Chip test socket
By designing a chip test socket with a base and clamping mechanism, the problem of not being able to test dual-sided pin array chips simultaneously in existing technologies has been solved, achieving stable fixation and efficient testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU JUNHEXIN SEMICON TECH CO LTD
- Filing Date
- 2025-05-19
- Publication Date
- 2026-05-12
AI Technical Summary
Existing test sockets cannot test both the top and bottom sides of a dual-sided pin array chip simultaneously, and are inconvenient to operate, affecting work efficiency.
A chip test socket is designed, comprising a base, a placement groove, a placement seat, a probe hole, and a clamping mechanism. The chip is stably fixed and conveniently installed through a movable notch, a clamping connecting plate, and an auxiliary clamping assembly.
This method achieves stable chip fixation, improves testing quality and work efficiency, and simplifies the operation process.
Smart Images
Figure CN224231819U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to a chip test socket, and more particularly to a test socket suitable for BGA297 model chips. Background Technology
[0002] With the development of science and technology, electronic chips have been widely used in various electronic products. After mass production of chips, it is necessary to test their conformity to select out unqualified chips and retain qualified ones. However, in the current field of semiconductor chip testing, test sockets mainly consist of a lower test socket body, test probes, and a lower test socket probe holding plate to complete the testing of single-sided pin array chips. While these sockets are designed for testing single-sided pin array chips, for new packaging technologies such as double-sided pin array chips, especially the main chip face of stacked semiconductor chips, these test sockets lack the function of simultaneously testing both the upper and lower sides of the chip.
[0003] A search revealed the patent: "An Aging Test Socket for Assisting Chip Heat Dissipation" (CN202222685037.5), which includes an upper pinhole plate, an upper metal clamping plate, a lower metal clamping plate, a lower pinhole plate, and probes. The upper pinhole plate has a test groove on its upper surface, four insulating plates in its center, and a first mounting groove in the center of the test groove. The upper metal clamping plate is fixedly installed inside the first mounting groove. Multiple probe holes are formed on the upper and lower metal clamping plates, and a second mounting groove is formed on the upper surface of the lower pinhole plate. The lower metal clamping plate is fixedly installed inside the second mounting groove. The above structure uses a cover plate to secure the product, requiring manual fixation, reducing work efficiency, and making handling and placement inconvenient.
[0004] In view of the above-mentioned shortcomings, the designer actively researched and innovated in order to create a new type of chip test socket with greater industrial application value. Utility Model Content
[0005] To solve the above-mentioned technical problems, the purpose of this utility model is to provide a chip test socket.
[0006] To achieve the above objectives, the present invention adopts the following technical solution:
[0007] A chip test socket includes a base with a placement groove in the center. A placement seat is connected to the placement groove. The placement groove has neatly arranged fixing pin holes. The placement seat has neatly arranged probe holes, each probe hole corresponding to each fixing pin hole. A probe passes through each fixing pin hole, with its upper end extending into the probe hole and contacting a test point of the chip placed in the placement seat. The base has movable notches on both the left and right sides, each movable notch connected to a first movable component. Corresponding to the movable notches, the placement seat also has notches on its left and right sides. A clamping mechanism is connected to the first movable component, with one side of the clamping mechanism passing through the notch and clamping against the placement seat. The other side of the clamping mechanism is connected to a clamping frame via a second movable component. A movable groove is formed on the base located on the side of the movable notch. A sliding block that slides within the movable groove is connected to the clamping frame. A spring connects the clamping frame and the base.
[0008] Preferably, in the chip test socket, the clamping mechanism includes a clamping connecting plate, which is movably connected to a first movable member. An auxiliary clamping component is connected to one side of the clamping connecting plate that contacts the product. The other end of the clamping connecting plate is connected to a sliding block through a second movable member. When the clamping frame is pressed down, the clamping connecting plate and the auxiliary clamping component will be lifted together and form an open state. A guide lifting platform for guiding the clamping connecting plate to lift is connected inside the movable notch.
[0009] Preferably, in the chip test socket, a positioning groove is provided on the guide lifting platform, and a positioning block corresponding to the positioning groove is connected to the pressing connecting plate.
[0010] Preferably, in the chip test socket, the auxiliary clamping assembly includes an auxiliary clamping plate. An auxiliary groove is formed on the clamping connecting plate on the side that contacts the product. A third movable member is connected to the auxiliary groove. The auxiliary clamping plate is movably connected to the third movable member. One side of the auxiliary clamping plate contacts the product, and the other side of the auxiliary clamping plate moves within the auxiliary groove. An auxiliary spring is connected between the other side of the auxiliary clamping plate and the auxiliary groove.
[0011] Preferably, in the chip test socket, the third moving part is a hinge.
[0012] Preferably, in the chip test socket, both the first movable component and the second movable component are hinges.
[0013] Preferably, in the chip test socket, a guide groove is provided on the base, and a guide block that slides within the guide groove is connected to the clamping frame.
[0014] Preferably, in the chip test socket, a limiting block for limiting the movement distance of the guide block is connected inside the guide slot.
[0015] By means of the above solution, this utility model has at least the following advantages:
[0016] This invention maximizes the opening of the clamping mechanism, facilitating chip installation and providing more stable fixation for the product, thereby improving testing quality and work efficiency.
[0017] The above description is only an overview of the technical solution of this utility model. In order to better understand the technical means of this utility model and to implement it in accordance with the contents of the specification, the preferred embodiments of this utility model are described in detail below with reference to the accompanying drawings. Attached Figure Description
[0018] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this utility model and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.
[0019] Figure 1 This is a schematic diagram of the structure of this utility model;
[0020] Figure 2 This is a top view of the present invention;
[0021] Figure 3 This is a cross-sectional view of the clamping assembly and auxiliary clamping component of this utility model. Detailed Implementation
[0022] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.
[0023] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.
[0024] Example
[0025] like Figure 1 , Figure 2 and Figure 3 As shown, a chip test socket includes a base 1, a placement groove 2 at the center of the base 1, a placement seat 3 connected to the placement groove 2, and a series of neatly arranged fixing pin holes in the placement groove 2. The placement seat 3 has neatly arranged probe holes 4, each probe hole 4 corresponding to a fixing pin hole. A probe 5 passes through each fixing pin hole, with its upper end extending into the probe hole 4 and contacting the test point of the chip placed in the placement seat. The base 1 also has movable... The movable notch is connected to a first movable component 6. Notches are provided on the left and right sides of the placement seat 3 corresponding to the movable notch. A pressing mechanism 7 is connected to the first movable component 6. One side of the pressing mechanism 7 passes through the notch and presses against the placement seat. The other side of the pressing mechanism 7 is connected to the pressing frame 9 through a second movable component 8. A movable groove 10 is provided on the base 1 located on the side of the movable notch. A sliding block 11 that slides in the movable groove is connected to the pressing frame 9. A spring 12 is connected between the pressing frame 9 and the base 1.
[0026] Furthermore, this utility model addresses the pressing and opening of the product, with the following structure: the pressing mechanism 7 includes a pressing connecting plate 71, which is movably connected to the first movable member 6. An auxiliary pressing component 72 is connected to one side of the pressing connecting plate 71 that contacts the product. The other end of the pressing connecting plate 71 is connected to the sliding block 11 via a second movable member. When the pressing frame 3 is pressed down, it causes the pressing connecting plate 71 and the auxiliary pressing component 72 to lift together and form an open state. A guide lifting platform 73 is connected within the movable notch to guide the pressing connecting plate 71 to lift. After the pressing frame is pressed down, the second movable member moves downwards, and simultaneously, under the action of the first movable member, the pressing connecting plate and the auxiliary pressing component are lifted, forcing the pressing connecting plate into an open state, thus allowing the product to be placed.
[0027] When the chip is pressed, the spring force lifts the pressing frame, causing the pressing connecting plate to move downward, thereby pressing the product.
[0028] Furthermore, the opening angle of the clamping connecting plate can be expanded to achieve more stable clamping of the product. The specific structure is as follows: the auxiliary clamping assembly 72 includes an auxiliary clamping plate 75. An auxiliary groove 76 is provided on the clamping connecting plate 71 on the side that contacts the product. A third movable member 77 is connected to the auxiliary groove 76. The auxiliary clamping plate 75 is movably connected to the third movable member 77. One side of the auxiliary clamping plate 75 contacts the product, and the other side of the auxiliary clamping plate 75 is located in the auxiliary groove and moves. An auxiliary spring 74 is connected between the other side of the auxiliary clamping plate 75 and the auxiliary groove 76.
[0029] The specific operation process is as follows: after the clamping connecting plate is opened to the maximum, the auxiliary clamping plate 75 contacts the clamping frame, and as the clamping frame continues to press down, the clamping frame applies pressure to the auxiliary clamping plate 75. Under the action of the third moving part, the auxiliary clamping plate 75 opens outward, thereby achieving a larger opening angle, and its final opening angle can be close to 90°.
[0030] The corresponding more stable clamping is achieved by applying a pushing force to the auxiliary clamping plate 75 again through the elasticity of the auxiliary spring, so that it is subjected to the action of both the spring and the auxiliary spring, thus ensuring stable pressure.
[0031] The pressing connecting plate can achieve accurate positioning during the pressing process. Its structure is as follows: the guide lifting platform 73 is provided with a positioning groove, and the pressing connecting plate 71 is connected with a positioning block corresponding to the positioning groove.
[0032] In this utility model, the first movable member, the second movable member, and the third movable member 77 are all rotating shafts, or other existing movable rods known in the art that can rotate the pressing connecting plate and the auxiliary pressing plate.
[0033] In this invention, the base 1 has a guide groove, and the pressing frame 9 is connected to a guide block that slides within the guide groove. Simultaneously, a limiting block is connected within the guide groove to restrict the movement distance of the guide block. This ensures stable movement of the pressing frame during the pressing process.
[0034] The working principle of this utility model is as follows:
[0035] In practice, the clamping frame is pressed down to open the clamping component, then the chip is placed into the corresponding product. Then the clamping frame is released, and the product is clamped by the spring. Finally, the socket is placed on the corresponding test bench for testing.
[0036] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.
[0037] In the description of this application, it should be noted that the terms "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product is in use. They are used only for the convenience of describing this application and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. Furthermore, the terms "first," "second," etc., are used only to distinguish descriptions and should not be construed as indicating or implying relative importance.
[0038] Furthermore, terms such as "horizontal" and "vertical" do not imply that components must be absolutely horizontal or vertical, but rather that they can be slightly tilted. For example, "horizontal" simply means that its direction is more horizontal than "vertical," and does not mean that the structure must be completely horizontal, but can be slightly tilted.
[0039] In the description of this application, it should also be noted that, unless otherwise expressly specified and limited, the terms "set up," "install," "connect," and "link" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0040] The above description is only a preferred embodiment of the present utility model and is not intended to limit the present utility model. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present utility model, and these improvements and modifications should also be considered within the protection scope of the present utility model.
Claims
1. A chip test socket, characterized in that: The device includes a base (1), a placement groove (2) at the center of the base (1), a placement seat (3) connected to the placement groove (2), a set of fixed pin holes arranged in a neat arrangement in the placement groove (2), and a set of probe holes (4) arranged in a neat arrangement on the placement seat (3). Each probe hole (4) corresponds one-to-one with each fixed pin hole. A probe (5) passes through the fixed pin hole, and the upper end of the probe (5) extends into the probe hole (4) and contacts the test point of the chip placed in the placement seat. The base (1) has movable notches on both the left and right sides. A first movable part (6) is connected inside the notch. The left and right sides of the placement seat (3) corresponding to the movable notch are notches. A pressing mechanism (7) is connected to the first movable part (6). One side of the pressing mechanism (7) passes through the notch and presses against the placement seat. The other side of the pressing mechanism (7) is connected to the pressing frame (9) through the second movable part (8). A movable groove (10) is opened on the base (1) located on the side of the movable notch. A sliding block (11) that slides in the movable groove is connected to the pressing frame (9). A spring (12) is connected between the pressing frame (9) and the base (1).
2. A chip test socket according to claim 1, characterized in that: The pressing mechanism (7) includes a pressing connecting plate (71), which is movably connected to the first movable member (6). An auxiliary pressing component (72) is connected to one side of the pressing connecting plate (71) that contacts the product. The other end of the pressing connecting plate (71) is connected to the sliding block (11) through the second movable member. A guide lifting platform (73) for guiding the pressing connecting plate (71) to lift is connected in the movable notch.
3. A chip test socket according to claim 2, characterized in that: The guide lifting platform (73) is provided with a positioning groove, and the pressing connecting plate (71) is connected with a positioning block corresponding to the positioning groove.
4. A chip test socket according to claim 2, characterized in that: The auxiliary pressing assembly (72) includes an auxiliary pressing plate (75). An auxiliary groove (76) is provided on the pressing connecting plate (71) on the side that contacts the product. A third movable member (77) is connected to the auxiliary groove (76). The auxiliary pressing plate (75) is movably connected to the third movable member (77). One side of the auxiliary pressing plate (75) contacts the product, and the other side of the auxiliary pressing plate (75) is located in the auxiliary groove and moves. An auxiliary spring (74) is connected between the other side of the auxiliary pressing plate (75) and the auxiliary groove (76).
5. A chip test socket according to claim 4, characterized in that: The third movable component (77) is a rotating shaft.
6. A chip test socket according to claim 1, characterized in that: Both the first and second movable parts are pivots.
7. A chip test socket according to claim 1, characterized in that: The base (1) is provided with a guide groove, and the clamping frame (9) is connected with a guide block that slides in the guide groove.
8. A chip test socket according to claim 7, characterized in that: The guide groove is connected to a limiting block for restricting the movement distance of the guide block.