A durometer provided with a modular probe for easy replacement
The modularly designed hardness tester, with its integrated display controller and signal transmission line, enables rapid probe replacement and stable connection, solving the problems of cumbersome and easily damaged probe replacement in traditional hardness testers, and improving measurement accuracy and equipment maintenance efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHANGHAI SHANGCAI TESTERMACHINE CO LTD
- Filing Date
- 2025-07-25
- Publication Date
- 2026-07-21
AI Technical Summary
Traditional hardness testers use fixed connections or complex structures to connect the probe to the main body of the device, which makes probe replacement cumbersome and time-consuming. Improper operation can easily damage the device and affect measurement accuracy.
Adopting a modular design, the integrated structure of the display controller, signal transmission line, probe outer cylinder and disassembly clamps enables quick probe replacement. The structure of positioning bosses and grooves, threaded connections and limit buffers ensures connection stability and signal transmission reliability.
It enables quick probe replacement, reduces the risk of component damage due to operational errors, improves measurement accuracy and equipment maintenance convenience, and reduces the failure rate.
Smart Images

Figure CN224535689U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the technical field of hardness testing equipment, specifically a hardness tester with a modular probe that is easy to replace. Background Technology
[0002] Hardness testers, as precision instruments used to measure the hardness of materials, are widely used in many fields such as mechanical manufacturing, materials science, and quality inspection. Types include Brinell hardness testers, Rockwell hardness testers, and Vickers hardness testers. Their working principle is mainly to apply specific pressure by contacting the probe with the surface of the material being tested, and then calculate the hardness value based on the degree of deformation of the material. Since the measurement requirements of different materials and different hardness ranges vary, it is often necessary to use probes of different specifications or types to ensure the accuracy and reliability of the measurement results.
[0003] Traditional hardness testers use a fixed connection between the probe and the main body of the device, or a complex connection structure. When the probe needs to be replaced, the operation is extremely cumbersome and time-consuming, requiring the disassembly of multiple parts to complete the replacement. Furthermore, improper operation may damage the probe or the main body of the device, which can seriously affect the measurement accuracy. Utility Model Content
[0004] The purpose of this invention is to provide a hardness tester with a modular probe that is easy to replace, in order to solve the problem mentioned in the background art that uses a complex connection structure, and when the probe needs to be replaced, the operation process is extremely cumbersome and time-consuming, requiring the disassembly of multiple parts to complete the replacement operation. Moreover, during the operation, improper operation may damage the probe or the main body of the device, thereby seriously affecting the measurement accuracy.
[0005] To achieve the above objectives, this utility model provides the following technical solution: a hardness tester with a modular probe for easy replacement, including an integrated display controller, which is a housing structure with an internal integrated control module. The integrated display controller is connected to the probe outer cylinder through a signal transmission line to form the basic structure of the hardness tester.
[0006] The integrated display controller has a display screen embedded on the upper front and control buttons on the lower front. The control buttons are electrically connected to the control module inside the integrated display controller. The upper end of the integrated display controller is provided with a connection hole for connecting to the signal transmission line.
[0007] The other end of the signal transmission line is connected to the probe connection end, and the probe connection end is inserted into the probe outer cylinder. A signal sensing element is installed inside the probe outer cylinder, and a probe inner core is located at the lower end of the signal sensing element. A measuring contact is installed at the bottom end of the probe inner core, and a disassembly clamp is provided on the outer sleeve of the probe inner core. The disassembly clamp is threadedly connected to one end of the probe outer cylinder. The upper end of the probe inner core is nested with a limiting buffer frame, and a guide spring frame is installed in the opening of the limiting buffer frame. The guide spring frame is supported by the signal sensing element.
[0008] By adopting the above technical solution, the overall structural design integrating components such as the display controller, signal transmission line, and probe outer cylinder has been constructed to build the basic framework of the hardness tester, realizing the integration of control, display, and measurement functions.
[0009] Preferably, the inner wall of the connection port of the probe connection end is provided with a positioning boss, and the outer wall of the docking part of the probe outer cylinder is provided with a positioning groove that matches the positioning boss, and the probe outer cylinder docks with the probe connection end.
[0010] By adopting the above technical solution, the positioning boss at the probe connection end and the positioning groove on the probe outer cylinder can be matched to quickly achieve precise docking of the two and avoid misalignment during installation.
[0011] Preferably, the probe outer cylinder is threaded at the connection between the probe and the disassembly clamp, and the inner wall of the probe connection end is engaged with the limiting buffer frame.
[0012] By adopting the above technical solution, the threaded connection between the probe connection end and the disassembly clamp, as well as the snap-fit connection with the limiting buffer frame, enhances the connection stability between the probe connection end and related components.
[0013] Preferably, the signal sensing element and the probe core are electrically connected, and the signal sensing element is connected to the signal transmission line, and the signal transmission line transmits the signal to the integrated display controller.
[0014] By adopting the above technical solution, the electrical signal connection between the signal sensing element, the probe core and the signal transmission line ensures that the physical signal can be stably converted into an electrical signal and transmitted to the integrated display controller during measurement, thus guaranteeing the reliability of signal transmission.
[0015] Preferably, the side wall of the disassembly clamp has an L-shaped bracket, and the L-shaped bracket abuts against the outer wall of the probe outer cylinder.
[0016] By adopting the above technical solution, the L-shaped bracket on the side wall of the disassembly clamp abuts against the outer wall of the probe outer cylinder, which can provide support when the disassembly clamp is tightened or loosened, reduce its shaking, make the operation more stable, and reduce the risk of component damage due to unstable operation.
[0017] Preferably, the limiting buffer frame is configured as an annular shape, and one connecting ring of the guide spring frame is installed inside the annular opening of the limiting buffer frame.
[0018] By adopting the above technical solution, the installation structure of the annular limiting buffer frame and the guide spring frame connecting ring provides a stable installation foundation for the guide spring frame, ensuring that the guide spring frame can play its guiding and buffering roles normally.
[0019] Preferably, the guide spring frame includes one spring and two connecting rings, with one connecting ring welded and fixed to the inner wall of the probe outer cylinder, and the other connecting ring connected to the outer wall of the probe inner core.
[0020] By adopting the above technical solution, the spring and two connecting ring structures of the guide spring frame, through their connection with the inner wall of the probe outer cylinder and the outer wall of the probe inner core, can guide the direction of the probe inner core and buffer the impact force when it moves.
[0021] Compared with the prior art, the beneficial effects of this utility model are: the hardness tester is equipped with a modular probe for easy replacement.
[0022] 1. By using the threaded connection structure between the clamp and the probe outer cylinder, and the precise alignment of the probe connection end with the positioning boss and positioning groove of the probe outer cylinder, the probe can be quickly replaced without disassembling multiple parts. Locking and unlocking can be completed simply by rotating the clamp, which effectively simplifies the operation steps and improves the efficiency of probe replacement.
[0023] 2. In this structure, the L-shaped bracket on the side wall of the disassembly clamp abuts against the outer wall of the probe outer cylinder, providing stable support during replacement and reducing shaking during operation. At the same time, the nested structure of the probe inner core and the limiting buffer frame, as well as the buffering effect of the guide spring frame, can prevent damage to components due to collision or excessive force. This structure effectively reduces the risk of damage to the probe or the main body of the equipment due to improper operation and ensures the stability of measurement accuracy.
[0024] 3. Furthermore, the snap-fit connection between the probe connection end and the limiting buffer frame, and the reliable electrical connection between the signal sensing element and the probe core and signal transmission line, ensure the structural stability and signal transmission accuracy of each component after assembly. The modular design of the overall structure makes probe replacement more convenient, facilitates equipment maintenance and calibration, and reduces the failure rate during use. Attached Figure Description
[0025] Fig. 1 This is a schematic diagram of the overall external three-dimensional structure of this utility model;
[0026] Fig. 2 This is a schematic diagram of the overall internal three-dimensional structure of this utility model;
[0027] Fig. 3This is a schematic diagram of the internal cross-sectional structure of the probe outer cylinder of this utility model;
[0028] Fig. 4 This is a three-dimensional structural diagram of the signal transmission line, probe connection end, and probe outer cylinder of this utility model.
[0029] Fig. 5 This is a three-dimensional structural diagram showing the disassembled core of the probe, the disassembly clamp, and the limiting buffer frame of this utility model.
[0030] Fig. 6 This is a three-dimensional structural diagram of the probe core and the disassembly and assembly clamps of this utility model.
[0031] In the diagram: 1. Integrated display controller; 2. Display screen; 3. Control buttons; 4. Signal transmission line; 5. Probe connection end; 6. Probe outer cylinder; 7. Signal sensing element; 8. Probe inner core; 9. Measuring contact; 10. Removable clamp; 11. Limit buffer frame; 12. Guide spring frame. Detailed Implementation
[0032] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0033] Please see Figs. 1-6 This utility model provides a technical solution: a hardness tester with a modular probe for easy replacement, including an integrated display controller 1, a display screen 2, control buttons 3, a signal transmission line 4, a probe connection end 5, a probe outer cylinder 6, a signal sensing element 7, a probe inner core 8, a measuring contact 9, a disassembly clamp 10, a limit buffer frame 11, and a guide spring frame 12.
[0034] Among them, the integrated display controller 1 is a housing structure for the internal integrated control module. The integrated display controller 1 is connected to the probe outer cylinder 6 through the signal transmission line 4 to form the basic structure of the hardness tester.
[0035] The integrated display controller 1 has a display screen 2 embedded on the upper front and a control button 3 on the lower front. The control button 3 is electrically connected to the control module inside the integrated display controller 1. The upper end of the integrated display controller 1 is provided with a connection hole for connecting to the signal transmission line 4.
[0036] Referring to the attached diagrams in the instruction manual Figs. 1-6As shown, when the operation begins, press the control button 3 at the bottom front of the integrated display controller 1 to start the device. The control module inside the integrated display controller 1 will then run, and the display screen 2 at the top front will light up and display the initial measurement interface, completing the device startup preparation.
[0037] The required measurement parameters are set on the display screen 2 by controlling the button 3. After the parameter command is processed by the integrated display controller 1, it is transmitted to the signal sensing element 7 inside the probe outer cylinder 6 through the signal transmission line 4 and the probe connection end 5. The measuring contact 9 contacts the object being measured. The reaction force generated by the object is transmitted to the signal sensing element 7 through the probe inner core 8. The signal sensing element 7 converts the physical signal into an electrical signal and transmits it back to the integrated display controller 1 along the probe inner core 8 and the signal transmission line 4.
[0038] The other end of the signal transmission line 4 is connected to the probe connection end 5, and the probe connection end 5 is inserted into the probe outer cylinder 6. The inner wall of the connection port of the probe connection end 5 is provided with a positioning boss, and the outer wall of the mating part of the probe outer cylinder 6 is provided with a positioning groove that matches the positioning boss. The probe outer cylinder 6 and the probe connection end 5 are mated together. The connection between the probe outer cylinder 6 and the disassembly clamp 10 is provided with a thread, and the inner wall surface of the probe connection end 5 is engaged with the limiting buffer frame 11. A signal sensing element 7 is installed inside the probe outer cylinder 6, and the lower end of the signal sensing element 7 is the probe inner core 8. The signal sensing element 7 and the probe inner core 8 are electrically connected, and the signal sensing element 7 is connected to the signal transmission line 4. The signal transmission line 4 transmits signals to the integrated display controller 1. The bottom end of the probe inner core 8 is installed with... The probe has a measuring contact 9 and a disassembly clamp 10 is provided on the outer sleeve of the probe inner core 8. The disassembly clamp 10 is threaded to one end of the probe outer cylinder 6. The side wall of the disassembly clamp 10 has an L-shaped bracket, and the L-shaped bracket abuts against the outer wall of the probe outer cylinder 6. The upper end of the probe inner core 8 is nested with a limiting buffer frame 11, and a guide spring frame 12 is installed in the opening of the limiting buffer frame 11. The guide spring frame 12 is controlled by the signal sensing element 7. The limiting buffer frame 11 is set as an annular shape, and one connecting ring of the guide spring frame 12 is installed in the annular opening of the limiting buffer frame 11. The guide spring frame 12 includes one spring and two connecting rings. One of the two connecting rings is welded and fixed to the inner wall of the probe outer cylinder 6, while the other connecting ring is connected to the outer wall of the probe inner core 8.
[0039] Referring to the attached diagrams in the instruction manual Figs. 1-3 As shown, when the probe needs to be replaced, first rotate the mounting and dismounting clamp 10 to separate it from the probe outer cylinder 6, releasing the locking state between the two. Then, pull the probe inner core 8 and measuring contact 9 out of the probe connection end 5 to complete the disassembly of the old probe;
[0040] When replacing the probe, align the probe inner core 8 and the measuring contact 9 with the inside of the disassembly clamp 10, ensuring that the probe inner core 8 inside the disassembly clamp 10 is aligned with the signal sensing element 7. Next, insert the disassembly clamp 10 into the probe outer cylinder 6 to achieve precise alignment of all components. Then, rotate the disassembly clamp 10 in the reverse direction to lock it with the probe outer cylinder 6 via threads, completing the probe replacement. At this point, the probe outer cylinder 6, signal sensing element 7, probe inner core 8, and measuring contact 9 are connected in a circuit. The probe connection end 5 can receive all signals and transmit them to the integrated display controller 1 via the signal transmission line 4. During measurement, when the probe inner core 8 moves under reaction force, its outer guide spring frame 12 guides the movement direction and buffers the impact force through the connecting rings at both ends. Simultaneously, the annular limiting buffer frame 11 nested at the upper end of the probe inner core 8 limits the movement stroke to prevent component damage. Finally, the integrated display controller 1 processes and calculates the received electrical signals and displays the resulting hardness value on the display screen 2, completing a single measurement. Overall, it has strong practicality.
[0041] Working principle: When using this hardness timer with a modular probe for easy replacement, press the control button 3 on the lower front of the integrated display controller 1 to start the device. At this time, the internal control module of the integrated display controller 1 will operate, and the display screen 2 on the upper front will light up, displaying the initial measurement interface, completing the device startup preparation;
[0042] When the probe needs to be replaced, first rotate the disassembly clamp 10 to separate it from the probe outer cylinder 6. After rotation, the locking can be released. Then, pull out the probe inner core 8 and the measuring contact 9 from the probe connection end 5 to complete the disassembly. When replacing the new probe, align the probe inner core 8 and the measuring contact 9 with the disassembly clamp 10 and install them. Align the probe inner core 8 with the signal sensing element 7 inside the disassembly clamp 10. As the disassembly clamp 10 is inserted into the probe outer cylinder 6, precise alignment is achieved. By rotating the disassembly clamp 10 in the opposite direction, it is locked with the probe outer cylinder 6 by threads, and the probe replacement is completed. At this time, the probe outer cylinder 6, the signal sensing element 7, the probe inner core 8 and the measuring contact 9 are connected in the circuit. The probe connection end 5 receives all signals and transmits them to the integrated display controller 1 through the signal transmission line 4.
[0043] In use, measurement parameters are set on the display screen 2 via control button 3. After processing by the integrated display controller 1, these parameters are transmitted via signal transmission line 4 and probe connection end 5 to the signal sensing element 7 inside the probe outer cylinder 6. As the measuring contact 9 contacts the object being measured, the object's reaction force is transmitted to the signal sensing element 7 via the probe inner core 8. The signal sensing element 7 converts the physical signal into an electrical signal, which is then transmitted back to the integrated display controller 1 along the probe inner core 8 and signal transmission line 4. During measurement, when the probe inner core 8 moves under the reaction force, the outer guide spring frame 12 guides the movement direction and buffers the impact force through the connecting rings at both ends. Simultaneously, the annular limiting buffer frame 11 nested at the upper end of the probe inner core 8 limits the movement stroke to prevent component damage. Finally, the integrated display controller 1 processes and calculates the received electrical signal, displays the hardness value on the display screen 2, and completes a single measurement, increasing overall practicality.
[0044] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A hardness tester with a modular probe for easy replacement, comprising: An integrated display controller (1) is a housing structure for an internal integrated control module. The integrated display controller (1) is connected to the probe outer cylinder (6) via a signal transmission line (4) to form the basic structure of the hardness tester. The feature is that: a display screen (2) is embedded on the upper front of the integrated display controller (1), and a control button (3) is located on the lower front of the integrated display controller (1). The control button (3) is electrically connected to the control module inside the integrated display controller (1). A connection hole for docking with the signal transmission line (4) is provided on the upper end of the integrated display controller (1). The other end of the signal transmission line (4) is connected to the probe connection end (5), and the probe connection end (5) is inserted into the probe outer cylinder (6). The probe outer cylinder (6) is equipped with a signal sensing element (7), and the lower end of the signal sensing element (7) is a probe inner core (8). The bottom end of the probe inner core (8) is equipped with a measuring contact (9), and the probe inner core (8) is covered with a disassembly clamp (10). The disassembly clamp (10) is threadedly connected to one end of the probe outer cylinder (6). The upper end of the probe inner core (8) is nested with a limiting buffer frame (11), and a guide spring frame (12) is installed in the opening of the limiting buffer frame (11), and the guide spring frame (12) is protected by the signal sensing element (7).
2. A hardness tester with a modular probe for easy replacement according to claim 1, characterized in that: The inner wall of the connection port of the probe connection end (5) is provided with a positioning boss, and the outer wall of the docking part of the probe outer cylinder (6) is provided with a positioning groove that matches the positioning boss, and the probe outer cylinder (6) docks with the probe connection end (5).
3. A hardness tester with a modular probe for easy replacement according to claim 1, characterized in that: The probe outer cylinder (6) is threaded at the connection point with the disassembly clamp (10), and the inner wall of the probe connection end (5) is engaged with the limiting buffer frame (11).
4. A hardness tester with a modular probe for easy replacement according to claim 1, characterized in that: The signal sensing element (7) and the probe core (8) are electrically connected, and the signal sensing element (7) is connected to the signal transmission line (4), and the signal transmission line (4) transmits signals to the integrated display controller (1).
5. A hardness tester with a modular probe for easy replacement according to claim 1, characterized in that: The side wall of the disassembly clamp (10) has an L-shaped bracket, and the L-shaped bracket abuts against the outer wall of the probe outer cylinder (6).
6. A hardness tester with a modular probe for easy replacement according to claim 1, characterized in that: The limiting buffer frame (11) is configured as an annular shape, and the annular opening of the limiting buffer frame (11) is installed with one connecting ring of the guide spring frame (12).
7. A hardness tester with a modular probe for easy replacement according to claim 1, characterized in that: The guide spring frame (12) includes one spring and two connecting rings. One of the two connecting rings is welded and fixed to the inner wall of the probe outer cylinder (6), while the other connecting ring is connected to the outer wall of the probe inner core (8).