Depth micrometer indication error testing fixture

By designing a depth micrometer indication error gauge, and adopting a vertically set measuring plate and gauge block structure, parallax error is eliminated, and the locking unit fixes the depth micrometer. This solves the mechanical wear and parallax problems of existing gauges during testing, and achieves efficient and accurate measurement.

CN224340836UActive Publication Date: 2026-06-09QINGHAI MEASURING TOOLS (CHANGZHOU) CO LTD
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Patent Information

Application Number
CN202521705389.X
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-08-12
Publication Date
2026-06-09
Estimated Expiration
2035-08-12

AI Technical Summary

Technical Problem

Existing depth micrometer indication error gauges are susceptible to mechanical wear during testing, leading to poor coaxiality. Furthermore, they rely on manual alignment of the scale lines, resulting in parallax errors and making accurate measurements impossible.

Method used

A depth micrometer indication error gauge was designed, comprising a gauge base, support legs, a testing mechanism, and a locking unit. The gauge eliminates parallax error by using a vertically set depth micrometer measuring plate, baffle, and standard gauge block, and the locking unit fixes the depth micrometer to prevent shaking.

Benefits of technology

It improves the reliability and efficiency of testing, eliminates parallax errors caused by manually aligning scale lines, ensures that the measuring end is parallel to the standard gauge block, reduces operating steps, and improves testing accuracy and stability.

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Abstract

The utility model discloses a micrometer depth gauge indicating value error testing fixture, which comprises a testing fixture base, four supporting legs, a micrometer depth gauge and a detection mechanism, the four supporting legs are symmetrically fixed at four corners of the bottom of the testing fixture base front and back and left and right, the detection mechanism is arranged at the top of the testing fixture base, and the micrometer depth gauge is connected and locked in the detection mechanism. According to the utility model, the detection mechanism is arranged, the depth micrometer measuring plate, the baffle plate and the standard gauge block are combined to form a detection structure, and through the connection points which are vertically and parallelly arranged, the measuring end of the depth micrometer is completely parallel to the standard gauge block when the depth micrometer is detected, so that data deviation caused by deflection is avoided; meanwhile, the standard gauge block is used as a reference, only the reading of the micrometer needs to be directly compared with the calibration size of the gauge block during detection, sight line errors caused by manual scale line alignment are eliminated, the detection reliability is remarkably improved, and a traditional method needs to read the micrometer and gauge scales synchronously.
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