A patch inductance testing device
By employing an anti-interference test box and filtering components in the surface mount inductor testing equipment to filter out external interference signals, and utilizing the collaborative work of multiple mechanisms, the problems of insufficient accuracy and low efficiency of existing surface mount inductor testing equipment are solved, achieving high-precision and high-efficiency testing results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN QIANGRUI ELECTRONICS
- Filing Date
- 2025-05-13
- Publication Date
- 2026-07-07
AI Technical Summary
Existing surface mount inductor testing equipment suffers from insufficient accuracy, low efficiency, and poor anti-interference capabilities, which affect the reliability and consistency of test results.
An anti-interference test box and a filter assembly are electrically connected. The filter circuit filters out external interference signals, and the drive assembly moves the test block and the contact inductor pins for testing. At the same time, multiple mechanisms work together to improve automation efficiency.
It improves testing accuracy and anti-interference capabilities, enhances testing precision and efficiency, and reduces labor costs.
Smart Images
Figure CN224471764U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of surface mount inductor testing equipment, and in particular to a surface mount inductor testing equipment. Background Technology
[0002] With the miniaturization and high performance of electronic devices, surface mount inductors, as key electronic components, directly affect the stability and efficiency of circuit operation. In recent years, the application scope of surface mount inductors has been expanding, with wide applications ranging from consumer electronics to industrial control.
[0003] However, due to the relatively lagging testing technology for surface mount inductors, it is difficult to meet the requirements for high-precision testing. The existing design has problems such as insufficient accuracy, low efficiency and poor anti-interference ability in the testing methods, which seriously affect the reliability and consistency of the test results. Utility Model Content
[0004] To improve the testing accuracy and anti-interference capability of surface mount inductor testing equipment, this application provides a high-precision anti-interference surface mount inductor testing equipment.
[0005] This application provides a surface mount inductor testing device, which adopts the following technical solution:
[0006] A test platform is provided, with a test mechanism mounted on top. The test mechanism includes a connecting frame, a test component, a test station, an anti-interference test box, an anti-interference filter component, a drive component, a test block, and contact inductor pins. The test component is mounted above the connecting frame, and the test station is located at the top of the test component. The drive component is located inside the test component, and the anti-interference test box is located below the test component. The anti-interference filter component is installed inside the anti-interference test box and is electrically connected to the test block. Contact inductor pins are soldered to the top of the test block. Driven by the drive component, the test block and the contact inductor pins connected to its top move up and down within the test component and the anti-interference test box, performing anti-interference testing on the surface-mount inductor at the test station.
[0007] By adopting the above technical solution, the anti-interference test box and the internal anti-interference filter component are electrically connected to the test block without any intermediate connecting wires. The anti-interference filter component filters out external interference signals through the filter circuit. The drive component moves the test block and the contact inductor pin connected to its top to perform patch inductance testing at the test station, which improves the test accuracy.
[0008] Optionally, it may also include a loading / unloading mechanism, a transferring mechanism, a testing mechanism, and a moving mechanism arranged sequentially along the length of the test operation table.
[0009] By adopting the above technical solutions, multiple organizations can cooperate to improve automation efficiency, reduce labor costs, and make testing more efficient.
[0010] Optionally, the loading and unloading mechanism includes a loading component, a slide rail, a unloading component, a loading and unloading drive component, and a tray. The loading component is provided at one end of the slide rail, and the unloading component is connected to the other end of the slide rail. The loading and unloading drive component is provided inside the slide rail, and the tray is provided above the slide rail. The tray is driven by the loading and unloading drive component and moves back and forth along the slide rail.
[0011] By adopting the above technical solution, the slide rail design reduces the tediousness of manual loading and unloading, ensures a smooth loading and unloading process, and improves detection efficiency.
[0012] Optionally, the material transfer mechanism includes a robotic arm base, a robotic arm, a material transfer component, a CCD imaging module, and a clamping part. The robotic arm base is provided above the test operation table. The top of the robotic arm base is connected to the robotic arm. The material transfer component is connected to one side of the robotic arm. The CCD imaging module is connected to one side of the material transfer component. The CCD imaging module and the material transfer component are electrically connected.
[0013] By adopting the above technical solutions, the robotic arm reduces labor costs, reduces blind spots, and improves work efficiency in loading and unloading operations, while the CCD camera module can perform image acquisition and position detection.
[0014] Optionally, the moving mechanism includes a moving mechanism base frame, a sliding component, and a moving mechanism clamping component. The moving mechanism base frame is provided above the test operating table. The sliding component is connected to the inner side of the moving mechanism base frame. The moving mechanism clamping component is connected to the side of the sliding component facing the test mechanism. The moving mechanism clamping component moves the patch on the workstation through the sliding component.
[0015] By adopting the above technical solution, the moving mechanism clamping component accurately places the patch at the test station, improving testing efficiency and reducing labor costs.
[0016] Optionally, the number is four, and the spacing between the four test stations is the same.
[0017] By adopting the above technical solution, four testing stations can conduct tests simultaneously, which greatly improves testing efficiency and reduces time costs.
[0018] Optionally, the contact inductor pins are made of copper.
[0019] By adopting the above technical solution, the brass contacts of the inductor are made of copper and surface-treated by gold plating (to maintain the conductivity of brass), thus improving the accuracy of testing.
[0020] Optionally, the number of contact inductor pins is 2.
[0021] By adopting the above technical solution, the setting of two contact inductor pins during surface mount inductor testing can improve testing efficiency.
[0022] Optionally, the number of the moving mechanism clamping components is three.
[0023] By adopting the above technical solution, the three moving mechanism clamping components can be raised and lowered simultaneously, moving multiple patches to the next testing station at the same time. This improves efficiency, reduces damage during the transfer process, and enhances the accuracy and efficiency of the test.
[0024] In summary, this application includes at least one of the following beneficial effects:
[0025] 1. An anti-interference test box and contact inductor pins have been added. The contact inductor pins are made of copper, which improves the test accuracy. The anti-interference test box filters out external interference signals through a filter circuit, especially in saturation current testing, which meets the high-precision test requirements. It also has strong anti-interference ability and is not affected by external electromagnetic interference, thus improving the accuracy of the test.
[0026] 2. The loading / unloading mechanism, the transfer mechanism, and the moving mechanism work together to perform efficient loading / unloading and moving tests, ensuring high work efficiency and improving test accuracy. Attached Figure Description
[0027] Figure 1 This is a schematic diagram of the overall structure of an embodiment of this application;
[0028] Figure 2 This is a schematic diagram of the loading and unloading mechanism according to an embodiment of this application;
[0029] Figure 3 This is a schematic diagram of the material transfer mechanism according to an embodiment of this application;
[0030] Figure 4 This is a schematic diagram of the test mechanism structure according to an embodiment of this application.
[0031] Figure 5 This is a schematic diagram showing the structural details of the testing mechanism according to an embodiment of this application;
[0032] Figure 6 This is a schematic diagram showing the internal structure of the anti-interference test box according to an embodiment of this application;
[0033] Figure 7 This is a schematic diagram showing the internal structure of the test component in an embodiment of this application;
[0034] Figure 8 This is a schematic diagram showing the structural details of the mobile mechanism according to an embodiment of this application.
[0035] Explanation of reference numerals in the attached drawings: 1. Test operating table; 2. Equipment frame; 3. Loading and unloading mechanism; 301. Loading component; 302. Slide rail; 303. Unloading component; 304. Loading and unloading drive component; 305. Tray; 4. Transfer mechanism; 401. Robotic arm base frame; 402. Robotic arm; 403. Transfer component; 404. CCD camera module; 405. Clamping part; 5. Test mechanism; 501. Connecting frame; 502. Test component; 503. Test station; 504. Anti-interference test box; 505. Anti-interference filter component; 506. Drive component; 507. Test block; 508. Contact inductor pin; 6. Moving mechanism; 601. Moving mechanism base frame; 602. Sliding component; 603. Moving mechanism clamping component. Detailed Implementation
[0036] The following is in conjunction with the appendix Figure 1-8 This application will be described in further detail.
[0037] This application discloses a surface mount inductor testing device, which is described in an embodiment of the present application. Figure 1 and Figure 2 A surface mount inductor testing device includes
[0038] The device is activated, and the patch is manually placed on the tray 305 in the loading and unloading mechanism 3 above the test operation table 1. The tray 305 is driven by the loading and unloading drive component 304 and slides on the slide rail 302 between the loading component 301 and the unloading component 303, moving to the vicinity of the robot arm 402 in the transfer mechanism 4 for easy operation of the robot arm 402.
[0039] Reference Figure 3 The robot arm 402 is connected to the top of the robot arm base 401 and rotates to the position of the tray 305. Then the robot arm 402, together with the connected transfer component 403 and clamping part 405, clamps the patch on the tray 305. At the same time, the CCD camera module 404 provided on one side of the transfer component 403 performs image acquisition and detection of the position.
[0040] Reference Figure 3 and 4 The robotic arm 402, together with the connected transfer component 403 and clamping part 405, cooperates to place the gripped patch on the test station 503 in the test mechanism 5, and the test component 502 performs the test.
[0041] Reference Figure 5 , Figure 6 and Figure 7 The anti-interference test box 504 inside the connector 501 is connected to the test block 507 via an internal anti-interference filter component 505 with a short distance and no intermediate connecting wires. The internal anti-interference filter component 505 of the anti-interference test box 504 filters out external interference signals through a filter circuit. The drive component 506 connected to the outside of the test block 507 drives the test block 507 and the contact inductor pin 508 connected to its top to move, thereby performing anti-interference testing on the patch.
[0042] Reference Figure 8 The inner side of the moving mechanism base frame 601 is connected to a sliding component 602. The sliding component drives the moving mechanism clamping component 603, so that the three moving mechanism clamping components 603 clamp the patch on the test station 503 and transfer it to the next station until the fourth test station 503. Then, the robot arm 402 cooperates with the connected transfer component 403 and clamping part 405 to clamp the tested patch onto the tray 305 to wait for discharge.
[0043] The implementation principle of the surface mount inductor testing device according to this application embodiment is as follows: First, the device is started, and the surface mount is manually placed on the tray 305 and placed on the loading component 301 in the loading and unloading mechanism 3 above the test operation table 1 for loading. The tray 305 is driven by the loading and unloading drive component 304 and moves back and forth along the slide rail 302 to move to the vicinity of the robot arm 402 in the transfer mechanism 4 for easy operation by the robot arm 402. The robot arm 402 is connected to the top of the robot arm base 401 and rotates to the position of the tray 305. Then, the robot arm 402, together with the connected transfer component 403 and clamping part 405, clamps the surface mount on the tray 305. At the same time, the CCD camera module 404 on one side of the transfer component 403 performs image acquisition to detect the position. Then, the robot arm 402, together with the connected transfer component 403 and clamping part 405, cooperates to place the clamped surface mount on the test station 503 in the test mechanism 5 for testing. Component 502 is tested, and the anti-interference test box 504 inside the connecting frame 501 is electrically connected to the test block 507 through the internal anti-interference filter component 505 without any intermediate connecting wires. The internal anti-interference filter component 505 of the anti-interference test box 504 filters out external interference signals through the filter circuit. The drive component 506 connected to the outside of the test block 507 drives the test block 507 and the contact inductor pin 508 connected to its top to move and perform anti-interference test on the chip. The sliding component 602 is connected to the inside of the moving mechanism base frame 601. The sliding component drives the moving mechanism clamping component 603, so that the three moving mechanism clamping components 603 clamp the chip on the test station 503 and transfer it to the next station until the fourth station. Then, the robot arm 402 cooperates with the connected transfer component 403 and clamping part 405 to clamp the tested chip onto the tray 305 to wait for discharge. This completes the test process of a chip inductor test equipment.
[0044] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.
Claims
1. A surface mount inductor testing device, characterized in that, include: A test operating table (1) is provided above the test operating table (1). The test mechanism (5) includes a connecting frame (501), a test component (502), a test station (503), an anti-interference test box (504), an anti-interference filter component (505), a drive component (506), a test block (507), and contact inductor pins (508). The test component (502) is provided above the connecting frame (501). The test station (503) is provided at the top of the test component (502). The drive component (506) is provided inside the test component (502). An anti-interference test box (504) is provided below the test block (507). An anti-interference filter component (505) is installed inside the anti-interference test box (504). The anti-interference filter component (505) is electrically connected to the test block (507). A contact inductor pin (508) is soldered to the top of the test block (507). The test block (507) and the contact inductor pin (508) connected to the top of the test block (507) are driven by a drive component (506) to move up and down inside the test component (502) and the anti-interference test box (504) to perform anti-interference testing on the surface mount inductor on the test station (503).
2. The surface mount inductor testing equipment according to claim 1, characterized in that, It also includes a loading and unloading mechanism (3), a transferring mechanism (4), a testing mechanism (5), and a moving mechanism (6) arranged sequentially along the length of the test operation table (1).
3. The surface mount inductor testing equipment according to claim 2, characterized in that, The loading and unloading mechanism (3) includes a loading component (301), a slide rail (302), an unloading component (303), a loading and unloading drive component (304), and a tray (305). The loading component (301) is provided at one end of the slide rail (302), and the unloading component (303) is connected to the other end of the slide rail (302). The loading and unloading drive component (304) is provided inside the slide rail (302), and the tray (305) is provided above the slide rail (302). The tray (305) is driven by the loading and unloading drive component (304) and moves back and forth along the slide rail (302).
4. The surface mount inductor testing device according to claim 2, characterized in that, The material transfer mechanism (4) includes a robot arm base (401), a robot arm (402), a material transfer component (403), a CCD camera module (404), and a clamping part (405). The robot arm base (401) is provided above the test operation table (1). The top of the robot arm base (401) is connected to the robot arm (402). The material transfer component (403) is connected to one side of the robot arm (402). The CCD camera module (404) is connected to one side of the material transfer component (403). The CCD camera module (404) and the material transfer component (403) are electrically connected.
5. The surface mount inductor testing equipment according to claim 2, characterized in that, The moving mechanism (6) includes a moving mechanism base frame (601), a sliding component (602), and a moving mechanism clamping component (603). The moving mechanism base frame (601) is provided above the test operation table (1). The sliding component (602) is connected to the inner side of the moving mechanism base frame (601). The moving mechanism clamping component (603) is connected to the side of the sliding component (602) facing the test mechanism (5). The moving mechanism clamping component (603) moves the patch on the workstation through the sliding component (602).
6. The surface mount inductor testing equipment according to claim 1, characterized in that, The number of test stations (503) is 4, and the spacing between the four test stations (503) is the same.
7. The surface mount inductor testing device according to claim 1, characterized in that, The contact inductor pin (508) is made of copper.
8. The surface mount inductor testing equipment according to claim 1, characterized in that, The number of contact inductor pins (508) is 2.
9. The surface mount inductor testing device according to claim 5, characterized in that, The number of the moving mechanism clamping components (603) is three.