A testing device for phase sequence protection capacitor

Abstract

The utility model discloses a kind of testing device for phase sequence protection capacitor;The testing device for phase sequence protection capacitor includes: test host computer, the test host computer is equipped with plugboard, the plugboard is equipped with slot, the slot inside is equipped with power-on probe, the test host computer is located the upper side of the slot still be equipped with driving element;When testing, phase sequence protection capacitor is placed in the slot, the test host computer controls the driving element work and drives the phase sequence protection capacitor to press down until with the power-on probe electric connection, and by the test host computer executes the test of phase sequence protection capacitor.The utility model is equipped with the plugboard and power-on probe with slot by setting, cooperate the automatic press-down action of driving element, can accurately insert the phase sequence protection capacitor placed in slot to power-on probe, realize power-on connection, test host computer can execute the automatic test to capacitor, without manual repeated operation, shorten the detection time of single capacitor, improve detection efficiency.

Description

Technical Field

[0001] This utility model relates to the field of capacitance testing technology, and in particular to a testing device for phase sequence protection capacitors. Background Technology

[0002] In the operation of power electronic equipment and electrical control systems, the correct phase sequence is one of the core elements ensuring the safe and stable operation of the equipment. An incorrect three-phase power supply phase sequence may lead to motor reversal, equipment damage, or even safety accidents. Therefore, phase sequence protection devices, as critical safety components, are widely used in industrial automation, new energy power generation, rail transportation, and other fields. Among them, the phase sequence protection capacitor, as the core component for detecting phase sequence, directly affects the reliability of phase sequence protection.

[0003] However, existing testing methods for phase sequence protection capacitors have significant drawbacks. Currently, the industry commonly uses manual testing, which involves measuring the parameters of each capacitor individually using a multimeter or specialized testing instrument. This testing method has the following problems:

[0004] Manual operation requires repeated plugging and unplugging of test leads and recording of data, and each test takes a long time, making it difficult to meet the rapid testing needs of large-scale production lines.

[0005] Therefore, developing a phase sequence protection capacitor testing technology that can replace manual labor and achieve automated batch testing has become an urgent technical problem to be solved in this field. Utility Model Content

[0006] The purpose of this invention is to overcome the shortcomings of the prior art and provide a testing device for phase sequence protection capacitors.

[0007] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0008] This utility model embodiment provides a testing device for a phase sequence protection capacitor, comprising: a testing host, the testing host having a plug plate, the plug plate having a slot, the slot having a power-on probe, and the testing host having a driving component located above the slot; during testing, the phase sequence protection capacitor is placed in the slot, the testing host controls the driving component to work and drive the phase sequence protection capacitor to be pressed down until it is electrically connected to the power-on probe, and the testing host performs the test on the phase sequence protection capacitor.

[0009] In one specific embodiment, a telescopic component is also provided between the insert plate and the test host.

[0010] In one specific embodiment, a sensor is also provided inside the telescopic component, and the sensor is electrically connected to the test host.

[0011] In one specific embodiment, the power-on probe is recessed into the slot.

[0012] In one specific embodiment, the insert plate has a plurality of slots evenly distributed thereon, the driving component is a cylinder, the cylinder includes a piston rod, the end of the piston rod is connected to a pressure plate, and the pressure plate is used to press down the phase sequence protection capacitor.

[0013] In one specific embodiment, the number of piston rods is two.

[0014] In one specific embodiment, the test host is provided with a bracket, the bracket is connected to a mounting base, and the mounting base is connected to the drive component.

[0015] In one specific embodiment, the test host is also equipped with a display screen.

[0016] In one specific embodiment, the test host is also equipped with an indicator light group.

[0017] In one specific embodiment, the test host is also equipped with a buzzer.

[0018] The advantages of this testing device for phase sequence protection capacitors compared to existing technologies are as follows: By setting up a plug plate with slots and power-on probes, and cooperating with the automatic pressing action of the drive component, the phase sequence protection capacitors placed in the slots can be quickly and accurately plugged into the power-on probes to achieve power-on connection. The testing host can perform an automated testing process on the capacitors according to a preset program, eliminating the need for repeated manual operation, significantly shortening the testing time for a single capacitor, and easily achieving continuous automated testing of batch capacitors, improving overall testing efficiency and meeting the rapid testing needs of large-scale production lines. In addition, the automatic plugging and unplugging of the capacitors and power-on probes through a mechanical structure eliminates the need for operators to directly contact high-voltage components during testing, effectively avoiding the risk of electric shock and ensuring the safety of the testing process.

[0019] The present invention will be further described below with reference to the accompanying drawings and specific embodiments. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 A schematic diagram showing the test device for phase sequence protection capacitors provided by this utility model in a depressed state;

[0022] Figure 2 This is a schematic diagram of the testing device for phase sequence protection capacitors provided by this utility model in a recycling state.

[0023] Figure label:

[0024] Test host 10, plug-in board 20, slot 21, drive component 30, piston rod 31, telescopic component 40, pressure plate 50, bracket 60, mounting base 70, display screen 80, indicator light group 90, buzzer 100, button group 110. Detailed Implementation

[0025] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0026] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.

[0027] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0028] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0029] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0030] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0031] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. The illustrative expressions of the above terms in this specification should not be construed as necessarily referring to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. In addition, those skilled in the art can combine and integrate the different embodiments or examples described in this specification.

[0032] See Figures 1 to 2 As shown, this utility model discloses a specific embodiment of a testing device for phase sequence protection capacitors, including: a testing host 10, the testing host 10 having a plug plate 20, the plug plate 20 having a slot 21, the slot 21 having a power-on probe inside, and the testing host 10 having a driving component 30 located above the slot 21; during testing, the phase sequence protection capacitor is placed in the slot 21, the testing host 10 controls the driving component 30 to work and drive the phase sequence protection capacitor down until it is electrically connected to the power-on probe, and the testing host 10 performs the test on the phase sequence protection capacitor.

[0033] Specifically, the test host 10, as the core control unit, integrates functional modules such as circuit control, sensor reception, and test result analysis. The test host 10 has a plug-in board 20 with a slot 21 for accommodating the phase sequence protection capacitor. Inside the slot 21 is a power-on probe used to connect to the capacitor during testing for electrical performance evaluation. Above the slot 21, the test host 10 has a drive unit 30. The drive unit 30 uses air pressure to drive a piston, which in turn presses down the phase sequence protection capacitor. After the capacitor is placed in the slot 21, the drive unit 30 presses the capacitor down until it contacts the power-on probe in the slot 21, ensuring a stable and tight contact. After the capacitor contacts the power-on probe, the test host 10 automatically performs the phase sequence protection capacitor test. Through the built-in test modules, the test host 10 performs electrical performance testing on the capacitor, such as capacitance value, phase sequence, and withstand voltage. The test results are fed back in real time and displayed on the interface of the test host 10. After the test is completed, the test host 10 will automatically record the test results and can generate a test report as needed.

[0034] In other words, by setting up a plug-in plate 20 with slot 21 and a power-on probe, and with the automatic pressing action of the drive component 30, the phase sequence protection capacitor placed in the slot 21 can be quickly and accurately plugged into the power-on probe to achieve power-on connection. The test host 10 can perform an automated test process on the capacitor according to a preset program, eliminating the need for repeated manual operation, significantly shortening the testing time for a single capacitor, and easily achieving continuous automated testing of batch capacitors, improving overall testing efficiency and meeting the rapid testing needs of large-scale production lines. In addition, by achieving automatic plugging and unplugging of the capacitor and the power-on probe through a mechanical structure, operators do not need to directly contact high-voltage components during the testing process, effectively avoiding the risk of electric shock and ensuring the safety of the testing process. Furthermore, during manual testing, operator skill levels, force applied, testing techniques, and environmental factors can all interfere with test results, leading to significant data fluctuations and poor repeatability. This device employs a mechanized drive component 30 pressing method to ensure consistent insertion force and position height between the capacitor and the power-on probe each time, avoiding the uncertainties of manual operation. The testing host 10 executes tests based on precise algorithms and standard parameters, reducing human error and making test results more stable and accurate, thus improving the reliability of product quality control. In addition, traditional manual testing methods require a large workforce, and prolonged repetitive operations can easily lead to operator fatigue, further affecting testing efficiency and accuracy. This device achieves automated testing, requiring only a small number of personnel to handle capacitor loading and unloading and simple monitoring and maintenance of the device, significantly reducing manpower needs and lowering enterprise labor costs. Simultaneously, automated operation reduces the labor intensity of operators, improves the working environment, and helps increase employee job satisfaction and production enthusiasm.

[0035] In one embodiment, a telescopic member 40 is further provided between the insert plate 20 and the test host 10. Preferably, the telescopic member 40 is a telescopic stud.

[0036] Specifically, the telescopic component 40 is telescopic to support the insert plate 20. More specifically, the telescopic component 40 consists of an outer threaded sleeve and an inner threaded rod. The outer threaded sleeve is fixedly installed on the test host 10 and has an internal threaded hole. The inner threaded rod engages with the outer threaded sleeve via a thread, allowing it to rotate within the outer threaded sleeve and thus move up and down. The top of the inner threaded rod is designed with a connection structure for connecting the insert plate 20, such as a threaded hole, a slot, or a flat connection, to securely mount the insert plate 20 onto the inner threaded rod. Inside the telescopic component 40, a spring is installed between the inner threaded rod and the bottom of the outer threaded sleeve. The spring is made of a metal material with good elasticity and durability, such as stainless steel spring steel. The specifications of the spring are precisely selected and designed based on factors such as the weight of the insert plate 20, the force during capacitance testing, and the required telescopic stroke. During installation, one end of the spring is fixed to the bottom of the outer threaded sleeve, and the other end is in contact with or fixedly connected to the bottom of the inner threaded rod, ensuring that the spring can produce corresponding elastic deformation when the inner threaded rod moves up and down.

[0037] When the phase sequence protection capacitor is not placed, the spring inside the telescopic component 40 is in a naturally extended state, and the insertion plate 20 is in a relatively high initial position supported by the spring. This initial height can be preset according to the overall design of the test device and the conventional size of the capacitor. When the operator places the phase sequence protection capacitor into the slot 21 of the insertion plate 20, the weight of the capacitor will exert a downward pressure on the insertion plate 20. This pressure is transmitted through the insertion plate 20 to the internal screw of the telescopic component 40, causing the internal screw to move downward against the spring force. The spring is compressed under the pressure, and its extension and contraction amount depends on the weight of the capacitor and the spring constant. As the internal screw moves downward, the insertion plate 20 also descends accordingly until the capacitor is stably placed in the slot 21, and the spring force and the weight of the capacitor reach a balance. When the test host 10 controls the drive component 30 to push the capacitor down and connect it with the power-on probe, the capacitor will be subjected to the downward pressure of the drive component 30 and the reaction force of the power-on probe. These external forces will further act on the insertion plate 20 and the telescopic component 40, causing the spring to continue to undergo elastic deformation. The elastic deformation of the spring can act as a buffer, reducing the impact of external forces on other components of the testing device and protecting the internal structure of the testing host 10 and critical components such as the power-on probe. At the same time, the spring force can ensure that the capacitor and the power-on probe maintain a stable contact pressure, ensuring a good electrical connection and improving the accuracy and reliability of the test. When the test is completed, the drive component 30 resets, and the external force on the capacitor disappears. At this time, the spring gradually returns to its original shape under its own elastic force, pushing the internal screw to move upward, thereby driving the insertion plate 20 and the capacitor to rise, and then pulling out the capacitor, thus returning to the initial state and preparing for the next test.

[0038] In other words, the spring has good elasticity and can undergo elastic deformation when the insertion plate 20 is subjected to external force, playing a role in buffering and shock absorption. Various external impacts generated during capacitor placement, the pressing of the drive component 30, and the testing process can be effectively mitigated by the spring's extension and contraction, avoiding rigid impacts on key components such as the test host 10 and the power-on probe, reducing component damage and wear, extending the device's service life, and lowering equipment maintenance costs. Furthermore, stable contact pressure is crucial for ensuring good electrical connection and accurate test results when the capacitor is plugged into the power-on probe for testing. The spring force can automatically adjust according to the weight of the capacitor and the force conditions during the test, always providing appropriate contact pressure between the capacitor and the power-on probe. Even when external forces change or the capacitor has certain dimensional deviations, the spring can maintain a stable contact state through its own extension and contraction, avoiding test errors caused by poor contact and improving test accuracy and repeatability. Additionally, phase sequence protection capacitors of different specifications may vary in weight and size. Through the elasticity of the spring, the telescopic component 40 automatically adapts to the pressure generated by capacitors of different weights, ensuring that the insertion plate 20 is adjusted to a suitable height and maintains stable support when placing capacitors of different specifications. This eliminates the need for specific adjustments and settings for each capacitor specification, improving the device's versatility and adaptability, and facilitating rapid switching and diverse testing during production. Furthermore, due to the spring's automatic adjustment, operators do not need to manually and precisely adjust the height of the insertion plate 20 when placing capacitors; they simply need to insert the capacitor into the slot 21. During testing, the spring also automatically adapts to changes in external force, requiring no additional operator intervention. This automated support and adjustment method simplifies the operation process, reduces manual operation time and errors, improves overall testing efficiency, and better meets the demands for rapid and efficient testing on large-scale production lines.

[0039] In one embodiment, the telescopic member 40 is further provided with a sensor, which is electrically connected to the test host 10.

[0040] Specifically, depending on the requirements, a sensor capable of detecting switching signals is selected, such as a micro switch sensor or a proximity switch sensor. Micro switch sensors are characterized by their high sensitivity and reliability; when an external force touches their contacts, they can quickly change the switching state. Proximity switch sensors, on the other hand, do not require physical contact; they output a switching signal by sensing the approach of a target object, making them suitable for scenarios where contact is required. Inside the telescopic component 40, the sensor's installation position is determined based on its structure and functional requirements. If a micro switch sensor is used, it can be installed near the extreme position of the relative movement between the inner screw and the outer sleeve of the telescopic component 40. For example, when the inner screw moves downwards to its lowest position (i.e., the insert plate 20 descends to its extreme position), the bottom of the inner screw will touch the contact of the micro switch sensor. If a proximity switch sensor is used, it can be installed on the side of the outer sleeve, corresponding to a specific mark (such as a metal piece) on the inner screw. When the inner screw moves to its extreme position and the mark enters the sensing range of the proximity switch, the sensor outputs a signal to the test host 10. Furthermore, a suitable fixing method is used to securely install the sensor inside the telescopic component 40. For micro switch sensors, screws can be used to fix them to the specially designed sensor mounting base 70, and then the mounting base 70 can be fixed to the appropriate position of the outer threaded sleeve or the inner threaded rod. For proximity switch sensors, their own mounting holes can be used to fix them directly to the outer threaded sleeve with screws, and the relative position and distance between them and the inner threaded rod marked on the screw can be adjusted to ensure that the sensor can detect accurately.

[0041] The appropriate connecting cable is selected based on the interface type of the sensor and the test host 10. The cable should have good insulation and anti-interference capabilities to ensure stable signal transmission. For example, if both the sensor and the test host 10 use common terminal block interfaces, a multi-core shielded cable can be selected to accurately connect the sensor's signal output terminal to the corresponding signal input terminal of the test host 10. Additionally, one end of the connecting cable should be securely connected to the sensor's signal output terminal, and the other end should be connected to the designated interface on the test host 10. During the connection process, attention should be paid to the polarity of the cable and the correspondence of the interfaces to avoid incorrect connection leading to signal transmission errors or equipment damage. After connection, insulating tape or heat shrink tubing can be used to wrap and secure the connection points to prevent loosening or short circuits. When the device is not operating, the sensor inside the telescopic component 40 is in a standby state. At this time, the test host 10 continuously monitors the sensor's signal input port but does not receive a valid switching signal. When the plug plate 20 moves to a preset limit position during operations such as capacitor placement or driver 30 pressing down, the sensor inside the telescopic component 40 is triggered. If it is a microswitch sensor, the movement of the internal screw causes its contacts to make contact with the microswitch, changing the on / off state of the microswitch and thus outputting a switching signal. If it is a proximity switch sensor, the mark on the internal screw enters its sensing range, and the proximity switch outputs a corresponding switching signal. The switching signal output by the sensor is transmitted to the test host 10 through a connecting cable. After receiving the signal, the microprocessor inside the test host 10 identifies and processes the signal. According to the preset program logic, the test host 10 determines whether the plug-in plate 20 has reached its limit position and performs the corresponding operation. For example, if the plug-in plate 20 descends to its limit position, the test host 10 stops the downward pressing action of the drive component 30 to prevent equipment damage; if the plug-in plate 20 rises to its limit position, the test host 10 may allow the next capacitor placement operation.

[0042] In other words, the sensor acts as a limit switch, accurately detecting the movement limit position of the insert plate 20. When the insert plate 20 reaches its limit position, the sensor promptly sends a signal to the test host 10, enabling the test host 10 to quickly take corresponding protective measures, such as stopping the movement of the drive component 30 and cutting off the power supply, to avoid safety accidents such as equipment damage, capacitor failure, or even personal injury caused by excessive movement of the insert plate 20, greatly improving the safety and reliability of the device. In addition, by detecting the switch signal through the sensor, the test host 10 can accurately grasp the position information of the insert plate 20. In the automated testing process, precise position control is crucial to ensuring the correct connection of the capacitor and the power-on probe, and the accurate operation of the drive component 30. The real-time position feedback provided by the sensor allows the test host 10 to accurately adjust the operating state of the device according to the actual situation, improving the accuracy and repeatability of the test and ensuring the consistency of product quality. Furthermore, the application of the sensor enables the device to achieve automated limit detection and control, eliminating the need for operators to manually determine whether the position of the insert plate 20 has reached its limit. Operators only need to follow the normal procedure for placing and testing capacitors. The device will automatically complete the corresponding actions and protective measures based on the sensor signals, simplifying the operation process, reducing operational difficulty, and improving production efficiency. It is especially suitable for batch testing of phase sequence protection capacitors on large-scale automated production lines. Furthermore, when the device malfunctions, the sensor output signals can serve as an important basis for fault diagnosis. By monitoring the sensor signal status, operators can quickly determine whether the insertion plate 20 can move normally to its limit position, thereby identifying the possible location of the fault, such as whether the sensor is damaged, whether the connecting cable is loose, or whether there is a problem with the control program of the test host 10. This helps to shorten troubleshooting time, improve maintenance efficiency, reduce equipment downtime, and reduce production losses.

[0043] In one embodiment, the power-on probe is recessed into the slot 21.

[0044] Specifically, the shape and size of slot 21 are designed based on the external dimensions and pin layout of the phase sequence protection capacitor. Slot 21 typically adopts a rectangular or square structure that matches the bottom contour of the capacitor, ensuring that the capacitor can be stably placed inside slot 21. Simultaneously, the depth of slot 21 is reasonably determined to ensure that the capacitor pins can accurately contact the power-on probes after placement, while providing sufficient space for the power-on probes to be recessed. A dedicated probe mounting area is provided at the bottom of slot 21, the shape and size of which are adapted to the mounting base of the power-on probes. Around the probe mounting area, some positioning protrusions or grooves can be designed to assist in the precise installation of the power-on probes and prevent them from shifting within slot 21. Furthermore, appropriate power-on probes are selected according to the specifications of the capacitor pins and testing requirements. The power-on probes should have good conductivity, elasticity, and abrasion resistance to ensure a stable and reliable electrical connection with the capacitor pins during repeated insertion and removal. Common power-on probes include spring probes and crown probes, which can be selected according to actual needs. Align the mounting base of the power-on probe with the probe mounting area at the bottom of slot 21, and securely install the power-on probe into slot 21 using screws, snap-fit ​​connections, or welding. During installation, ensure that the tip of the power-on probe is accurately positioned according to the design and maintains a proper perpendicularity to the bottom plane of slot 21 to ensure smooth contact between the capacitor leads and the probe when inserted. Control the depth of the power-on probe tip relative to the plane of slot 21 through precise design and manufacturing. Generally, the depth should be determined based on the length of the capacitor leads and the operator's habits, typically ranging from a few millimeters to tens of millimeters. For example, for capacitors with shorter leads, the depth can be controlled at 3-5 mm, ensuring that the capacitor leads can be inserted and contact the probe while effectively preventing accidental probe contact by the operator.

[0045] In other words, the power-on probe is recessed within the slot 21, preventing the probe tip from being exposed outside the slot. This reduces the risk of accidental contact with the probe when placing or removing the capacitor, effectively preventing electric shock accidents and significantly improving operator safety. Furthermore, the recessed probe prevents accidental finger injuries during operation, reducing the risk of mechanical injury and providing a safer working environment. Additionally, the recessed position ensures accurate contact between the capacitor leads and the probe, minimizing contact problems caused by probe misalignment or external interference. Stable electrical connection guarantees accurate transmission of test signals, improving the reliability and repeatability of test results. The recessed position also shields the probe from external electromagnetic interference and mechanical vibrations, further enhancing test stability and accuracy, ensuring the testing device accurately detects the performance parameters of the phase sequence protection capacitor. Finally, the recessed position prevents damage from collisions and scratches during daily operation, extending the probe's lifespan. Meanwhile, it reduces oxidation and wear on the probe surface, ensuring the probe's conductivity and lowering equipment maintenance costs. Operators no longer need to deliberately avoid the power-on probes when placing or removing capacitors; they can simply place or remove the capacitor smoothly into or from slot 21, making operation more convenient and efficient.

[0046] In one embodiment, the insert plate 20 has a plurality of slots 21 evenly distributed thereon, the driving member 30 is a cylinder, the cylinder includes a piston rod 31, and the end of the piston rod 31 is connected to a pressure plate 50, the pressure plate 50 is used to press down the phase sequence protection capacitor.

[0047] Specifically, multiple slots 21 are evenly distributed on the insertion plate 20. In practice, the size and shape of the slots 21 are first determined based on the capacitor's dimensions, generally designed as rectangles or squares matching the bottom contour of the capacitor. Then, the positions of the slots 21 are planned on the insertion plate 20 according to a certain row and column spacing, for example, using a matrix arrangement. The row and column spacing are reasonably set according to the capacitor's pin spacing and operating space requirements to ensure that each capacitor can be accurately and securely inserted into the slot 21, with sufficient spacing between adjacent capacitors for easy handling. Furthermore, a suitable drive unit 30 is selected based on the total downward pressure required for testing multiple phase sequence protection capacitors simultaneously and the space limitations of the testing device. The cylinder diameter, stroke, and output force of the drive unit 30 must meet the testing requirements. For example, if 10 capacitors need to be tested simultaneously, and the downward pressure required for each capacitor test is 10N, then the output force of the drive unit 30 must be at least 100N, while also considering a certain safety factor. The drive unit 30 is then fixedly installed in a suitable position on the testing device, ensuring that the axis of the drive unit 30 is perpendicular to the plane of the insertion plate 20. The piston rod 31 extends from the front end of the drive component 30, and its end is fitted with the pressure plate 50 via threaded connection, welding, or snap-fit ​​connection. During installation, it is crucial to ensure a secure connection between the piston rod 31 and the pressure plate 50, and that the movement direction of the piston rod 31 is consistent with the downward pressing direction of the pressure plate 50 to prevent misalignment or jamming. Furthermore, the shape of the pressure plate 50 is designed according to the distribution of the slots 21 on the insert plate 20, generally using a rectangular flat plate shape, and its size must be sufficient to cover the capacitor positions corresponding to all slots 21 on the insert plate 20. The edges of the pressure plate 50 are chamfered to prevent scratching the capacitors or operators during operation. Additionally, the pressure plate 50 is made of a material with uniform texture and moderate hardness, such as stainless steel or hard plastic. The surface of the pressure plate 50 is smoothed to reduce friction with the capacitors, ensuring smooth and even pressure application during pressing. A connecting hole matching the end of the piston rod 31 is made at the center of the pressure plate 50, and the pressure plate 50 is fixed to the end of the piston rod 31 with screws. When connecting, ensure the perpendicularity of the pressure plate 50 and the piston rod 31 so that the pressure plate 50 can remain horizontal during the pressing process, thereby ensuring that the pressure applied to each capacitor is uniform.

[0048] The operator inserts multiple phase sequence protection capacitors into their respective slots 21 on the plug-in board 20, ensuring accurate contact between the capacitor leads and the power-on probes within the slots 21. The control program of the test host 10 activates the drive unit 30, extending its piston rod 31 and causing the pressure plate 50 to move downwards. The pressure plate 50 gradually approaches the capacitors, eventually contacting their upper surfaces and continuing to press down, establishing a stable and reliable electrical connection between the capacitors and the power-on probes. Simultaneously, the test host 10 begins performance testing on each capacitor, such as checking capacitance and insulation resistance. After testing, the test host 10 controls the piston rod 31 of the drive unit 30 to retract, causing the pressure plate 50 to move upwards and return to its initial position. The operator can then remove the tested capacitors from their slots 21 for further processing or place new capacitors for the next round of testing.

[0049] In other words, multiple slots 21 are evenly distributed on the insertion plate 20, allowing multiple phase sequence protection capacitors to be placed simultaneously for testing, greatly reducing the clamping and disassembly time required for testing a single capacitor. Compared with the traditional method of testing a single capacitor sequentially, more capacitors can be tested in the same amount of time, significantly improving production efficiency, especially suitable for rapid capacitor testing on large-scale production lines. By combining the automatic pressing function of the drive unit 30 and the pressure plate 50, the capacitor testing process is automated. The operator only needs to place the capacitor into the slot 21 and start the test program; the drive unit 30 will automatically complete the pressing and resetting actions, reducing manual intervention and further improving testing efficiency. In addition, the pressure plate 50, driven by the piston rod 31 of the drive unit 30, can smoothly and evenly apply pressure to multiple capacitors simultaneously, ensuring consistent contact pressure between each capacitor and the power-on probe. Stable contact pressure is key to ensuring good electrical connection and accurate test results, avoiding test errors caused by poor contact, and improving test accuracy and repeatability. Simultaneous testing of multiple capacitors eliminates the impact of environmental factors (such as temperature and humidity changes) introduced by differences in testing time on the test results, making the test data more comparable and reliable, and helping to more accurately evaluate the performance and quality of the capacitors. Furthermore, the insertion plate 20, drive component 30, piston rod 31, and pressure plate 50 constitute a stable mechanical structure. The uniform slot design 21 of the insertion plate 20 ensures the stable placement of the capacitors, the rigid connection of the drive component 30 and piston rod 31, and the reasonable design of the pressure plate 50 enable it to withstand greater pressure during the pressing process without deformation or damage, improving the overall stability and reliability of the device. In addition, operators only need to perform simple capacitor placement and removal operations, eliminating the need for complex debugging and manual pressurization processes, reducing the skill requirements for operators and making operation simpler and faster. The automated pressing and reset functions reduce the physical labor of operators, avoid fatigue caused by prolonged manual operation, improve work efficiency, and also improve the working environment for operators.

[0050] In one embodiment, the number of piston rods 31 is two.

[0051] Specifically, the two piston rods 31 act simultaneously, balancing the forces as the drive unit 30 pushes the pressure plate 50. Compared to a single-piston rod drive unit 30, where a single piston rod 31 might cause vibration and swaying due to unilateral force, the double-piston rod 31 structure effectively disperses this unbalanced force, making the movement of the pressure plate 50 smoother and more stable. This reduces mechanical vibration interference during testing and improves the stability and accuracy of the test signal. In the testing environment, external factors (such as vibration from other equipment or airflow) may interfere with the testing device. The smooth pushing force provided by the two piston rods 31 allows the pressure plate 50 to better resist these external interferences, maintaining a stable downward pressing action and ensuring the reliability of the testing process. Furthermore, the two piston rods 31 ensure that the pushing force is evenly distributed on the pressure plate 50. This allows the pressure plate 50 to evenly transfer force to each capacitor when in contact with the phase sequence protection capacitor, ensuring that the pressure on each capacitor is essentially the same. Uniform pressure is crucial for ensuring a good electrical connection between the capacitor and the power-on probe, preventing problems such as poor contact or damage from excessive pressure on some capacitors, thus improving the accuracy and consistency of test results. For some irregularly shaped or large-sized pressure plates 50, a single piston rod 31 can hardly guarantee a uniform distribution of the pushing force. However, two piston rods 31 can be rationally arranged according to the actual situation of the pressure plate 50, better adapting to pressure plates 50 of different shapes and sizes, so that the pushing force can be evenly applied to the entire surface of the pressure plate 50, expanding the applicability of the testing device. In addition, the two piston rods 31 share the task of pushing the pressure plate 50, distributing the large force originally borne by a single piston rod 31 into two parts, reducing the stress on each piston rod 31. This can reduce fatigue damage to the piston rods 31, internal parts of the drive component 30, and connecting parts, extending the service life of these components and improving the overall reliability of the device. In addition, the dual piston rod 31 structure has a certain degree of redundancy. Even if one piston rod 31 has a minor fault (such as poor sealing or slight deformation), the other piston rod 31 can still provide a certain amount of pushing force to ensure that the pressure plate 50 can basically complete the downward pressing action, so that the testing device can continue to operate to a certain extent and will not stop working immediately. This provides time for timely maintenance and replacement of parts and improves the stability of the device.

[0052] In one embodiment, the test host 10 is provided with a bracket 60, the bracket 60 is connected to a mounting base 70, and the mounting base 70 is connected to the drive component 30.

[0053] Specifically, the support bracket 60 is constructed from suitable materials based on the weight and size of the test host 10 and the requirements of the testing environment. Common materials include aluminum alloy, stainless steel, and carbon steel. Aluminum alloy is lightweight and corrosion-resistant, making it suitable for testing scenarios with strict weight requirements and relatively good environmental conditions. Stainless steel has excellent corrosion resistance and high strength, making it suitable for use in humid or corrosive environments. Carbon steel has high strength and low cost, and its corrosion resistance can be improved through surface treatments (such as painting or galvanizing), making it commonly used in cost-sensitive situations with less demanding environmental conditions. The structural design of the support bracket 60 must consider the stability and ease of installation of the test host 10. A frame structure can be adopted, composed of multiple profiles (such as square or rectangular tubes) connected by welding or bolts. The dimensions of the frame must be rationally designed according to the size of the test host 10 to ensure that the test host 10 can be stably placed on the support bracket 60. Adjustable feet can be installed at the bottom of the support bracket 60, and the levelness of the support bracket 60 can be adjusted by rotating the feet to ensure that the test host 10 is in a horizontal position, guaranteeing the accuracy of the test. In addition, the material of the mounting base 70 must match that of the bracket 60 and the drive component 30. Typically, the same or similar material as the bracket 60 is selected to ensure the consistency and stability of the overall structure. The shape of the mounting base 70 should be designed according to the installation requirements and spatial layout of the drive component 30, generally using a rectangular or square flat plate shape. Its dimensions must meet the installation and fixing requirements of the drive component 30 and leave sufficient operating space. Furthermore, the mounting base 70 is fixed to the bracket 60 by welding or bolting. If welding is used, the welding quality must be ensured to guarantee a firm and reliable connection between the mounting base 70 and the bracket 60, free from defects such as incomplete welds or porosity. If bolting is used, bolt holes should be drilled at corresponding positions on the mounting base 70 and the bracket 60, and bolts and nuts of appropriate specifications should be used for connection. Thread locking agent should be applied to the connection area to prevent bolt loosening. Simultaneously, the position and angle of the mounting base 70 on the bracket 60 should be reasonably determined according to the movement direction and stress conditions of the drive component 30 to ensure the normal operation of the drive component 30. In addition, a dedicated mounting interface for the drive component 30 is designed on the mounting base 70, and the size and shape of the interface must be compatible with the mounting location of the drive component 30. Common connection methods include flange connection and threaded connection. For flange connection, flanges are installed on the mounting base 70 and the drive component 30 respectively, and the two flanges are connected together by bolts; for threaded connection, an internal threaded hole is machined on the mounting base 70, and an external thread is machined on the mounting end of the drive component 30, so that the drive component 30 is screwed into the internal threaded hole of the mounting base 70. During the connection process, it is necessary to ensure that the axis of the drive component 30 is aligned with the design axis of the mounting base 70 to avoid misalignment or tilting, which would affect the motion accuracy of the drive component 30.

[0054] In other words, the test host 10 is sequentially connected to the drive component 30 via the bracket 60, mounting base 70, and so on, forming a stable mechanical structure system. The bracket 60 provides a solid support foundation for the test host 10, while the mounting base 70, as an intermediate connecting component, reliably connects the drive component 30 to the bracket 60. This allows the entire device to withstand the reaction force generated by the movement of the drive component 30 and other external interferences during testing, reducing vibration and shaking of the device and ensuring the accuracy and stability of the test. This connection method can evenly distribute the force generated by the movement of the drive component 30 onto the bracket 60, avoiding structural damage caused by excessive local stress. For example, when the drive component 30 pushes the pressure plate 50 to press down the phase sequence protection capacitor, the resulting reaction force is transmitted to the bracket 60 through the mounting base 70. The frame structure of the bracket 60 can distribute these forces to various support points, improving the load-bearing capacity and deformation resistance of the device.

[0055] In one embodiment, the test host 10 is further provided with a display screen 80.

[0056] Specifically, the appropriate display screen type 80 is selected based on the usage scenario, cost budget, and display requirements of the test host 10. Common types include liquid crystal displays (LCDs), light-emitting diode displays (LEDs), and organic light-emitting diode displays (OLEDs).

[0057] LCD displays: Relatively low cost and low power consumption, suitable for testing scenarios where display quality requirements are not particularly high and long-term operation is necessary. For example, in some conventional capacitance testing equipment, LCD displays can clearly display test parameters and results, meeting basic human-computer interaction needs.

[0058] LED displays are characterized by high brightness and wide viewing angles, enabling clear information display even outdoors or in brightly lit environments. If the testing host 10 needs to be used in brightly lit locations such as workshops, the LED display can ensure that operators can clearly see the displayed content from different angles.

[0059] OLED displays offer vibrant colors, high contrast, and fast response times, providing a more vivid and clear display. For high-end testing equipment with stringent display quality requirements, such as the testing host 10 for precision electronic components, OLED displays can better showcase complex testing parameters and detailed test status.

[0060] The connection between the display screen 80 and the test host 10 is determined by their interface types. Common interfaces include HDMI, VGA, DVI, and LVDS. If both the test host 10 and the display screen 80 support HDMI, this is a high-speed, high-bandwidth connection capable of transmitting high-quality audio and video signals, suitable for displaying complex graphics and dynamic information. For some older test host 10 models or certain types of display screens 80, VGA or DVI interfaces may be required. Choose a suitable length and quality cable to ensure stable signal transmission. The cable length should be determined based on the actual installation locations of the test host 10 and the display screen 80 to avoid signal attenuation due to excessive length or installation inconvenience due to insufficient length. Also, pay attention to the cable's shielding performance to prevent external electromagnetic interference from affecting the display signal. Install the corresponding display screen 80 driver in the operating system of the test host 10 to enable the operating system to recognize and control the display screen 80. The driver must be compatible with the model and specifications of the display screen 80 to ensure it can display various information correctly. After installing the driver, the display parameters of the display screen 80, such as resolution, refresh rate, and color mode, also need to be set to achieve the best display effect.

[0061] In other words, through the human-machine interface, operators can directly set the test parameters on the display screen 80, eliminating the need for complex physical buttons or knobs. The simple and clear interface layout and operation guidance enable operators to quickly and accurately complete parameter settings, improving operational efficiency. The test status display interface provides real-time feedback on various information during the test process, allowing operators to understand the test progress and status at any time without frequently checking other parts of the test equipment. This allows for timely detection of problems during the test and the implementation of corresponding measures, avoiding prolonged test time and inaccurate test results due to delayed problem detection. Furthermore, setting parameters on the display screen 80 enables precise control of the test parameters, avoiding errors caused by manually adjusting physical buttons or knobs. Simultaneously, the test host 10 can perform precise tests based on the parameters set by the operator, ensuring the accuracy and reliability of the test results. When abnormal situations occur during the test, the display screen 80 can promptly and comprehensively display abnormal information, helping operators quickly locate the problem. Operators can take corresponding measures to troubleshoot and repair based on the prompts, reducing test errors and equipment damage caused by untimely troubleshooting and improving test reliability.

[0062] In one embodiment, the test host 10 is further provided with an indicator light group 90.

[0063] Specifically, the indicator light group 90 includes red, green, and yellow lights. These lights represent three different states: abnormal, normal operation, and stopped operation, respectively. Operators do not need to consult complex instruments or data; they can quickly understand the current operating status of the test host 10 simply by observing the color of the indicator lights. This intuitive display method greatly improves the efficiency of equipment status monitoring and reduces the workload of operators. When the test host 10 malfunctions, the red light will illuminate immediately, allowing operators to detect the equipment fault at the first moment and take appropriate measures to handle it. Timely fault indication helps prevent further escalation of the fault, reduces equipment damage and downtime, and improves equipment reliability and availability.

[0064] In addition, the illumination of the red abnormality indicator light serves as a strong safety warning to operators, reminding them not to operate the equipment arbitrarily when abnormalities occur, thus avoiding safety accidents. For example, when the test host 10 detects dangerous conditions such as overvoltage or overcurrent, the red light illuminates, and the operator will immediately stop operation and wait for maintenance personnel to inspect and repair the equipment. The status changes of the indicator light group 90 can guide operators to operate the equipment according to the correct procedures. For example, operators can only perform testing operations when the green light is on, indicating normal equipment operation; when the yellow light is on, indicating that the equipment is stopped, operators can perform equipment maintenance and upkeep. This standardized operating procedure helps improve the lifespan of the equipment and the accuracy of test results. Furthermore, by observing the location and status of the red light, maintenance personnel can quickly locate the part and cause of the equipment malfunction. For example, if the red light corresponding to a specific functional module is on, maintenance personnel can focus on checking the circuitry, sensors, and actuators of that module, improving troubleshooting efficiency. The status changes of the indicator light group 90 can record the equipment's operating history, providing important information for equipment maintenance and management. By analyzing the timing and frequency of indicator light status changes, maintenance personnel can understand the equipment's operating status and fault occurrence patterns, develop maintenance plans in advance, allocate maintenance resources rationally, and reduce equipment maintenance costs.

[0065] In one embodiment, the test host 10 is further provided with a buzzer 100.

[0066] Specifically, if the operating current of buzzer 100 is small, the positive terminal of buzzer 100 can be directly connected to the control signal output terminal of the test host 10, and the negative terminal can be connected to the ground wire of the test host 10. The high and low levels of the control signal output terminal control the sounding and stopping of buzzer 100. When the control signal is high, buzzer 100 is powered on and sounds; when the control signal is low, buzzer 100 is powered off and stops sounding. If the operating current of buzzer 100 is large, or the control signal output capability of the test host 10 is limited, a driver circuit is needed to connect buzzer 100. Commonly used driver circuits include transistor driver circuits and relay driver circuits. Transistor driver circuits have the advantages of low cost and fast response speed, and are suitable for driving low-power buzzers 100; relay driver circuits have the characteristics of good isolation and strong driving capability, and are suitable for driving high-power buzzers 100.

[0067] In other words, the sound emitted by the buzzer 100 can instantly attract the operator's attention, especially in noisy working environments. Compared to visual cues (such as indicator lights), sound cues are more direct and effective. When the test host 10 malfunctions, the buzzer 100 immediately sounds, allowing the operator to quickly detect the problem and take timely measures to prevent further deterioration. By setting different sound modes (such as continuous and intermittent sound), the severity of the malfunction can be differentiated. Operators can quickly determine the urgency of the malfunction based on the buzzer 100's sound mode, thus rationally arranging the handling sequence. For urgent malfunctions, priority can be given to handling them, ensuring the safety of equipment and personnel. In addition, when equipment malfunctions, the buzzer 100's alarm can promptly remind the operator to stop the equipment or take appropriate safety measures to prevent further escalation of the accident. For example, when the test host 10 detects an overload, the buzzer 100 sounds to remind the operator to reduce the load, preventing equipment damage or fire accidents caused by overload. By promptly alerting operators to handle abnormal situations, equipment malfunctions and damage caused by abnormal operation can be reduced, improving the stability and reliability of the equipment. Simultaneously, operators can use the alarm information from buzzer 100 to perform regular maintenance and upkeep, extending the equipment's lifespan.

[0068] In one embodiment, the test host 10 is further provided with a button group 110.

[0069] Specifically, button group 110 includes a start button, a start detection button, and a stop button. More specifically, to facilitate quick identification and operation by operators, buttons with different functions should use different colors. The start button is typically green, as green in people's minds represents start and passage, providing a positive psychological cue to the operator. The start detection button can be blue, as blue conveys a sense of professionalism and calmness. The stop button is red, as red has a strong warning effect, reminding the operator to quickly press it to stop the equipment in an emergency. Alternatively, clear function markings such as "Start," "Start Detection," and "Stop" can be printed on the button surface, along with corresponding icons, such as a power symbol for start, a magnifying glass symbol for start detection, and a stop symbol for stop. The markings should be printed with wear-resistant and fade-resistant materials to ensure they remain clearly visible even after long-term use.

[0070] In other words, buttons with different functions are clearly distinguished by color, label, and layout, allowing operators to quickly find the required button and reducing operation time and the possibility of misoperation. For example, in an emergency, operators can quickly locate and press the red stop button to stop the equipment in time and avoid an accident.

[0071] The operating procedure for this testing device is as follows:

[0072] Press the start button to power on the test host 10. The test host 10 uses two AC contactors and one phase sequence protection capacitor to detect the three-phase power sequence of the line. Press and hold the start / stop button for 3 seconds to initiate automatic three-phase power sequence detection. If the AC contactor detects an incorrect phase sequence three times consecutively, the buzzer 100 will sound an alarm. When the three-phase power sequence is correct, the test host 10 will proceed to voltage detection until the external power supply is correct. Then, the operator simply places the phase sequence protection capacitor into slot 21 and presses the start button. The test host 10 will issue a command to control the drive unit 30 to press down the pressure plate 50 until the phase sequence protection capacitor and the power-on probe are properly connected. The test host 10 will then automatically power on and begin automatically detecting and judging the positive / negative phase of the phase sequence protection capacitor. Once all phase sequence protection capacitors at all stations have passed the detection, the drive unit 30 will automatically rise. If some stations fail the detection, the buzzer 100 will sound an alarm, the drive unit 30 will stop working, and the display screen 80 will show the failed stations.

[0073] The above embodiments are preferred implementations of this utility model. In addition, this utility model can also be implemented in other ways. Any obvious substitutions without departing from the concept of this technical solution are within the protection scope of this utility model.

Claims

1. A testing device for phase sequence protection capacitor, characterized in that, include: The test host has a plug-in board with a slot. A power-on probe is located inside the slot. The test host is also equipped with a driving component located above the slot. During testing, a phase sequence protection capacitor is placed in the slot. The test host controls the driving component to push the phase sequence protection capacitor down until it is electrically connected to the power-on probe. The test host then performs the test on the phase sequence protection capacitor.

2. The testing device for phase sequence protection capacitor according to claim 1, characterized in that, An extension component is also provided between the insert plate and the test host.

3. The testing device for phase sequence protection capacitors according to claim 2, characterized in that, The telescopic component is also equipped with a sensor, which is electrically connected to the test host.

4. The testing device for phase sequence protection capacitor of claim 1, wherein, The power-on probe is recessed into the slot.

5. The testing device for phase sequence protection capacitor of claim 1, wherein, The insert plate has multiple slots evenly distributed. The driving component is a cylinder, which includes a piston rod. The end of the piston rod is connected to a pressure plate, which is used to press down the phase sequence protection capacitor.

6. The testing device for phase sequence protection capacitor according to claim 5, characterized in that, The number of piston rods is two.

7. The testing device for phase sequence protection capacitor of claim 1, wherein, The test host is equipped with a bracket, the bracket is connected to a mounting base, and the mounting base is connected to the drive component.

8. The testing device for phase sequence protection capacitor of claim 1, wherein, The test host is also equipped with a display screen.

9. The testing device for phase sequence protection capacitor of claim 1, wherein, The test host is also equipped with an indicator light group.

10. The testing apparatus for phase sequence protection capacitors according to claim 1, characterized in that, The test host is also equipped with a buzzer.

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