Radio frequency circuit detection apparatus for optical devices
By placing the transmitter and receiver ports on the same substrate in the optical device RF circuit testing device and adopting a star topology and pin connection, the problem of high testing cost of optical device RF circuits is solved, and efficient and accurate testing is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- CHENGDU GUANGCHUANGLIAN CO LTD
- Filing Date
- 2025-06-25
- Publication Date
- 2026-06-26
AI Technical Summary
The existing testing of radio frequency circuits for optical devices requires the design of separate high-frequency test boards for transmitters and receivers, resulting in high testing costs and the need to set up multiple test environments on the production line.
Design an RF circuit detection device that places the transmitter and receiver ports on the same substrate, adopts a star topology, and is equipped with a driver chip compatible with both the transmitter and receiver. The device uses pin connections to reduce signal loss and improve detection accuracy, and employs a high-frequency jack connection method to improve connection efficiency.
This enables alternating testing of transmitters and receivers on the same substrate, reducing testing costs, improving testing accuracy and connection efficiency, and reducing signal loss.
Smart Images
Figure CN224416914U_ABST