A calibration device for calibrating sensor beams

Abstract

This utility model discloses a calibration device for calibrating a sensor beam, comprising a base and a support. The base has a slide rail, on which a first sliding plate is slidably connected. An analysis device is mounted on the first sliding plate. The base also includes a mold, a fine-tuning mechanism, and a limiting mechanism. A lens is mounted on the mold. A docking plate is slidably connected to the fine-tuning mechanism, and a circuit board is mounted on the docking plate. An interface is electrically connected to the circuit board. The fine-tuning mechanism has a fine-tuning component that drives the docking plate to slide. A transmitter is slidably connected to the support, facing the lens and the analysis device. A locking component is detachably connected to the support to hold the transmitter in place. The support is mounted on the mold, and the limiting mechanism contacts the support, constraining it to the mold. This utility model provides a calibration device for calibrating a sensor beam, reducing the difficulty for operators in adjusting the distance between the transmitter and the lens.

Description

Technical Field

[0001] This utility model relates to the field of sensor testing technology, and in particular to a calibration device for calibrating sensor beams. Background Technology

[0002] In optical sensors based on active light sources (such as lasers), the light beam emitted by the transmitter is focused by a lens and projected onto the target object. The reflected light is captured by the receiver for measurement. Since the accuracy of the optical working distance between the transmitter and the lens is crucial and directly affects the focusing characteristics of the light beam, including the minimum spot size and depth of focus, it determines the measurement accuracy and performance of the sensor. Therefore, during the sensor assembly process, the transmitter must be precisely installed and calibrated to ensure that the designed optical working distance is achieved.

[0003] The existing calibration method involves the operator initially installing the transmitter on the sensor's bracket, then using a spot detection device (such as a beam analyzer) to monitor the focusing quality of the emitted beam (such as spot size and shape) in real time, and manually adjusting the position of the transmitter on the bracket accordingly (usually involving small translations or angle adjustments) until the spot characteristics meet the requirements, and then installing the bracket into the sensor's housing.

[0004] However, this manual adjustment method has the problem of high operational difficulty. The internal space of the sensor bracket is compact, and the installation size of the transmitter and bracket is usually very small. The physical space left for operators to perform tool operations and fine adjustments is extremely limited, making operation very inconvenient. In addition, the adjustment accuracy of the optical working distance is extremely high, requiring tiny displacement changes to achieve the best focusing effect. This manual adjustment of tiny distances requires extremely high skills and stability from the operators, significantly increasing the difficulty and time consumption of debugging, becoming the main bottleneck restricting production efficiency and calibration accuracy. Utility Model Content

[0005] The purpose of this invention is to provide a calibration device for calibrating sensor beams, thereby reducing the difficulty for operators in adjusting the distance between the transmitter and the lens.

[0006] The technical solution adopted by the debugging device for calibrating sensor beams disclosed in this utility model is as follows:

[0007] The device includes a base and a support. The base has a slide rail, and a first slide plate is slidably connected to the slide rail. An analysis device is mounted on the first slide plate. The base has a mold, a fine-tuning mechanism, and a limiting mechanism. A lens is mounted on the mold. A docking plate is slidably connected to the fine-tuning mechanism. A circuit board is mounted on the docking plate, and an interface is electrically connected to the circuit board. A fine-tuning component is mounted on the fine-tuning mechanism, which drives the docking plate to slide. A transmitter is slidably connected to the support, and the transmitter faces the lens and the analysis device. A locking component is detachably connected to the support to hold the transmitter in place. The support is mounted on the mold, and the limiting mechanism contacts the support and constrains the support to the mold.

[0008] As a preferred embodiment, a second slide plate is slidably connected to the slide rail, the fine-tuning component includes a slide block and a micrometer, the slide block is slidably connected to the second slide plate, the micrometer is fixedly connected to the second slide plate, the micrometer screw is rotatably connected to the slide block, and the docking plate is fixedly connected to the slide block.

[0009] As a preferred embodiment, both the first and second slide plates are fitted with knobs, which are pressed against the slide rails.

[0010] As a preferred embodiment, the docking plate is detachably connected to a mounting plate, the mounting plate has a protrusion extending from it, the circuit board is detachably connected to the mounting plate, and the interface passes through the protrusion.

[0011] As a preferred embodiment, the bracket has a through mounting hole and a groove communicating with the mounting hole. The transmitter is placed in the mounting hole and slides. A slider extends from the outside of the transmitter and slides in the groove. The protrusion is aligned with the mounting hole.

[0012] As a preferred embodiment, the bracket is provided with multiple positioning holes, and the mold extends with multiple positioning posts, which are inserted into the positioning holes.

[0013] As a preferred embodiment, the limiting mechanism includes a connecting seat, a rocker arm, and a connecting rod. The connecting seat is connected to the base, one end of the rocker arm is rotatably connected to the connecting seat, and the other end of the rocker arm abuts against the bracket. One end of the connecting rod is rotatably connected to the connecting seat, and the other end of the connecting rod is rotatably connected to a lever, which is rotatably connected to the rocker arm.

[0014] The beneficial effects of the calibration device for calibrating sensor beams disclosed in this utility model are:

[0015] After loosening the locking mechanism, slide the transmitter onto the bracket, then install the assembled bracket into the mold and constrain it within the mold using a limiting mechanism. The mold simulates the preset position of the bracket installed within the sensor. Adjust the fine-tuning component to push the docking plate toward the bracket, making the interface electrically connected to the transmitter and lighting it up. The beam emitted by the transmitter is projected onto the analysis device through the lens on the mold. The analysis device is used to detect whether the size and shape of the light spot meet the standards.

[0016] If there are defects in the beam, the fine-tuning component is adjusted to drive the docking plate to push the transmitter to slide on the support, changing the distance between the transmitter and the lens to improve the beam focusing quality. This process enables real-time adjustment of the transmitter position based on the detection results, reducing the difficulty for operators to adjust the distance between the transmitter and the lens. Furthermore, by pushing the first slide plate to the position after the slide rail has moved, the distance between the transmitter and the analysis device can be changed, enabling the analysis device to detect beams irradiated from different distances.

[0017] After debugging, rotate the locking component to tighten the transmitter end to constrain its sliding, adjust the fine-tuning component to pull the docking plate away from the bracket, and after the limiting mechanism releases the constraint on the bracket, remove the bracket from the mold and install it into the sensor housing to complete the sensor testing and assembly. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of a calibration device for calibrating sensor beams according to the present invention.

[0019] Figure 2 This is a schematic diagram of the structure of a calibration device for calibrating sensor beams according to the present invention.

[0020] Figure 3 This is a top view of a calibration device for calibrating sensor beams according to this utility model (the dashed line represents the beam illumination path).

[0021] Figure 4 This is a structural schematic diagram of the fine-tuning mechanism and support of an adjustment device for calibrating sensor beams according to this utility model.

[0022] Figure 5 This is a schematic diagram (partial cross-sectional view of the bracket) of a fine-tuning mechanism and support for a calibration device for calibrating sensor beams according to this utility model.

[0023] Figure 6 This is a schematic diagram of the structure of a bracket for a calibration device for a sensor beam, which is mounted on a mold according to this utility model. Detailed Implementation

[0024] The present invention will be further described and illustrated below with reference to specific embodiments and the accompanying drawings:

[0025] Please refer to Figures 1-3 .

[0026] The present invention discloses a calibration device for calibrating a sensor beam, comprising a base 1 and a bracket 4;

[0027] A slide rail 11 is fixedly connected to the top of the base 1. A first slide plate 12 and a second slide plate 13 are slidably connected on the slide rail 11. The first slide plate 12 and the second slide plate 13 are respectively close to the two ends of the slide rail 11.

[0028] Furthermore, both the first slide plate 12 and the second slide plate 13 are provided with first threaded holes. A knob 131 is connected to the first threaded hole of the first slide plate 12 and the first threaded hole of the second slide plate 13. The knob 131 presses against the slide rail 11. When it is necessary to adjust the position of the first slide plate 12 and the second slide plate 13 on the slide rail 11, the two knobs 131 are loosened to release the constraint on the first slide plate 12 and the second slide plate 13 respectively. After the first slide plate 12 and the second slide plate 13 are pushed to slide on the slide rail 11 to complete the position adjustment, the two knobs 131 are locked to constrain the first slide plate 12 and the second slide plate 13 to the current position respectively.

[0029] The first slide plate 12 is fixedly connected to an analysis device 121. In this embodiment, the analysis device 121 is preferably a spot analyzer.

[0030] A connecting seat 14 is fixedly connected to the top of the base 1, and a slide rail 11 passes through the connecting seat 14. The connecting seat 14 is located between the first slide plate 12 and the second slide plate 13.

[0031] Please refer to Figures 3-5 .

[0032] A mold 2 is provided on the base 1, and the bottom of the mold 2 is fixedly connected to the top of the connecting seat 14; a plurality of positioning posts 21 extend from the mold 2, and in this embodiment, it is preferred that there are two positioning posts 21.

[0033] Furthermore, a lens 22 is installed on the mold 2. The mold 2 simulates the preset position and installation environment of the bracket 4 installed inside the sensor housing, so that after the bracket 4 is debugged on the mold 2, it can be directly installed inside the sensor housing, improving the convenience of sensor debugging.

[0034] The base 1 is provided with a fine adjustment mechanism 3, and a docking plate 31 is slidably connected to the fine adjustment mechanism 3. One end of the docking plate 31 has a notch, and a circuit board 311 is provided on the docking plate 31. The circuit board 311 is located in the notch, and an interface 312 is electrically connected to the circuit board 311.

[0035] Furthermore, one end of the docking plate 31 is detachably connected to a mounting plate 32. A protrusion 321 extends from the mounting plate 32, and a through hole is formed on the protrusion 321, which penetrates the mounting plate 32 and the protrusion 321. The circuit board 311 is detachably connected to the mounting plate 32, and the interface 312 passes through the protrusion 321 through the through hole. The protrusion 321 is close to the mold 2. When other specifications of transmitters 43 are installed on the bracket 4, the mounting plate 32 can be removed, the circuit board 311 of the corresponding transmitter 43 specification can be replaced, and then it can be reinstalled and reset, so that this debugging equipment can be compatible with different specifications of transmitters 43.

[0036] Furthermore, the fine-tuning mechanism 3 is equipped with a fine-tuning component 33, which drives the docking plate 31 to slide.

[0037] Furthermore, the fine-tuning component 33 includes a slide 331 and a micrometer 332. The bottom of the slide 331 is slidably connected to the top of the second slide plate 13; the micrometer 332 is fixedly connected to the top of the second slide plate 13; the micrometer screw of the micrometer 332 is rotatably connected to the slide 331; and the bottom of the mating plate 31 is fixedly connected to the top of the slide 331.

[0038] Rotating the micrometer 332 causes the micrometer screw of the micrometer 332 to drive the slide block 331 to slide a small distance on the second slide plate 13, making the protrusion 321 closer to the mold 2.

[0039] The bracket 4 has a through mounting hole and a groove 411. The groove 411 communicates with the inner wall of the mounting hole, and the protrusion 321 is aligned with the mounting hole. A transmitter 43 is slidably connected to the bracket 4. The transmitter 43 slides within the mounting hole. A slider 431 extends from the outer side of the transmitter 43 and slides within the groove 411. The slider 431 protrudes from the groove 411. The groove 411, through the slider 431, constrains the transmitter 43 within the mounting hole for axial sliding, preventing the transmitter 43 from rotating within the mounting hole.

[0040] Furthermore, a second threaded hole is provided on the bracket 4, which communicates with the inner wall of the mounting hole. A locking member 42 is detachably connected to the second threaded hole of the bracket 4, and the locking member 42 presses against the transmitting end 43.

[0041] Furthermore, the bracket 4 is provided with multiple positioning holes 44. In this embodiment, it is preferred to have two positioning holes 44, and the two positioning holes 44 correspond to two positioning posts 21. The bracket 4 is installed in the mold 2, and the positioning posts 21 are inserted into the positioning holes 44, so as to achieve the effect of detachable connection and positioning between the bracket 4 and the mold 2.

[0042] The emitting end 43 faces the lens 22 and the analysis device 121. The light beam emitted by the emitting end 43 is projected onto the analysis device 121 through the lens 22 on the mold 2. The light beam emitted by the emitting end 43 is parallel to the slide rail.

[0043] Please refer to Figure 6 .

[0044] The base 1 is provided with a limiting mechanism 5, which contacts the support 4 and constrains the support 4 on the mold 2. The limiting mechanism 5 includes a connecting seat 51, a rocker arm 52 and a connecting rod 53.

[0045] Furthermore, the connecting seat 51 is fixedly connected to the connecting seat 14 of the base 1, the connecting seat 51 is located on the top of the connecting seat 14, and the top of the connecting seat 51 has a recess.

[0046] Furthermore, in this embodiment, the rocker arm 52 is preferably right-angled, with the right angle located in the middle of the rocker arm 52. One end of the rocker arm 52 is rotatably connected to the connecting seat 51, and the connection between the rocker arm 52 and the connecting seat 51 is located on the recessed side. The rocker arm 52 has a mounting groove, which is close to the other end of the rocker arm 52. A connecting rod 521 is provided in the mounting groove, and a thread is provided on the outer side of the connecting rod 521, which is close to one end of the connecting rod 521. A contact block is fixedly connected to the other end of the connecting rod 521. Two limiting plates are sleeved on the outer side of the connecting rod 521, and the two limiting plates respectively abut against the bottom and top of the rocker arm 52. The contact block abuts against one of the limiting plates, and a nut is connected to the thread, which abuts against the other limiting plate.

[0047] The rocker arm 52 rotates at a certain angle on the connecting seat 51, so that the contact block at the other end of the rocker arm 52 touches the bracket 4; by loosening the nut, the friction between the two limiting plates and the rocker arm 52 is reduced, and the connecting rod 521 is pulled to slide in the mounting groove, changing the position of the contact block on the rocker arm 52 to adapt to different specifications of bracket 4.

[0048] Furthermore, one end of the connecting rod 53 is rotatably connected to the connecting seat 51, the connection point between the connecting rod 53 and the connecting seat 51 is located on the other side of the recess, the other end of the connecting rod 53 is rotatably connected to the lever 54, the connection point between the connecting rod 53 and the lever 54 is located in the middle of the lever 54, and one end of the lever 54 is rotatably connected to the middle of the rocker arm 52.

[0049] By rotating the lever 54 on the connecting rod 53, the rocker arm 52 and the connecting rod 53 are simultaneously rotated on the connecting seat 51. The other end of the connecting rod 53 is located in the recess, and the rocker arm 52 and the lever 54 are both in a horizontal state, so that the contact block touches the bracket 4, constraining the bracket 4 within the mold 2. By rotating the lever 54 on the connecting rod 53, the rocker arm 52 and the connecting rod 53 are simultaneously pulled to rotate on the connecting seat 51, so that the contact block moves away from the top of the bracket 4, and the other end of the connecting rod 53 disengages from the recess. The middle part of the rocker arm 52 and one end of the lever 54 are both located in the recess, releasing the constraint on the bracket 4.

[0050] Please refer to Figures 1-6 .

[0051] During debugging:

[0052] After the operator loosens the locking part 42 and slides the transmitter 43 onto the bracket 4, the assembled bracket 4 is installed in the mold 2. By pushing the lever 54, the contact block of the limiting mechanism 5 touches the bracket 4, thus constraining the bracket 4 within the mold 2.

[0053] Loosen the knob 131 on the second slide plate 13 and push the second slide plate 13 towards the connecting seat 14 so that the protrusion 321 approaches the mounting hole. Then, lock the knob 131 to constrain the second slide plate 13 in the current position. Rotate the micrometer 332 so that the micrometer screw of the micrometer 332 drives the slide 331 to slide on the second slide plate 13. The protrusion 321 passes into the mounting hole. The interface 312 is electrically connected to the transmitter 43 and lit. The beam emitted by the transmitter 43 is projected to the analysis device 121 through the lens 22 on the mold 2. The analysis device 121 is used to detect whether the size and shape of the light spot meet the standard.

[0054] After releasing the knob 131 on the first slide plate 12 and pushing the first slide plate 12 to slide on the slide rail 11 to the designated position, the knob 131 is locked to constrain the first slide plate 12 to the current position, thereby changing the distance between the transmitter 43 and the analyzer 121, so that the analyzer 121 can detect beams of light irradiated from different distances.

[0055] According to the detection results fed back by the analysis device 121, if there is a defect in the beam, the micrometer 332 is continuously rotated, and the protrusion 321 slides slightly within the mounting hole of the emitter 43, thereby changing the distance between the emitter 43 and the lens 22 to improve the beam focusing quality. This process realizes real-time adjustment of the position of the emitter 43 based on the detection results, reducing the difficulty for operators to adjust the distance between the emitter 43 and the lens 22. If the operator makes a mistake, the emitter 43 needs to be reset and adjusted again. The micrometer 332 is rotated in the opposite direction so that the protrusion 321 moves away from the emitter 43, and the slider 431 is manually moved to reset the emitter 43 and adjust it again.

[0056] After debugging, rotate the locking part 42 to tighten the transmitter 43 to constrain its sliding; release the knob 131 on the second slide plate 13 and push the second slide plate 13 to slide away from the connecting seat 14, so that the protrusion 321 is pulled out from the mounting hole; pull the lever 54 to make the contact block of the limiting mechanism 5 move away from the bracket 4, release the constraint on the bracket 4, and remove the bracket 4 from the mold 2 and install it into the sensor housing; then put the bracket 4 of the next transmitter 43 to be debugged into the mold 2 for the next round of debugging.

[0057] This invention provides a calibration device for calibrating sensor beams. After loosening the locking mechanism, the transmitter is slidably connected to the bracket, and then the assembled bracket is installed in the mold and constrained within the mold by a limiting mechanism. The mold simulates the preset position of the bracket installed in the sensor. Adjusting the fine-tuning component pushes the docking plate toward the bracket, so that the interface is electrically connected to the transmitter and illuminates it. The beam emitted by the transmitter is projected onto the analysis device through the lens on the mold. The analysis device is used to detect whether the size and shape of the light spot meet the standard.

[0058] If there are defects in the beam, the fine-tuning component is adjusted to drive the docking plate to push the transmitter to slide on the support, changing the distance between the transmitter and the lens to improve the beam focusing quality. This process enables real-time adjustment of the transmitter position based on the detection results, reducing the difficulty for operators to adjust the distance between the transmitter and the lens. Furthermore, by pushing the first slide plate to the position after the slide rail has moved, the distance between the transmitter and the analysis device can be changed, enabling the analysis device to detect beams irradiated from different distances.

[0059] After debugging, rotate the locking component to tighten the transmitter end to constrain its sliding, adjust the fine-tuning component to pull the docking plate away from the bracket, and after the limiting mechanism releases the constraint on the bracket, remove the bracket from the mold and install it into the sensor housing to complete the sensor testing and assembly.

[0060] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit the scope of protection of this utility model. Although this utility model has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this utility model without departing from the essence and scope of the technical solutions of this utility model.

Claims

1. A commissioning device for calibrating a sensor beam, characterized by, include: A base, on which a slide rail is provided, on which a first slide plate is slidably connected, and on which an analysis device is provided, and on which a mold, a fine-tuning mechanism and a limiting mechanism are provided, and on which a lens is installed; A docking plate is slidably connected to the fine-tuning mechanism. A circuit board is provided on the docking plate. An interface is electrically connected to the circuit board. A fine-tuning component is provided on the fine-tuning mechanism. The fine-tuning component drives the docking plate to slide. A bracket, on which a transmitter is slidably connected, the transmitter facing the lens and the analysis device, and a locking member that presses against the transmitter is detachably connected to the bracket; The bracket is installed on the mold, and the limiting mechanism contacts the bracket and constrains the bracket on the mold.

2. A commissioning device for calibrating a sensor beam as claimed in claim 1, characterized in that, A second slide plate is slidably connected to the slide rail. The fine-tuning component includes a slide block and a micrometer. The slide block is slidably connected to the second slide plate, and the micrometer is fixedly connected to the second slide plate. The micrometer's micrometer screw is rotatably connected to the slide block, and the docking plate is fixedly connected to the slide block.

3. The calibration device for calibrating a sensor beam as described in claim 2, characterized in that, Both the first and second slide plates are fitted with knobs, which are pressed against the slide rails.

4. The calibration device for calibrating a sensor beam as described in claim 2, characterized in that, The docking plate is detachably connected to a mounting plate, and a protrusion extends from the mounting plate. The circuit board is detachably connected to the mounting plate, and the interface passes through the protrusion.

5. The calibration device for calibrating a sensor beam as described in claim 4, characterized in that, The bracket has a through mounting hole and a groove communicating with the mounting hole. The transmitter is placed in the mounting hole and slides. A slider extends from the outside of the transmitter and slides in the groove. The protrusion is aligned with the mounting hole.

6. The calibration device for calibrating a sensor beam as described in claim 1, characterized in that, The bracket has multiple positioning holes, and the mold has multiple positioning posts extending from it, which are inserted into the positioning holes.

7. The calibration device for calibrating a sensor beam as described in claim 1, characterized in that, The limiting mechanism includes a connecting seat, a rocker arm, and a connecting rod. The connecting seat is connected to the base. One end of the rocker arm is rotatably connected to the connecting seat, and the other end of the rocker arm touches the bracket. One end of the connecting rod is rotatably connected to the connecting seat, and the other end of the connecting rod is rotatably connected to a lever. The lever is rotatably connected to the rocker arm.

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