Absolute quantum efficiency testing device
By employing two symmetrically arranged sample holders and motion mechanisms within the integrating sphere, combined with a multi-channel spectroscopic measurement device and temperature control elements, the influence of changes in the integrating sphere's state on the measurement results was resolved, achieving high-precision absolute quantum efficiency testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- FUDAN UNIV YIWU RES INST
- Filing Date
- 2025-05-22
- Publication Date
- 2026-05-15
AI Technical Summary
Existing technologies cannot effectively eliminate the influence of changes in the state of the integrating sphere when measuring the absolute quantum efficiency of optoelectronic materials, resulting in large measurement errors, especially when there are significant differences between the samples.
The method employs two symmetrically arranged sample holders and motion mechanisms to ensure that the integrating sphere remains unchanged during the measurement process, while eliminating the influence of the excitation source re-excitation. The method also utilizes a multi-channel spectroscopic measurement device and temperature control elements to improve measurement accuracy.
It enables simultaneous measurement of blank samples and test samples under almost identical conditions, eliminating the effects of self-absorption and re-excitation, and improving the accuracy and precision of absolute quantum efficiency testing.
Smart Images

Figure CN224247575U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of quantum efficiency testing technology for luminescent materials, and more specifically, to a device for testing absolute quantum efficiency. Background Technology
[0002] Optoelectronic materials, such as quantum dots, rare earth phosphors, and organic light-emitting materials, have been widely used in industries such as lighting and display, and are an important support for the development of these industries. Quantum efficiency is a key parameter that characterizes the performance of materials. Quantum efficiency is the efficiency of quantum dots in converting absorbed photons into emitted photons.
[0003] Quantum efficiency measurement devices can accurately measure the fluorescence emission intensity of quantum dots at different excitation wavelengths and compare it with the excitation light intensity to accurately calculate the quantum efficiency. Quantum efficiency testing is crucial for evaluating the optical properties of quantum dots, screening high-performance quantum dot materials, and optimizing quantum dot synthesis processes. The integrating sphere method is a common method for measuring quantum efficiency. An integrating sphere is a spherical cavity with a uniformly sprayed high-reflectivity diffuse reflection coating on its inner wall. The sample to be tested is placed at the center of the sphere or at other locations within the sphere. An excitation beam is used to directly or indirectly irradiate the sample. The light emitted by the sample is received by the integrating sphere and transmitted to an optical measurement device to obtain the absolute quantum efficiency test result. The optical measurement device can be a spectroradiometer, photometer, optical power meter, etc. Utility Model Content
[0004] The technical problem to be solved by this invention is to provide a testing device for the absolute quantum efficiency of the integrating sphere method.
[0005] The technical solution adopted by this utility model to solve the above-mentioned technical problems is as follows:
[0006] An absolute quantum efficiency testing device includes an integrating sphere and two sample holders located inside the integrating sphere, symmetrically arranged along a vertical plane at the center of the sphere and situated on the same base; the testing device also includes an excitation light source and a light measurement device.
[0007] Further, the testing device includes the integrating sphere, a first sample holder and a second sample holder symmetrically arranged along a vertical plane located at the center of the integrating sphere, a motion mechanism, the excitation light source, and the light measurement device; the inner wall of the integrating sphere is provided with a first opening, a second opening, and a third opening, the first sample holder and the second sample holder are symmetrical about the vertical plane, and the centers of the first opening, the second opening, and the third opening are located on a circular trajectory where the vertical plane intersects the inner wall of the integrating sphere; the light measurement device is connected to the first opening and can seal the first opening, and the testing device also includes a positive... A first light-blocking screen, spaced apart from the first opening, is used to block direct light emitted from the excitation source and the sample within the integrating sphere. The motion mechanism is disposed on the second opening and can seal the second opening. The excitation source is disposed on the motion mechanism and can move with the motion mechanism. The first sample holder and the second sample holder are detachably connected to the third opening through a shared connecting structure. The connecting structure includes a base for supporting the two sample holders, a connecting rod connected to the base, and a sealing member connected to the connecting rod for sealing the third opening.
[0008] Further, the testing device includes an integrating sphere, a first sample holder and a second sample holder symmetrically arranged along a vertical plane at the center of the integrating sphere, a motion mechanism, the excitation light source, and the optical measurement device; the inner wall of the integrating sphere is provided with a first opening, a second opening, and a third opening; the first sample holder and the second sample holder are symmetrical about a vertical plane; the centers of the first opening, the second opening, and the third opening are located on a circular trajectory where the vertical plane intersects the inner wall of the integrating sphere; the optical measurement device is connected to the first opening and can seal the first opening; the testing device also includes a first light-blocking screen arranged opposite the first opening and spaced apart, used to block direct light emitted from the excitation light source and the sample inside the integrating sphere; the carrier of the excitation light source is connected to the second opening and can seal the second opening; the motion mechanism is arranged on the third opening and can seal the third opening; the first sample holder and the second sample holder are arranged on the motion mechanism through a connecting structure; the two sample holders can move with the movement of the motion mechanism; the connecting structure includes a base for supporting the two sample holders and a connecting rod connected to the base.
[0009] Furthermore, the motion mechanism is a rotary mechanism that can rotate about the central axis of the second opening, or the motion mechanism is a translational mechanism that can translate along the direction of the base.
[0010] Furthermore, the motion mechanism is a 180-degree rotatable mechanism, which is a rotatable mechanism that can rotate about the line connecting the center of the third opening and the center of the integrating sphere.
[0011] Furthermore, the surface of the sample holder is coated with the same diffuse reflective material as the inner wall of the integrating sphere.
[0012] Furthermore, the optical measurement device is a multi-channel spectroscopic measurement device.
[0013] Furthermore, the excitation light source is a monochromatic LED, a semiconductor laser, or a light source with an tunable wavelength obtained through a monochromator.
[0014] Furthermore, the connection structure includes a temperature control element.
[0015] Furthermore, the testing device has a housing, and the integrating sphere is located inside the housing.
[0016] Using the aforementioned testing equipment, a blank sample and the sample to be tested are placed simultaneously during the measurement process. Due to the symmetrical integrating sphere structure used in the measurement, the blank sample and the sample to be tested are measured simultaneously under almost identical conditions, which can eliminate the effects of self-absorption and re-excitation, thereby improving measurement accuracy. Attached Figure Description
[0017] The accompanying drawings, which form part of this application, are used to provide a further understanding of this disclosure. The illustrative embodiments of this disclosure and their descriptions are used to explain this disclosure and do not constitute an undue limitation of this disclosure. In the drawings:
[0018] Figure 1 A front view structural schematic diagram of a test apparatus used in one embodiment of this disclosure is shown.
[0019] Figure 2 A side view of the test apparatus used in one embodiment of this disclosure is shown.
[0020] In the figure, 1: integrating sphere; 1-1: first opening; 1-1-1: first light-blocking screen; 1-2: second opening; 1-3: third opening; 2-1: first sample holder; 2-2: second sample holder; 3: motion mechanism; 4: excitation light source; 5: optical measurement device; 6: connection structure. Detailed Implementation
[0021] The following will describe in detail the implementation of this application with reference to the accompanying drawings and embodiments, so that the implementation process of how this application uses technical means to solve technical problems and achieve technical effects can be fully understood and implemented accordingly.
[0022] The applicant discovered that when measuring the absolute quantum efficiency of materials using the integrating sphere method, the integrating sphere's response to the photon flux of the excitation source is inconsistent depending on whether a sample is present or absent. The measurement process requires eliminating the influence of changes in the integrating sphere's state. Existing technical solutions involve: first, setting a blank sample within the integrating sphere and testing the photon flux of the excitation source; then removing the blank sample, setting the sample to be tested, and measuring the photon flux of the excitation source and the fluorescence photon flux, based on which the absolute quantum efficiency is calculated. This process assumes that the blank sample and the sample to be tested have the same influence on the integrating sphere's state, but this assumption is clearly invalid, and the greater the difference between the sample to be tested and the blank sample, the greater the measurement error. Currently, no equipment or measurement method has been found to solve this problem, therefore, an accurate absolute quantum efficiency value cannot be measured.
[0023] To address the aforementioned problems, this invention provides an absolute quantum efficiency testing device. The device includes an integrating sphere and two sample holders located inside the sphere, symmetrically arranged along a vertical plane at the sphere's center and situated on the same base. The device also includes an excitation source and a light measurement device. This invention employs two sample holders with a completely symmetrical structure, ensuring that the state within the integrating sphere remains unchanged during testing and eliminating the influence of re-excitation from the excitation source. This improves the accuracy of the absolute quantum efficiency test results using this device.
[0024] In some embodiments, the testing apparatus includes an integrating sphere, a first sample holder and a second sample holder symmetrically arranged along a vertical plane at the center of the integrating sphere, a motion mechanism, an excitation light source, and a light measuring device. The wall of the integrating sphere has a first opening, a second opening, and a third opening. The first and second sample holders are symmetrical about a vertical plane, and the centers of the first, second, and third openings are located on a circular trajectory where the vertical plane intersects the wall of the integrating sphere. The light measuring device is connected to the first opening and can seal the first opening. The testing apparatus also includes a first light-blocking screen (which may be circular) positioned opposite the first opening and spaced apart to block direct light emitted from the excitation light source and the sample (including the sample to be tested and the blank sample) within the integrating sphere. An excitation light source is disposed on the second opening and can be sealed (closed during testing, open when not testing) via a motion mechanism (e.g., a movable sealing element). The excitation light source is disposed on the motion mechanism via a threaded connection, pin connection, latching connection, or plug-in connection. The excitation light source can move with the motion mechanism. The first sample holder and the second sample holder are detachably connected to the third opening via a shared connection structure (connected during testing). The connection structure includes a base for supporting the two sample holders, a connecting rod connected to the base, and a sealing element (e.g., a cover) connected to the connecting rod for sealing the third opening. During testing, the cover and the third opening form a sealed structure through various methods of the prior art.
[0025] The aforementioned vertical plane is a virtual reference plane introduced to illustrate the relative positional relationship between the first sample holder, the second sample holder, and the first opening. This positional relationship can fully utilize the symmetry characteristics of the integrating sphere, resulting in high measurement accuracy.
[0026] In some embodiments, the motion mechanism is detachably connected to the second opening.
[0027] In some embodiments, the motion mechanism can be a rotation mechanism or a translation mechanism. By rotating or translating the motion mechanism, the excitation light source disposed on the motion mechanism can sequentially irradiate the first sample holder, the second sample holder, and the inner wall of the direct integrating sphere.
[0028] In some embodiments, the first opening, the second opening, and the third opening are all circular in shape.
[0029] In some embodiments, the motion mechanism is a rotating mechanism that can rotate about the center of the second opening.
[0030] In some embodiments, the rotation axis of the above-mentioned rotating mechanism can be the axis of the plane where the second opening is located. The excitation light source is installed off-center from this axis, and the axis of the light emitted from the excitation light source is parallel to the rotation axis. In use, the light emitted from the excitation light source can scan a circular trajectory along the rotation axis inside the integrating sphere. This setting is simple to implement, has little impact on the integrating sphere structure, and has high measurement accuracy.
[0031] In other embodiments, the rotation axis of the above-mentioned rotating mechanism is perpendicular to the optical axis of the excitation light source. In use, the direction of the emitted light from the excitation light source can swing at a certain angle within the integrating sphere.
[0032] In some embodiments, the motion mechanism is a translation mechanism that can translate along the base direction. During use, the excitation light source is translated to directly illuminate the sample to be tested, the blank sample, and the inner wall of the integrating sphere, respectively. This setup is simple to implement, has minimal impact on the integrating sphere structure, and offers high measurement accuracy.
[0033] In other embodiments, the testing apparatus includes an integrating sphere, a first sample holder and a second sample holder symmetrically arranged along a vertical plane located at the center of the integrating sphere, a motion mechanism, an excitation light source, and a light measuring device. The integrating sphere wall has a first opening, a second opening, and a third opening. The first and second sample holders are symmetrical about a vertical plane. The centers of the first, second, and third openings are located on a circular trajectory where the vertical plane intersects the integrating sphere wall. The light measuring device (which may include a sealing element) is connected to and can seal the first opening. The testing apparatus also includes a device facing the first opening. A first light-blocking screen is provided at intervals to block direct light emitted from the excitation source and the sample (including the sample to be tested and the blank sample) inside the integrating sphere. The carrier of the excitation source is connected to the second opening and can seal the second opening. A motion mechanism (e.g., a movable sealing component) is provided on the third opening and can seal the third opening. A first sample holder and a second sample holder are provided on the motion mechanism through a connecting structure. The two sample holders can move with the movement of the motion mechanism. The connecting structure includes a base for supporting the two sample holders and a connecting rod connected to the base.
[0034] In some embodiments, the motion mechanism is a rotating mechanism that can rotate 180 degrees, and the motion mechanism rotates about the line connecting the center of the second opening and the center of the ball.
[0035] In some embodiments, the first light-blocking screen is fixed to the inner wall of the integrating sphere by a fastener.
[0036] In some embodiments, the carrier is a cuvette, or a structural component with a surface coated with the same diffuse reflective material as the inner wall of the integrating sphere. Cuvettes are a common and inexpensive carrier; using a structural component with a surface coated with the same diffuse reflective material as the interior of the integrating sphere minimizes the impact on the spectral response of the integrating sphere and improves measurement accuracy.
[0037] In some embodiments, the optical measurement device is a multi-channel spectroscopic measurement device. Using a multi-channel spectroscopic measurement device, such as a spectrometer, allows for precise measurement of the excitation source loss and fluorescence emission, with no spectral matching error and high measurement accuracy.
[0038] In some embodiments, the surface of the sample holder is coated with the same diffuse reflective material as the inner wall of the integrating sphere.
[0039] In some embodiments, the excitation source is a monochromatic LED, a semiconductor laser, or a light source with an adjustable wavelength obtained through a monochromator. Using a monochromatic LED as the excitation source is low-cost and easy to implement; using a semiconductor laser as the excitation source can obtain an excitation source with a relatively pure spectrum, resulting in higher measurement accuracy; using a broadband light source with an adjustable wavelength obtained through a monochromator can achieve measurements at different excitation wavelengths, providing a wide testing range and high measurement accuracy.
[0040] In some embodiments, the connection structure includes a temperature control element. In some embodiments, the connection structure is a temperature control base, and the temperature control element of the temperature control base can be a heating wire, a semiconductor cooling chip, etc. The temperature control base can change the sample temperature and can be used to measure the absolute quantum efficiency of the sample at different temperatures with high measurement accuracy.
[0041] In some embodiments, the testing apparatus has a housing, and the integrating sphere is located inside the housing. The housing material can be metal or plastic. By housing the integrating sphere (including other components inside the integrating sphere), the testing apparatus reduces the influence of external factors on the integrating sphere. Other components of the testing apparatus can be found in the prior art; this disclosure only describes the essential components of the testing apparatus.
[0042] To better understand the above apparatus, its operation is described below. The method for testing absolute quantum yield includes preparing any of the above-mentioned testing apparatuses, and introducing a collimated beam from the excitation source into an integrating sphere during the testing process. The testing method includes: S1, with no sample or blank sample placed inside the integrating sphere, the photon flux Φ1 of the excitation source is measured using an optical measurement device; S2, with the sample and blank sample placed inside the integrating sphere, the collimated beam is directly incident on the wall of the integrating sphere, and both the sample and blank sample deviate from the collimated beam, the photon flux Φ2 of the excitation source is measured using an optical measurement device, and the photon flux of the stimulated emission of the sample is P2; S3, with the sample and blank sample placed inside the integrating sphere, the collimated beam is directly incident on the sample, the photon flux of the excitation source is measured using an optical measurement device as Φ3, and the photon flux of the stimulated emission of the sample is P3. Let K1 be the reflectivity of the first reflection of the sample and carrier from the collimated beam, and K... 1x The reflectivity of the first reflection from the blank sample and the carrier aligned with the straight beam can be obtained as follows: S4, the sample to be tested and the blank sample are placed inside the integrating sphere. The collimated beam is directly shone on the blank sample, and the photon flux of the excitation source is measured to be Φ4 by the optical measurement device. From S1 to S4, the sample to be tested and the blank sample are placed in the same carrier and in the same sample holder in each step. The absolute quantum efficiency is η, η = (P3 - P2K) 1x ) / (Φ1(K 1x -K1)).
[0043] As mentioned earlier, when using the integrating sphere measurement method, any change to the internal state of the integrating sphere will affect the measurement results. For example, the presence or absence of a sample inside the sphere changes the internal state, and consequently, the optical measurement response of the integrating sphere changes accordingly; this is commonly referred to as the self-absorption effect. Existing testing methods do not consider the influence of the carrier (such as a cuvette), blank sample, and the sample itself on the internal state of the integrating sphere. In this invention, two sample holders are used with a completely symmetrical structure, which does not change the internal state of the integrating sphere during the measurement process, while simultaneously eliminating the influence of re-excitation from the excitation source.
[0044] It should be noted that the testing equipment needs to be calibrated before the test begins, and the calibration should be performed in accordance with existing technology.
[0045] The mathematical derivation of the absolute quantum yield calculation will be explained below.
[0046] S1: The photon flux of the excitation source measured when neither the sample to be tested nor the blank sample is placed inside the integrating sphere is:
[0047]
[0048] In the formula: Φ is the incident photon flux of the excitation source, ρ is the reflectivity of the integrating sphere, and K is the calibration coefficient of the optical measurement device;
[0049] S2: The sample to be tested and the blank sample are placed inside the integrating sphere. The sample to be tested and the blank sample are placed in a carrier (such as a cuvette). The excitation source shines directly on the wall of the integrating sphere. The measured photon flux of the excitation source is:
[0050]
[0051] In the formula: Φ is the incident photon flux of the excitation source, ρ is the reflectivity of the integrating sphere, K is the calibration coefficient of the optical measurement device, and K D is the self-absorption coefficient of the sample and blank sample under diffuse illumination;
[0052] Assume the absorption coefficient of the sample under diffuse illumination is A. D1 The absorption coefficients of the carrier and the blank sample are A. D0 ,but:
[0053] K D =1-A D1 -A D0 (3)
[0054] At this point, the photon flux of the stimulated emission from the sample is:
[0055]
[0056] In the formula: η is the quantum efficiency;
[0057] S3: The sample to be tested and the blank sample are placed inside the integrating sphere. The sample to be tested and the blank sample are placed in the carrier. The excitation source shines directly on the sample to be tested. The measured photon flux of the excitation source is:
[0058]
[0059] In the formula: Φ is the incident photon flux of the excitation source, ρ is the reflectivity of the integrating sphere, K is the calibration coefficient of the optical measurement device, and K D K1 is the self-absorption coefficient of the sample and blank under diffuse illumination, and K2 is the reflectivity of the sample and carrier to the excitation source in the first reflection.
[0060] Assume the absorption coefficient of the sample being tested in the first incident is A. Z1 The absorption coefficient of the vehicle is A. Z0 The total absorption coefficient of the sample and the carrier is:
[0061] K1 = 1 - A Z =1-A Z1 -A Z0 (6)
[0062] At this point, the photon flux of the stimulated emission from the sample is:
[0063]
[0064] In the formula: η is the quantum efficiency;
[0065] S4: The sample to be tested and the blank sample are placed inside the integrating sphere. The sample to be tested and the blank sample are placed in the carrier. The excitation source shines directly on the blank sample. The measured photon flux of the excitation source is:
[0066]
[0067] In the formula: Φ is the incident photon flux of the excitation source, ρ is the reflectivity of the integrating sphere, K is the calibration coefficient of the optical measurement device, and K D K represents the self-absorption coefficient of the sample and blank sample under diffuse illumination. 1x Let be the reflectance of the blank sample and the carrier upon the first reflection from the excitation source, and:
[0068] K 1x =1-A Z0 (9)
[0069] From equations (2) and (5), we can obtain:
[0070]
[0071] From equations (2) and (8), we can obtain:
[0072]
[0073] Substituting (1), (4), (10), and (11) into (7) yields:
[0074] P3=Φ1A z1 η+P2K1 (12)
[0075] P3=Φ1A z1 η+P2(1-A z1 -A z0 (13)
[0076] P3=Φ1(K 1x -K1)η+P2K 1x (14)
[0077] η=(P3-P2K 1x ) / (Φ1(K 1x -K1)) (15)
[0078] Please see Figure 1 This utility model provides an embodiment of an apparatus for testing the absolute quantum efficiency of an integrating sphere, comprising an integrating sphere 1, two sample holders 2-1 and 2-2 symmetrically arranged about a vertical plane at the center of the integrating sphere 1, a motion mechanism 3, an excitation light source 4, and an optical measurement device 5. The integrating sphere has a first opening 1-1, a second opening 1-2, and a third opening 1-3. The first sample holders 2-1 and 2-2 are symmetrical about a vertical plane 2-3. The centers of the first opening 1-1, the second opening 1-2, and the third opening 1-3 are located on a circular trajectory where the vertical plane 2-3 intersects with the inner wall of the integrating sphere. The optical measurement device 5 is connected to the first opening 1-1. A first light-blocking screen 1-3 is provided on the first opening 1-1 to prevent direct light rays emitted from the excitation light source, the sample, and the blank sample inside the integrating sphere. The motion mechanism 3 is disposed on the second opening 1-2, the excitation light source 4 is disposed on the motion mechanism 3, and the first sample holders 2-1 and 2-2 are disposed on the third opening 1-3 through a connecting structure 6.
[0079] In this embodiment, the optical measurement device 5 is directly facing the plane containing the first sample holder 2-1 and the second sample holder 2-2.
[0080] In this embodiment, the motion mechanism 3 is a rotating mechanism that rotates around the center of the second opening 1-2. The rotation axis of the rotating mechanism can be the axis of the plane where the second opening is located. The excitation light source 4 is installed off-center from the axis, and the light emitted from the excitation light source 4 is parallel to the rotation axis. In use, the light emitted from the excitation light source 4 can scan a circular trajectory along the rotation axis inside the integrating sphere. This setting is simple to implement, has little impact on the integrating sphere structure, and has high measurement accuracy.
[0081] While specific embodiments of this disclosure have been described in detail by way of example, those skilled in the art should understand that the examples are for illustrative purposes only and not intended to limit the scope of this disclosure. The various embodiments disclosed herein can be combined in any way without departing from the spirit and scope of this disclosure. Those skilled in the art should also understand that various modifications can be made to the embodiments without departing from the scope and spirit of this disclosure. The scope of this disclosure is defined by the appended claims.
Claims
1. An absolute quantum efficiency testing device, characterized in that, The testing device includes an integrating sphere and two sample holders located inside the integrating sphere, symmetrically arranged along the vertical plane at the center of the sphere and situated on the same base; the testing device also includes an excitation light source and a light measurement device.
2. The absolute quantum efficiency testing device according to claim 1, characterized in that, The testing device includes an integrating sphere, a first sample holder and a second sample holder symmetrically arranged along a vertical plane located at the center of the integrating sphere, a motion mechanism, an excitation light source, and a light measuring device. The inner wall of the integrating sphere has a first opening, a second opening, and a third opening. The first and second sample holders are symmetrical about a vertical plane, and the centers of the first, second, and third openings are located on a circular trajectory where the vertical plane intersects the inner wall of the integrating sphere. The light measuring device is connected to the first opening and can seal the first opening. The testing device also includes a mechanism facing the integrating sphere. A first light-blocking screen, spaced apart from the first opening, is used to block direct light emitted from the excitation source and the sample within the integrating sphere. A motion mechanism is disposed on the second opening and can seal the second opening. The excitation source is disposed on the motion mechanism and can move with the motion mechanism. The first sample holder and the second sample holder are detachably connected to the third opening via a shared connecting structure. The connecting structure includes a base for supporting the two sample holders, a connecting rod connected to the base, and a sealing member connected to the connecting rod for sealing the third opening.
3. The absolute quantum efficiency testing device according to claim 1, characterized in that, The testing device includes an integrating sphere, a first sample holder and a second sample holder symmetrically arranged along a vertical plane at the center of the integrating sphere, a motion mechanism, an excitation light source, and a light measurement device. The inner wall of the integrating sphere has a first opening, a second opening, and a third opening. The first and second sample holders are symmetrical about a vertical plane. The centers of the first, second, and third openings are located on a circular trajectory where the vertical plane intersects the inner wall of the integrating sphere. The light measurement device is connected to the first opening and can seal it. The testing device also includes a first light-blocking screen positioned opposite the first opening and spaced apart to block direct light emitted from the excitation light source and the sample within the integrating sphere. The carrier of the excitation light source is connected to the second opening and can seal it. The motion mechanism is positioned on the third opening and can seal it. The first and second sample holders are connected to the motion mechanism via a connecting structure, allowing the two sample holders to move with the motion mechanism. The connecting structure includes a base for supporting the two sample holders and a connecting rod connected to the base.
4. The absolute quantum efficiency testing device according to claim 2, characterized in that, The motion mechanism is a rotating mechanism that can rotate about the central axis of the second opening, or the motion mechanism is a translating mechanism that can translate along the direction of the base.
5. The absolute quantum efficiency testing device according to claim 3, characterized in that, The motion mechanism is a rotating mechanism that can rotate 180 degrees. The motion mechanism is a rotating mechanism that can rotate about the line connecting the center of the third opening and the center of the integrating sphere.
6. The absolute quantum efficiency testing device according to claim 1, characterized in that, The surface of the sample holder is coated with the same diffuse reflective material as the inner wall of the integrating sphere.
7. The absolute quantum efficiency testing device according to claim 2 or 3, characterized in that, The optical measurement device is a multi-channel spectroscopic measurement device.
8. The absolute quantum efficiency testing device according to claim 2 or 3, characterized in that, The excitation source is a monochromatic LED, a semiconductor laser, or a light source with tunable wavelength obtained through a monochromator.
9. The absolute quantum efficiency testing device according to claim 2 or 3, characterized in that, The connection structure includes a temperature control element.
10. The absolute quantum efficiency testing device according to claim 1, characterized in that, The testing device has a housing, and the integrating sphere is located inside the housing.