Surface mount electronic component static detection fixture

Abstract

The utility model relates to detection clamp technical field, concretely relates to a surface mount electronic component static detection clamp, it includes: test board, the test board top is equipped with test groove, and one end of test groove extends to the test board outside, push -back, push -back sets up in test groove, and push -back with test board between be equipped with the compression mechanism, push -back corresponds test groove inside is equipped with electrode strip, test groove corresponds push -back is equipped with independent electrode piece, the test board top still is equipped with with electrode strip electric connection's basic electrode, and with independent electrode piece electric connection's test electrode, basic electrode is used for establishing reference potential, test electrode is used for detecting component parameter, the utility model discloses through the innovative mechanical structure and electrical design, has realized to the high -efficient, accurate detection of miniaturization component.

Description

Technical Field

[0001] This utility model relates to the field of testing fixture technology, specifically to a static testing fixture for surface mount electronic components. Background Technology

[0002] With the rapid development of surface mount technology (SMT), surface mount electronic components are constantly evolving towards miniaturization and high density. Small-package components have become mainstream, which poses a serious challenge to static testing technology.

[0003] Traditional testing fixtures employ a single-station mechanical probe contact method, which suffers from low testing efficiency, poor contact reliability, and insufficient positioning accuracy. Especially when testing miniaturized components, instability in contact resistance can cause fluctuations in test data, affecting test accuracy. Furthermore, existing fixture systems are ill-suited to the flexible production demands of diverse product types and small batches, and fixture replacement is time-consuming and labor-intensive. Utility Model Content

[0004] This invention provides a static testing fixture for surface mount electronic components, which achieves efficient and accurate testing of miniaturized components through innovative mechanical structure and electrical design.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a static testing fixture for surface mount electronic components, comprising: a test plate, wherein a test groove is provided on the top of the test plate and one end of the test groove extends outward from the test plate; a push plate, wherein the push plate is disposed within the test groove and a clamping mechanism is provided between the push plate and the test plate; an electrode strip is provided on the push plate corresponding to the interior of the test groove, and an independent electrode sheet is provided on the test groove corresponding to the push plate; a base electrode electrically connected to the electrode strip and a test electrode electrically connected to the independent electrode sheet are also provided on the top of the test plate; the base electrode is used to establish a reference potential, and the test electrode is used to detect component parameters.

[0006] Preferably, the bottom of the test groove is a sloping structure inclined towards the push plate.

[0007] Preferably, the test slot is provided with multiple positioning steps on the side opposite to the push plate, each positioning step forming a horizontal stepped structure, and each positioning step is provided with an independent electrode plate; multiple test electrodes are provided, and each is electrically connected to the corresponding independent electrode plate.

[0008] Preferably, the push plate is provided with a plurality of longitudinally penetrating grooves, each groove being perpendicular to the length direction of the test groove, and the push plate is engaged with the test plate by a pin penetrating the groove.

[0009] Preferably, the push plate has an inclined surface on the side away from the electrode strip, and the test plate has a channel parallel to the length direction of the test groove corresponding to the inclined surface area; the clamping mechanism includes a wedge-shaped slider adapted to the inclined surface and an eccentric wrench disposed outside the test plate, the end of the wedge-shaped slider is connected to a flexible shaft, the free end of the flexible shaft extends outward from the test plate through the channel and is connected to the rotating shaft inside the eccentric wrench.

[0010] Preferably, the wedge-shaped slider is provided with an armature, and the push plate is provided with a magnet corresponding to the armature; a spring is provided between the end of the wedge-shaped slider and the test groove.

[0011] The advantages of this invention are as follows: This static testing fixture for surface mount electronic components significantly improves the testing efficiency and reliability of miniaturized components through its innovative structural design and working principle. The test slot at the top of the test board extends outwards at one end, forming an open component placement area. The component under test is pressed and fixed within the test slot by a push plate, achieving rapid positioning without the need for the precise alignment operations of traditional fixtures. Electrode strips are integrated on the push plate and connected to the base electrodes on the test board, providing a stable reference potential for the component. Independent electrode plates are distributed within the test slot and connected to the test electrodes for detecting the component's electrical parameters, such as resistance, capacitance, and conductivity. The clamping mechanism ensures tight contact between the electrodes and the component leads, reducing contact resistance fluctuations. This effectively solves the pain points of traditional fixtures in the testing of micro-sized components, combining accuracy, efficiency, and flexibility, making it an ideal testing solution for the high-density trend of SMT (Surface Mount Technology). The inclined slope at the bottom of the test slot allows the component to automatically slide onto the positioning step when pressed by the push plate, reducing manual adjustment time. The push plate, through a floating design of grooves and pins, adapts to component height deviations during clamping, ensuring uniform force on the electrode contact surface. When the eccentric wrench rotates, it pulls the wedge-shaped slider along the inclined plane via a flexible shaft, converting horizontal thrust into vertical clamping force, achieving a lever-like force amplification effect. After releasing the wrench, a spring pushes the wedge-shaped slider back to its original position, the magnet attracts the armature, and the push plate automatically releases the component. In summary, this surface mount electronic component static testing fixture can cover multiple sizes, such as 0201 to 0805, with a single fixture. By selecting different positioning steps, it automatically matches the electrode spacing, resulting in near-zero changeover time. Simultaneously, it utilizes mechanical clamping to reduce fretting wear, controlling electrode contact resistance fluctuations within ±1%, making it suitable for testing micro-packages such as 01005. The inclined structure prevents component placement at an angle; the groove limit prevents overpressure damage to fragile components. Furthermore, the wedge-shaped slider uses a wear-resistant coating, and the flexible shaft drive reduces mechanical wear, resulting in an overall lifespan of over 100,000 cycles. The eccentric wrench enables quick clamping / releasing with one hand, with an operation time of less than 2 seconds. Therefore, this fixture is suitable for incoming material inspection or in-process sampling of micro-packages such as QFN and μBGA, and is compatible with both manual and automated equipment, facilitating small-batch rework. Attached Figure Description

[0012] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0013] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0014] Figure 2 This is a partial structural cross-sectional view of the present invention.

[0015] In the diagram: 1. Test plate; 2. Test slot; 3. Push plate; 4. Electrode strip; 5. Independent electrode sheet; 6. Base electrode; 7. Test electrode; 8. Sliding contact; 9. Positioning step;

[0016] 10. Slide; 11. Pin; 12. Channel; 13. Wedge slider; 14. Eccentric wrench; 15. Flexible shaft; 16. Shaft; 17. Armature; 18. Magnet; 19. Spring. Detailed Implementation

[0017] The technical solution of this utility model will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0018] according to Figure 1 , Figure 2 As shown, a static testing fixture for surface mount electronic components includes: a test plate 1, with a test groove 2 on its top and one end of the test groove 2 extending outward from the test plate 1; a push plate 3, disposed within the test groove 2, with a clamping mechanism between the push plate 3 and the test plate 1; an electrode strip 4 corresponding to the interior of the test groove 2 on the push plate 3, and an independent electrode sheet 5 corresponding to the push plate 3 on the test groove 2; a base electrode 6 electrically connected to the electrode strip 4 and a test electrode 7 electrically connected to the independent electrode sheet 5 are also provided on the top of the test plate 1; the base electrode 6 is used to establish a reference potential; the test electrode 7 is used to detect component parameters; and a sliding contact 8 for conducting electricity is provided between the push plate 3 and the test plate 1.

[0019] This surface mount electronic component static testing fixture significantly improves the testing efficiency and reliability of miniaturized components through its innovative structural design and working principle. Specifically, the test slot 2 on the top of the test board 1 extends outward at one end, forming an open component placement area. The component under test is pressed and fixed within the test slot 2 by a push plate 3, achieving rapid positioning without the need for the precise alignment operations of traditional fixtures.

[0020] Electrode strip 4 is integrated on push plate 3 and connected to base electrode 6 on test plate 1, providing a stable reference potential for components. Independent electrode pieces 5 are distributed in test slots 2 and connected to test electrodes 7 for detecting component electrical parameters such as resistance, capacitance, and conductivity. A clamping mechanism ensures tight contact between the electrodes and component leads, reducing contact resistance fluctuations. This effectively solves the pain points of traditional fixtures in the inspection of micro-sized components, combining accuracy, efficiency, and flexibility, making it an ideal inspection solution for the high-density trend of SMT (Surface Mount Technology).

[0021] The bottom of the test slot 2 is a sloping structure inclined towards the push plate 3. Multiple positioning steps 9 are provided on the side of the test slot 2 opposite to the push plate 3, forming a horizontal stepped structure. Each positioning step 9 is equipped with an independent electrode piece 5. Multiple test electrodes 7 are provided, each electrically connected to its corresponding independent electrode piece 5. The multi-level horizontal positioning steps 9 on the sidewall of the test slot 2 can accommodate components of different sizes. Each step is equipped with an independent electrode piece 5, achieving simultaneous physical positioning and electrical contact through the height difference of the steps. Furthermore, the modular design of the push plate 3 and the test slot 2 allows for quick replacement of electrode strips 4 and independent electrode pieces 5 of different specifications, accommodating components of different package sizes.

[0022] The push plate 3 has multiple longitudinally penetrating grooves 10, each groove 10 being perpendicular to the length direction of the test groove 2. The push plate 3 engages with the test plate 1 via pins 11 penetrating the grooves 10. The push plate 3 has an inclined surface on the side away from the electrode strip 4, and the test plate 1 has a channel 12 corresponding to the inclined surface area, parallel to the length direction of the test groove 2. The clamping mechanism includes a wedge-shaped slider 13 adapted to the inclined surface and an eccentric wrench 14 disposed outside the test plate 1. A flexible shaft 15 is connected to the end of the wedge-shaped slider 13, and the free end of the flexible shaft 15 extends outward from the test plate 1 through the channel 12 and connects to a rotating shaft 16 inside the eccentric wrench 14. The wedge-shaped slider 13 has an armature 17, and the push plate 3 has a magnet 18 corresponding to the armature 17. A spring 19 is provided between the end of the wedge-shaped slider 13 and the test groove 2.

[0023] The inclined slope at the bottom of test slot 2 allows components to automatically slide onto positioning step 9 when pressed by push plate 3, reducing manual adjustment time. Push plate 3, through the floating design of slide groove 10 and pin 11, adapts to component height deviations during pressing, ensuring uniform force on the electrode contact surface. When eccentric wrench 14 rotates, it pulls wedge slider 13 along the inclined plane via flexible shaft 15, converting horizontal thrust into vertical clamping force, achieving a lever-type force amplification effect. After releasing the wrench, spring 19 pushes wedge slider 13 back to its original position, and magnet 18 attracts armature 17, causing push plate 3 to automatically release the components.

[0024] In summary, this surface mount electronic component static inspection fixture can cover multiple sizes, such as 0201 to 0805, with a single fixture. By selecting different positioning steps 9, it automatically matches the electrode spacing, resulting in near-zero changeover time. Simultaneously, it utilizes mechanical clamping to reduce fretting wear, controlling electrode contact resistance fluctuations within ±1%, making it suitable for testing micro-packages such as 01005. The sloping structure prevents components from being placed at an angle; the slide groove 10 limits movement to prevent overpressure damage to fragile components. Furthermore, the wedge-shaped slider 13 uses a wear-resistant coating, and the flexible shaft 15 reduces mechanical wear, resulting in an overall lifespan of over 100,000 cycles. The eccentric wrench 14 enables quick one-handed clamping / release with an operation time of <2 seconds. Therefore, this fixture is suitable for incoming material inspection or in-process sampling of micro-packages such as QFN and μBGA, and is compatible with both manual and automated equipment, facilitating small-batch rework.

[0025] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.

Claims

1. A static testing fixture for surface mount electronic components, characterized in that, include: A test plate (1) is provided with a test groove (2) on its top, and one end of the test groove (2) extends outward from the test plate (1); Push plate (3), the push plate (3) is disposed in the test slot (2), and a clamping mechanism is provided between the push plate (3) and the test plate (1); The push plate (3) is provided with an electrode strip (4) inside the test slot (2), and the test slot (2) is provided with an independent electrode sheet (5) corresponding to the push plate (3). The top of the test plate (1) is also provided with a base electrode (6) electrically connected to the electrode strip (4) and a test electrode (7) electrically connected to the independent electrode sheet (5). The base electrode (6) is used to establish a reference potential, and the test electrode (7) is used to detect component parameters.

2. The static testing fixture for surface mount electronic components according to claim 1, characterized in that: The bottom of the test groove (2) is a sloping structure that slopes towards the push plate (3).

3. The static testing fixture for surface mount electronic components according to claim 2, characterized in that: The test slot (2) is provided with multiple positioning steps (9) on the side opposite to the push plate (3). Each positioning step (9) forms a horizontal stepped structure, and each positioning step (9) is provided with an independent electrode plate (5). Multiple test electrodes (7) are provided and are electrically connected to the corresponding independent electrode plate (5).

4. The static testing fixture for surface mount electronic components according to claim 3, characterized in that: The push plate (3) is provided with multiple through grooves (10), each groove (10) being perpendicular to the length direction of the test groove (2), and the push plate (3) is engaged with the test plate (1) through a pin (11) passing through the groove (10).

5. A static testing fixture for surface mount electronic components according to claim 4, characterized in that: The push plate (3) has an inclined surface on the side away from the electrode strip (4), and the test plate (1) has a channel (12) parallel to the length direction of the test groove (2) corresponding to the inclined surface area; the clamping mechanism includes a wedge-shaped slider (13) adapted to the inclined surface, and an eccentric wrench (14) disposed outside the test plate (1). The end of the wedge-shaped slider (13) is connected to a flexible shaft (15), and the free end of the flexible shaft (15) extends outward from the test plate (1) through the channel (12) and is connected to the rotating shaft (16) inside the eccentric wrench (14).

6. A static testing fixture for surface mount electronic components according to claim 5, characterized in that: The wedge-shaped slider (13) is provided with an armature (17), and the push plate (3) is provided with a magnet (18) corresponding to the armature (17); a spring (19) is provided between the end of the wedge-shaped slider (13) and the test groove (2).

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