Multi-axis optical measurement apparatus and integrated device
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- BEIJING NORMAL UNIVERSITY
- Filing Date
- 2025-05-16
- Publication Date
- 2026-06-09
AI Technical Summary
Existing optical measurement devices are insufficient in terms of measurement accuracy and spatial angle adjustment, making it difficult to meet the requirements of high-precision measurement.
A multi-axis optical measurement device is adopted, including an XYZ three-axis adjustment stage and adjustment mechanism, to realize the position and spatial angle adjustment of the detection element. Combined with fine adjustment and coarse adjustment functions, the measurement accuracy and angle adjustment flexibility are improved.
It achieves high-precision micro-displacement control and three-dimensional spatial attitude adjustment, adapting to test samples with various shapes and surface features, thus improving measurement accuracy and effectiveness.
Smart Images

Figure CN224339861U_ABST