Wiring device

Abstract

This invention provides a wiring device. A first terminal of the wiring device is configured to connect to at least one test device performing multiple tests, and a second terminal of the wiring device is configured to connect to multiple terminals of a distributed control system under test. This establishes a test channel between the at least one test device and the multiple terminals, allowing multiple tests to be performed. The terminals are connected to devices communicating with the distributed control system. The wiring device activates at least one test channel, enabling the at least one test device to connect to the distributed control system through the activated test channel. The wiring device transmits test signals between the distributed control system and the connected test devices. This wiring device enables automated connection between terminals and test devices during the testing of a distributed control system.

Description

Technical Field

[0001] This utility model relates to the field of industrial process automation control technology, and in particular to a wiring device. Background Technology

[0002] A distributed control system (DCS), also known as a distributed control system, is a new type of control system developed to meet the requirements of large-scale industrial production and increasingly complex process control. From the perspective of comprehensive automation, it integrates process control and process monitoring, combining 4C technologies, such as computer, communication, display (CRT), and control.

[0003] Distributed control systems require rigorous testing before leaving the factory. However, current testing methods for distributed control systems require the integration of multiple testing devices, necessitating separate wiring between the testing devices and the distributed control system during testing, making the process relatively cumbersome. Utility Model Content

[0004] To address the aforementioned technical problems, this utility model provides a wiring device to at least solve or alleviate these problems.

[0005] According to a first aspect of the present invention, a wiring device is provided. A first terminal of the wiring device is configured to connect to at least one test device performing multiple tests, and a second terminal of the wiring device is configured to connect to multiple terminals of a distributed control system under test, thereby establishing a test channel between the at least one test device and the multiple terminals allowing the execution of the multiple tests. The terminals are connected to devices communicating with the distributed control system. The wiring device enables at least one of the test channels, allowing the at least one test device to connect to the distributed control system through the enabled test channel. The wiring device transmits test signals between the distributed control system and the connected test device, causing the distributed control system or the test device to generate test data corresponding to the test signals, the test data being used to determine the test result of the distributed control system.

[0006] Optionally, the wiring device includes multiple control boards stacked to form a control board array, wherein different control boards control the connection and disconnection of the first terminal to different terminals; each control board integrates a board connection area, and the board connection areas of adjacent control boards are connected by plug-in elements; the first terminal and the second terminal are located on the top-level control board in the control board array; the top-level control board in the control board array receives test signals sent by at least one test device through the first terminal and transmits the test signals to a target board, so that the target board transmits the test signals to the distributed control system through the second terminal; the target board receives test data sent by the distributed control system; the target board is one of the control boards in the control board array, and the target board is determined by the host computer according to the type of test device sending the test signals; the host computer communicates wirelessly with the wiring device, the at least one test device, and the distributed control system.

[0007] Optionally, the projection of the board connection area in the control board onto the plane perpendicular to the control board coincides with the area of ​​the board connection area in the adjacent control board.

[0008] Optionally, the board connection area includes: a distributed control system connection sub-area and a test equipment connection sub-area, the distributed control system connection sub-area and the test equipment connection sub-area being connected via a relay group; the second terminal includes a distributed control system connector, and the first terminal includes a test equipment connector; the distributed control system connector is used to connect to multiple terminals of the distributed control system under test; the test equipment connector is used to connect to the at least one test equipment.

[0009] Optionally, the board connection area further includes: a power connection sub-area; a power connector is integrated on the top-level control board in the control board array; the power connector is used to connect to an external power supply and receive a first voltage from the external power supply.

[0010] Optionally, a voltage converter is integrated on the top-level control board in the control board array; the voltage converter adjusts the voltage value of the second voltage input to the power connector to be the same as the voltage value of the first voltage, wherein the second voltage is greater than the first voltage.

[0011] Optionally, the at least one test device includes a signal input terminal; the board connection area further includes a signal receiving sub-area; the first terminal includes a signal receiver; when the signal receiver is connected to the signal input terminal, it receives a logic level corresponding to the distributed control system from the signal input terminal, and the logic level is used to determine the test result of the distributed control system.

[0012] Optionally, the control board integrates a processor and an antenna, with the antenna connected to the processor; the processor is wirelessly connected to the host computer via the antenna; the host computer sends control commands to the processor via the antenna to control the control board array to transmit test signals between the distributed control system and the connected test equipment.

[0013] Optionally, the at least one test device includes a process calibrator; the board connection area further includes a process calibrator connection sub-area; the first terminal includes a process calibrator connector; the process calibrator connector is used to connect to the process calibrator.

[0014] Optionally, adjacent control boards in the control board array are connected by a connection component.

[0015] As can be seen from the above technical solution, the wiring device of this solution can realize the automated connection between the wiring terminals and the test equipment during the testing of the distributed control system, simplifying the wiring process of the test operation and having higher wiring accuracy. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings.

[0017] Figure 1 This is a schematic diagram of a wiring device according to an embodiment of this application;

[0018] Figure 2 This is a schematic diagram of a control board array according to an embodiment of this application;

[0019] Figure 3 This is a top view of the control board located at the top layer in a control board array according to an embodiment of this application.

[0020] List of reference numerals in the attached diagram:

[0021] 10: Wiring device; 20: Testing equipment; 30: Distributed control system

[0022] 40: Host computer; 111: Control board; 112: Distributed control system connection sub-area 113: Test equipment connection sub-area; 114: Relay group; 115: Distributed control system connector.

[0023] 116: Test equipment connector; 117: Power connection sub-area; 118: Power connector

[0024] 119: Voltage converter; 120: Signal receiving sub-section; 121: Signal receiver

[0025] 122: Processor; 123: Antenna; 124: Process Verifier Connection Sub-area

[0026] 125: Process Validator Connector Detailed Implementation

[0027] To enable those skilled in the art to better understand the technical solutions in the embodiments of this application, the technical solutions in the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art should fall within the protection scope of this utility model.

[0028] Figure 1 This is a schematic diagram of a wiring device according to an embodiment of this application, as shown below. Figure 1 As shown, the first terminal of the wiring device 10 is configured to connect to at least one test device 20 performing multiple tests, and the second terminal of the wiring device 10 is configured to connect to multiple terminals of the distributed control system 30 under test, thereby establishing a test channel between the at least one test device 20 and the multiple terminals, allowing multiple tests to be performed. The terminals are connected to devices communicating with the distributed control system 30. The wiring device 10 enables at least one test channel, allowing the at least one test device 20 to connect to the distributed control system 30 through the enabled test channel. The wiring device 10 transmits test signals between the distributed control system 30 and the connected test device 20, causing the distributed control system 30 or the test device 20 to generate test data corresponding to the test signals. The test data is used to determine the test results of the distributed control system 30.

[0029] A distributed control system 30 is a computer-controlled system that centrally manages and distributes control over a production process. The "controlled" objects are primarily parameters and equipment operating states in various production processes. It has found widespread application in industries such as power, metallurgy, and petrochemicals. For example, in the chemical industry, during crude oil distillation, the distributed control system 30 can precisely control parameters such as temperature, pressure, and liquid level within the distillation column. Specifically, in atmospheric and vacuum distillation units, the cutting temperatures of different side streams need strict control. The distributed control system 30 can adjust the furnace power in real time according to the properties of the crude oil and product requirements, enabling accurate separation of light and heavy fractions. Another example is in the food and beverage industry, where the distributed control system 30 can precisely control the amount of carbon dioxide added and the blending ratio of the beverage in carbonated beverage production. By monitoring the operating speed of the filling machine and data from the liquid level sensor, it automatically adjusts the valve opening to achieve precise filling of the beverage. Simultaneously, it can also effectively control the cooling and packaging processes of the beverage. Therefore, the distributed control system 30 contains multiple devices or modules that perform different functions. To achieve stable communication, each device or module typically has a communication wire connected to its communication interface, resulting in multiple terminal blocks in the distributed control system 30. To automate testing of the distributed control system 30, these terminal blocks can be connected to the second terminal block of the wiring device 10. This connection can be achieved by fabricating precast branch cables for the terminal blocks and installing corresponding ports on the second terminal block of the wiring device 10. Inserting the connectors of the precast cables into the ports on the second terminal block of the wiring device 10 establishes the connection between the multiple terminal blocks of the distributed control system 30 and the wiring device 10. After the first terminal block of the wiring device 10 is connected to at least one test device 20, the wiring device 10 can control the test device 20 to connect to at least some of the terminal blocks of the distributed control system 30 and enable automatic switching. The test device 20 can perform multiple tests, and it needs to be connected to different terminal blocks when performing different tests.For example, the test device 20 is a multimeter. Each time the multimeter is tested, it needs to be connected to two terminals in the distributed control system 30, and these two terminals need to include a positive terminal and a negative terminal. At this time, the wiring device 10 will activate different test channels to realize the continuity between multiple terminals of the distributed control system 30 and the multimeter. In the first test, a test channel corresponding to a positive terminal and a negative terminal is activated, so that a positive terminal and a negative terminal are connected to the multimeter. In the second test, the test channel activated in the first test is deactivated, and another test channel corresponding to a positive terminal and a negative terminal is activated. The positive terminal and the negative terminal connected to the multimeter in the first test are disconnected, and a positive terminal and a negative terminal of a terminal that has not been connected to the multimeter are connected to the multimeter. This process is repeated, and after multiple tests, the test of all terminals of the distributed control system 30 by the multimeter is completed. During the testing process, the wiring device 10 also receives test data from the distributed control system 30 or the test equipment 20. When the distributed control system 30 is a signal input terminal, the wiring device 10 receives test data from the test equipment 20; when the test equipment 20 is a signal input terminal, the wiring device 10 receives test data from the distributed control system 30. The test results of the distributed control system 30 can be determined based on the test data. For example, when testing the input channel of the distributed control system 30, the wiring device 10 sends a first instruction to the test equipment 20 through the process calibrator connector according to the test procedure. The first instruction instructs the test equipment 20 to output the corresponding signal value. Simultaneously, the wiring device 10 also sends the first instruction to the host computer 40. The host computer 40 reads the reading of the corresponding input channel of the distributed control system 30 to determine the measured value of the distributed control system 30. Then, the host computer 40 determines the test result by comparing the signal value output by the test equipment 20 with the measured value of the distributed control system 30. For example, when testing the output channel of the distributed control system 30, the host computer 40 sends a second instruction to the distributed control system 30. The second instruction is used to instruct the distributed control system 30 to output the corresponding signal value. The wiring device 10 reads the measured value on the test device 20 through the process calibrator connector and sends it to the host computer 40. Then, the host computer 40 determines the test result by comparing the measured value of the test device 20 with the signal value output by the distributed control system 30.

[0030] In this embodiment, the wiring device 10 can automatically connect the wiring terminals to the test equipment 20 during the testing of the distributed control system 30, simplifying the wiring process of the test operation and having higher wiring accuracy.

[0031] Figure 2 This is a schematic diagram of a control board array according to one embodiment of this application. Figure 3This is a top view of the control board located at the top layer in a control board array according to an embodiment of this application, as shown below. Figure 2-3 As shown, the wiring device includes more than 10 control boards 111, which are stacked to form an array. Different control boards 111 control the connection between a first terminal and different terminal blocks. Each control board 111 integrates a board connection area, and adjacent control boards 111 have these connection areas connected via plug-in components. The first terminal and the second terminal are located on the top-level control board 111 in the array. The top-level control board 111 in the control board array 111 receives test signals sent by at least one test device 20 through a first terminal and transmits the test signals to a target board, so that the target board transmits the test signals to the distributed control system 30 through a second terminal. The target board receives test data sent by the distributed control system 30. The target board is one of the control boards 111 in the control board array 111. The target board is determined by the host computer 40 according to the type of the test device 20 that sends the test signals. The host computer 40 communicates wirelessly with the wiring device 10, at least one test device 20 and the distributed control system 30.

[0032] For example, the control board array 111 includes three control boards 111. The host computer 40 determines the target board as the control board 111 located at the bottom layer of the control board array 111 according to the type of the test device 20 that sends the test signal. When the distributed control system 30 is the test signal sender, the control board 111 located at the top layer of the control board array 111 transmits the test signal sent by the distributed control system 30 to the control board 111 located at the middle layer of the control board array 111 through the plug-in element. Then, the control board 111 located at the middle layer of the control board array 111 transmits the test signal to the control board 111 located at the bottom layer of the control board array 111 through the plug-in element. The control board 111 located at the bottom layer of the control board array 111 transmits the test signal to at least one test device 20, so that at least one test device 20 generates test data according to the test signal. Then, at least one test device 20 sends the test data to the control board 111 located at the bottom layer of the control board array 111. Then, the host computer 40 determines the test result of the distributed control system 30 according to the test data.

[0033] Figure 2 The control board array shown includes three control boards 111. Each control board has an integrated board connection area, and adjacent control boards 111 can be connected by plug-in components (not shown in the figure).

[0034] Specifically, the projection of the board connection area in the control board 111 onto the plane perpendicular to the control board 111 coincides with the area of ​​the board connection area in the adjacent control board 111.

[0035] To facilitate the connection of the board connection area via plug-in components, multiple control boards 111 can be arranged in parallel in a direction perpendicular to the plane where the control board 111 is located, and the area where the board connection area of ​​the control board 111 is located can be ensured to coincide in a direction perpendicular to the plane where the control board 111 is located. With this arrangement, the distance between the wiring holes in the board connection area is the shortest, which can reduce the difficulty of plugging in the plug-in components.

[0036] Specifically, the board connection area includes: a distributed control system connection sub-area 112 and a test equipment connection sub-area 113, which are connected by a relay group 114.

[0037] The second terminal includes a distributed control system connector 115, and the first terminal includes a test equipment connector 116. The distributed control system connector 115 is used to connect to multiple terminals of the distributed control system 30 under test. The test equipment connector 116 is used to connect to at least one test device 20.

[0038] Each control board 111 integrates a distributed control system connection sub-area 112. After the top-level control board 111 is connected to multiple terminals of the distributed control system 30 under test via the distributed control system connector 115, other control boards 111 connect to each other in the distributed control system connection sub-area 112 via plug-in components, thereby achieving connection between all control boards 111 in the control board array and multiple terminals of the distributed control system 30. Similarly, each control board 111 integrates a test equipment connection sub-area 113. After the top-level control board 111 is connected to at least one test equipment 20 via the test equipment connector 116, other control boards 111 connect to each other in the test equipment connection sub-area 113 via plug-in components, thereby achieving connection between all control boards 111 in the control board array and at least one test equipment 20.

[0039] Understandably, each relay is equivalent to a switch, used to control the connection between a wire of the test equipment 20 and a terminal of the distributed control system 30 under test.

[0040] Specifically, the board connection area also includes a power connection sub-area 117. A power connector 118 is integrated on the top-level control board 111 in the control board array. The power connector 118 is used to connect to an external power supply and receive a first voltage from the external power supply.

[0041] After the external power supply is connected to the power connector 118 integrated on the top-level control board 111 in the control board array, it outputs a first voltage to the power connector 118. The first voltage is 5V. The power connection sub-areas 117 of other control boards 111 in the control board array are connected to the power connection sub-areas 117 of adjacent control boards 111 through plug-in elements, so that they can all receive the first voltage, which is the operating voltage of the control board 111.

[0042] Specifically, a voltage converter 119 is integrated on the top-level control board 111 in the control board array. The voltage converter is used to adjust the voltage value of the second voltage of the input power connector 118 to be the same as the voltage value of the first voltage, wherein the second voltage is greater than the first voltage.

[0043] The top-level control board 111 in the control board array can also receive a second voltage input that is higher than the first operating voltage. When an external power supply inputs a second voltage higher than the first voltage to the power connector 118, the voltage converter 119 will perform voltage control on the second voltage until it is suppressed to the same voltage value as the first voltage.

[0044] In this embodiment of the application, by providing a voltage converter 119, the voltage range of the voltage input from the external power supply to the power connector 118 can be widened.

[0045] Specifically, at least one capacitor can be integrated on the control board 111. The capacitor is used to filter the voltage of the input power connection sub-area 117, thereby protecting the control board 111.

[0046] Specifically, at least one test device 20 includes a signal input terminal. The board connection area also includes a signal receiving sub-area 120. The first terminal includes a signal receiver 121. When the signal receiver 121 is connected to the signal input terminal, it receives logic levels from the signal input terminal corresponding to the distributed control system 30. These logic levels are used to determine the test results of the distributed control system 30.

[0047] Test device 20 can be a signal input terminal, which can send logic levels corresponding to the distributed control system 30, such as 0-24V electrical signals. Therefore, a signal receiving sub-area 120 is integrated on the control board 111. After the top-level control board 111 is connected to the signal input terminal through the signal receiver 121, other control boards 111 connect to the signal receiving sub-areas 120 through plug-in components, thereby realizing the connection between all control boards 111 in the control board array and the signal input terminal. By inputting 0-24V electrical signals, different tests can be performed on the distributed control system 30.

[0048] Specifically, the distributed control system test system 100 also includes: a processor 122 and an antenna 123 integrated on the control board 111, the antenna 123 being connected to the processor 124, the processor 124 being wirelessly connected to the host computer 40 through the antenna 123, and the host computer 40 sending control commands to the processor 124 through the antenna 123 to control the array of the control board 111 to transmit test signals between the distributed control system 30 and the connected test equipment 20.

[0049] The host computer 40 analyzes the design drawings of the distributed control system 30 and records the correspondence between each terminal of the distributed control system 30 and the devices included in the distributed control system 30 in a configuration file (dictionary). The host computer also obtains and analyzes the parameter information of each test device 20 to determine the wiring method between each test device 20 and multiple terminals of the distributed control system 30, and records it in the configuration file as well. For example, the distributed control system 30 includes 30 terminals. In the control board array 111, the top-level control board 111 is connected to terminals 1-10, the middle-level control board 111 is connected to terminals 11-20, and the bottom-level control board 111 is connected to terminals 21-30. Device A in the distributed control system 30 is connected to terminals 1-4, thus forming D-A14. In the test channel, device B is connected to terminals 15-17, and device C is connected to terminals 24-25. When test device 20 needs to test device C, host computer 40 analyzes test device 20 to determine that the terminals to be connected to test device 20 are 24-25. It then determines that the target board is the control board 111 located at the bottom layer of the control board 111 array. At this time, host computer 40 sends a control command to processor 124 through antenna 123. Processor 124 determines the target control board 111 to be connected according to the control command and closes the relays in the relay group 114 integrated on the target control board 111 that are connected to terminals 24-25. This establishes and enables the C-24-25 test channel between test device 20 and terminals 24-25, realizing the connection between test device 20 and device C in the distributed control system 30. During testing, the host computer 40, the control board array, and the test equipment 20 are all on the same local area network. Therefore, the host computer 40 can obtain test data from the distributed control system 30 or the test equipment 20. The host computer 40 can analyze the test data to determine the test results of the distributed control system 30.

[0050] Specifically, at least one test device 20 includes a process calibrator. The board connection area also includes a process calibrator connection sub-area 124. A first terminal includes a process calibrator connector 125. The process calibrator connector 125 is used for connection to the process calibrator.

[0051] The process calibrator is a handheld portable instrument used to measure and output electrical and physical parameters. After the process calibrator is connected to the top-level control board 111 in the control board array through the process calibrator connector 125, the other control boards 111 are connected to the process calibrator connection sub-area 124 through plug-in elements, thereby realizing the connection between all control boards 111 in the control board array and the process calibrator.

[0052] Specifically, adjacent control boards 111 in the control board array are connected by a connection component.

[0053] By using connection components, the connection strength of the control board array can be improved.

[0054] It should be noted that not all steps and modules in the above processes and system structure diagrams are mandatory; some steps or modules can be omitted as needed. The execution order of each step is not fixed and can be adjusted as required. The system structure described in the above embodiments can be a physical structure or a logical structure. That is, some modules may be implemented by the same physical entity, or some modules may be implemented by multiple physical entities, or they may be jointly implemented by certain components in multiple independent devices.

[0055] In this patent application, nouns and pronouns relating to people are not limited to specific genders.

[0056] In the above embodiments, the hardware modules can be implemented mechanically or electrically. For example, a hardware module may include permanent dedicated circuitry or logic (such as a dedicated processor, FPGA, or ASIC) to perform the corresponding operations. The hardware module may also include programmable logic or circuitry (such as a general-purpose processor or other programmable processor), which can be temporarily configured by software to perform the corresponding operations. The specific implementation method (mechanical, dedicated permanent circuitry, or temporarily configured circuitry) can be determined based on cost and time considerations.

[0057] The present application has been shown and described in detail above with reference to the accompanying drawings and preferred embodiments. However, the present application is not limited to these disclosed embodiments. Based on the above multiple embodiments, those skilled in the art will know that more embodiments of the present application can be obtained by combining the code review methods in the different embodiments above. These embodiments are also within the protection scope of the present application.

Claims

1. A wiring device (10), characterized in that, The first terminal of the wiring device (10) is configured to connect to at least one test device (20) that performs multiple tests, and the second terminal of the wiring device (10) is configured to connect to multiple terminals of the distributed control system (30) to be tested, thereby establishing a test channel between the at least one test device (20) and the multiple terminals that allows the performance of the multiple tests, wherein the terminals are connected to devices that communicate with the distributed control system (30); The wiring device (10) enables at least one of the test channels so that the at least one test device (20) can be connected to the distributed control system (30) through the enabled test channel; The wiring device (10) transmits test signals between the distributed control system (30) and the connected test equipment (20) so that the distributed control system (30) or the test equipment (20) generates test data corresponding to the test signals, and the test data is used to determine the test results of the distributed control system (30).

2. The wiring device (10) of claim 1, wherein, include: Multiple control boards (111) are stacked to form a control board (111) array, wherein different control boards (111) control the on / off connection of the first terminal to different terminals; The control board (111) integrates a board connection area. The board connection areas of adjacent control boards (111) are connected by plug-in elements. The first terminal and the second terminal are disposed on the top control board (111) in the control board (111) array. The top-level control board (111) in the control board (111) array receives test signals sent by at least one test device (20) through the first terminal and transmits the test signals to the target board, so that the target board transmits the test signals to the distributed control system (30) through the second terminal. The target board receives test data sent by the distributed control system (30). The target board is a control board (111) in the control board (111) array. The target board is determined by the host computer (40) according to the type of the test device (20) that sends the test signals. The host computer (40) communicates wirelessly with the wiring device (10), the at least one test device (20), and the distributed control system (30).

3. The wiring device (10) of claim 2, wherein, The projection of the board connection area in the control board (111) onto the plane perpendicular to the control board (111) coincides with the area of ​​the board connection area in the adjacent control board (111).

4. The wiring device (10) of claim 3, wherein, The board connection area includes a distributed control system connection sub-area (112) and a test equipment connection sub-area (113), which are connected by a relay group (114). The second terminal includes a distributed control system connector (115), and the first terminal includes a test equipment connector (116); The distributed control system connector (115) is used to connect to multiple terminals of the distributed control system (200) under test; The test equipment connector (116) is used to connect to the at least one test equipment (20).

5. The wiring device (10) according to claim 4, characterized in that, The board connection area also includes: a power connection sub-area (117); A power connector (118) is integrated on the top-level control board (111) in the control board (111) array; The power connector (118) is used to connect to an external power source and receive a first voltage from the external power source.

6. The wiring device (10) according to claim 5, characterized in that, A voltage converter (119) is integrated on the top-level control board (111) in the control board (111) array; The voltage converter (119) adjusts the voltage value of the second voltage input to the power connector (118) to be the same as the voltage value of the first voltage, wherein the second voltage is greater than the first voltage.

7. The wiring device (10) of claim 4, wherein, The at least one test device (20) includes a signal input terminal; The board connection area also includes: a signal receiving sub-area (120); The first terminal includes a signal receiver (121); When the signal receiver (121) is connected to the signal input terminal, it receives the logic level corresponding to the distributed control system (200) from the signal input terminal. The logic level is used to determine the test result of the distributed control system (30).

8. The wiring device (10) of claim 2, wherein, The control board (111) integrates a processor (122) and an antenna (123), and the antenna (123) is connected to the processor (124); The processor (124) is wirelessly connected to the host computer (40) via the antenna (123); The host computer (40) sends control commands to the processor (124) through the antenna (123) to control the array of control boards (111) to transmit test signals between the distributed control system (30) and the connected test equipment (20).

9. The wiring device (10) of claim 4, wherein, The at least one test device (20) includes a process calibrator; The board connection area also includes: a process calibrator connection sub-area (124); The first terminal includes a process calibrator connector (125); The process calibrator connector (125) is used to connect to the process calibrator.

10. The wiring device (10) according to any one of claims 2-9, characterized in that, Adjacent control boards (111) in the array of control boards (111) are connected by a connection component.

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