RGA ion deflection structure
By optimizing the ion path and voltage control of the RGA equipment, the problems of ion beam purity and noise in existing equipment have been solved, and high signal-to-noise ratio ion detection has been achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SUZHOU ANYIPU PRECISION INSTR CO LTD
- Filing Date
- 2025-05-16
- Publication Date
- 2026-05-26
AI Technical Summary
The signal-to-noise ratio of existing RGA equipment is limited by ion diffusion, electromagnetic interference and detector noise. Neutral ion collision detectors lead to reduced ion beam purity and increased noise.
The ion path is optimized by using a quadrupole analyzer, deflection system, exit lens, and shaping lens. Different voltages are applied to the quadrupole electrode assembly to deflect the ion beam in the central turning region. Combined with real-time monitoring of the ion beam intensity and position using a Faraday cup, the electrode voltage is dynamically adjusted to optimize the ion path.
It improves the purity of the ion beam, reduces detector noise, minimizes the loss of effective ions during transmission, and enhances signal quality.
Smart Images

Figure CN224288246U_ABST