Full-dynamic testing device for high-voltage silicon stack

Abstract

The utility model discloses a full dynamic testing device for a high-voltage silicon stack, which comprises a testing device, the front surface of the testing device is provided with a fixing mechanism, the fixing mechanism comprises a fixing block, the rear surface of the fixing block is provided with a movable groove, the front surface of the fixing block is provided with a through hole, and the through hole is communicated with the movable groove. Two moving blocks are slidably connected into the penetrating opening, moving plates are fixed to the front surfaces of the moving blocks, rectangular blocks are fixed to the surfaces of the front edges of the moving plates, sliding grooves are formed in the opposite sides of the two moving plates, and the moving plates are moved according to the length of the high-voltage silicon stack, so that the two moving plates adapt to the length of the high-voltage silicon stack. The C-shaped rod is moved, the C-shaped rod drives the movable block to move, and the movable magnetic block and the fixed magnetic block are closed and attracted, so that the two ends of the high-voltage silicon stack are clamped, the testing device is started, the high-voltage silicon stack is fixedly tested, the two ends of the high-voltage silicon stack do not need to be contacted by holding two meter pens, and the test is simple and convenient.

Description

Technical Field

[0001] This utility model relates to the field of high-voltage silicon stack testing technology, specifically to a device for full dynamic testing of high-voltage silicon stacks. Background Technology

[0002] A high-voltage silicon diode, also called a silicon pillar, is a type of silicon high-frequency high-voltage rectifier diode. It operates at voltages ranging from several kilovolts to tens of thousands of volts. It is commonly used in black-and-white televisions and other electronic instruments for high-frequency high-voltage rectification.

[0003] Existing high-voltage silicon stack testing devices test high-voltage silicon stacks by having two probes contact the two ends of the high-voltage silicon stack. This is very inconvenient, and the power cord connecting the probes and the testing device is quite long. When not in use, the power cord needs to be wound up, and it is easy for it to get tangled after being wound up, making it very inconvenient to use. Utility Model Content

[0004] To address the shortcomings of existing technologies, this invention provides a fully dynamic testing device for high-voltage silicon stacks, solving the problems mentioned in the background section.

[0005] To achieve the above objectives, this utility model is implemented through the following technical solution: a full dynamic testing device for high-voltage silicon stacks, comprising a testing device, a fixing mechanism provided on the front surface of the testing device, the fixing mechanism comprising a fixing block, a movable groove provided on the rear surface of the fixing block, a through opening provided on the front surface of the fixing block, two movable blocks slidably connected inside the through opening, a movable plate fixed on the front surface of the movable block, a rectangular block fixed on the front surface of the movable plate, and sliding grooves provided on the opposite sides of the two movable plates;

[0006] A connecting rod is slidably connected inside the chute, and a movable block is fixed to the other end of the connecting rod. A magnetic strip is fixed to the lower inner surface of the movable chute. An iron block is fixed to the bottom of the movable block. An electric sheet is fixed to the top of the rectangular block. Two connecting wires are fixed to the front surface of the testing device, and the other end of the connecting wires passes through the movable block and the movable plate.

[0007] It is fixedly connected to the electric sheet, and a C-shaped rod is slidably connected to the top of the movable block. Sliding openings are provided on both sides of the left side of the fixed block. The two ends of the C-shaped rod are slidably connected to the two sliding openings respectively. A movable magnetic block is fixed to the bottom of the connecting rod, and fixed magnetic blocks are fixed to both sides of the movable plate.

[0008] Preferably, the movable block has two sliding rods internally connected, the bottom end of the sliding rod is fixed with a clamping plate, the top of the clamping plate is fixed with a compression spring, and the other end of the compression spring is fixedly connected to the movable block.

[0009] Preferably, a compression spring is fixed to the bottom end of the connecting rod, and the other end of the compression spring is fixedly connected to the inner lower surface of the slide groove. The elastic force of the compression spring is less than the attraction force between the moving magnetic block and the fixed magnetic block.

[0010] Preferably, a limiting rod is slidably connected inside the connecting rod, and both ends of the limiting rod are slidably connected to the slide groove. The limiting rod is located inside the compression spring.

[0011] Preferably, two rectangular plates are fixed to the bottom of the C-shaped rod, and a top rod is slidably connected inside the rectangular plates. An extrusion block is fixed to the opposite side of the two top rods. An inclined surface is provided at the end of the fixed magnetic block and the movable magnetic block away from the movable plate. A tension spring is sleeved on the outside of the top rod, and the two ends of the tension spring are fixedly connected to the extrusion block and the rectangular plate, respectively.

[0012] Preferably, a pressing block is fixed to the end of the top rod away from the extrusion block.

[0013] This invention provides a device for full dynamic testing of high-voltage silicon stacks. Compared with the prior art, it has the following advantages:

[0014] This device for full dynamic testing of high-voltage silicon stacks uses a fixed mechanism to move two movable plates according to the length of the high-voltage silicon stack. By moving a C-shaped rod, the movable block moves along with the C-shaped rod, causing the movable and fixed magnetic blocks to attract each other, thus clamping both ends of the high-voltage silicon stack. The testing device is then activated to perform fixed testing on the high-voltage silicon stack. This eliminates the need to use two test leads to contact the ends of the high-voltage silicon stack for testing, making it simple and convenient. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the structure of this utility model;

[0016] Figure 2 This is a bottom view of the fixing mechanism in this utility model;

[0017] Figure 3 This utility model Figure 2 Schematic diagram of the structure at point A;

[0018] Figure 4 This is a side view of the fixing mechanism in this utility model.

[0019] Figure 5 This is a cross-sectional view of the movable plate and movable block in this utility model.

[0020] In the diagram: 1. Testing device; 101. Movable block; 102. Compression spring; 103. Moving rod; 104. Moving plate; 105. Connecting wire; 106. Electrical piece; 107. Fixed block; 108. Through hole; 109. Sliding hole; 110. Rectangular block; 111. Fixed magnetic block; 112. Limiting rod; 113. Slide groove; 114. Compression spring; 115. Clamping plate; 116. Top rod; 117. Moving magnetic block; 118. C-shaped rod; 119. Tension spring; 120. Compression block; 121. Rectangular plate; 122. Connecting rod; 123. Movable groove; 124. Magnetic strip; 125. Iron block; 126. Moving block; 2. Fixing mechanism. Detailed Implementation

[0021] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0022] Please see Figures 1-5This utility model provides a technical solution: a full dynamic testing device for high-voltage silicon stacks, including a testing device 1. The front surface of the testing device 1 is provided with a fixing mechanism 2, which includes a fixing block 107. The rear surface of the fixing block 107 has a movable groove 123. The front surface of the fixing block 107 has a through-hole 108. Two movable blocks 126 are slidably connected inside the through-hole 108. A movable plate 104 is fixed to the front surface of the movable block 126. A rectangular block 110 is fixed to the front surface of the movable plate 104. Sliding grooves 113 are provided on opposite sides of the two movable plates 104. A connecting rod 122 is slidably connected inside the sliding groove 113. A movable block 101 is fixed to the other end of the connecting rod 122. A magnetic strip 124 is fixed to the lower surface of the movable groove 123. An iron block 125 is fixed to the bottom of the movable block 126. An electric sheet 106 is fixed to the top of the rectangular block 110. Two connecting wires 105 are fixed to the front surface of the device 1. The other end of the connecting wires 105 passes through the movable block 126 and the movable plate 104 and is fixedly connected to the electrode 106. A C-shaped rod 118 is slidably connected to the top of the movable block 101. Sliding openings 109 are provided on both sides of the left side of the fixed block 107. The two ends of the C-shaped rod 118 are slidably connected to the two sliding openings 109 respectively. A movable magnetic block 117 is fixed to the bottom of the connecting rod 122. Fixed magnetic blocks 111 are fixed to both sides of the movable plate 104. This facilitates the testing of the high-voltage silicon stack. The two probes are used to test the contact between the two ends of the high-voltage silicon stack. Two moving rods 103 are slidably connected inside the movable block 101. A clamping plate 115 is fixed to the bottom of the moving rod 103. A compression spring 102 is fixed to the top of the clamping plate 115. The other end of the compression spring 102 is fixedly connected to the movable block 101. This allows for the clamping of high-voltage silicon stacks of different thicknesses.

[0023] Furthermore, a compression spring 114 is fixed to the bottom end of the connecting rod 122. The other end of the compression spring 114 is fixedly connected to the lower inner surface of the slide groove 113. The elastic force of the compression spring 114 is less than the attraction between the moving magnetic block 117 and the fixed magnetic block 111. Thus, after the fixed magnetic block 111 and the moving magnetic block 117 separate, the compression spring 114 pushes the connecting rod 122, the movable block 101, the clamping plate 115, and the moving magnetic block 117 back to their original positions. A limit rod 112 is slidably connected inside the connecting rod 122. Both ends of the limit rod 112 are slidably connected to the slide groove 113. The limit rod 112 is located inside the compression spring 114, thus controlling the compression spring 114. The limit switch prevents the compression spring 114 from bending. Two rectangular plates 121 are fixed to the bottom of the C-shaped rod 118. A top rod 116 is slidably connected inside the rectangular plate 121. A pressing block 120 is fixed to the opposite side of the two top rods 116. The fixed magnetic block 111 and the movable magnetic block 117 have an inclined surface at the end away from the movable plate 104. A tension spring 119 is sleeved on the outside of the top rod 116. The two ends of the tension spring 119 are fixedly connected to the pressing block 120 and the rectangular plate 121 respectively, which facilitates the separation of the movable magnetic block 117 and the fixed magnetic block 111. A pressing block is fixed to the end of the top rod 116 away from the pressing block 120, which facilitates the movement of the top rod 116.

[0024] During operation, the movable plates 104 are moved according to the length of the high-voltage silicon stack, adapting them to the stack's length. The iron block 125 and magnetic strip 124 attract each other, limiting the movement of the movable block 126 and the movable plates 104 to prevent further movement. Next, the C-shaped rod 118 is moved, carrying the movable block 101. The movable magnetic block 117 and fixed magnetic block 111 then attract each other, clamping the ends of the high-voltage silicon stack with the clamping plate 115 and the electrical plate 106. The testing device 1 is then activated to test the high-voltage silicon stack. This eliminates the need to physically contact the ends of the high-voltage silicon stack with two test leads, making the process simple and convenient. After the test is completed, press the pressing block. The pressing block moves the top rod 116 and the squeezing block 120. The squeezing block 120 separates the moving magnetic block 117 and the fixed magnetic block 111. In this way, the compression spring 114 pushes the connecting rod 122, the movable block 101, the clamping plate 115 and the moving magnetic block 117 back to their original positions. Remove the tested high-voltage silicon stack, place a new high-voltage silicon stack and test again. It is very convenient to use. The test device 1 is a device that integrates a signal generator and an oscilloscope. The signal generated by the signal generator is input into the circuit where the high-voltage silicon stack under test is located, and the oscilloscope displays the waveform. The waveform is used to determine whether the high-voltage silicon stack is normal.

[0025] Furthermore, any content not described in detail in this specification is existing technology known to those skilled in the art.

[0026] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, the phrase "comprising an element defined as..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0027] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A full dynamic testing device for high-voltage silicon stacks, comprising a testing device (1), characterized in that: The front surface of the testing device (1) is provided with a fixing mechanism (2), the fixing mechanism (2) includes a fixing block (107), the rear surface of the fixing block (107) is provided with a movable groove (123), the front surface of the fixing block (107) is provided with a through hole (108), two movable blocks (126) are slidably connected inside the through hole (108), a movable plate (104) is fixed on the front surface of the movable block (126), a rectangular block (110) is fixed on the front side surface of the movable plate (104), and a sliding groove (113) is provided on the opposite sides of the two movable plates (104). A connecting rod (122) is slidably connected inside the chute (113), and a movable block (101) is fixed at the other end of the connecting rod (122). A magnetic strip (124) is fixed on the lower inner surface of the movable groove (123). An iron block (125) is fixed at the bottom of the movable block (126). An electric sheet (106) is fixed at the top of the rectangular block (110). Two connecting wires (105) are fixed on the front surface of the test device (1). The other end of the connecting wires (105) passes through the movable block (126) and the movable plate (104). It is fixedly connected to the electric sheet (106), and a C-shaped rod (118) is slidably connected to the top of the movable block (101). Sliding openings (109) are provided on both sides of the left side of the fixed block (107). The two ends of the C-shaped rod (118) are slidably connected to the two sliding openings (109) respectively. A movable magnetic block (117) is fixed to the bottom of the connecting rod (122), and a fixed magnetic block (111) is fixed to both the left and right sides of the movable plate (104).

2. The device for full dynamic testing of high-voltage silicon stacks according to claim 1, characterized in that: The movable block (101) has two sliding rods (103) inside. The bottom end of the sliding rod (103) is fixed with a clamping plate (115), and the top of the clamping plate (115) is fixed with a compression spring (102). The other end of the compression spring (102) is fixedly connected to the movable block (101).

3. The device for full dynamic testing of high-voltage silicon stacks according to claim 2, characterized in that: A compression spring (114) is fixed at the bottom of the connecting rod (122). The other end of the compression spring (114) is fixedly connected to the inner lower surface of the slide groove (113). The elastic force of the compression spring (114) is less than the attraction force between the moving magnetic block (117) and the fixed magnetic block (111).

4. The device for full dynamic testing of high-voltage silicon stacks according to claim 3, characterized in that: The connecting rod (122) is internally slidably connected to a limiting rod (112), and both ends of the limiting rod (112) are slidably connected to the slide groove (113). The limiting rod (112) is located inside the compression spring (114).

5. The device for full dynamic testing of high-voltage silicon stacks according to claim 4, characterized in that: Two rectangular plates (121) are fixed to the bottom of the C-shaped rod (118). A top rod (116) is slidably connected inside the rectangular plate (121). A pressing block (120) is fixed to the opposite side of the two top rods (116). An inclined surface is provided at the end of the fixed magnetic block (111) and the movable magnetic block (117) away from the movable plate (104). A tension spring (119) is sleeved on the outside of the top rod (116). The two ends of the tension spring (119) are fixedly connected to the pressing block (120) and the rectangular plate (121) respectively.

6. The device for full dynamic testing of high-voltage silicon stacks according to claim 5, characterized in that: A pressing block is fixed to one end of the top rod (116) away from the pressing block (120).

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