A device for testing the resistivity of a semiconductive sheath material

Abstract

The utility model relates to a kind of testing device of semi-conductive sheath material resistivity, comprising: current test part and potential test part, current test part includes bottom plate and pressing plate, the surface of bottom plate is embedded with a pair of first electrode, the surface of pressing plate is embedded with a pair of second electrode, the surface of pressing plate is opened with detection port, pressing plate is buckled in the top of bottom plate, and the side of bottom plate with first electrode is set to the side of pressing plate with second electrode, first electrode and second electrode are electrically connected;Potential test part includes test block, the two sides of test block are provided with third electrode, test block is embedded in detection port, and the detection end of third electrode is in abutment with bottom plate.The testing device in the utility model is simple in structure, convenient to operate.Product can detect current and potential under the same state, on the one hand, ensure the accuracy of detection value, improve the reliability of detection result, on the other hand, simplify test process, improve test efficiency.

Description

Technical Field

[0001] This utility model relates to the field of electrical performance testing technology of materials, and in particular to a testing device for the resistivity of semiconductive sheathing material. Background Technology

[0002] Semiconductive sheath material is a special polymer material widely used in power cables, high-voltage cables, and other fields. Its resistivity is an important parameter for measuring its conductivity, directly affecting the electrical performance and safety of the cable. Therefore, accurate measurement of the resistivity of semiconductive sheath material is of great significance for cable design, production, and quality control.

[0003] Existing testing devices for semiconductive sheathing materials are complex in structure and operation, resulting in low measurement efficiency. Furthermore, during testing, the potential and current of the semiconductive sheathing material need to be measured separately. It is difficult to ensure that the measurement states for potential and current are consistent during the measurement process, affecting the numerical values ​​of the measurement results and leading to inaccurate results. Utility Model Content

[0004] Therefore, the technical problem to be solved by this utility model is to overcome the shortcomings of the existing technology in that the testing steps for semiconductive sheath materials are complicated and the test results are inaccurate.

[0005] To solve the above-mentioned technical problems, this utility model provides a device for testing the resistivity of semiconductive sheathing materials, comprising:

[0006] The current testing unit includes a base plate and a pressure plate. A pair of first electrodes are embedded on the surface of the base plate, and a pair of second electrodes are embedded on the surface of the pressure plate. A detection port is opened through the surface of the pressure plate. The pressure plate is fastened to the top of the base plate, and the side of the base plate with the first electrodes faces the side of the pressure plate with the second electrodes. The first electrodes and the second electrodes are electrically connected.

[0007] The potential testing unit includes a test block, with third electrodes disposed on both sides of the test block. The test block is embedded in the detection port, and the detection end of the third electrode abuts against the base plate.

[0008] In one embodiment of this utility model, the first electrode protrudes from the surface of the base plate, and the second electrode protrudes from the surface of the pressure plate.

[0009] In one embodiment of the present invention, a first terminal is provided on one side of the base plate, the first terminal is connected to the first electrode, and a second terminal is provided on one side of the pressure plate, the second terminal is electrically connected to the second electrode.

[0010] In one embodiment of this invention, the position of the first electrode corresponds to the position of the second electrode.

[0011] In one embodiment of this utility model, a pair of limiting plates are provided on the surface of the base plate near the pressure plate.

[0012] In one embodiment of this utility model, a limiting post is provided on the surface of the base plate, and a limiting hole that cooperates with the limiting post is provided on the surface of the pressure plate.

[0013] In one embodiment of the present invention, a first counterweight is provided on the surface of the pressure plate, and the first counterweight is detachably connected to the pressure plate.

[0014] In one embodiment of the present invention, a second counterweight is provided on the surface of the test block, and the second counterweight is detachably connected to the test block.

[0015] In one embodiment of this utility model, a third terminal is provided on the surface of the test block, and the third terminal is electrically connected to the third electrode.

[0016] In one embodiment of this utility model, the width of the test block is the same as the width of the detection port, and the length of the detection port is greater than the length of the test block.

[0017] The above-mentioned technical solution of this utility model has the following advantages compared with the prior art:

[0018] This invention discloses a testing device for the resistivity of semiconductive sheathing materials. The testing device of this invention has a simple structure, is easy to operate, and does not require complex equipment or specialized technicians. The product can detect current and potential under the same conditions, ensuring the accuracy of the measured values ​​and improving the reliability of the test results. Furthermore, it simplifies the testing process and increases testing efficiency. Attached Figure Description

[0019] To make the content of this utility model easier to understand, the present utility model will be further described in detail below with reference to specific embodiments and accompanying drawings.

[0020] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0021] Figure 2 for Figure 1 Schematic diagram of the medium current testing section;

[0022] Figure 3 for Figure 2 Top view of the middle base plate structure;

[0023] Figure 4 for Figure 2 Top view of the intermediate pressure plate structure;

[0024] Figure 5 for Figure 1 Schematic diagram of the intermediate potential testing section;

[0025] Explanation of reference numerals in the accompanying drawings: 1. Current testing section; 2. Potential testing section; 11. Base plate; 12. Pressure plate; 13. First electrode; 14. Second electrode; 15. First terminal; 16. Second terminal; 17. Limiting plate; 18. First counterweight; 21. Test block; 22. Third electrode; 23. Third terminal; 24. Second counterweight; 111. Limiting post; 121. Limiting hole; 122. Detection port. Detailed Implementation

[0026] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, so that those skilled in the art can better understand and implement the present invention. However, the embodiments are not intended to limit the present invention.

[0027] Reference Figures 1-5 As shown, this utility model discloses a device for testing the resistivity of a semiconductive sheath material to solve the above-mentioned technical problems, comprising:

[0028] The current testing unit 1 includes a base plate 11 and a pressure plate 12. A pair of first electrodes 13 are embedded on the surface of the base plate 11, and a pair of second electrodes 14 are embedded on the surface of the pressure plate 12. A detection port 122 is opened through the surface of the pressure plate 12. The pressure plate 12 is fastened to the top of the base plate 11, and the side of the base plate 11 with the first electrodes 13 faces the side of the pressure plate 12 with the second electrodes 14. The first electrodes 13 and the second electrodes 14 are electrically connected.

[0029] Potential testing unit 2 includes a test block 21, with third electrodes 22 disposed on both sides of the test block 21. The test block 21 is embedded in the detection port 122, and the detection end of the third electrode 22 abuts against the base plate 11.

[0030] The testing device of this invention comprises a base plate 11 and a pressure plate 12. To avoid affecting the test results, both the base plate 11 and the pressure plate 12 are insulating plates. The pressure plate 12 is fastened to the top of the base plate 11, and the product to be tested (semi-conductive sheath material) is placed between the pressure plate 12 and the base plate 11. A first electrode 13 is embedded on the surface of the pressure plate 12, and a second electrode 14 is embedded on the surface of the top plate. The first electrode 13 and the second electrode 14 are attached to both sides of the product to be tested, and the first electrode 13 and the second electrode 14 on the same side are connected in series. In the actual testing process, a current testing device is connected to the series-connected first electrode 13 and the second electrode 14, and the current value passing through the product is measured.

[0031] In the potential testing section 2, the test block 21 is embedded in the detection port 122, and the test block 21 can reciprocate along the length of the detection port 122. Similarly, the body of the test block 21 is made of insulating material, and a pair of third electrodes 22 are provided on both sides of the test block 21. The distance between the two third electrodes 22 is fixed. The two third electrodes 22 are connected to the potential detection device, and the potential testing device is connected to the two third electrodes 22. The two third electrodes 22 are in contact with the product under test, and the potential value between the two electrodes is measured. By reciprocating the test block 21, the voltage distribution along the entire length of the product is measured.

[0032] The testing device of this invention has a simple structure and is easy to operate, requiring no complex equipment or professional technicians. The product can detect current and potential under the same conditions, ensuring the accuracy of the detected values ​​and improving the reliability of the results, while also simplifying the testing process and increasing testing efficiency.

[0033] Furthermore, the first electrode 13 protrudes from the surface of the base plate 11, and the second electrode 14 protrudes from the surface of the pressure plate 12.

[0034] Specifically, in the actual testing process, it is necessary to ensure that both sides of the product are in contact with the first electrode 13 and the second electrode 14 respectively. Therefore, the first electrode 13 is set to protrude from the surface of the base plate 11, and the second electrode 14 is set to protrude from the surface of the pressure plate 12, so that the first electrode 13 and the second electrode 14 can effectively contact the product surface.

[0035] Furthermore, a first terminal 15 is provided on one side of the base plate 11, and the first terminal 15 is connected to the first electrode 13. A second terminal 16 is provided on one side of the pressure plate 12, and the second terminal 16 is electrically connected to the second electrode 14.

[0036] Specifically, the first terminal 15 and the second terminal 16 can facilitate the connection of the wire harness. In the actual testing process, the first terminal 15 and the second terminal 16 on the same side are connected by the wire harness, and then the wire harnesses connected on both sides are connected to the positive and negative poles of the current detection device respectively. After the test is completed, the current is reversed, a positive reading and a negative reading are read, and the arithmetic mean is taken.

[0037] Furthermore, the position of the first electrode 13 corresponds to the position of the second electrode 14.

[0038] Specifically, the distance between the two first electrodes 13 and the distance between the two second electrodes 14 are equal, so that the current passes through the product with consistent length, ensuring the reliability of the test results.

[0039] Furthermore, a pair of limiting plates 17 are provided on the surface of the base plate 11 near the pressure plate 12.

[0040] Specifically, before testing, the sheath material needs to be pressed into sheath material sheets using a flat vulcanizing machine, and then the product is cut using a punch according to the distance between the two limiting plates 17. During testing, the product is placed between the two limiting plates 17 to prevent product displacement during the testing process, which would affect the test results.

[0041] Furthermore, the surface of the base plate 11 is provided with a limiting post 111, and the surface of the pressure plate 12 is provided with a limiting hole 121 that cooperates with the limiting post 111.

[0042] Specifically, after the product is placed between the limiting plates 17, the pressure plate 12 is fastened to the top of the base plate 11, and the limiting post 111 is inserted into the limiting hole 121. The limiting post 111 can fix the position of the pressure plate 12 to prevent the pressure plate 12 from moving during the detection process, and at the same time, it can also ensure that the positions of the first electrode 13 and the second electrode 14 correspond.

[0043] Furthermore, a first counterweight 18 is provided on the surface of the pressure plate 12, and the first counterweight 18 is detachably connected to the pressure plate 12.

[0044] Specifically, during the testing process, the product to be tested is first placed on the base plate 11, and then the pressure plate 12 is pressed on top of the product. The first counterweight 18 can increase the mass of the pressure plate 12, ensuring that the pressure plate 12 can flatten the product, so that both sides of the product contact the first electrode 13 and the second electrode 14. As a preferred embodiment of this utility model, the first counterweight 18 is threadedly connected to the pressure plate 12, and different weights of counterweights are replaced according to different test products.

[0045] Furthermore, a second counterweight 24 is provided on the surface of the test block 21, and the second counterweight 24 is detachably connected to the test block 21.

[0046] Similarly, the second counterweight 24 is connected to the test block 21 by a thread to increase the weight of the test block 21 and press the product in the area of ​​the detection port 122 onto the base plate 11.

[0047] Furthermore, a third terminal 23 is provided on the surface of the test block 21, and the third terminal 23 is electrically connected to the third electrode 22.

[0048] Similarly, the third terminal 23 can facilitate the connection of the wiring harness. The third terminal 23 can be connected to the potential testing equipment through the wiring harness, thereby realizing the connection between the third electrode 22 and the potential testing equipment.

[0049] Furthermore, the width of the test block 21 is the same as the width of the detection port 122, and the length of the detection port 122 is greater than the length of the test block 21. This ensures that the test block 21 can only move along the length of the detection port 122 at a time, guaranteeing that the third electrode 22 used for potential detection is perpendicular to the direction of current flow, thus ensuring the accuracy of the potential test results.

[0050] In summary, this utility model introduces a device for testing the resistivity of semiconductive sheathing materials, and the specific testing method is as follows:

[0051] S1. Press the sheath material into sheath material sheets using a flat vulcanizing machine;

[0052] S2. Cut the tablets into samples of a fixed size using a custom dumbbell-shaped die;

[0053] S3. Measure the thickness at six equidistant points along the length of the sample, calculate the average value, and the difference between the measured value at each point and the average value should not exceed 5%;

[0054] S4. Place the sample on the base plate 11, ensuring that the sample is in full contact with the first electrode 13 on the base plate 11;

[0055] S5. Connect the pressure plate 12 to the base plate 11 through the limiting pin and the limiting hole 121, so that the positions of the first electrode 13 and the second electrode 14 coincide.

[0056] S6. Pass the test block 21 through the detection port 122 and press one end of the third electrode 22 onto the sample surface, ensuring that the direction of the third electrode 22 is perpendicular to the current flow direction.

[0057] S7. Place the entire device on an insulating plate, attach current electrodes to both ends of the sample, and heat it in a constant temperature chamber at (70±1)℃ for 2 hours.

[0058] S8. After heating, remove the product and let it stand for 16 hours under an environment with a temperature of (23±2)℃ and a relative humidity of (50±5)%.

[0059] S9. Turn on the current and read the positive current reading after charging for 1 minute to eliminate the measurement error caused by the contact potential. Reverse the current and read a positive reading and a negative reading, and take the arithmetic mean.

[0060] S10. Repeat the above measurement twice for the same sample. Move the third electrode 22 once for each measurement to determine the voltage distribution over the entire sample length and take the arithmetic mean.

[0061] S11. Calculate the volume resistivity of the sample according to the calculation formula:

[0062] Volume resistivity of the sample, in ohm-cm (Ω·cm);

[0063] U - Average voltage reading, in volts (V);

[0064] W - Sample width, in centimeters (cm);

[0065] T - Average thickness of the sample, in centimeters (cm);

[0066] I - Average current reading, in amperes (A);

[0067] L - The distance between the two potential electrodes in contact with the sample, in centimeters (cm);

[0068] The testing device of this invention has a simple structure and is easy to operate, requiring no complex equipment or professional technicians. The product can detect current and potential under the same conditions, ensuring the accuracy of the detected values ​​and improving the reliability of the results, while also simplifying the testing process and increasing testing efficiency.

[0069] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all possible implementations here. However, obvious variations or modifications derived therefrom are still within the protection scope of this invention.

Claims

1. A testing device for the resistivity of a semiconductive sheath material, characterized in that, include: The current testing unit includes a base plate and a pressure plate. A pair of first electrodes are embedded on the surface of the base plate, and a pair of second electrodes are embedded on the surface of the pressure plate. A detection port is opened through the surface of the pressure plate. The pressure plate is fastened to the top of the base plate, and the side of the base plate with the first electrodes faces the side of the pressure plate with the second electrodes. The first electrodes and the second electrodes are electrically connected. The potential testing unit includes a test block, with third electrodes disposed on both sides of the test block. The test block is embedded in the detection port, and the detection end of the third electrode abuts against the base plate.

2. The apparatus for testing the resistivity of a semiconductive jacketing compound of claim 1 wherein: The first electrode protrudes from the surface of the base plate, and the second electrode protrudes from the surface of the pressure plate.

3. The apparatus for testing the resistivity of a semiconductive jacketing material of claim 1, wherein: A first terminal is provided on one side of the base plate, and the first terminal is connected to the first electrode. A second terminal is provided on one side of the pressure plate, and the second terminal is electrically connected to the second electrode.

4. The apparatus for testing the resistivity of a semiconductive jacketing material of claim 1 wherein: The position of the first electrode corresponds to the position of the second electrode.

5. The apparatus for testing the resistivity of a semiconductive jacketing material of claim 1 wherein: A pair of limiting plates are provided on the surface of the base plate near the pressure plate.

6. The apparatus of claim 1, wherein: The base plate surface is provided with limit posts, and the pressure plate surface is provided with limit holes that cooperate with the limit posts.

7. The apparatus of claim 1, wherein: The surface of the pressure plate is provided with a first counterweight, and the first counterweight is detachably connected to the pressure plate.

8. The apparatus of claim 1, wherein: The surface of the test block is provided with a second counterweight, and the second counterweight is detachably connected to the test block.

9. The apparatus of claim 1, wherein: The surface of the test block is provided with a third terminal, which is electrically connected to the third electrode.

10. The apparatus for testing the resistivity of semiconductive sheathing material according to claim 1, characterized in that: The width of the test block is the same as the width of the detection port, and the length of the detection port is greater than the length of the test block.

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