Module test system

Abstract

The utility model relates to the radio frequency signal test field, and discloses a module test system, the system comprises a test cabinet and a test rack installed in the test cabinet, the test rack comprises a plurality of test boxes and a plurality of plug assemblies arranged corresponding to each test box, the test boxes are suitable for placing various types of development boards, and the plug assemblies are arranged in the test boxes. The modules are connected to the development board in a buckled mode, and the modules are connected with the corresponding plug assemblies through the connectors so that the modules can be tested through the test cabinet when the test frame is installed on the test cabinet. The test interface standard can be unified, high concentration of test resources is realized, the test efficiency and the resource utilization rate are greatly improved, meanwhile, the field occupation is remarkably reduced, and the test cost is effectively reduced.

Description

Technical Field

[0001] This utility model relates to the field of radio frequency testing technology, and in particular to a module testing system. Background Technology

[0002] In the current development of electronic technology, various RF cellular modules based on different chip platforms are constantly emerging. However, the RF antenna ports of these RF cellular modules based on different chip platforms are not standardized, which brings many inconveniences and challenges to the testing work. When testing RF modules based on different chip platforms, it is necessary to build a separate test environment for each module, which makes the test environment construction complex and diverse. The construction methods of each test environment are different, which increases the difficulty and time cost of the preparation work before testing.

[0003] Furthermore, on the one hand, various test environments may be idle for a long time when there are no test tasks, resulting in a waste of equipment resources; on the other hand, when multiple test tasks require the use of test environments at the same time, there may be situations where resources are scarce and test requirements cannot be met in a timely manner. Moreover, these test environments occupy a large area and are scattered in different areas, making it impossible to achieve highly centralized management, which brings great difficulties to unified scheduling and makes it impossible to flexibly allocate and optimize test tasks. Utility Model Content

[0004] This invention aims to at least partially solve one of the technical problems in related technologies. Therefore, one objective of this invention is to propose a modular testing system that can unify testing interface standards, achieve a high degree of centralization of testing resources, greatly improve testing efficiency and resource utilization, while significantly reducing site occupation and effectively lowering testing costs.

[0005] To achieve the above objectives, the first aspect of this utility model proposes a module testing system, wherein the system includes a test cabinet and a test rack installed in the test cabinet. The test rack includes multiple test boxes and multiple plug assemblies corresponding to each test box. The test boxes are suitable for placing various types of development boards. The module is snap-fit ​​connected to the development board, and the module is connected to the corresponding plug assembly through a connector, so that when the test rack is installed in the test cabinet, the module can be tested through the test cabinet.

[0006] The module testing system proposed in this utility model can unify the testing interface standard, achieve a high degree of concentration of testing resources, greatly improve testing efficiency and resource utilization, and at the same time significantly reduce site occupation and effectively reduce testing costs.

[0007] In some examples, the test cabinet is equipped with at least one radio frequency switch, which is connected to multiple plug assemblies to control the test sequence of multiple test nodes on the module and the test sequence between different modules by controlling the connection status of the multiple plug assemblies with the test cabinet.

[0008] In some examples, the module is a cellular test module, and the test nodes include high-frequency signal test nodes, intermediate-frequency signal test nodes, and low-frequency signal test nodes.

[0009] In some examples, the number of test nodes on the module is less than or equal to the number of plug components corresponding to the module.

[0010] In some examples, the test fixture also includes a plug assembly carrier, a female plug assembly and a male plug assembly, the female plug being disposed on the test box and the male plug being mounted on the plug assembly carrier.

[0011] In some examples, the male and female prongs in the plug assembly are positioned correspondingly in the horizontal direction.

[0012] In some examples, the test fixture also includes multiple power plugs, each of which is mounted on the plug assembly carrier plate and corresponds one-to-one with a plurality of test boxes.

[0013] In some examples, each of the multiple plug assemblies corresponding to the test box includes a high-frequency signal test plug assembly, a medium-frequency signal test plug assembly, and a low-frequency signal test plug assembly.

[0014] In some examples, the test fixture also includes multiple guide rails, each of which corresponds to one of the multiple test boxes. The guide rails are used to facilitate the detachable connection between the test boxes and the corresponding multiple plug assemblies.

[0015] In some examples, the connector is an SMA connector.

[0016] Additional aspects and advantages of this invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. Attached Figure Description

[0017] Figure 1 This is a block diagram of the module testing system according to an embodiment of the present utility model;

[0018] Figure 2 This is a structural schematic diagram of the test rack according to an embodiment of the present utility model;

[0019] Figure 3This is a structural schematic diagram of the test box and RF switch according to an embodiment of the present invention;

[0020] Figure 4 This is a structural schematic diagram of the test cabinet according to an embodiment of the present utility model.

[0021] Figure label:

[0022] Module test system 1000, test cabinet 100, test rack 10, test box 11, plug assembly 12, development board 13, module 14, connector 15, guide rail 16, plug assembly carrier board 17, female plug 18, male plug 19, power plug 20, RF switch 21, RF cable 22. Detailed Implementation

[0023] The embodiments of this utility model are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this utility model, and should not be construed as limiting this utility model.

[0024] The module testing system of this utility model embodiment is described below with reference to the accompanying drawings.

[0025] Figure 1 This is a structural schematic diagram of the module testing system according to an embodiment of the present utility model.

[0026] Specifically, in some embodiments of this utility model, such as Figure 1 As shown, the module testing system 1000 includes a test cabinet 100 and a test rack 10 installed in the test cabinet 100. The test rack 10 includes multiple test boxes 11 and multiple plug assemblies 12 corresponding to each test box 11. The test boxes 11 are suitable for placing various types of development boards 13. The module 14 is snap-fit ​​connected to the development board 13, and the module 14 is connected to the corresponding plug assembly 12 through a connector 15, so that when the test rack 10 is installed in the test cabinet 100, the module 14 can be tested through the test cabinet 100.

[0027] Specifically, in this embodiment, such as Figure 2 and Figure 3 As shown, the number of test boxes 11 can preferably be four, such as test box 11A, test box 11B, test box 11C and test box 11D. In addition, the present invention does not specifically limit the number of test boxes 11. The number of test boxes 11 can be configured according to actual test requirements. The test box 11 is provided with eight plug assemblies 12, namely one high-frequency signal test plug assembly 12, one medium-frequency signal test plug assembly 12, one low-frequency signal test plug assembly 12 and five spare components.

[0028] Test box 11 is suitable for placing various types of development boards 13. Module 14 is snap-fit ​​connected to the development board 13. For example, test box 11A is suitable for placing type A1 development board 13, test box 11B is suitable for placing type B1 development board 13, module 14A2 is snap-fit ​​connected to development board 13A1, and module 14B2 is snap-fit ​​connected to development board 13B1. The test node positions of different types of modules 14 may be different. For example, the high-frequency signal test node of module 14A2 is point a in the figure, while the high-frequency signal test node of module 14B2 is point b in the figure. To solve this problem, module 14 is connected to the corresponding plug assembly 12 through connector 15. Thus, no matter how the test node position of module 14 changes, different test nodes of module 14 can be connected to the corresponding plug assembly 12 through connector 15. For example, the high-frequency signal test node is connected to the high-frequency signal test plug assembly 12, and the intermediate frequency signal test node is connected to the intermediate frequency signal test plug assembly 12. This improves the flexibility and versatility of testing, simplifies the testing process, and improves testing efficiency.

[0029] Furthermore, in some embodiments of this utility model, the test cabinet 100 is provided with at least one radio frequency switch 21, which is connected to multiple plug assemblies 12 respectively, so as to control the test sequence of multiple test nodes on the module 14 and the test sequence between different modules 14 by controlling the connection status of multiple plug assemblies 12 with the test cabinet 100.

[0030] Specifically, in this embodiment, such as Figure 3 As shown, each test box 11 is equipped with a corresponding RF switch 21. Taking two test boxes 11 as an example, test box 11A is equipped with RF switch 21A. RF switch 21A is connected to multiple plug components 12 of test box 11A through RF lines 22. RF switch 21A is used to control the connection status of multiple plug components 12 with test cabinet 100 and control the test sequence of multiple test nodes on module 14. Test box 11B is equipped with RF switch 21B. RF switch 21B is connected to multiple plug components 12 of test box 11B through RF lines 22. RF switch 21B is used to control the connection status of multiple plug components 12 with test cabinet 100 and control the test sequence of multiple test nodes on module 14. RF switches 21A and RF switches 21B are also connected to the master control RF switch 21 through RF lines 22. The master control RF switch 21 is used to control the test sequence between different modules 14.

[0031] Furthermore, in some embodiments of this utility model, module 14 is a cellular test module, and the test nodes include high-frequency signal test nodes, intermediate-frequency signal test nodes, and low-frequency signal test nodes.

[0032] Specifically, in this embodiment, module 14 is a cellular test module, which may include three test nodes: a high-frequency signal test node, a medium-frequency signal test node, and a low-frequency signal test node. It should be noted that in the actual test system design, the number and type of test nodes can be customized and expanded according to specific test requirements. This utility model does not specifically limit the number and type of test nodes.

[0033] Furthermore, in some embodiments of this invention, the number of test nodes on the module is less than or equal to the number of plug assemblies corresponding to the module. This enables the system to be compatible with different chip platforms and cellular modules of different specifications, enhancing the system's compatibility and versatility, as well as facilitating system integration and standardization.

[0034] Furthermore, in some embodiments of this utility model, the test frame 10 also includes a plug assembly carrier plate 17, a plug assembly female head 18 and a male head 19, with the female head 18 disposed on the test box 11 and the male head 19 mounted on the plug assembly carrier plate 17.

[0035] Specifically, in this embodiment, such as Figure 3 As shown, the test fixture 10 also includes a plug assembly carrier plate 17, a female plug assembly 18 and a male plug assembly 19. The female plug 18 is disposed on the test box 11, and the male plug 19 is mounted on the plug assembly carrier plate 17. The number of female plugs 18 and male plugs 19 can preferably be three. The female plug 18 includes a high-frequency signal test female plug 18, an intermediate frequency signal test female plug 18 and a low-frequency signal test female plug 18, and the male plug 19 includes a high-frequency signal test male plug 19, an intermediate frequency signal test male plug 19 and a low-frequency signal test male plug 19. It should be noted that the number and type of female plugs 18 and male plugs 19 can be customized and expanded according to specific test requirements. This utility model does not specifically limit the number and type of female plugs 18 and male plugs 19.

[0036] By connecting the test nodes of different types of modules 14 to the female connector 18 of the plug assembly, the disordered high-frequency signal test nodes, intermediate-frequency signal test nodes, and low-frequency signal test nodes in different modules 14 are connected to the plug assembly carrier board 17 in an orderly manner. For example, the position of the high-frequency signal test node in module 14 is found, and the test node at that position is connected to the high-frequency signal test female connector 18. The high-frequency signal test female connector 18 is then connected to the high-frequency signal test male connector 19, which serves as a test interface for testing high-frequency signals. This process is repeated to connect the intermediate-frequency signal test nodes and low-frequency signal test nodes in module 14. This unifies the test interface standard, improves the compatibility and universality between different modules, and greatly enhances the flexibility and scalability of the entire system.

[0037] In addition, such as Figure 2 and 4 As shown, the test rack 10 can include four test boxes. During testing, the test box 11A in the first row can be tested first, followed by the test boxes 11B, 11C, and 11D in sequence. Each test box contains different modules 14. By connecting the test nodes of different types of modules 14 to the plug assembly female head 18, the test environment is unified, and the test resources are highly concentrated, which greatly improves the test efficiency and resource utilization, while significantly reducing the space occupation and effectively reducing the test cost.

[0038] Furthermore, in some embodiments of this utility model, such as Figure 3 As shown, the male connector 19 and female connector 18 in the plug assembly 12 are arranged correspondingly in the horizontal direction. This reduces the swinging and misalignment of the male connector 19 and female connector 18 during connection, thereby improving the accuracy and reliability of the connection between the male connector 19 and female connector 18.

[0039] Furthermore, in some embodiments of this utility model, such as Figure 3 As shown, the test fixture 10 also includes multiple power plugs 20, which are all mounted on the plug assembly 12 carrier plate, and each power plug 20 is respectively set to correspond one-to-one with a multiple test box 11.

[0040] Specifically, in this embodiment, the number of power plugs 20 is preferably four, such as a first power plug, a second power plug, a third power plug, and a fourth power plug. The first power plug is connected to test box 11A and provides independent power to test box 11A; the second power plug is connected to test box 11B and provides independent power to test box 11B; the third power plug is connected to test box 11C and provides independent power to test box 11C; and the fourth power plug is connected to test box 11D and provides independent power to test box 11D. This ensures that each test box 11 receives an independent and stable power supply, thereby ensuring the accuracy of the test results.

[0041] Furthermore, in some embodiments of this utility model, each test box includes a high-frequency signal test plug assembly, a medium-frequency signal test plug assembly, and a low-frequency signal test plug assembly among its multiple plug assemblies.

[0042] Specifically, in this embodiment, each test box includes multiple plug assemblies, each comprising a high-frequency signal test plug assembly, an intermediate-frequency signal test plug assembly, and a low-frequency signal test plug assembly. The high-frequency signal test plug assembly is connected to the high-frequency signal test node via a connector, the intermediate-frequency signal test plug assembly is connected to the intermediate-frequency signal test node via a connector, and the low-frequency signal test plug assembly is connected to the low-frequency signal test node via a connector.

[0043] Furthermore, in some embodiments of this utility model, the test rack 10 also includes a plurality of guide rails 16, which are respectively arranged in a one-to-one correspondence with a plurality of test boxes 11. The guide rails 16 are used to assist the test boxes 11 in being detachably connected to the corresponding plurality of plug assemblies 12.

[0044] Specifically, in this embodiment, the multiple guide rails may include a first guide rail, a second guide rail, a third guide rail, and a fourth guide rail. The first guide rail is correspondingly arranged with the test box 11A. The first guide rail is used to assist the first high-frequency signal test female connector 18 on the test box 11A in detachable connection with the first high-frequency signal test male connector 19 on the plug assembly 12 carrier board. The first intermediate frequency signal test female connector 18 on the auxiliary test box 11A is detachably connected with the first intermediate frequency signal test male connector 19 on the plug assembly 12 carrier board. The first low-frequency signal test female connector 18 on the auxiliary test box 11A is detachably connected with the first low-frequency signal test male connector 19 on the plug assembly 12 carrier board.

[0045] The second guide rail is correspondingly set to the test box 11B. The second guide rail is used to detachably connect the second high-frequency signal test female connector 18 on the auxiliary test box 11B to the second high-frequency signal test male connector 19 on the plug assembly 12 carrier board. The second intermediate frequency signal test female connector 18 on the auxiliary test box 11B is detachably connected to the second intermediate frequency signal test male connector 19 on the plug assembly 12 carrier board. The second low-frequency signal test female connector 18 on the auxiliary test box 11B is detachably connected to the second low-frequency signal test male connector 19 on the plug assembly 12 carrier board.

[0046] The third guide rail is correspondingly set with the test box 11C. The third guide rail is used to detachably connect the third high-frequency signal test female connector 18 on the auxiliary test box 11C with the third high-frequency signal test male connector 19 on the plug assembly 12 carrier board. The third intermediate frequency signal test female connector 18 on the auxiliary test box 11C is detachably connected with the third intermediate frequency signal test male connector 19 on the plug assembly 12 carrier board. The third low-frequency signal test female connector 18 on the auxiliary test box 11C is detachably connected with the third low-frequency signal test male connector 19 on the plug assembly 12 carrier board.

[0047] The fourth guide rail is set in correspondence with the test box 11D. The fourth guide rail is used to detachably connect the fourth high-frequency signal test female connector 18 on the auxiliary test box 11D with the fourth high-frequency signal test male connector 19 on the plug assembly 12 carrier board. The fourth intermediate frequency signal test female connector 18 on the auxiliary test box 11D with the fourth intermediate frequency signal test male connector 19 on the plug assembly 12 carrier board is also detachably connected. The fourth low-frequency signal test female connector 18 on the auxiliary test box 11D with the fourth low-frequency signal test male connector 19 on the plug assembly 12 carrier board is also detachably connected.

[0048] Therefore, each guide rail provides precise guidance and positioning for the corresponding test box, ensuring that the multiple female test connectors of different frequencies on the test box can be accurately, quickly and reliably detachably connected to the corresponding male connectors on the plug assembly carrier board, improving the efficiency of test preparation and module replacement, and ensuring the stability of the test process.

[0049] Furthermore, in some embodiments of this utility model, the connector is an SMA connector.

[0050] Specifically, in this embodiment, there can be three SMA connectors. Each SMA connector includes a cable and connectors respectively disposed at both ends of the cable. One SMA connector has one connector connected to the high-frequency signal test node of the cellular test module and the other connector connected to the high-frequency signal test female connector in the plug assembly. Another SMA connector has one connector connected to the intermediate-frequency signal test node of the cellular test module and the other connector connected to the intermediate-frequency signal test female connector in the plug assembly. A third SMA connector has one connector connected to the low-frequency signal test node of the cellular test module and the other connector connected to the low-frequency signal test female connector in the plug assembly.

[0051] Furthermore, in some embodiments of this utility model, the module testing system further includes a test control and data processing unit, a test data display and interaction unit, and a test instrument integration unit. For example... Figure 4 As shown, the test control and data processing unit can be a computer for test control and data processing; the test data display and interaction unit can be a display screen for displaying various data during the test process; and the test instrument integration unit can be an instrument compartment for accurately measuring various signals in the cellular module.

[0052] It should be noted that the logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a sequenced list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Alternatively, the computer-readable medium may be paper or other suitable media on which the program can be printed, since the program can be obtained electronically, for example, by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in a computer memory.

[0053] It should be understood that the various parts of this utility model can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, multiple steps or methods can be implemented using software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0054] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0055] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0056] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this utility model, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0057] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0058] In this utility model, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0059] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A module testing system, characterized in that, The system includes a test cabinet and a test rack installed in the test cabinet. The test rack includes multiple test boxes and multiple plug assemblies corresponding to each test box. The test boxes are suitable for holding various types of development boards. The modules are snap-fit ​​connected to the development boards, and the modules are connected to the corresponding plug assemblies through connectors, so that the modules can be tested through the test cabinet when the test rack is installed in the test cabinet.

2. The module testing system according to claim 1, characterized in that, The test cabinet is equipped with at least one radio frequency switch, which is connected to multiple plug assemblies to control the test sequence of multiple test nodes on the module and the test sequence between different modules by controlling the connection status of the multiple plug assemblies with the test cabinet.

3. The module testing system according to claim 2, characterized in that, The module is a cellular testing module, and the test nodes include high-frequency signal test nodes, intermediate-frequency signal test nodes, and low-frequency signal test nodes.

4. The module testing system according to claim 2, characterized in that, The number of test nodes on the module is less than or equal to the number of plug components corresponding to the module.

5. The module testing system according to claim 1, characterized in that, The test fixture also includes a plug assembly carrier plate, a female plug assembly connector and a male plug assembly connector, with the female connector disposed on the test box and the male connector mounted on the plug assembly carrier plate.

6. The module testing system according to claim 5, characterized in that, The male and female prongs in the plug assembly are arranged correspondingly in the horizontal direction.

7. The module testing system according to claim 5, characterized in that, The test fixture also includes multiple power plugs, which are mounted on the plug assembly carrier plate, and each power plug corresponds to one of the multiple test boxes.

8. The module testing system according to claim 5, characterized in that, Each of the multiple plug assemblies corresponding to the test box includes a high-frequency signal test plug assembly, a medium-frequency signal test plug assembly, and a low-frequency signal test plug assembly.

9. The module testing system according to claim 1, characterized in that, The test fixture also includes multiple guide rails, each of which corresponds to one of the multiple test boxes. The guide rails are used to assist the test boxes in being detachably connected to the corresponding multiple plug assemblies.

10. The module testing system according to any one of claims 1-9, characterized in that, The connector is an SMA connector.

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