Semi-automatic programmer chip detection device

Abstract

The utility model discloses a semi-automatic programmer chip detection device which comprises a working box and a driver installed at the upper end of the working box, a feeding port is formed in the outer wall of the front end of the working box, a feeding rail is arranged in the feeding port to convey a chip to move, a driving rod is arranged in the driver, and the driving rod is connected with the working box. A detection plate is fixedly connected to the outer wall of the lower end of the driving rod to process detected information, a detection head is arranged on the outer wall of the lower end of the detection plate to abut against a chip, and a display screen is fixedly connected to the outer wall of the right end of the working box to display a detected result. When the burnt chips need to be detected, the waiting time of each round of detection is reduced, the efficiency of the whole production line is indirectly improved, a plurality of chips can be detected in the same time period, the detection period is shortened, and higher working efficiency can be realized in a smaller space.

Description

Technical Field

[0001] This utility model belongs to the field of chip testing technology, specifically relating to a semi-automatic programmer chip testing device. Background Technology

[0002] A semi-automatic chip programmer testing device is a piece of equipment used in the production or testing of electronic components. It is designed to write programs into chips and perform functional tests. This device is typically used on production lines or in laboratories to ensure that the chips manufactured or used meet specific technical parameters and quality standards. However, in manual loading and unloading processes, after testing a chip, it needs to be removed and replaced. Using this method for chip testing requires a significant amount of time for chip replacement, reducing testing efficiency. Utility Model Content

[0003] The purpose of this invention is to provide a semi-automatic chip testing device for programmers, in order to solve the problem mentioned in the background art that a lot of time needs to be spent on chip replacement, which reduces testing efficiency.

[0004] To achieve the above objectives, this utility model provides the following technical solution: a semi-automatic programmer chip testing device, comprising a work box and a driver installed on the upper end of the work box;

[0005] The front outer wall of the working box has a feed inlet.

[0006] The feed inlet is equipped with a feed rail to transport the chip for movement.

[0007] The driver has a drive rod inside, and a detection plate is fixedly connected to the lower outer wall of the drive rod to process the detected information. A probe head is provided on the lower outer wall of the detection plate to abut against the chip. A display screen is fixedly connected to the right outer wall of the work box to display the detected results.

[0008] A fixed frame is fixedly connected to the rear outer wall of the feeding rail to limit the position of the chip. A guide rail is provided on the rear side of the fixed frame. Multiple rollers are equidistantly arranged inside the guide rail to guide the movement of the chip. A push rod is provided inside the feeding rail to push the chip to move under the action of external force.

[0009] Preferably, an outlet is provided inside the outer wall of the right end of the work box, and multiple positioning rods are fixedly connected at equal intervals between the inner walls of the left and right ends of the guide rail to limit the position of the roller.

[0010] Preferably, a push plate is fixedly connected to the outer wall of the rear end of the push rod, and the corner of the guide rail is arc-shaped.

[0011] Preferably, the vertical length of the guide rail is greater than the vertical length of the roller, and the feed rail has an opening inside for the push rod to move.

[0012] Preferably, a control box is fixedly connected to the upper outer wall of the work box, and a power supply box is provided inside the control box to provide the power required by the accessories.

[0013] Preferably, a handle is fixedly connected to the front outer wall of the feeding rail so that the feeding rail can move back and forth inside the feed inlet under the action of external force, and an indicator light is provided on the front outer wall of the working box to indicate the working status.

[0014] Preferably, a base is fixedly connected to the lower outer wall of the work box, and a signal transmitter is provided inside the detection plate to transmit data after the detection is completed.

[0015] Preferably, the display screen is equipped with a signal receiver to receive signals emitted by the signal transmitter, and the display screen can be controlled by touch.

[0016] Compared with the prior art, the present invention provides a semi-automatic chip testing device for programmers, which has the following advantages:

[0017] By installing push rods, rollers, guide rails, and a fixed frame, multiple chips to be tested can be arranged sequentially on the feed rail when testing is required. The chips to be tested are placed inside the fixed frame, and then the feed rail is inserted into the inlet. After the chips on the fixed frame are tested, the push rod is pushed to move the last chip on the feed rail and the chips in front, so that the chips on the fixed frame are pushed onto the roller, and the chips behind fall into the fixed frame to wait for testing. After testing, the push rod is pushed forward again, and the previous operation is repeated. The first chip pushed onto the roller can be pushed forward by the subsequent chips and pushed outward under the guidance of the roller and guide rail. This allows for rapid replacement of chips, reduces the waiting time between each round of testing, and indirectly improves the efficiency of the entire production line. Multiple chips can be tested in the same time period, greatly shortening the testing cycle. It can also achieve high working efficiency in a small space and is suitable for production environments of different sizes. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of a semi-automatic programmer chip testing device according to the present invention.

[0019] Figure 2 This is a partial structural schematic diagram of the front cross-section of the working box area of ​​this utility model.

[0020] Figure 3 This is a top view of a partial structural diagram of the working box area of ​​this utility model.

[0021] Figure 4 This is a partial structural schematic diagram of the side cross-section of the feeding rail area of ​​this utility model.

[0022] In the diagram: 1. Base; 2. Working box; 3. Feed inlet; 4. Indicator light; 5. Control box; 6. Display screen; 7. Feed rail; 8. Handle; 9. Push rod; 10. Power supply box; 11. Driver; 12. Drive rod; 13. Detection plate; 14. Probe head; 15. Roller; 16. Outlet; 17. Guide rail; 18. Push plate; 19. Fixing frame; 20. Positioning rod. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] This utility model provides, for example Figure 1-4 The semi-automatic programmer chip testing device shown includes a work box 2 and a driver 11 installed on the upper end of the work box 2;

[0025] The front outer wall of the working box 2 is provided with a feed inlet 3;

[0026] The feed inlet 3 is equipped with a feed rail 7 to transport the chip for movement;

[0027] The driver 11 has a drive rod 12 inside. The lower outer wall of the drive rod 12 is fixedly connected to a detection plate 13 to process the detected information. The lower outer wall of the detection plate 13 is provided with a probe head 14 to abut against the chip. The right outer wall of the work box 2 is fixedly connected to a display screen 6 to display the detection results. First, the feed rail 7 is pulled outward and the chip to be tested is placed inside the feed rail 7. Then, the feed rail 7 is inserted into the feed port 3. When the chip reaches the detection position, the driver 11 is started and the drive rod 12 starts to move. The drive rod 12 moves downward and pushes the detection plate 13 toward the chip to be tested. The probe head 14 abuts against the chip surface through the detection plate 13 to perform electrical and functional tests on the chip. The detection plate 13 receives the information fed back by the probe head 14, processes and analyzes the data, and transmits the data to the display screen 6 for the staff to view.

[0028] A fixed frame 19 is fixedly connected to the rear outer wall of the feed rail 7 to limit the position of the chip. A guide rail 17 is provided on the rear side of the fixed frame 19. Multiple rollers 15 are equidistantly arranged inside the guide rail 17 to guide the movement of the chip. A push rod 9 is provided inside the feed rail 7 to push the chip to move under the action of external force. When it is necessary to test the programmed chip, multiple chips to be tested can be arranged sequentially on the feed rail 7, and the chips to be tested can be placed inside the fixed frame 19. Then, the feed rail 7 is inserted into the feed port 3. After the chips on the fixed frame 19 have been tested, the feed rail can be pushed by pushing the push rod 9. The last chip on the 7th side pushes the chip on the front side, causing the chip on the fixed frame 19 to be pushed onto the roller 15, and the chip on the rear side falls into the fixed frame 19. The chip that falls into the fixed frame 19 will be positioned by the bottom roller 15. When the external force push is blocked, it means that the chip has been pushed into position and is waiting for the bottom to detect. After the detection is completed, it is pushed forward again, but with greater force, so that the chip can be pushed onto the roller 15. Then the previous operation is repeated. The first chip pushed onto the roller 15 can be pushed forward by the subsequent chips and pushed outward under the guidance of the roller 15 and the guide rail 17.

[0029] like Figure 3 and Figure 4 As shown, an outlet 16 is provided inside the outer wall of the right end of the work box 2. Multiple positioning rods 20 are fixedly connected at equal intervals between the inner walls of the left and right ends of the guide rail 17 to limit the position of the roller 15. A push plate 18 is fixedly connected to the outer wall of the rear end of the push rod 9. The corner of the guide rail 17 is arc-shaped. The vertical length of the guide rail 17 is greater than the vertical length of the roller 15. An opening for the push rod 9 to move is provided inside the feeding rail 7.

[0030] When transporting chips on multiple rollers 15, the chips are eventually pushed out through outlet 16, allowing staff to collect the chips after inspection. When a damaged chip is found, the feed rail 7 is removed. After removing the damaged chip, the feed rail 7 can be reinserted into the inlet 3 for continued inspection. When pushing the chip, the push rod 9 is gripped, and the push plate 18 pushes the chip from front to back. When the chip is pushed, the chip on the roller 15 moves, causing the roller 15 to rotate under the restriction of the positioning rod 20, thereby guiding the chip to move outward and be output from outlet 16.

[0031] like Figure 1 and Figure 2As shown, a control box 5 is fixedly connected to the upper outer wall of the working box 2. The control box 5 is equipped with a power supply box 10 to provide the power required by the accessories. A handle 8 is fixedly connected to the front outer wall of the feeding rail 7 so that the feeding rail 7 can move back and forth inside the feed inlet 3 under the action of external force. An indicator light 4 is provided on the front outer wall of the working box 2 to indicate the working status.

[0032] The power supply box 10 inside the control box 5 provides power to the entire equipment, ensuring that all component drivers 11, probes 14, indicator lights 4, and displays 6 can work normally. A handle 8 is set at the front end of the feed rail 7, allowing the operator to manually move the feed rail 7 back and forth as needed to better align it with the feed inlet 3 or perform maintenance. During equipment operation, the indicator light 4 will display the current status of the equipment. If the indicator light 4 is green, it means that a testing process is in progress; if it is red, it means that the chip is currently damaged; if it is flashing, it means that it is in standby mode, waiting for the testing process to begin.

[0033] like Figure 1 and Figure 2 As shown, a base 1 is fixedly connected to the lower outer wall of the working box 2. A signal transmitter is installed inside the detection plate 13 to send out data after the detection is completed. A signal receiver is installed inside the display screen 6 to receive the signal sent by the signal transmitter. The display screen 6 can be controlled by touch.

[0034] The base 1 restricts the placement of the work box 2 and provides overall support for the equipment. When the detection board 13 detects the information of the chip being detected, it can send a signal to the signal receiver inside the display screen 6 through the signal transmitter. The display screen 6 can convert the received signal into text and display it on the display screen 6.

[0035] The implementation principle of this embodiment is as follows: First, the feeding rail 7 is pulled outward, and the chip to be tested is placed inside the feeding rail 7. Then, the feeding rail 7 is inserted into the inlet 3. When the chip reaches the testing position, the driver 11 is activated, and the drive rod 12 starts to move. The drive rod 12 moves downward, pushing the detection plate 13 towards the chip to be tested. The probe 14 abuts against the chip surface through the detection plate 13 to perform electrical and functional tests on the chip. The detection plate 13 receives the information fed back by the probe 14, processes and analyzes the data, and transmits the data to the display screen 6 for viewing by the staff. When it is necessary to test the programmed chip, multiple chips to be tested can be arranged sequentially on the feeding rail 7 and placed inside the fixed frame 19, and then the feeding rail 7 is inserted. The feed rail 7 is inserted into the feed inlet 3. After the chips on the fixed frame 19 are detected, the last chip on the feed rail 7 can be pushed by pushing the push rod 9, thereby pushing the chips on the front side. This pushes the chips on the fixed frame 19 onto the roller 15, and the chips on the back side fall into the fixed frame 19. The chips that fall into the fixed frame 19 will be positioned by the bottom roller 15. When the external force push is blocked, it means that the chip has been pushed into position and is waiting for detection on the lower side. After the detection is completed, it is pushed forward again, but with greater force, so that the chip can be pushed onto the roller 15. Then the previous operation is repeated. The first chip pushed onto the roller 15 can be pushed forward by the subsequent chips and pushed outward under the guidance of the roller 15 and the guide rail 17.

[0036] Finally, it should be noted that the above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. Although the present utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. A semi-automatic programmer chip testing device, comprising a work box (2) and a driver (11) mounted on the upper end of the work box (2); The front outer wall of the working box (2) is provided with a feed inlet (3); The feed inlet (3) is equipped with a feed rail (7) to transport the chip for movement; The driver (11) is equipped with a drive rod (12) inside. A detection plate (13) is fixedly connected to the lower outer wall of the drive rod (12) to process the detected information. A probe head (14) is provided on the lower outer wall of the detection plate (13) to abut against the chip. A display screen (6) is fixedly connected to the right outer wall of the work box (2) to display the detected results. Its features are: A fixed frame (19) is fixedly connected to the outer wall of the rear end of the feeding rail (7) to limit the position of the chip. A guide rail (17) is provided on the rear side of the fixed frame (19). Multiple rollers (15) are equidistantly arranged inside the guide rail (17) to guide the movement of the chip. A push rod (9) is provided inside the feeding rail (7) to push the chip to move under the action of external force.

2. The semi-automatic programmer chip testing device according to claim 1, characterized in that: An outlet (16) is provided inside the outer wall of the right end of the work box (2), and multiple positioning rods (20) are fixedly connected at equal intervals between the inner walls of the left and right ends of the guide rail (17) to limit the position of the roller (15).

3. The semi-automatic programmer chip testing device according to claim 1, characterized in that: The push rod (9) has a push plate (18) fixedly connected to its rear outer wall, and the guide rail (17) has an arc shape at the corner.

4. The semi-automatic programmer chip testing device according to claim 1, characterized in that: The vertical length of the guide rail (17) is greater than the vertical length of the roller (15), and the inside of the feeding rail (7) is provided with an opening for the push rod (9) to move.

5. The semi-automatic programmer chip testing device according to claim 1, characterized in that: The upper outer wall of the work box (2) is fixedly connected to a control box (5), and the inside of the control box (5) is equipped with a power supply box (10) to provide the power required for the accessories.

6. The semi-automatic programmer chip testing device according to claim 1, characterized in that: The front end of the feeding rail (7) is fixedly connected to a handle (8) so that the feeding rail (7) can be moved back and forth inside the feed inlet (3) under the action of external force. The front end of the working box (2) is provided with an indicator light (4) to indicate the working status.

7. The semi-automatic programmer chip testing device according to claim 1, characterized in that: The lower outer wall of the work box (2) is fixedly connected to a base (1), and the inside of the detection plate (13) is equipped with a signal transmitter to send out data after the detection is completed.

8. The semi-automatic programmer chip testing device according to claim 1, characterized in that: The display screen (6) is equipped with a signal receiver to receive signals emitted by the signal transmitter, and the display screen (6) can be controlled by touch.

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