Traceless test needle mold assembly compatible with height difference and test device

Abstract

The utility model is suitable for the field of flexible printed circuit board testing, and provides a height difference compatible traceless test needle mold assembly and a test device. The utility model discloses a height difference compatible traceless test needle mold assembly, which comprises a first needle mold, a fulcrum adjusting unit, a needle head fixing unit, a probe and a double-end needle, the first needle die is used for controlling the needle withdrawing amount of the probe and positioning a product, the probe sequentially penetrates through the fulcrum adjusting unit and the first needle die, and the two ends of the fulcrum adjusting unit are connected with the probe to form an adjustable fulcrum distance; the needle head fixing unit is used for fixing the double-end needle, one end of the double-end needle penetrates out of the needle head fixing unit, and the other end of the double-end needle is connected with the probe. The pin mold assembly can be suitable for PIN pins of products with different height differences, the applicability is improved, the products are prevented from being punctured by the probes, and the product yield is improved.

Description

TECHNICAL FIELD

[0001] The utility model belongs to the field of flexible printed circuit board test, especially relate to a kind of traceless test needle mould assembly and testing device compatible with height difference. BACKGROUND

[0002] With the popularity of mobile electronic products and the advent of 5G era, the volume and function of electronic products such as mobile phones and wearable devices are increasingly demanding, and the test items of flexible printed circuit assembly (FPCA) as the connecting and controlling element in electronic products will be more diversified, with various forms, higher testing difficulty and increasingly higher testing requirements.

[0003] Flexible printed circuit (FPC) is a kind of printed circuit board made of flexible substrate, and there are various components on FPC. Each component has several, and the height difference of each component is different, such as connector, and the test place is not necessarily on the same horizontal plane. The head of the probe in the traditional test method is theoretically on the same horizontal plane, but the test part of the connector has different heights, and the probe compression is different. The previous test method is fixed, that is, the probe is fixed on the needle mould, which leads to inconsistent probe compression if the height of the component is inconsistent, and further unstable test pinning. If the probe compression is too small, it may cause unstable product contact, and if the probe compression is too large, it is easy to pierce or hurt the product itself, damaging the product.

[0004] Therefore, the PIN pin of the existing connector has height difference, which is easy to cause needle printing after probe test, and further cannot pass quality inspection. SUMMARY

[0005] The utility model embodiment aims to provide a kind of traceless test needle mould assembly compatible with height difference, to solve the problem that different height difference connectors cannot be compatible, and traceless test cannot be realized.

[0006] The utility model discloses a kind of compatible height difference's traceless test needle mould components, the compatible height difference's traceless test needle mould components include: first needle mould, fulcrum adjusting unit, needle head fixed unit, probe and double-end needle;The first needle mould is used to control the needle amount of the probe and positioning product, the probe sequentially passes through the fulcrum adjusting unit and the first needle mould, the fulcrum adjusting unit both ends are connected with the probe, forming adjustable fulcrum distance;The needle head fixed unit is used to fix the double-end needle, the double-end needle one end passes out the needle head fixed unit, the other end is connected with the probe.

[0007] Further, the fulcrum adjusting unit includes second needle mould, third needle mould and adjusting column, the probe is inserted from the third needle mould, sequentially passes through the second needle mould and the first needle mould, and is connected with one end of the double-end needle;The adjusting column is arranged between the second needle mould and the third needle mould, the second needle mould is used together with the third needle mould to confirm probe fulcrum distance, and the first needle mould is used to control needle amount and positioning product.

[0008] Further, the adjusting column is a plurality of support columns with different lengths.

[0009] Further, the adjusting column is telescopic column with changeable length.

[0010] Further, the needle head fixed unit includes fourth needle mould and fifth needle mould, the fourth needle mould is used to fix the double-end needle, the double-end needle one end passes out the fifth needle mould, and the other end is connected with the probe.

[0011] Further, the compatible height difference's traceless test needle mould component also includes needle mould PCB board, the needle mould PCB board is connected with the fifth needle mould, and touches the protruding end of the double-end needle.

[0012] Another purpose of the utility model embodiment is a kind of compatible height difference's traceless test device, the compatible height difference's traceless test device includes ceiling assembly, carrier assembly and at least one compatible height difference's traceless test needle mould component;The compatible height difference's traceless test needle mould component is arranged at the bottom of the ceiling assembly and / or the top of the carrier assembly, the carrier assembly is used to place product, and the ceiling assembly is used to drive the compatible height difference's traceless test needle mould component to press down the connector of the product.

[0013] The utility model discloses a kind of compatible height difference's traceless test needle mould assembly provided in embodiment of the utility model. Since the elastic force of probe is related to the compression amount of probe and fulcrum distance, therefore, the utility model designs a needle mould assembly that can simultaneously adjust the compression amount of probe and fulcrum distance. Specifically, fulcrum adjusting unit two ends connect probe, middle section is fulcrum distance, and the greater fulcrum distance, the smaller elastic force of probe;Probe tail is provided with double-end needle, double-end needle is fixed in needle head fixed unit, double-end needle has elasticity, play buffering and reduce the role of elastic force. Two features are combined with each other, so that the needle mould assembly of the utility model can be applicable to various different height difference product PIN pin, improve applicability, avoid probe to hurt product, improve product yield. BRIEF DESCRIPTION OF DRAWINGS

[0014] FIG. 1 The utility model discloses a compatible height difference's traceless test needle mould assembly's explosion map provided in embodiment of the utility model;

[0015] FIG. 2 The utility model discloses a compatible height difference's traceless test needle mould assembly's explosion map provided in embodiment of the utility model;

[0016] FIG. 3 The utility model discloses a compatible height difference's traceless test needle mould assembly's section view provided in embodiment of the utility model;

[0017] Figures:

[0018] 1, first needle mould;2, second needle mould;3, third needle mould;4, fourth needle mould;5, fifth needle mould;6, probe;7, double-end needle;8, adjusting column;9, needle mould PCB board. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical scheme and advantage of the utility model more clearly, the following is combined with drawing and embodiment, and the utility model is further detailed. It should be understood that the specific embodiments described herein are only used to explain the utility model, and are not used to limit the utility model.

[0020] It can be understood that the terms "first", "second" and the like used in the present application can be used in the description herein to describe various elements, unless specifically stated otherwise, these elements are not limited by these terms. These terms are only used to distinguish the first element from another element.

[0021] In one embodiment, as FIGS. 1-3As shown, a non-marking test needle mold assembly compatible with height differences is proposed. The non-marking test needle mold assembly compatible with height differences includes: a first needle mold 1, a fulcrum adjustment unit, a needle fixing unit, a probe 6, and a double-ended needle 7; the first needle mold 1 is used to control the needle extension of the probe 6, the probe 6 passes through the fulcrum adjustment unit and the first needle mold 1 in sequence, the two ends of the fulcrum adjustment unit are connected to the probe 6 to form an adjustable fulcrum distance; the needle fixing unit is used to fix the double-ended needle 7, one end of the double-ended needle 7 passes through the needle fixing unit, and the other end is connected to the probe 6.

[0022] In this embodiment, probe 6 passes sequentially through the fulcrum adjustment unit and the first needle mold 1, and finally contacts the double-ended needle 7 (a double-ended needle is a probe with compressible ends) in the needle fixing unit; the first needle mold 1 is used to position the product to be tested and control the needle extension of probe 6; the fulcrum adjustment unit is used to fix probe 6 and control the elasticity of probe 6; the needle fixing unit is used to fix double-ended needle 7. It can be understood that the fulcrum adjustment unit in this embodiment fixes probe 6 at both ends and can adjust the fulcrum distance. There are several structures that can achieve this function: First, a double-needle mold combined with a sliding structure, where two needle molds are fixedly connected to the probe, and the distance between the needle molds constitutes the fulcrum distance. The needle molds are provided with sliding grooves, all connected to a sliding plate, making the distance between the two needle molds adjustable; Second, a structure where the double needle molds are connected to support columns, where the two needle molds are fixed together by support columns, and the length of the support columns is replaceable, thereby changing the size of the fulcrum distance (e.g., FIG. 3 (As shown); Third, the structure connecting the double-needle mold and the adjusting post, that is, the two needle molds are fixed together by a telescopic post, the length of which is adjustable. This embodiment only gives three feasible methods, but it can be understood that as long as the structure can meet the requirements of the telescopic adjustment fulcrum distance, it should be considered as an inspiration given by the design concept of this embodiment. The double-headed needle 7 is fixed in the needle fixing unit, one end is connected to the probe 6, and the other end is used to connect to the PCB.

[0023] In this embodiment, the compression amount of probe 6 is related to the pin height of the connector. Different pin heights result in different compression amounts of probe 6, and probe 6 with excessive compression may damage the connector pin surface due to excessive elasticity. Since the elasticity of probe 6 is related to both the compression amount and the fulcrum distance, this embodiment designs a pin mold assembly that can simultaneously adjust the compression amount and the fulcrum distance of probe 6. The fulcrum adjustment unit is connected to probe 6 at both ends, with the fulcrum distance in the middle. The larger the fulcrum distance, the smaller the elasticity of probe 6. A double-ended pin 7 is provided at the tail of probe 6 and is fixed to the pin head fixing unit. The double-ended pin 7 is elastic and plays a role in buffering and reducing elasticity. The combination of these two features makes the pin mold assembly of this embodiment applicable to product PIN pins with various height differences, improving applicability, preventing probe 6 from damaging the product, and improving product yield.

[0024] In an optimization scheme, the specific structure of the fulcrum adjusting unit is given. The fulcrum adjusting unit comprises a second needle die 2, a third needle die 3, and an adjusting column 8, the probe 6 is inserted from the third needle die 3, sequentially passes through the second needle die 2 and the first needle die 1, and connects one end of the double-end needle 7; the adjusting column 8 is arranged between the second needle die 2 and the third needle die 3, and is used for adjusting the fulcrum distance of the probe 6.

[0025] In the optimization scheme, the second needle die 2 is floatingly connected with the first needle die 1, a guide column and a spring are arranged between the second needle die 2 and the first needle die 1, the distance between the second needle die 2 and the first needle die 1 can be adjusted through a movable copper sleeve or an equal height screw, the third needle die 3 is fixedly connected with the needle head fixing unit, and the distance between the second needle die 2 and the third needle die 3 determines the size of the fulcrum distance. The second needle die 2 and the third needle die 3 are used for fixing the probe 6 and controlling the elastic force of the probe 6. When the probe 6 is subjected to pressure, the probe 6 located between the second needle die 2 and the third needle die 3 will be elastically deformed. The elastic force of the probe is related to the local elastic deformation of the probe. When the probe is compressed, the length of the probe 6 located between the second needle die 2 and the third needle die 3 will increase. For example, when the fulcrum distance is 30 mm and the probe 6 is compressed by 1 mm, the probe will be elastically deformed (bent) between the second needle die 2 and the third needle die 3. Within a certain range, the smaller the fulcrum distance, the greater the elastic deformation of the probe 6, and the greater the elastic force generated. The adjusting column 8 is used for adjusting the distance between the second needle die 2 and the third needle die 3. Different lengths of supporting columns can be selected as the adjusting column 8. The adjusting column 8 can be provided with a telescopic structure, or the adjusting column 8 can be a slidable and fixable adjusting column. The structure of the adjusting column 8 is not limited in the embodiment.

[0026] In an optimization scheme, the specific structure of the needle head fixing unit is given. The needle head fixing unit comprises a fourth needle die 4 and a fifth needle die 5, the fourth needle die 4 is used for fixing the double-end needle 7, one end of the double-end needle 7 passes through the fifth needle die 5, and the other end is connected with the probe 6.

[0027] In the optimization scheme, the fourth needle die 4 is fixedly arranged on the fulcrum adjusting unit, the fifth needle die 5 is fixedly arranged on the fourth needle die 4, and the fourth needle die 4 and the fifth needle die 5 can be used for fixing the double-end needle 7, so that the double-end needle 7 can transmit the elastic force generated when touching the product connector. FIG. 2 FIG. 3 and 3As shown, the given scheme is that the fifth needle die 5 is smaller than the fourth needle die 4, but is not limited to this structure, and it is possible that the fourth needle die 4 and the fifth needle die 5 are the same size, or the fifth needle die 5 is larger than the fourth needle die 4. The main role of the fourth needle die 4 and the fifth needle die 5 is to fix the double-headed needle 7. The needle die PCB board 9 is attached to the fourth needle die 4 (when the fifth needle die is larger than the fourth needle die, the PCB is attached to the fifth needle die), and there is a metal nut on the third needle die 3, which is fixed to the third needle die 3 together with the fourth needle die 4, the fifth needle die 5 and the needle die PCB board 9 through a bolt, and makes the needle die PCB board 9 touch the extended end of the double-headed needle 7. The contact between the needle die PCB board 9 and the double-headed needle 7 facilitates signal extraction.

[0028] In another embodiment, a traceless test device compatible with height difference is given, which comprises a ceiling assembly, a carrier assembly and at least one of the traceless test needle die assembly compatible with height difference; the traceless test needle die assembly compatible with height difference is arranged at the bottom of the ceiling assembly and / or the top of the carrier assembly, the carrier assembly is used to place products, and the ceiling assembly is used to drive the traceless test needle die assembly compatible with height difference to press on the connectors of the products.

[0029] In this embodiment, the arrangement position of the traceless test needle die assembly compatible with height difference is determined according to the position and quantity of the products to be tested, which can be arranged on the carrier assembly or on the ceiling assembly. The needle die assemblies are not necessarily all on the ceiling assembly or the carrier assembly, and there can be the following combinations: one, there is at least one needle die assembly on the carrier assembly and at least one needle die assembly on the ceiling assembly; two, there is at least one needle die assembly on the carrier assembly and no needle die assembly on the ceiling assembly; three, there is no needle die assembly on the carrier assembly and at least one needle die assembly on the ceiling assembly. The power source of the ceiling assembly can be a pneumatic cylinder or an electric cylinder. The carrier assembly is provided with a work station hole and a positioning block for placing and positioning products.

[0030] When the product needs to be detected, the ceiling assembly is pressed against the carrier assembly, the probe 6 is compressed, and the probe 6 is subjected to extrusion; when the compression amount of the probe 6 is large, causing the spring force of the probe 6 to be too large, the probe 6 will compress the double-headed needle 7, which is used to reduce the spring force of the probe 6 acting on the connector pin, at this time the probe 6 will share the spring force, solving the problem of uneven distribution of spring force.

[0031] The technical features of the above-mentioned embodiments can be combined in any way, and in order to make the description concise, not all possible combinations of the technical features in the above-mentioned embodiments are described, but as long as the combinations of the technical features do not exist contradictory, they should be considered as the scope of the present disclosure.

[0032] The above merely describes preferred embodiments of the present application and is not intended to limit the present application, and any modification, equivalent replacement, and improvement within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A non-marking test needle mold assembly compatible with height differences, characterized in that, The non-marking test needle mold assembly compatible with height differences includes: a first needle mold, a fulcrum adjustment unit, a needle fixing unit, a probe, and a double-ended needle; the first needle mold is used to control the needle extension and positioning of the probe, the probe passes through the fulcrum adjustment unit and the first needle mold in sequence, the two ends of the fulcrum adjustment unit are connected to the probe to form an adjustable fulcrum distance; the needle fixing unit is used to fix the double-ended needle, one end of the double-ended needle passes through the needle fixing unit, and the other end is connected to the probe.

2. The non-marking test needle mold assembly compatible with height differences according to claim 1, characterized in that, The fulcrum adjustment unit includes a second needle mold, a third needle mold, and an adjustment post. The probe is inserted from the third needle mold, passes through the second needle mold and the first needle mold in sequence, and is connected to one end of the double-headed needle. The adjustment post is disposed between the second needle mold and the third needle mold. The second needle mold and the third needle mold are used together to confirm the probe fulcrum distance. The first needle mold is used to control the needle output and position the product.

3. The non-marking test needle mold assembly compatible with height differences according to claim 2, characterized in that, The adjusting column consists of several support columns of different lengths.

4. The non-marking test needle mold assembly compatible with height differences according to claim 2, characterized in that, The adjusting column is a telescopic column whose length can be extended and retracted.

5. The non-marking test needle mold assembly compatible with height differences according to claim 2, characterized in that, The needle fixing unit includes a fourth needle mold and a fifth needle mold. The fourth needle mold is used to fix the double-headed needle. One end of the double-headed needle passes through the fifth needle mold, and the other end is connected to the probe.

6. The non-marking test needle mold assembly compatible with height differences according to claim 5, characterized in that, The non-marking test needle mold assembly compatible with height differences also includes a needle mold PCB board, which is connected to the fifth needle mold and touches the protruding end of the double-headed needle.

7. A non-marking testing device compatible with height differences, characterized in that, The non-marking testing device for compatible height differences includes a top plate assembly, a carrier assembly, and at least one non-marking testing pin mold assembly for compatible height differences as described in any one of claims 1-6; the non-marking testing pin mold assembly for compatible height differences is disposed at the bottom of the top plate assembly and / or the top of the carrier assembly, the carrier assembly is used to place the product, and the top plate assembly is used to drive the non-marking testing pin mold assembly for compatible height differences to press down onto the connector of the product.

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