A testing device for solar silicon wafers

Abstract

This invention provides a solar silicon wafer testing device, comprising a testing unit and a light-emitting device. The testing unit includes a testing base, a positioning component, and a probe component. The testing base has a testing slot for loading the solar silicon wafer. The positioning component includes a positioning block and a positioning drive device. The probe component includes a probe holder, a probe assembly, and a probe drive device. The light-emitting device outputs light to the bottom wall of the testing slot. By loading the solar silicon wafer into the testing slot, the movement of the positioning block positions the solar silicon wafer adjacent to the positioning sidewall and the end of the positioning block. The probe assembly can then accurately contact the positive and negative electrodes of the silicon wafer. Combined with the light-emitting device outputting light to the bottom wall of the testing slot, the solar silicon wafer generates a potential difference upon receiving light. The detection by the probe assembly allows for determination of whether the generated potential difference meets requirements, thereby improving the testing efficiency and stability of the silicon wafer.

Description

Technical Field

[0001] This utility model relates to the field of silicon photonics testing, and in particular to a solar silicon photonics testing device. Background Technology

[0002] Solar modules typically consist of multiple silicon photocells to achieve higher power generation. The performance of each individual silicon photocell encapsulated within the same solar module must meet factory requirements; otherwise, it will negatively impact the overall performance of the solar module. Therefore, before encapsulation, the performance of each silicon photocell must be tested to classify them into grades, and then solar modules are encapsulated with silicon photocells of the same grade.

[0003] Because back-contact silicon photocells have no main grid lines on the front side and the welding points for both positive and negative electrodes are located on the same side of the photocell, shading is reduced, thereby improving the conversion efficiency. Therefore, back-contact silicon photocells are widely used. Similarly, to assemble multiple back-contact silicon photocells into solar modules, it is necessary to perform performance testing on each individual photocell. This requires the design of corresponding automated testing equipment to improve the testing efficiency of the silicon photocells. At the same time, due to the dense and small size of the positive and negative electrodes, it is also necessary to consider how to improve the alignment accuracy of the test probes to enhance the testing stability. Utility Model Content

[0004] The purpose of this invention is to provide a highly efficient and stable testing device for solar silicon photocells.

[0005] To achieve the purpose of this utility model, a solar silicon wafer testing device is provided, including a testing device and a light-emitting device. The testing device includes a testing seat, a positioning component, and a probe component. The testing seat is provided with a testing slot for loading solar silicon wafers. The testing slot has an opening at the top, and the bottom wall of the testing slot is made of a light-transmitting material. The testing seat has a sliding groove on the first horizontal side of the testing slot, which extends along the horizontal positioning direction. The testing seat has a positioning sidewall on the second horizontal side of the testing slot. The positioning component includes a positioning block and a positioning drive device. The positioning drive device is connected to the positioning block and drives the positioning block to move along the horizontal positioning direction. The positioning block is located in the sliding groove, and the end of the positioning block is located in the testing slot and moves toward or away from the positioning sidewall. The probe component includes a probe holder, a probe group, and a probe drive device. The probe group is disposed on the lower surface of the probe holder. The probe drive device is connected to the probe holder and drives the probe holder to move in the vertical direction. The probe holder is located above the testing slot, and the probe group moves toward or away from the testing slot. The light-emitting device outputs light to the bottom wall of the testing slot.

[0006] As can be seen from the above scheme, by loading the solar silicon photosheet into the test tank and using the movement of the positioning block, the solar silicon photosheet is positioned between the positioning sidewall and the end of the positioning block. Then, the probe group can accurately contact the positive and negative electrodes of the silicon photosheet and output light to the bottom wall of the test tank in conjunction with the light-emitting device. This causes the solar silicon photosheet to generate a potential difference when it receives light. With the detection of the probe group, it can be determined whether the generated potential difference meets the requirements, thereby improving the testing efficiency and testing stability of the silicon photosheet.

[0007] A further proposed solution is to arrange the test slot in a rectangular shape, with the positioning sidewalls and the ends of the positioning blocks located on both sides of the horizontal positioning direction, and avoidance grooves provided at the four corners of the test slot.

[0008] As can be seen from the above, the design of the avoidance groove allows for smoother removal of silicon wafers, making the loading and unloading of silicon wafers more efficient.

[0009] A further proposed solution is that the testing device includes a mounting base, which has a peripheral wall and a top wall, forming a cavity. The mounting base has a connection port at the bottom of the cavity, and the top wall is located at the top of the cavity. The top wall has a through-hole mounting groove that communicates with the cavity, and the testing base is installed in the mounting groove.

[0010] A further improvement is to install a reflective film on the inner wall of the cavity.

[0011] As can be seen from the above, the cavity of the mounting base can concentrate the light, and with the arrangement of the reflective film, the light is concentrated and projected onto the test base so that it can be converted into energy by the silicon photosheet.

[0012] A further proposed solution is that the test holder is provided with multiple test slots arranged in a horizontal direction, which is perpendicular to the horizontal positioning direction. The positioning component includes a positioning bracket and multiple positioning blocks, which are arranged in a horizontal direction on the positioning bracket. The positioning drive device is connected to the positioning bracket and drives the positioning bracket to move in the horizontal positioning direction. The needle holder is provided with multiple probe groups arranged in a horizontal direction, with one probe group opposite to one test slot.

[0013] As can be seen from the above, multiple silicon wafers can be tested simultaneously using multiple test slots and probe groups, thereby improving testing efficiency.

[0014] A further proposed solution is that the light-emitting device includes a light-emitting module and a light-collecting box. The light-collecting box forms a cavity, and the light-emitting module is placed inside the cavity. The light-collecting box has a through-hole at the upper end of the cavity. The upper end of the light-collecting box is connected to the test base, and the through-hole faces the bottom wall of the test slot.

[0015] A further embodiment is that the light-emitting device includes a conical light guide cover, which has a light guide hole running vertically through it. The lower cross-sectional area of ​​the light guide hole is larger than the upper cross-sectional area of ​​the light guide hole. The lower end of the conical light guide cover is connected to the upper end of the light collecting box, and the upper end of the light guide hole is connected to the test base. The upper end of the light guide hole faces the bottom wall of the test tank.

[0016] As can be seen from the above, by arranging the light-collecting box, a larger light-emitting module can be arranged to increase the light-emitting power, and with the light-collecting of the conical light guide, the light can be focused and projected onto the test slot.

[0017] A further proposed solution is to include a light-emitting device that also includes a filter, which is disposed within the cavity and located between the conical light guide and the light-emitting module.

[0018] A further embodiment is that the light-emitting device includes a cover, and the light-collecting box has an opening on the horizontal side of the filter. The cover is detachably disposed at the opening and connected to the light-collecting box.

[0019] A further embodiment is that the light-emitting device includes a filter bracket that extends horizontally and has a light-transmitting hole that runs through it vertically. The filter bracket is placed inside the cavity and connected to the light-collecting box, and a filter is placed on the filter bracket and covers the light-transmitting hole.

[0020] As can be seen from the above scheme, by arranging the cover, filter bracket and filter, the output type, output wavelength and output power of the light source can be adjusted according to actual needs, thereby improving the testing efficiency. Attached Figure Description

[0021] Figure 1 This is a structural diagram of an embodiment of the solar silicon wafer testing device of this utility model.

[0022] Figure 2 This is a structural diagram of the light-emitting device in an embodiment of the solar silicon wafer testing device of this utility model.

[0023] Figure 3 This is a structural diagram of the testing device in an embodiment of the solar silicon wafer testing device of this utility model.

[0024] Figure 4 This is a structural diagram of the probe assembly in an embodiment of the solar silicon wafer testing device of this utility model.

[0025] Figure 5 This is a structural diagram of the probe group in an embodiment of the solar silicon wafer testing device of this utility model.

[0026] Figure 6 This is a structural diagram of the silicon photodiode in an embodiment of the solar silicon photodiode testing device of this utility model.

[0027] Figure 7 This is a cross-sectional view of an embodiment of the solar silicon wafer testing device of this utility model.

[0028] Figure 8 This is a cross-sectional view of the testing device in an embodiment of the solar silicon wafer testing device of this utility model.

[0029] The present invention will be further described below with reference to the accompanying drawings and embodiments. Detailed Implementation

[0030] Reference Figures 1 to 8 The solar silicon wafer testing device 2 includes a testing device 2, a light-emitting device 1, and multiple solar silicon wafers 10. The light-emitting device 1 includes a light-emitting module 13, a conical light guide 12, multiple filters 14, a cover 16, multiple filter supports 15, and a light-collecting box 11. The light-collecting box 11 is arranged in a rectangular box shape, forming a cavity 111. The light-emitting module 13 can be an LED light-emitting module or other light-emitting device. The light-emitting module 13 is set inside the cavity 111 and emits light upwards. The light-collecting box 11 has a through-hole at the upper end of the cavity 111. The conical light guide 12 has a light-guiding hole 121 through-hole in the vertical direction. The light-guiding hole 121 is conical, and the lower cross-sectional area of ​​the light-guiding hole 121 is larger than the upper cross-sectional area of ​​the light-guiding hole 121. The lower end of the conical light guide 12 is connected to the through-hole at the upper end of the light-collecting box 11.

[0031] A filter holder 15 extends horizontally and has a light-transmitting hole 151 extending vertically through it. The filter holder 15 is disposed within a cavity 111 and connected to a light-collecting box 11. Multiple filter holders 15 are arranged vertically. A filter 14 can be selectively disposed on the filter holder 15 and cover the light-transmitting hole 151. The filter 14 is then disposed within the cavity 111, located between the conical light guide cover 12 and the light-emitting module 13. The light-collecting box 11 has an opening on the horizontal side of the filter 14. A cover 16 is detachably disposed at the opening and connected to the light-collecting box 11 to facilitate the selection and replacement of the filter 15.

[0032] The testing device 2 includes a test base 21, a positioning component 22, a probe component 23, and a mounting base 238. The test base 21 is provided with multiple test slots 211, which are arranged in a horizontal direction. The test slots 211 are used to load solar silicon photosheets 10. The test slots 211 have an opening at the top. The bottom wall of the test slots 211 is made of a light-transmitting material, or the entire test base 21 can be made of a light-transmitting material. The test base 21 is provided with a sliding groove 214 on the first horizontal side of the test slots 211, which extends along the horizontal positioning direction X. The test base 21 is provided with a positioning sidewall 212 on the second horizontal side of the test slots 211. The test slots 211 are arranged in a rectangular shape. The ends 224 of the positioning sidewalls 212 and the positioning blocks 223 are located on both sides of the horizontal positioning direction X. The four corners of the test slots 211 are respectively provided with clearance grooves 213.

[0033] The mounting base 238 is provided with a peripheral wall 241 and a top wall 242, which together form a cavity 239. The mounting base 238 has a connection port 244 at the bottom of the cavity 239. The top wall 242 is located at the top of the cavity 239 and has a through mounting groove 243 that communicates with the cavity 239. The test seat 21 is installed in the mounting groove 243, and the connection port 244 is located below the mounting groove 243. The inner wall of the cavity 239 is provided with a reflective film.

[0034] The positioning component 22 includes a positioning bracket 222, a plurality of positioning blocks 223 and a positioning drive device 221. The plurality of positioning blocks 223 are arranged on the positioning bracket 222 along the horizontal arrangement direction and extend along the horizontal positioning direction X. The positioning drive device 221 is connected to the positioning bracket 222 and drives the positioning bracket 222 to move along the horizontal positioning direction X. Then, the positioning drive device 221 drives the positioning blocks 223 to move along the horizontal positioning direction X. The positioning blocks 223 are located in the slide groove 214. The end 224 of the positioning blocks 223 is located in the test groove 211 and moves toward or away from the positioning sidewall 212, and the horizontal arrangement direction is perpendicular to the horizontal positioning direction X.

[0035] The probe assembly 232 includes a needle holder 231, a probe assembly 232, a slider 236, and a probe driving device 237. The needle holder 231 is provided with multiple probe assemblies 232, which are disposed on the lower surface of the needle holder 231. The multiple probe assemblies 232 are arranged along a horizontal arrangement direction. One probe assembly 232 is opposite to one test slot 211. One probe assembly 232 includes multiple positive probes 235 and multiple negative probes 234. The multiple positive probes 235 and multiple negative probes 234 are respectively arranged along the horizontal positioning direction X, and the multiple positive probes 235 and multiple negative probes 234 are arranged in an alternating manner. The bottom surface of the solar silicon photocell 10 is the light-receiving surface. The top surface of the solar silicon photocell 10 is provided with multiple positive electrodes 101 and multiple negative electrodes 102. The multiple positive electrodes 101 and multiple negative electrodes 102 are arranged alternately along the horizontal positioning direction X. The positive electrode probe 235 is used to contact the positive electrode 101, and the negative electrode probe 234 is used to contact the negative electrode 102.

[0036] The needle holder 231 is mounted on the slider 23, which is mounted on the slide rail. The probe driving device 237 is connected to the slider 23 and drives the slider 23 to move vertically. This enables the probe driving device 237 to drive the needle holder 231 to move vertically. The needle holder 231 is located above the test groove 211, and the probe group 232 moves toward or away from the test groove 211.

[0037] The upper end of the light guide hole 121 is connected to the mounting base 238. The upper end of the light guide hole 121 faces the bottom wall of the test slot 211. When testing multiple solar silicon wafers 10, the solar silicon wafers 10 can be transported into the test slot 211 using a loading and unloading device. One solar silicon wafer 10 is located in one test slot 211. Then, a positioning block 223 moves toward the positioning side wall 212. Subsequently, the solar silicon wafer 10 is adjacent to the end 224 of the positioning block 223 and the positioning side wall 212. The bottom surface of the solar silicon wafer 10 faces the bottom wall of the test slot 211, and the top surface of the solar silicon wafer 10 faces the probe group 232. Then, the light-emitting module 13 works and emits light. The light propagates and converges and finally enters the bottom wall of the test tank 211. It is then received and converted by the light-receiving surface of the solar silicon photosheet 10, which then generates a potential difference between the positive electrode 101 and the negative electrode 102. Finally, the probe group 232 moves downward and measures the generated potential difference by contacting the corresponding electrodes. Then, by judging whether the potential difference meets the factory requirements, the voltage detection result can be displayed on the display screen 3.

[0038] As can be seen from the above, by loading the solar silicon photosheet into the test tank and using the movement of the positioning block, the solar silicon photosheet is positioned between the positioning sidewall and the end of the positioning block. Then, the probe group can accurately contact the positive and negative electrodes of the silicon photosheet and output light to the bottom wall of the test tank in conjunction with the light-emitting device. This causes the solar silicon photosheet to generate a potential difference when exposed to light. With the detection of the probe group, it can be determined whether the generated potential difference meets the requirements, thereby improving the testing efficiency and testing stability of the silicon photosheet.

Claims

1. A solar silicon wafer testing device, comprising a testing device and a light-emitting device, Its features are: The testing device includes a test base, a positioning component, and a probe component. The test base is provided with a test slot for loading solar silicon photosheets. The test slot has an opening at the top. The bottom wall of the test slot is made of a light-transmitting material. The test base is provided with a sliding groove on the first horizontal side of the test slot, and the sliding groove extends along the horizontal positioning direction. The test base is provided with a positioning sidewall on the second horizontal side of the test slot. The positioning component includes a positioning block and a positioning drive device. The positioning drive device is connected to the positioning block and drives the positioning block to move along the horizontal positioning direction. The positioning block is located in the slide groove, and the end of the positioning block is located in the test groove and moves toward or away from the positioning sidewall. The probe assembly includes a needle holder, a probe group, and a probe driving device. The probe group is disposed on the lower surface of the needle holder. The probe driving device is connected to the needle holder and drives the needle holder to move vertically. The needle holder is located above the test slot. The probe group moves toward or away from the test slot. The light-emitting device outputs light to the bottom wall of the test tank.

2. The solar silicon wafer testing device according to claim 1, characterized in that: The test slot is arranged in a rectangular shape, and the ends of the positioning sidewall and the positioning block are located on both sides of the horizontal positioning direction. The four corners of the test slot are respectively provided with avoidance grooves.

3. The solar silicon wafer testing device according to claim 2, characterized in that: The testing device includes a mounting base, which has a peripheral wall and a top wall. The peripheral wall and the top wall form a cavity. The mounting base has a connection port at the bottom of the cavity. The top wall is located at the top of the cavity. The top wall has a through-hole mounting groove that communicates with the cavity. The testing base is installed in the mounting groove.

4. The solar silicon wafer testing device according to claim 3, characterized in that: The inner wall of the cavity is provided with a reflective film.

5. The solar silicon wafer testing device according to claim 1, characterized in that: The test seat is provided with a plurality of test slots, which are arranged along a horizontal direction and perpendicular to the horizontal positioning direction. The positioning component includes a positioning bracket and a plurality of positioning blocks, which are arranged on the positioning bracket along the horizontal direction. The positioning drive device is connected to the positioning bracket and drives the positioning bracket to move along the horizontal positioning direction. The needle holder is provided with a plurality of probe groups, which are arranged along the horizontal arrangement direction, with one probe group opposite to one test slot.

6. The solar silicon wafer testing apparatus according to any one of claims 1 to 5, characterized in that: The light-emitting device includes a light-emitting module and a light-collecting box. The light-collecting box forms a cavity, and the light-emitting module is disposed in the cavity. The light-collecting box has a through hole at the upper end of the cavity. The upper end of the light-collecting box is connected to the test base, and the through hole faces the bottom wall of the test slot.

7. The solar silicon wafer testing device according to claim 6, characterized in that: The light-emitting device includes a conical light guide cover, which has a light guide hole extending vertically through it. The lower cross-sectional area of ​​the light guide hole is larger than the upper cross-sectional area of ​​the light guide hole. The lower end of the conical light guide cover is connected to the upper end of the light collecting box, and the upper end of the light guide hole is connected to the test base. The upper end of the light guide hole faces the bottom wall of the test slot.

8. The solar silicon wafer testing device according to claim 7, characterized in that: The light-emitting device further includes a filter, which is disposed within the cavity and located between the conical light guide cover and the light-emitting module.

9. The solar silicon wafer testing device according to claim 8, characterized in that: The light-emitting device includes a cover, and the light-collecting box has an opening on the horizontal side of the filter. The cover is detachably disposed at the opening and connected to the light-collecting box.

10. The solar silicon wafer testing device according to claim 8, characterized in that: The light-emitting device includes a filter bracket that extends horizontally and has a light-transmitting hole that extends vertically. The filter bracket is disposed in the cavity and connected to the light-collecting box. The filter is disposed on the filter bracket and covers the light-transmitting hole.

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