Kelvin clip probe self-adapting test socket

The design of the floating seat and elastic connection solves the problem of unstable contact of the Kelvin clip probe under position and angle deviation, improving the testing accuracy and equipment life, and is suitable for high-precision electronic manufacturing and testing.

CN224317651UActive Publication Date: 2026-06-02KUNSHAN XINQIHONGZHI INTELLIGENT TECH CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
KUNSHAN XINQIHONGZHI INTELLIGENT TECH CO LTD
Filing Date
2025-05-30
Publication Date
2026-06-02

AI Technical Summary

Technical Problem

Existing Kelvin clip probe fixing methods are prone to unstable contact and unreliable conductivity when faced with positional or angular deviations in the test piece, and the test results are inconsistent in vibration environments.

Method used

The design employs a floating seat, elastic connection, and guide structure. The floating seat has degrees of freedom of movement in the axial and tilt directions. Combined with the elastic connection and guide groove, it ensures stable contact between the probe and the workpiece under test, avoiding hard collisions.

Benefits of technology

It improves testing accuracy and equipment lifespan, enhances compatibility with automated testing, and strengthens adaptability to alignment deviations and shock resistance.

✦ Generated by Eureka AI based on patent content.

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Abstract

This utility model provides an adaptive test base for Kelvin clip probes, including a device connecting plate, a fixed base, a floating base, a probe positioning plate, and an end cap. The probe positioning plate has multiple clip probes. The floating base and the end cap are respectively located on both sides of the probe positioning plate. The floating base has symmetrically formed first connecting channels at both ends. The fixed base has a second connecting channel corresponding to the first connecting channel. A first equal-height screw passes through the second connecting channel and is positioned within the first connecting channel, movably positioning the floating base on one side of the fixed base. A first connecting spring is installed within both the first and second connecting channels. A gap exists between the first equal-height screw and the second connecting channel, allowing the floating base axial and tilting freedom of movement on one side of the fixed base. This test base, through its innovative design of a floating base + elastic connection + guiding structure, effectively solves problems such as alignment deviation, probe damage, and poor test stability in rigid probe testing.
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Description

Technical Field

[0001] This utility model relates to the field of testing, and in particular to an adaptive test base for a Kelvin clip probe. Background Technology

[0002] In the field of electronic test and measurement, Kelvin clip probes are widely used for high-precision resistance, voltage, or signal testing, especially suitable for electrical performance testing of products such as PCBs, connectors, and battery modules. However, existing test probe fixing methods have the following limitations: 1. If the device under test (DUT) (such as plugs or terminals) has positional or angular deviations, it cannot effectively align the contacts, resulting in unstable contact and unreliable conductivity. Furthermore, hard collisions can easily occur between the probe and the DUT, leading to probe wear or product scratches; 2. Vibration interference issues: In high-speed automated testing or production line environments, equipment vibration may cause poor probe contact, affecting the consistency of test results. Therefore, a new adaptive test base for Kelvin clip probes is needed. Utility Model Content

[0003] In view of the above, this utility model provides an adaptive test base for Kelvin clip probes. Through the innovative design of floating base + elastic connection + guide structure, it effectively solves the problems of alignment deviation, probe damage and poor test stability in rigid probe testing, significantly improves test accuracy, equipment life and automation compatibility, and is suitable for high-precision electronic manufacturing and testing fields.

[0004] The present invention specifically adopts the following technical solution: A Kelvin clip probe adaptive test base includes a device connecting plate, a fixed base, a floating base, a probe positioning plate, and an end cap. The probe positioning plate is provided with multiple clip probes. The floating base and the end cap are respectively located on both sides of the probe positioning plate. The clip probes penetrate the floating base. First connecting channels are symmetrically opened at both ends of the floating base. A second connecting channel is opened on the fixed base corresponding to the position of the first connecting channel. A first equal-height screw passes through the second connecting channel and is disposed within the first connecting channel, movably positioning the floating base on one side of the fixed base. A first connecting spring is provided within the first connecting channel and the second connecting channel. A gap exists between the first equal-height screw and the second connecting channel, and a gap also exists between the fixed base and the floating base, allowing the floating base to have axial and tilting degrees of freedom of movement on one side of the fixed base.

[0005] As a further improved technical solution, the second connecting channel includes a head platform stage, a middle through section, and a tail groove section. The outer diameter of the middle smooth rod section of the first equal-height screw is smaller than the inner diameter of the middle through section, and there is a gap between them. The head nut of the first equal-height screw is engaged in the head platform stage.

[0006] As a further improved technical solution, the first connecting channel includes a threaded hole and a spring groove. The two ends of the first connecting spring are respectively located in the spring groove of the first connecting channel and in the tail groove of the second connecting channel. The smooth section and the threaded section of the first equal-height screw pass through the first connecting spring, and the threaded section of the first equal-height screw is matched and connected with the threaded hole of the first connecting channel.

[0007] As a further improved technical solution, the inner diameter of the head platform stage is larger than the inner diameter of the middle through section, and the inner diameter of the tail groove section is larger than the inner diameter of the head platform stage.

[0008] As a further improved technical solution, the floating seat has multiple probe channels corresponding to the number and position of the clamping probes, and the probe tip of the clamping probe penetrates the probe channel.

[0009] As a further improved technical solution, the end cap is provided with multiple insertion holes corresponding to the number and position of the clip probes, and the clip end of the clip probe is inserted into the insertion hole.

[0010] As a further improved technical solution, a guide groove is provided along the edge of the insertion hole, and the sidewall of the guide groove is arc-shaped.

[0011] As a further improved technical solution, the floating seat, the probe positioning plate, and the end cap are connected by screws.

[0012] As a further improved technical solution, the side of the device connection plate is provided with two third connection channels, and the fixed base is provided with a fourth connection channel corresponding to the position of the third connection channels. The second equal-height screw passes through the fourth connection channel from one end of the fixed base and connects to the third connection channel.

[0013] As a further improved technical solution, a second connecting spring is provided between the third connecting channel and the fourth connecting channel, and a gap is provided between the device connecting plate and the fixed base, so that the device connecting plate has axial movement space on one side of the fixed base.

[0014] This utility model's Kelvin clip probe adaptive test base, through its floating mechanism design, eliminates the need for manual intervention. Even with minor positioning errors during docking, it maintains stable contact, significantly enhancing the test base's flexibility and impact resistance. The floating connection between the floating seat and the fixed seat allows the floating seat to move freely in both axial and tilt directions, effectively absorbing axial and angular deviations during plug insertion. When there is an angular deviation during plug insertion, the floating seat can slightly tilt with the plug to ensure the plug contacts align with the probe. When there is an axial positional deviation, the floating seat can slightly translate using the elastic deformation of the spring, avoiding hard collisions. The end cap design better protects the clip tip of the probe from impacts, and the guide groove in the insertion hole on the end cap guides the plug under test during insertion. This, combined with the deflection of the floating seat, adjusts the probe position to ensure final alignment. Attached Figure Description

[0015] Figure 1 This is a top view of the Kelvin clip probe adaptive test base of this application.

[0016] Figure 2 This is an exploded structural diagram of the Kelvin clip probe adaptive test base of this application.

[0017] Figure 3 for Figure 1 Directional sectional view.

[0018] Figure 4 This is a schematic diagram of the end cap structure. Detailed Implementation

[0019] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, not the entire structure.

[0020] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "set up" and "connection" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal connection of two components. For those skilled in the art, the specific meaning of the above terms in this utility model can be understood through the specific circumstances.

[0021] Reference Figures 1-3This embodiment of a Kelvin clip probe adaptive test base includes a device connection plate 1, a fixed base 2, a floating base 3, a probe positioning plate 4, and an end cap 5. The test base of this application can be fixed to a multi-scenario platform or device via the device connection plate 1. The device connection plate 1 is fixed to the required platform or device using screws, and the fixed base 2 is connected to the device connection plate 1. The probe positioning plate 4 is provided with multiple clip probes 6. The floating base 3 and the end cap 5 are respectively located on both sides of the probe positioning plate 4. The clip probes 6 penetrate the floating base 3. The floating base 3 has symmetrically provided first connecting channels 31 at both ends. In this embodiment, there are two first connecting channels 31 at each end of the floating base 3, for a total of four. A second connecting channel 21 is provided on the fixed base 2 at the position corresponding to the first connecting channel 31. The first equalizing screw 7 passes through the second connecting channel 21 and is set in the first connecting channel 31, so that the floating seat 3 is movably set on one side of the fixed base 2. A first connecting spring 8 is provided in the first connecting channel 31 and the second connecting channel 21. There is a gap between the first equalizing screw 7 and the second connecting channel 21, and there is a gap between the fixed base 2 and the floating seat 3, so that the floating seat 3 has axial and tilting freedom of movement on one side of the fixed base 2.

[0022] Specific references Figure 3 The second connecting channel 21 includes a head platform stage 211, a middle through section 212, and a tail groove section 213. The inner diameter of the head platform stage 211 is larger than that of the middle through section 212, and the inner diameter of the tail groove section 213 is larger than that of the head platform stage 211. The outer diameter of the middle smooth section of the first equal-height screw 7 is smaller than that of the middle through section 212, with a gap between them. The head nut of the first equal-height screw 7 is engaged in the head platform stage 211, restricting the first equal-height screw 7 from moving towards the floating seat 3. The first connecting channel 31 includes a threaded hole 311 and a spring groove 312. The two ends of the first connecting spring 8 are respectively located in the spring groove 312 of the first connecting channel 31 and the tail groove section 213 of the second connecting channel 21. The smooth section and the threaded section of the first equal-height screw 7 pass through the first connecting spring 8, and the threaded section at the tail of the first equal-height screw 7 is threadedly connected to the threaded hole 311 of the first connecting channel 31. The first connecting spring 8 provides elastic buffering during the docking process. The axial force when the plug under test is inserted will compress the spring to avoid rigid impact on the probe. The spring rebound force ensures that the probe and plug contacts maintain stable contact. Even if there is vibration or slight displacement, the conductivity reliability can still be maintained. If the plug is inserted too deeply or too shallowly, the extension and contraction of the spring can automatically compensate to prevent the probe from being over-pressurized or making poor contact. Moreover, the slight deflection of the floating seat 3 will not cause the spring to jam, and the reset capability can still be guaranteed.

[0023] Furthermore, the floating base 3 has multiple probe channels 32 corresponding to the number and position of the clip probes 6. The probe end 61 of the clip probe 6 penetrates the probe channel, so that the probe end 61 protrudes from the floating base and extends towards the fixed base 2, so as to connect the lead wire. The number and position of the clip probes 6 can be set in advance according to the test position requirements of the test part.

[0024] The floating seat 3, probe positioning plate 4, and end cap 5 are fixedly connected by screws 345. The floating seat 3 and the fixed seat 2 are floatingly connected by the first equal-height screw 7 and the first connecting spring 8. That is, the floating seat 3 can move relative to the fixed seat 2 along the axial direction of the first equal-height screw 7. The floating seat 3 can move back and forth slightly, compress or release the spring, absorb the axial deviation when the plug under test is inserted, and can also tilt up, down, left, and right (e.g., Figure 1 and Figure 3 (The diagram shows the skew directions of a, b, c, and d in the diagram). To accommodate the angular deviation of the plug, when the plug is being tested is being approached from the end cap 5, if there is an angular deviation when the plug is inserted (such as not being completely perpendicular), the floating seat 3 will tilt slightly with the plug so that the probe 6 can still be aligned with the plug contact. If there is an axial position deviation of the plug (such as not being completely aligned), the floating seat 3 can be slightly translated by the elastic deformation of the spring to avoid hard collisions.

[0025] Simultaneously refer to Figure 4 The end cap 5 has multiple insertion holes 51 corresponding to the number and position of the clip probes 6. The clip end 62 of the clip probe 6 passes through the insertion hole and does not protrude from the surface of the end cap 5. The end cap 5 can better protect the clip end 62 of the clip probe from bumps and makes it easier to accept the plug to be tested. Moreover, the edge of the insertion hole 51 is provided with a guide groove 52. The side wall of the guide groove 52 is arc-shaped. When the plug to be tested is inserted into the test base from the side of the end cap 5, the design of the guide groove 52 makes it easier for the plug to be tested to be inserted into the insertion hole 51. The arc-shaped side wall of the guide groove 52 will gradually guide the plug to the center position. Even if there is an initial deviation of ±1~2mm, it can slide into the correct position. If the plug is not completely aligned, it will first contact the inclined surface of the guide groove 52 and be gradually corrected to the center of the insertion hole during the insertion process. If the plug is significantly deviated, the guidance of the guide groove 52 will work together with the deflection of the floating seat 3 to adjust the probe position and ensure final alignment.

[0026] Furthermore, the Kelvin clip probe adaptive test base also includes two third connection channels 11 on the side of the device connection plate 1, and a fourth connection channel on the fixing base 2 corresponding to the third connection channels 11. The second equalization screw 9 passes through the fourth connection channel from one end of the fixing base 2 and connects to the third connection channel 11. A second connection spring 10 is provided between the third connection channel 11 and the fourth connection channel. A gap is provided between the device connection plate 1 and the fixing base 2, allowing the device connection plate 1 to have axial movement space along the second equalization screw 9 on one side of the fixing base 2. The third connecting channel 11 has the same structure as the first connecting channel 31, with threaded holes and spring grooves. The fourth connecting channel has the same structure as the second connecting channel 21, with a head platform stage, a middle section, and a tail groove section. However, the arrangement directions on the fixing seat 2 are opposite. The two ends of the second connecting spring 10 are respectively located in the spring groove of the third connecting channel 11 and in the tail groove section of the fourth connecting channel. The smooth rod section and threaded section of the second equal-height screw 9 pass through the fourth connecting channel and are threadedly connected to the threaded hole of the third connecting channel 11 through the threaded section at the tail. At the same time, it passes through the second connecting spring 10. The head nut of the second equal-height screw 9 is locked in the head platform stage.

[0027] The equipment connecting plate 1 and the fixed base 2 are connected by the second equal-height screw 9, and a second connecting spring 10 is also provided at the connection. The equipment connecting plate 2 can move slightly along the axis of the second equal-height screw 9, and the second connecting spring 10 can buffer external vibration or impact. When the test base is installed on the platform, if there is slight vibration or position deviation on the platform, the axial floating of the equipment connecting plate 1 can absorb part of the displacement and avoid direct transmission to the probe.

[0028] This test base is equipped with a two-stage floating mechanism, which further enhances the flexibility and impact resistance of the entire test base. The multi-stage floating mechanism also expands the adaptability of the test base, enabling it to work reliably under complex working conditions (such as vibration environment, assembly error, high impact insertion).

[0029] Furthermore, the above embodiments are only used to illustrate the present utility model and are not intended to limit the technical solutions described in the present utility model. The understanding of this specification should be based on those skilled in the art. Although the present utility model has been described in detail with reference to the above embodiments, those skilled in the art should understand that they can still make modifications or equivalent substitutions to the present utility model. All technical solutions and improvements that do not depart from the spirit and scope of the present utility model should be covered within the scope of the claims of the present utility model.

Claims

1. A Kelvin clip probe adaptive test base, characterized in that: The device includes a connecting plate, a fixed base, a floating base, a probe positioning plate, and an end cap. The probe positioning plate is provided with multiple clamping probes. The floating base and the end cap are respectively located on both sides of the probe positioning plate. The clamping probes penetrate the floating base. The two ends of the floating base are symmetrically provided with first connecting channels. The fixed base is provided with a second connecting channel corresponding to the position of the first connecting channel. A first equalizing screw passes through the second connecting channel and is set in the first connecting channel, movably positioning the floating base on one side of the fixed base. A first connecting spring is provided in the first connecting channel and the second connecting channel. There is a gap between the first equalizing screw and the second connecting channel, and there is also a gap between the fixed base and the floating base, allowing the floating base to have axial and tilting degrees of freedom of movement on one side of the fixed base.

2. The Kelvin clip probe adaptive test base according to claim 1, characterized in that: The second connecting channel includes a head platform stage, a middle through section, and a tail groove section. The outer diameter of the middle smooth rod section of the first equal-height screw is smaller than the inner diameter of the middle through section, and there is a gap between them. The head nut of the first equal-height screw is engaged in the head platform stage.

3. The Kelvin clip probe adaptive test base according to claim 2, characterized in that: The first connecting channel includes a threaded hole and a spring groove. The two ends of the first connecting spring are respectively located in the spring groove of the first connecting channel and in the tail groove of the second connecting channel. The smooth section and the threaded section of the first equal-height screw pass through the first connecting spring. The threaded section of the first equal-height screw is matched and connected with the threaded hole of the first connecting channel.

4. The Kelvin clip probe adaptive test base according to claim 2, characterized in that: The inner diameter of the head platform stage is larger than the inner diameter of the middle section, and the inner diameter of the tail groove section is larger than the inner diameter of the head platform stage.

5. The Kelvin clip probe adaptive test base according to claim 1, characterized in that: The floating base has multiple probe channels corresponding to the number and position of the clip probes, and the probe tip of the clip probe penetrates the probe channel.

6. The Kelvin clip probe adaptive test base according to claim 1, characterized in that: The end cap has multiple insertion holes corresponding to the number and position of the clip probes, and the clip end of the clip probe is inserted into the insertion hole.

7. The Kelvin clip probe adaptive test base according to claim 6, characterized in that: The insertion hole is provided with a guide groove along its edge, and the sidewall of the guide groove is arc-shaped.

8. The Kelvin clip probe adaptive test base according to claim 1, characterized in that: The floating seat, the probe positioning plate, and the end cap are connected by screws.

9. The Kelvin clip probe adaptive test base according to claim 8, characterized in that: The device connection plate has two third connection channels on its side, and the fixed base has a fourth connection channel corresponding to the third connection channels. The second equal-height screw passes through the fourth connection channel from one end of the fixed base and connects to the third connection channel.

10. The Kelvin clip probe adaptive test base according to claim 9, characterized in that: A second connecting spring is provided between the third connecting channel and the fourth connecting channel, and a gap is provided between the device connecting plate and the fixed base, so that the device connecting plate has axial movement space on one side of the fixed base.