as to realize the adjustment of the distance between the first test end and the second test end.

5. The test fixture according to claim 3, characterized in that, The positioning part is provided with a first guide structure, and the first receiving groove is provided with a second guide structure extending along the distribution direction of the first test end and the second test end. The first guide structure and the second guide structure slide together and move back and forth along the distribution direction of the first test end and the second test end. The first test end and the second test end slide together with the second guide structure of the first receiving groove through their respective first guide structures, so as to realize the adjustment of the distance between the first test end and the second test end.

6. The test fixture according to any one of claims 3 to 5, characterized in that, The conductive part includes a groove and a first pressing body connected to one end of the groove. The end of the groove away from the first pressing body is electrically connected to the resistance tester. The end of the groove connected to the first pressing body accommodates the first conductive pin or the second conductive pin. The first pressing body is used to press and fix the first conductive pin or the second conductive pin.

7. The test fixture according to any one of claims 3 to 5, characterized in that, One end of the conductive part is provided with a first wire hole, and the end of the conductive part away from the first wire hole is electrically connected to the resistance tester. The end of the conductive part with the first wire hole is used to accommodate the first conductive pin or the second conductive pin. The inner diameter of the first wire hole gradually increases from the end connected to the resistance tester to the end away from the resistance tester.

8. The test fixture according to any one of claims 3 to 5, characterized in that, The conductive part includes two first elastic sheets spaced apart, and the distance between the two first elastic sheets can be elastically adjusted; the end of the conductive part away from the two first elastic sheets is electrically connected to the resistance tester, and the first conductive pin or the second conductive pin is sandwiched between the two first elastic sheets.

9. The test fixture according to any one of claims 2 to 5, characterized in that, The test fixture also includes a zeroing component, which is rotatably connected to the base so that the zeroing component is close to the first test end and the second test end, thereby making the first test end and the second test end conductive.

10. The test fixture according to claim 9, characterized in that, The base has a second receiving groove recessed on one side of the bearing surface, which is adjacent to the first receiving groove; the reset component is received in the second receiving groove.

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