An SMD crystal oscillator electro-aging device

Abstract

This invention proposes an SMD crystal oscillator electrical aging device, comprising a test chamber and a steam component. The test chamber contains a capsule-type housing module and a sealing cover. A cylinder is installed on the test chamber to drive the sealing cover towards or away from the capsule-type housing module. An air supply component is installed on the back of the test chamber to supply air into the capsule-type housing module. The steam component is used to guide steam into the test chamber and the steam component. This invention provides an SMD crystal oscillator electrical aging device that simulates the sealed working environment of the crystal oscillator using the capsule-type housing module and the sealing cover. The size of the capsule is adjusted and sealed using the air supply component and the tubular shunt component to closely approximate the real-world condition. Steam is guided into the test chamber through the first air pipe of the steam component to simulate a humid and hot environment, overcoming the shortcomings of traditional methods. Steam is then introduced into the sealing cover through the second air pipe, directly contacting the crystal oscillator to enhance the testing effect and accurately assess its reliability under harsh environments.

Description

Technical Field

[0001] This utility model relates to the field of SMD crystal oscillator testing technology, specifically to an SMD crystal oscillator electro-aging device. Background Technology

[0002] SMD crystal oscillators are miniaturized, high-performance electronic components widely used in various electronic devices to provide stable clock signals for circuits. Their working principle is based on the piezoelectric effect of quartz crystals. By applying voltage across the crystal, it vibrates mechanically, generating a stable oscillation frequency. However, in practical applications, the performance of SMD crystal oscillators is affected by various factors, such as temperature, humidity, and power supply voltage fluctuations. These factors can lead to frequency drift, aging, and other problems, affecting the normal operation of electronic devices. To ensure that the performance of SMD crystal oscillators still meets requirements after long-term use, aging tests are necessary. Aging tests simulate long-term use under different environmental conditions using an aging device to verify the stability and reliability of the crystal. Specifically, the SMD crystal oscillator is placed in a test chamber, and the temperature inside the chamber is raised to test its performance at different temperatures. "Powering on" mainly refers to testing through an external power supply. This aging test can identify potential problems with the SMD crystal oscillator during long-term use, thereby improving its stability and reliability in practical applications.

[0003] A search revealed that Chinese patent CN222420435U discloses an SMD crystal oscillator aging device, including a test chamber. A temperature sensor is installed inside the test chamber, and a heater is fixed on the test chamber. The output of the heater is connected to the test chamber. A PLC controller is fixed on the top of the test chamber, electrically connected to the temperature sensor and the heater. A cover is provided on the front side of the test chamber, and a filter box is fixed on the test chamber. An absorption mechanism is provided on the test chamber to absorb odors from inside the test chamber into the filter box. The above technical solution mainly uses the filter box and absorption mechanism to promptly absorb odors generated by the high temperature inside the test chamber into the filter box after the SMD crystal oscillator aging test, preventing odor residue from affecting subsequent tests. The installation frame and activated carbon adsorption mesh are also included. However, this solution still has shortcomings in practical use:

[0004] SMD crystal oscillators are typically installed inside electronic devices in relatively enclosed environments with poor air circulation. Furthermore, some electronic devices operate under harsh conditions such as humidity and high temperature for extended periods. However, existing aging test equipment can only place the SMD crystal oscillator inside a test chamber and simulate its operating environment by controlling temperature changes. This cannot effectively simulate the actual enclosed space environment and humid weather conditions where the SMD crystal oscillator is located. Therefore, existing aging test methods cannot fully meet the actual usage requirements in terms of test results and cannot accurately assess the long-term stability and reliability of SMD crystal oscillators in real working environments. Utility Model Content

[0005] This invention provides an SMD crystal oscillator power-on aging device, which solves the problem that power-on aging devices in related technologies cannot effectively simulate the actual enclosed space environment and hot and humid weather conditions of SMD crystal oscillators.

[0006] To achieve the above objectives, this utility model provides the following technical solution: an SMD crystal oscillator electro-aging device, comprising a test chamber and a steam component;

[0007] The test chamber is equipped with a capsule-type storage module and a sealing cover. The test chamber is equipped with a cylinder that drives the sealing cover to move closer to or away from the capsule-type storage module. An air supply component that supplies air to the capsule-type storage module is installed on the back of the test chamber.

[0008] The steam element is used to guide steam into the test chamber and the steam element.

[0009] Preferably, the capsule-type storage module includes a capsule-type storage component and a tubular diverter component. The capsule-type storage component is installed inside the test chamber, and the tubular diverter component is connected to the capsule-type storage component and is connected to the air supply component.

[0010] Preferably, the bladder-type storage component includes a storage box, which has multiple spaced assembly chambers, each of which contains a bladder tube, and the tubular diverter is connected to each of the multiple bladder tubes.

[0011] Preferably, the tubular diverter includes a diverter pipe and multiple connecting pipes, the multiple connecting pipes being connected to multiple bladders respectively, the diverter pipe being connected to the multiple connecting pipes, the diverter pipe being connected to an air supply component, and a control valve being installed at one end of the diverter pipe.

[0012] Preferably, the air supply component includes an air pump and an air supply pipe. The air pump is installed on the back of the test chamber, and the two ends of the air supply pipe are respectively connected to the air outlet of the air pump and one end of the diverter pipe.

[0013] Preferably, the steam component includes a steam generator, which is disposed on one side of the test chamber. The steam generator is connected to a steam pipe at its outlet. A first air guide pipe and a second air guide pipe are connected to the steam pipe. The first air guide pipe extends into the test chamber, and the second air guide pipe communicates with the inside of the sealing cover. An exhaust head is connected to one side of the test chamber, and an exhaust hose communicating with the exhaust head is connected to the bottom of the sealing cover.

[0014] The beneficial effects of this utility model are as follows:

[0015] 1. In use, multiple crystal oscillators are placed into multiple capsules on a capsule-type storage module. Gas is then supplied to a tubular distribution device, which distributes the gas to the corresponding capsules. The size of the capsules is adjusted, and a cylinder drives a sealing cover closer to the capsule-type storage module, causing the sealing cover to contact the storage box and seal the multiple capsules. This simulates the relatively enclosed space environment in which the crystal oscillators actually operate. Compared with traditional aging test methods that only control temperature changes, this simulation method is closer to the real working state of the crystal oscillators inside electronic devices, which helps to more accurately evaluate their long-term stability and reliability in enclosed spaces, making the test results more valuable.

[0016] 2. In use, the present invention can guide steam to the test chamber through the first air guide pipe on the steam component, so that the crystal oscillator inside the capsule is in a humid and hot environment. This design can simulate the humid and hot weather conditions that the crystal oscillator may encounter in actual applications, making up for the shortcomings of existing aging test methods in simulating humid and hot environments. By testing the crystal oscillator in a humid and hot environment, its performance under different climatic conditions can be examined more comprehensively, further improving the comprehensiveness and effectiveness of the test, and providing a more sufficient basis for evaluating the reliability of the crystal oscillator.

[0017] 3. To further improve the crystal oscillator testing effect, steam can be guided into the sealed enclosure through the second vent pipe on the steam component, and then discharged through the exhaust hose at the bottom of the sealed enclosure. When the steam flows inside the sealed enclosure, it can enter the corresponding capsule and directly contact the crystal oscillator. This design allows the humid and hot gas to act more directly and evenly on the crystal oscillator surface, further enhancing the testing effect. Compared to simply creating a humid and hot environment inside the test chamber, this direct contact method can more effectively simulate the interaction between the crystal oscillator and the humid and hot gas during actual operation, thereby more accurately assessing its long-term reliability in harsh environments and providing a more reliable reference for the selection and application of crystal oscillators in electronic devices. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of the overall structure of an SMD crystal oscillator electro-aging device proposed in this utility model;

[0020] Figure 2 This is a schematic diagram of the back structure of an SMD crystal oscillator electro-aging device proposed in this utility model;

[0021] Figure 3 This is an internal sectional view of the test chamber of this utility model;

[0022] Figure 4 This is a schematic diagram of the structure of the bag-type storage module of this utility model;

[0023] Figure 5 This is a schematic diagram of the structure of the steam component of this utility model;

[0024] The diagram is labeled as follows: 1. Test box; 2. Bag-type storage module; 21. Bag-type storage component; 211. Storage box; 212. Bag tube; 22. Tubular diverter; 221. Diverter pipe; 222. Connecting pipe; 223. Control valve; 3. Air supply component; 31. Air pump; 32. Air supply pipe; 4. Sealing cover; 41. Exhaust hose; 42. Exhaust head; 5. Cylinder; 6. Steam component; 61. Steam generator; 62. Steam pipe; 63. First air guide pipe; 64. Second air guide pipe. Detailed Implementation

[0025] The technical solution of this utility model will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0026] according to Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 As shown, an SMD crystal oscillator aging device includes a test chamber 1 and a steam element 6.

[0027] The test chamber 1 is equipped with a capsule-type storage module 2 and a sealing cover 4. The test chamber 1 is equipped with a cylinder 5 that drives the sealing cover 4 to move closer to or away from the capsule-type storage module 2. The back of the test chamber 1 is equipped with an air supply component 3 that supplies air to the capsule-type storage module 2.

[0028] Steam component 6 is used to guide steam into test chamber 1 and steam component 6.

[0029] Test chamber 1 serves as the main structure of the device, providing space for crystal oscillator testing. The capsule-shaped storage module 2 is used to place the crystal oscillator. The sealing cover 4 can be moved under the drive of cylinder 5. When cylinder 5 pushes the sealing cover 4 closer to and against the capsule-shaped storage module 2, a relatively sealed space can be formed inside the test chamber 1, simulating the sealed working environment of the crystal oscillator in electronic equipment, reducing external airflow interference, making the test environment closer to the actual working conditions, and improving the reliability of the test results. The air supply component 3 supplies air to the capsule-shaped storage module 2, which can adjust the internal state of the capsule-shaped storage module 2 to provide stable support or a specific gas environment for the crystal oscillator. The steam component 6 guides steam into the test chamber 1 to increase the humidity and temperature of the test environment, simulating hot and humid weather conditions, and comprehensively examining the performance of the crystal oscillator in complex environments.

[0030] In a specific embodiment, the capsule-type storage module 2 includes a capsule-type storage component 21 and a tubular diverter component 22. The capsule-type storage component 21 is installed inside the test chamber 1, the tubular diverter component 22 is connected to the capsule-type storage component 21, and the tubular diverter component 22 is connected to the air supply component 3.

[0031] The capsule-shaped housing 21 is used to specifically support the crystal oscillator. The gas output from the gas supply unit 3 is evenly distributed to each part of the capsule-shaped housing 21 through the pipe-type distribution unit 22, so that each crystal oscillator area can obtain a stable gas supply, ensuring the consistency of the test conditions for each crystal oscillator and avoiding deviations in test results due to uneven gas distribution.

[0032] In a specific embodiment, the bladder-type storage device 21 includes a storage box 211, which has multiple spaced assembly chambers. Each of the multiple assembly chambers is equipped with a bladder tube 212, and the tubular diverter 22 is connected to the multiple bladder tubes 212 respectively.

[0033] Multiple assembly chambers within the storage box 211 can simultaneously hold multiple crystal oscillators, enabling batch testing and improving testing efficiency. The capsule 212 within each assembly chamber is connected to the tubular shunt 22. Gas enters the capsule 212 through the tubular shunt 22. The size of the capsule 212 can be adjusted by gas pressure according to the size of the crystal oscillator or testing requirements, forming a stable clamp for the crystal oscillator and preventing it from shaking or shifting during testing. At the same time, it creates a specific microenvironment for the crystal oscillator.

[0034] In a specific embodiment, the tubular diversion component 22 includes a diversion pipe 221 and multiple connecting pipes 222. The multiple connecting pipes 222 are respectively connected to multiple bladders 212. The diversion pipe 221 is connected to the multiple connecting pipes 222. The diversion pipe 221 is connected to the air supply component 3. A control valve 223 is installed at one end of the diversion pipe 221.

[0035] The splitter pipe 221 and multiple connecting pipes 222 form a splitting structure. The gas from the gas supply component 3 first enters the splitter pipe 221, and then is delivered to the corresponding capsule 212 through the multiple connecting pipes 222, thereby achieving precise gas splitting. The control valve 223 is installed at one end of the splitter pipe 221. By adjusting the opening of the control valve 223, the flow rate and pressure of the gas can be controlled, thereby flexibly adjusting the gas parameters in each capsule 212 to meet the testing requirements of different crystal oscillators and making the testing process more controllable.

[0036] In a specific embodiment, the air supply component 3 includes an air pump 31 and an air supply pipe 32. The air pump 31 is installed on the back of the test chamber 1, and the two ends of the air supply pipe 32 are respectively connected to the air outlet of the air pump 31 and one end of the diversion pipe 221.

[0037] The air pump 31 serves as the air supply source, delivering gas to the distribution pipe 221 through the air supply pipe 32, providing power for the entire air supply system. The air pump 31 can provide stable air pressure and flow according to test requirements, ensuring the continuity and stability of the air supply, ensuring that the capsule-type storage module 2 can work normally, and providing reliable gas environment support for crystal oscillator testing.

[0038] In a specific embodiment, the steam component 6 includes a steam generator 61, which is disposed on one side of the test chamber 1. The steam generator 61 is connected to a steam pipe 62 at its outlet. A first air guide pipe 63 and a second air guide pipe 64 are connected to the steam pipe 62. The first air guide pipe 63 extends into the test chamber 1, and the second air guide pipe 64 communicates with the inside of the sealing cover 4. An exhaust head 42 is connected to one side of the test chamber 1, and an exhaust hose 41 communicating with the exhaust head 42 is connected to the bottom of the sealing cover 4.

[0039] Steam generator 61 generates steam, which is delivered to the first air guide pipe 63 and the second air guide pipe 64 through steam pipe 62. The first air guide pipe 63 guides the steam into the test chamber 1, creating a humid and hot environment inside the entire test chamber 1 to simulate the working conditions of the crystal oscillator in humid and hot weather. The second air guide pipe 64 guides the steam into the sealed cover 4. After circulating inside the sealed cover 4, the steam is discharged through the exhaust hose 41 and the exhaust head 42. The steam directly contacts the crystal oscillator inside the sealed cover 4, enhancing the effect of the humid and hot gas on the crystal oscillator, making the test more realistically reflect the performance of the crystal oscillator in harsh environments. The exhaust hose 41 and the exhaust head 42 are used to discharge the steam inside the sealed cover 4, maintain the airflow circulation of the test environment, and avoid excessive steam accumulation that may affect the test.

[0040] The specific working principle of this utility model is as follows:

[0041] Multiple crystal oscillators are placed into the capsules 212 of the multiple assembly chambers of the storage box 211. The air pump 31 supplies air to the distribution pipe 221 through the air supply pipe 32. The gas enters each capsule 212 through the connecting pipe 222. According to the size of the crystal oscillator, the gas flow rate and pressure are controlled by adjusting the control valve 223 to adjust the size of the capsule 212 and form a stable clamp for the crystal oscillator.

[0042] The cylinder 5 drives the sealing cover 4 to move towards the capsule-type storage module 2 until the sealing cover 4 contacts the storage box 211, forming a sealed space inside the test box 1 to simulate the sealed working environment of the crystal oscillator in electronic equipment.

[0043] Steam generator 61 generates steam, which is diverted through steam pipe 62 to first air guide pipe 63 and second air guide pipe 64. First air guide pipe 63 introduces steam into test chamber 1, so that the crystal oscillator in capsule 212 is in a humid and hot environment. Second air guide pipe 64 introduces steam into sealing cover 4. After the steam flows in sealing cover 4, it is discharged through exhaust hose 41 and exhaust head 42. During the process, the steam directly contacts the crystal oscillator, which enhances the effect of humid and hot operation.

[0044] In a closed and humid environment, the crystal oscillator is powered on and tested to observe its performance under different environmental conditions, such as frequency stability. The aging test of the crystal oscillator is completed to evaluate its reliability and stability in the actual working environment.

[0045] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.

Claims

1. A power-on burn-in device for SMD crystal oscillators, characterized in that , including test chamber (1) and steam component (6); The test box (1) is equipped with a bag-type storage module (2) and a sealing cover (4). The test box (1) is equipped with a cylinder (5) that drives the sealing cover (4) to move closer to or away from the bag-type storage module (2). The back of the test box (1) is equipped with an air supply component (3) that supplies air to the bag-type storage module (2). The steam element (6) is used to guide steam into the test chamber (1) and the steam element (6).

2. The SMD crystal oscillator electro-aging device according to claim 1, characterized in that: The capsule-type storage module (2) includes a capsule-type storage component (21) and a tubular diverter component (22). The capsule-type storage component (21) is installed inside the test chamber (1). The tubular diverter component (22) is connected to the capsule-type storage component (21) and is connected to the air supply component (3).

3. The SMD crystal oscillator electro-aging device according to claim 2, characterized in that: The bag-type storage device (21) includes a storage box (211), which has multiple spaced assembly chambers. Each of the multiple assembly chambers is equipped with a bag tube (212), and the tubular diverter (22) is connected to the multiple bags tubes (212) respectively.

4. The SMD crystal oscillator electro-aging device according to claim 3, characterized in that: The tubular diversion component (22) includes a diversion pipe (221) and multiple connecting pipes (222). The multiple connecting pipes (222) are respectively connected to multiple bladders (212). The diversion pipe (221) is connected to the multiple connecting pipes (222). The diversion pipe (221) is connected to the air supply component (3). A control valve (223) is installed at one end of the diversion pipe (221).

5. The SMD crystal oscillator electro-aging device according to claim 4, characterized in that: The air supply component (3) includes an air pump (31) and an air supply pipe (32). The air pump (31) is installed on the back of the test box (1). The two ends of the air supply pipe (32) are respectively connected to the air outlet of the air pump (31) and one end of the diversion pipe (221).

6. The SMD crystal oscillator electro-aging device according to claim 5, characterized in that: The steam component (6) includes a steam generator (61), which is located on one side of the test chamber (1). The steam generator (61) is connected to a steam pipe (62) at its outlet. A first air guide pipe (63) and a second air guide pipe (64) are connected to the steam pipe (62). The first air guide pipe (63) extends into the test chamber (1), and the second air guide pipe (64) communicates with the inside of the sealing cover (4). An exhaust head (42) is connected to one side of the test chamber (1), and an exhaust hose (41) communicating with the exhaust head (42) is connected to the bottom of the sealing cover (4).

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