Probe card structure for filter chip test

Abstract

The utility model discloses a probe card structure used for filter chip testing, and specifically relates to the probe card manufacturing technology field, the probe card structure comprises a shielding needle body and a PCB board, the shielding needle body is installed on the PCB board, the shielding needle body comprises a tungsten steel needle, an insulating layer is arranged outside the tungsten steel needle, a metal outer layer is arranged outside the insulating layer, and the metal outer layer is arranged outside the shielding needle body. One end of the tungsten steel needle is connected with an SMA connector. According to the utility model, the inner conductor of the pin card is replaced by the tungsten steel pin, and the metal sheet is additionally arranged on the epoxy surface, so that the performance of the pin card is greatly improved, the strict requirement of a filter product on high test frequency is effectively met, the anti-interference capability is enhanced, and the accuracy and stability of test data are ensured; all parts and machining modes can be autonomously mastered, dependence on imported products can be avoided, and industrial safety and autonomy are greatly improved.

Description

Technical Field

[0001] This utility model relates to the field of probe card manufacturing technology, and specifically to a probe card structure for testing filter chips. Background Technology

[0002] In the integrated circuit manufacturing process, chip functional testing is crucial. A common method is to use probes on a probe card to directly contact the area of ​​the chip to be tested to extract signals. With the help of peripheral testing instruments and software control, the measurement of a single chip can be achieved. Currently, the production of consumer electronics products such as mobile phones continues to rise. Among them, the dependence on external sources for filter products is quite high, which is particularly significant. Moreover, the testing of filter products has very high requirements for the test frequency, which means that the probes that come into direct contact with the chip must have strong anti-interference capabilities.

[0003] Currently, all filter pin clips are imported products. Their manufacturing process uses semi-steel cables, first making individual shielded pins, and then assembling them into pin clips. The specific steps involve grinding the front end of the inner conductor into a conical shape, installing it in the designated position, and then fixing it with epoxy resin fixing blocks to finally produce the filter pin clip. However, the grinding process of the inner conductor of the filter pin clip is extremely complex and requires a variety of high-precision equipment. This not only makes the manufacturing process difficult but also makes it difficult to produce independently, relying solely on imports. Importing pin clips from abroad results in long delivery times, seriously affecting the production schedule. At the same time, the relatively high price of imported pin clips significantly increases production costs, which is detrimental to the independent development and cost control of related industries. Utility Model Content

[0004] The purpose of this invention is to provide a probe card structure for testing filter chips, in order to address the aforementioned shortcomings in the technology.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a probe card structure for testing filter chips, comprising a shielding pin body and a PCB board, wherein the shielding pin body is mounted on the PCB board, the shielding pin body comprises a tungsten steel pin, the tungsten steel pin is provided with an insulating layer on the outside, the insulating layer is provided with a metal outer layer, one end of the tungsten steel pin is connected to an SMA connector, an epoxy resin fixing block is provided between the shielding pin body and the PCB board, and a metal sheet is provided on the outside of the epoxy resin fixing block.

[0006] Based on the above and in conjunction with existing technologies, the following specific explanations are provided:

[0007] Preferably, a semi-steel cable is used to make a single shielded pin, which is then made into a pin clip, an SMA connector, an insulation layer, an inner conductor, and a metal outer layer to form a single shielded pin. The main steps are to grind the front end of the inner conductor into a tapered shape, install it in the designated position, fix the position with an epoxy resin fixing block, and make a filter pin clip.

[0008] Preferably, the existing controllable structure involves fabricating a semi-steel cable assembly with SMA connectors at both ends for frequency testing. The semi-steel cable is then cut, the inner conductor is extracted and replaced with a tungsten steel needle, and the assembled single shielded needle is installed in the designated position. An epoxy resin fixing block is used to fix the position. Considering the performance degradation caused by replacing the inner conductor, a layer of metal sheet is added to the surface of the epoxy resin fixing block to create a new structure filter pin clip.

[0009] The technical effects and advantages provided by this utility model in the above technical solution are as follows:

[0010] By replacing the inner conductor of the pin clip with a tungsten steel pin and adding a metal sheet to the epoxy surface, the performance of the pin clip is greatly improved. This effectively meets the stringent requirements of high test frequencies for filter products, enhances anti-interference capabilities, and ensures the accuracy and stability of test data. Secondly, from the perspective of independent control, all parts and processing methods can be independently mastered, eliminating dependence on imported products and greatly improving industrial security and autonomy. In addition, in terms of cost and delivery time, the new structure filter pin clip no longer relies on imports, completely solving the problem of long delivery times for imported pin clips. It can be supplied in a timely manner according to production needs, significantly improving production efficiency. At the same time, independent production effectively reduces production costs and alleviates the cost pressure caused by high import prices. Attached Figure Description

[0011] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this utility model. For those skilled in the art, other drawings can be obtained based on these drawings.

[0012] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0013] Figure 2 This is a schematic diagram of the semi-steel cable assembly of this utility model;

[0014] Figure 3 This is a schematic diagram of the cut half-steel cable according to the present invention;

[0015] Figure 4 A schematic diagram of a single shielding pin for replacing the inner wire of the tungsten carbide pin of this utility model;

[0016] Figure 5 This is a schematic diagram of the existing filter pin card structure of this utility model;

[0017] Figure 6 This is a schematic diagram of the existing single shielding pin structure of this utility model.

[0018] Explanation of reference numerals in the attached figures:

[0019] 1. SMA connector; 2. Insulation layer; 3. Tungsten carbide pin; 31. Inner conductor; 4. Metal outer layer; 5. PCB board; 6. Epoxy resin fixing block; 7. Metal sheet. Detailed Implementation

[0020] To enable those skilled in the art to better understand the technical solution of this utility model, the present utility model will be further described in detail below with reference to the accompanying drawings.

[0021] This utility model provides, for example Figures 1-4 The probe card structure shown includes a shielding pin body and a PCB board 5. The shielding pin body is mounted on the PCB board 5. The shielding pin body includes a tungsten steel pin 3. An insulating layer 2 is provided on the outside of the tungsten steel pin 3. A metal outer layer 4 is provided on the outside of the insulating layer 2. One end of the tungsten steel pin 3 is connected to an SMA connector 1. An epoxy resin fixing block 6 is provided between the shielding pin body and the PCB board 5. A metal sheet 7 is provided on the outside of the epoxy resin fixing block 6.

[0022] Based on the above and in conjunction with existing technologies, the following specific explanations are provided:

[0023] See Figure 5 and Figure 6 As shown, a single shielded pin is made using a semi-steel cable, and then a pin clip is made. The SMA connector 1, insulation layer 2, inner conductor 31 and metal outer layer 4 together form a single shielded pin. The main steps are to grind the front end of the inner conductor 31 into a cone shape, install it in the designated position, fix the position with epoxy resin fixing block 6, and make a filter pin clip.

[0024] The existing controllable structure involves fabricating a semi-steel cable assembly with SMA connectors 1 at both ends for frequency testing. The semi-steel cable is then cut, the inner conductor 31 is extracted and replaced with a tungsten steel needle 3, and the assembled single shielded needle is installed in the designated position and fixed in place using an epoxy resin fixing block 6. Considering the performance degradation caused by replacing the inner conductor 31, we add a layer of metal sheet 7 to the surface of the epoxy resin fixing block 6 to create a new structure filter pin clip.

[0025] The foregoing description only illustrates certain exemplary embodiments of the present invention. Undoubtedly, those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. A probe card structure for testing filter chips, characterized in that, include: The shielding pin body and PCB board (5) are mounted on the PCB board (5). The shielding pin body includes a tungsten steel pin (3). The tungsten steel pin (3) has an insulating layer (2) on its outside and a metal outer layer (4) on its outside. One end of the tungsten steel pin (3) is connected to an SMA connector (1).

2. The probe card structure for testing filter chips according to claim 1, characterized in that: An epoxy resin fixing block (6) is provided between the shielding pin body and the PCB board (5).

3. The probe card structure for testing filter chips according to claim 2, characterized in that: The epoxy resin fixing block (6) is provided with a metal sheet (7) on its exterior.

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