Capacitance test auxiliary device and capacitance test system

Abstract

The application relates to the technical field of capacitor testing, and provides a capacitor testing auxiliary device and a capacitor testing system. The capacitor testing auxiliary device comprises a bottom plate provided with a placement area for placing capacitors to be tested, the placement area extends along the length direction of the bottom plate to accommodate a plurality of capacitors to be tested; a plurality of groups of first probes are correspondingly arranged on the bottom plate, the first probes are connected with pins of the capacitors to be tested; a pressing plate is correspondingly provided with a plurality of groups of second probes; the pressing plate moves towards the bottom plate, so that the second probes are in contact with the pins of the capacitors to be tested. The capacitor testing auxiliary device provided by the application can effectively solve the problems of capacitor testing efficiency and easy generation of error data in the prior art, and improves the accuracy of capacitor detection.

Description

Technical Field

[0001] This application relates to the field of capacitance testing technology, and in particular to a capacitance testing auxiliary device and a capacitance testing system. Background Technology

[0002] In the field of capacitor performance testing, traditional testing methods often rely on manual operation with a multimeter. For example, when testing a supercapacitor, the capacitor to be tested is first placed on an insulated platform. The multimeter is set to the capacitor test mode, and the red and black probes are used to contact the positive and negative leads of the capacitor. After the readings stabilize, they are recorded. The probes are then removed, and the capacitor is charged using an external, monitorable positive DC power supply. The changes in the power supply data are observed. After charging is complete, the multimeter is switched to the DC voltage mode, and the voltage is recorded again by contacting the leads. After the capacitor has settled, the voltage test is repeated, and the data are compared.

[0003] However, this method has significant drawbacks: the testing process relies on repetitive manual operations, which are cumbersome, inefficient, and difficult to meet the needs of batch testing. Furthermore, prolonged repetitive manual operations can lead to fatigue, causing problems such as poor probe contact and data reading errors, significantly increasing the risk of misjudgment and limiting the accuracy and reliability of the test results. Utility Model Content

[0004] This application provides a capacitance testing auxiliary device to solve the problems of low capacitance testing efficiency and erroneous data generation in the prior art, thereby improving the accuracy of capacitance testing.

[0005] This application also provides a capacitance testing system.

[0006] According to an embodiment of the first aspect of this application, a capacitance testing auxiliary device includes:

[0007] The base plate has a placement area for placing the capacitors to be tested, the placement area extending along the length of the base plate to accommodate multiple capacitors to be tested; the base plate is correspondingly provided with multiple sets of first probes, the first probes being connected to the pins of the capacitors to be tested;

[0008] A pressure plate is fitted with multiple sets of second probes; the pressure plate moves toward the base plate so that the second probes contact the pins of the capacitor to be tested.

[0009] According to one embodiment of this application, a through hole is provided on the base plate, the first probe is installed in the through hole, and the upper end extends out of the upper part of the through hole to connect with the pin of the capacitor to be tested, and the lower end extends out of the lower part of the through hole to connect with a preset device.

[0010] The base plate has a limiting groove on the side where the capacitor to be tested is mounted. The limiting groove is connected to the through hole, so that the lower part of the first probe is located in the limiting groove, thereby restricting the first probe from rotating in the through hole.

[0011] According to one embodiment of this application, a guide post is provided on one of the base plate and the pressure plate, and a linear bearing is provided on the other. The guide post cooperates with the linear bearing to allow the pressure plate to move vertically and move closer to or away from the base plate.

[0012] According to one embodiment of this application, the second probe includes a first column and a second column, the second column being partially sleeved on the outside of the first column, and the first column and the second column being movable relative to each other;

[0013] The second column is provided with an elastic element, which abuts against the first column;

[0014] The free end of the first column is in contact with the pin of the capacitor to be tested;

[0015] The free end of the first column is provided with a puncture tip.

[0016] According to one embodiment of this application, the first probe is a clip-on probe.

[0017] According to one embodiment of this application, the capacitor to be tested includes two pins;

[0018] The first probes on the two pins are staggered, and / or the second probes on the two pins are staggered.

[0019] According to one embodiment of this application, the base plate and the pressure plate are made of glass fiber, polytetrafluoroethylene, bakelite, nylon or epoxy resin.

[0020] According to a second aspect of this application, a capacitance testing system includes a capacitance testing instrument and the aforementioned capacitance testing auxiliary device.

[0021] The first probe and the second probe are electrically connected to the capacitance testing instrument.

[0022] According to one embodiment of this application, the capacitance testing system further includes a charging module connected to the first probe for charging the capacitor under test.

[0023] The above-described one or more technical solutions in the embodiments of this application have at least one of the following technical effects:

[0024] The capacitance testing auxiliary device in this application has a placement area on the base plate to accommodate multiple capacitors to be tested. Multiple sets of first and second probes are configured for capacitance detection, significantly improving testing efficiency compared to the traditional method of testing a single capacitor using a multimeter. The first and second probes can simultaneously test the capacitors, improving accuracy and avoiding errors caused by the failure of one probe. Furthermore, the first and second probes can perform different types of tests separately, such as charging the capacitor with the first probe for aging testing, or detecting current or voltage with the second probe, thus improving the comprehensiveness of capacitance testing.

[0025] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0026] To more clearly illustrate the technical solutions in the embodiments or related technologies of this application, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0027] Figure 1 This is a schematic diagram of the capacitance testing auxiliary device provided in this application.

[0028] Figure 2 This is a schematic diagram of the structure of the pressure plate provided in this application (a second probe is installed on the pressure plate).

[0029] Figure 3 This is a partial structural schematic diagram of the capacitor to be tested provided in this application.

[0030] Figure 4 This is a partial structural schematic diagram of the capacitance testing auxiliary device provided in this application (a schematic diagram of the connection between the first probe, the second probe and the pins).

[0031] Figure 5 This is a schematic diagram of the connection structure of the first probe, the second probe and the pin provided in this application (the base plate is omitted).

[0032] Figure 6 This is a structural schematic diagram of the base plate provided in this application. Figure 1 (The capacitor to be tested is mounted on the base plate).

[0033] Figure 7 This is a structural schematic diagram of the base plate provided in this application. Figure 2 (The capacitor to be tested is not installed on the base plate).

[0034] Figure 8 This is a structural diagram of the placement area on the base plate provided in this application.

[0035] Figure 9 This is a schematic diagram of the installation of the first probe provided in this application.

[0036] Figure label:

[0037] 1. Base plate; 11. First probe; 111. Connecting end; 112. Lead-out end; 12. Placement area; 121. First recessed area; 122. Second recessed area; 123. Third recessed area; 13. Linear bearing; 14. Limiting block; 15. Support foot; 16. Through hole; 17. Limiting groove; 18. Operating empty area; 2. Pressure plate; 21. Second probe; 211. Puncture tip; 22. Guide post; 23. Micro switch; 24. Handle; 3. Capacitor to be tested; 31. Pin; 32. Tape material. Detailed Implementation

[0038] The embodiments of this application will be described in further detail below with reference to the accompanying drawings and examples. The following examples are used to illustrate this application, but should not be used to limit the scope of this application.

[0039] In the description of the embodiments of this application, it should be noted that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this application. In addition, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0040] In the description of the embodiments of this application, it should be noted that, unless otherwise explicitly specified and limited, the terms "connected" and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in the embodiments of this application based on the specific circumstances.

[0041] In the embodiments of this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0042] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., refer to specific features, structures, materials, or characteristics described in connection with that embodiment or example, which are included in at least one embodiment or example of the embodiments of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0043] Current capacitance testing devices have the following drawbacks: First, they use a point-to-point testing method, meaning only one capacitor is tested in each round, which fails to fully utilize the advantages of braided tape and results in low efficiency. Second, the probe plate has a densely packed pin design, making it prone to false triggers under uncertain disturbances, leading to a risk of misjudgment. Third, they use many rigid metal components and pneumatic transmission parts, resulting in high costs and relatively limited functionality. For production processes without large-scale capacitance testing needs, the cost-effectiveness ratio is not high.

[0044] A capacitance testing auxiliary device according to an embodiment of the first aspect of this application, such as Figures 1 to 9 As shown, the capacitor testing auxiliary device includes: a base plate 1, which has a placement area 12 for placing the capacitors 3 to be tested, the placement area 12 extending along the length of the base plate 1 to accommodate multiple capacitors 3 to be tested; a plurality of first probes 11 are correspondingly arranged on the base plate 1, the first probes 11 being connected to the pins 31 of the capacitors 3 to be tested; a pressure plate 2, which has a plurality of second probes 21 correspondingly installed; the pressure plate 2 moves toward the base plate 1, so that the second probes 21 contact the pins 31 of the capacitors 3 to be tested.

[0045] The specific number of the first probe 11 and the second probe 21 corresponds to the number of capacitors 3 to be tested, so as to meet the testing requirements of capacitors 3 to be tested.

[0046] The capacitance testing auxiliary device of this application has a placement area 12 extending along the length direction on the base plate 1. This placement area 12 can simultaneously accommodate multiple capacitors 3 to be tested, changing the limitation of traditional methods that can only test a single capacitor at a time. Multiple capacitors can be tested simultaneously in a single operation, significantly reducing the tedious manual steps of repeatedly placing capacitors and switching test leads during the testing process, and significantly improving the overall testing efficiency. Multiple sets of first probes 11 configured on the base plate 1 can contact and communicate with the pins 31 of the capacitors 3 to be tested after they are placed in the placement area 12. Similarly, multiple sets of second probes 21 installed on the pressure plate 2 will also contact the pins 31 of multiple capacitors 3 to be tested after the pressure plate 2 moves towards the base plate 1 to a preset position. The first probes 11 and second probes 21 form a dual detection channel. This structural design allows the first probes 11 and second probes 21 to test the same capacitor simultaneously. Through mutual verification of the detection data from both, deviations in the detection results caused by poor contact or abnormal performance of a single probe are effectively avoided, enhancing the reliability of the testing process and the accuracy of the detection results.

[0047] Furthermore, the first probe 11 and the second probe 21 can each undertake different types of detection tasks, forming a functional division of labor. For example, the first probe 11 can be connected to an external DC power supply to charge the capacitor for aging tests, evaluating the capacitor's performance stability during long-term charging and discharging. The second probe 21 can be connected to a measuring instrument to detect the capacitor's voltage, current, and other electrical parameters in real time, obtaining specific performance data of the capacitor under operating conditions. This multi-dimensional detection method can comprehensively cover the capacitor's charging and discharging characteristics, aging state, electrical parameters, and other key performance parameters, overcoming the shortcomings of traditional methods that only detect a single item, and enabling the test results to more objectively and fully reflect the capacitor's comprehensive performance.

[0048] A handle 24 can be provided on the pressure plate 2 to facilitate the operator's handling and movement of the pressure plate 2. In addition to manual operation, the pressure plate 2 can also be driven by electric or pneumatic methods, using a motor or cylinder to control its movement, improving operational convenience and stability. This is particularly suitable for batch testing or automated production line scenarios, continuously enhancing the device's practicality and adaptability in different application environments. Support feet 15 can be provided on the base plate 1, and the support feet 15 are fixedly connected to the base plate 1 by bolts.

[0049] According to one embodiment of this application, such as Figure 7 and Figure 8 As shown, the placement area 12 includes: a first recessed area 121 for accommodating the tape material 32 connected to the capacitor 3 to be tested; and a second recessed area 122, which communicates with the first recessed area 121 for accommodating the pins 31 of the capacitor 3 to be tested.

[0050] Of course, the placement area 12 may also include a third recessed area 123 for accommodating the capacitor body portion of the capacitor 3 to be tested.

[0051] In this embodiment, the placement area 12 adopts a connected structure of a first recessed area 121 and a second recessed area 122. The first recessed area 121 can accurately accommodate the tape material 32 connected to the capacitor 3 to be tested, and the second recessed area 122 is connected to the first recessed area 121 and can accommodate the pins 31 of the capacitor 3 to be tested. The first recessed area 121 and the second recessed area 122 form a dedicated placement space for the tape-packaged capacitor.

[0052] In actual testing, the tape 32 can be directly embedded in the first recessed area 121. The capacitor 3 to be tested is stably placed in the placement area 12 by the fixing effect of the tape 32, and the capacitor leads 31 naturally fall to the second recessed area 122. This eliminates the need for manual adjustment of the capacitor positions one by one, significantly reducing the clamping time for individual capacitors. This is particularly suitable for assembly line or batch testing scenarios, effectively improving the continuity and efficiency of the testing process. Simultaneously, the cooperation of the two recessed areas provides a limiting effect on the capacitor, ensuring that the capacitor leads 31 are precisely aligned with the first probe 11 on the base plate 1 and the second probe 21 on the pressure plate 2. This avoids poor probe contact or testing errors caused by capacitor misalignment or displacement, enhancing the stability of the testing process and the reliability of the results. Furthermore, the first and second recessed areas 121 and 122 also provide physical protection for the tape 32 and the capacitor, reducing interference from external contact or vibration during the testing process, further enhancing the practicality of the device.

[0053] In practical applications, adjustable limiting components can be provided in the first recessed area 121 and the second recessed area 122. For example, the width and depth of the recessed area can be adjusted by sliding guide rails or elastic buckles to accommodate different specifications of braided tape 32 (such as carrier tapes of different widths) and capacitors 3 under test with different pin spacing and lengths, thus broadening the applicability of the capacitor testing auxiliary device. A buffer pad layer (such as rubber or silicone material) can also be added inside the second recessed area 122 to provide elastic support while accommodating the pins 31, preventing deformation or damage to the pins 31 due to hard contact.

[0054] According to one embodiment of this application, such as Figure 4 and Figure 5As shown, the first probe 11 can be a clip-on probe. Exemplarily, the first probe 11 includes two metal plates, each metal plate having a connected connection end 111 and a lead-out end 112. The connection end 111 is connected to the pin 31 of the capacitor 3 under test, and the lead-out end 112 passes through the base plate 1 to be connected to a preset device. The lead-out ends 112 of the two metal plates are connected (not shown in the figure). In other words, the two metal plates can be an integral component to form a clip-on first probe 11. The connection end 111 is tilted to guide the pin 31 of the capacitor 3 under test into the second recessed area 122.

[0055] In this embodiment, the first probe 11 adopts a metal plate structure. The metal plate includes a connecting end 111 and a lead-out end 112. The connecting end 111 is inclined, which can automatically guide the capacitor pin 31 to the second recessed area 122 when the capacitor to be tested 3 is placed, forming a precise positioning guide for the pin 31. This changes the traditional operation method of manually aligning the pin 31 in the test. When the capacitor pin 31 contacts the inclined connecting end 111, it will naturally slide to the predetermined position of the second recessed area 122 under the guidance of the inclined surface. There is no need for the tester to manually adjust the angle or position of the pin 31, which significantly reduces the alignment time during the clamping process. It is especially suitable for capacitor types with long or dense pins 31, effectively improving the convenience and efficiency of the test operation.

[0056] The lead-out end 112 of the first probe 11 passes through the base plate 1 and is connected to the preset device, forming a stable signal transmission path. This ensures that the capacitance parameters can be accurately transmitted to the external measuring device, providing a structural basis for the reliability of subsequent detection data.

[0057] In practical applications, an elastic buffer layer (such as conductive rubber or a spring sheet) can be provided on the surface of the connection end 111 to provide a certain elastic contact force while guiding the pin 31, adapting to pins 31 of different lengths or degrees of curvature, and reducing damage to the pin 31 that may be caused by rigid contact. A limiting protrusion or groove can also be provided on the connection end 111 to cooperate with the second recessed area 122 to form a dual positioning of the pin 31, further improving the accuracy and stability of the pin 31 placement.

[0058] In this embodiment, two metal plates are symmetrically arranged along the second recessed area 122, forming an opposing guide and contact structure. The leads 112 of the two metal plates are connected; in other words, the two metal plates can be an integral component to form a clip-on first probe 11. During the placement of the lead 31 of the capacitor under test, the two symmetrically distributed metal plates can synchronously guide the lead 31 into the second recessed area 122 from both sides. The symmetrical geometric layout generates a balanced guiding force, ensuring that the lead 31 is accurately positioned along the central axis, avoiding skewness or offset caused by unilateral guidance, and significantly improving the accuracy and stability of the contact between the lead 31 and the probe. This symmetrical structure allows the lead 31 to be simultaneously constrained by the metal plates on both sides, forming a stable clamping state. It is particularly suitable for capacitors with long or narrow leads 31 or small spacing, effectively reducing the contact gap between the lead 31 and the metal plate, ensuring the reliability of the electrical connection, and avoiding signal distortion or data deviation caused by poor contact. Furthermore, the symmetrically arranged metal plates can evenly distribute the force on the pins 31, reducing the risk of pin 31 deformation caused by excessive pressure on one side, and maintaining stable contact performance during long-term testing, providing structural protection for the accurate acquisition of capacitance parameters.

[0059] According to one embodiment of this application, a through hole 16 is provided on the base plate 1, and a first probe 11 is installed in the through hole 16, with its upper end extending out of the upper part of the through hole 16 to connect with the pin 31 of the capacitor 3 to be tested, and its lower end extending out of the lower part of the through hole 16 to connect with a preset device; a limiting groove 17 is also provided on the side of the base plate 1 where the capacitor 3 to be tested is installed, and the limiting groove 17 communicates with the through hole 16, so that the lower part of the first probe 11 is located in the limiting groove 17, so as to restrict the first probe 11 from rotating in the through hole 16.

[0060] In this embodiment, the base plate 1 is provided with a through hole 16 and a metal plate (first probe 11) is installed therein. The connecting end 111 of the metal plate extends out of the upper part of the through hole 16 and is connected to the lead 31 of the capacitor to be tested. The lead-out end extends out of the lower part and is connected to a preset device. At the same time, the side of the base plate 1 where the capacitor is installed is provided with a limiting groove 17 that communicates with the through hole 16. The wall of the limiting groove 17 abuts against the two side walls of the metal plate to restrict its rotation in the through hole 16. The base plate 1 is provided with an operating space 18 that communicates with the limiting groove 17 to provide operating space for tweezers to pick up the first probe 11, forming a stable and easy-to-install probe connection structure.

[0061] Figure 9 In order to clearly show the structure of "through hole 16 + limiting groove 17 + operating empty area 18", the first probe 11 originally set in the through hole 16 is hidden. Figure 9 The first probe 11 on the left side is hidden, while the first probe 11 on the right side is retained.

[0062] The mechanical limiting effect of the limiting groove 17 ensures that the first probe 11 remains fixed in the through hole 16, preventing the connection end 111 from shifting or the pin 31 from making poor contact due to rotation. This ensures a reliable electrical connection between the capacitor pin 31 and the connection end 111 and stable signal transmission. The setting of the operating space 18 optimizes the installation convenience of the first probe 11. The testing personnel can accurately grasp the first probe 11 with tweezers and position it in the through hole 16. This is especially suitable for scenarios where the probe layout on the base plate 1 is dense or the size of the first probe 11 is small, significantly reducing the installation difficulty and improving assembly efficiency. Furthermore, the communication structure between the limiting groove 17 and the through hole 16 allows the first probe 11 to be partially embedded in the limiting groove 17 after installation. The surface contact between the groove wall and the first probe 11 enhances the fixing effect, making installation simple.

[0063] According to one embodiment of this application, a guide post 22 is provided on one of the base plate 1 and the pressure plate 2, and a linear bearing 13 is provided on the other. The guide post 22 cooperates with the linear bearing 13 to allow the pressure plate 2 to move vertically and move closer to or away from the base plate 1. Figure 1 , Figure 6 and Figure 7 As shown.

[0064] A guide post 22 and a linear bearing 13 are provided between the base plate 1 and the pressure plate 2 to form a stable guiding and moving mechanism.

[0065] When the guide post 22 is used in conjunction with the linear bearing 13, the guide post 22 provides vertical guidance for the movement of the pressure plate 2. The precise fit between the guide post 22 and the linear bearing 13 reduces the shaking and offset of the pressure plate 2 during movement, ensuring that the pressure plate 2 can move vertically and smoothly towards or away from the base plate 1. This keeps the second probe 21 on the pressure plate 2 vertically aligned with the pin 31 of the capacitor 3 to be tested on the base plate 1, avoiding probe wear or poor contact due to tilted contact, and ensuring the stability and reliability of the electrical connection during the testing process. The guide post 22 and the linear bearing 13 can be configured in 6 groups, located at the four corners of the pressure plate 2 and the base plate 1, and at the middle of the two long sides.

[0066] In practical applications, elastic buffer devices (such as springs or rubber dampers) can be added to the guide post 22 or slide rail to provide buffer protection when the pressure plate 2 moves to the contact position, avoiding probe damage or capacitor displacement caused by rigid collision. Of course, electric drive components (such as servo motors or cylinders) can also be integrated with the guide structure to automatically control the moving distance and pressure of the pressure plate 2 through the control system, realizing the automated operation of the detection process, which is especially suitable for batch detection scenarios on production lines.

[0067] According to one embodiment of this application, the second probe 21 includes a first column and a second column, the second column being partially sleeved on the outside of the first column, and the first column and the second column being movable relative to each other; an elastic element is provided inside the second column, and the elastic element abuts against the first column; the free end of the first column is in contact with the pin 31 of the capacitor 3 to be tested.

[0068] The second probe 21 adopts a sleeve structure of the first and second pillars. The second pillar is partially sleeved on the outside of the first pillar, and the two can move relative to each other. The elastic element set in the second pillar can abut against the first pillar, forming a contact structure with adaptive adjustment capability. During the test, when the pressure plate 2 moves the second probe 21, the free end of the first pillar contacts the pin 31 of the capacitor 3 under test. When there are slight differences in the height of different pins 31 or differences in the installation position of the second probe 21, the elastic element can adjust the extension length of the first pillar through its own deformation, so that multiple second probes 21 can synchronously abut against the pins 31 based on elastic force, avoiding the problem of some second probes 21 making poor contact or failing to contact the pins 31 due to installation accuracy deviation.

[0069] The structure of the second probe 21 significantly reduces the installation accuracy requirements for the second probe 21 and the clamping accuracy requirements for the capacitor 3 under test. Capacitance testing can be achieved without relying on high-precision machining or complex calibration, avoiding problems with poor probe contact. This is particularly suitable for scenarios involving simultaneous multi-probe testing, ensuring that each probe can form a stable electrical connection with the pin 31, improving the reliability and consistency of the testing process. Furthermore, the contact pressure provided by the elastic element can compensate for unevenness on the surface of the pin 31, ensuring the stability of electrical signal transmission and laying the foundation for accurate acquisition of capacitor electrical parameters.

[0070] In practical applications, the elastic element can be designed as a pressure-adjustable structure. By adjusting the compression of the elastic element or replacing components with different elastic coefficients (such as springs of different hardness), the contact pressure requirements of different pin materials or testing standards can be adapted. A guide groove or limiting boss can also be added between the first and second pillars to prevent radial offset during relative movement, further improving the stability of probe contact.

[0071] According to one embodiment of this application, such as Figure 4 and Figure 5 As shown, the free end of the first column is provided with a puncture tip 211.

[0072] The free end of the first post is equipped with a piercing tip 211, forming an active removal structure for the oxide layer of the pin 31. When an oxide layer forms on the surface of the pin 31 of the capacitor under test due to long-term storage or environmental influences, the planar contact method of traditional probes is prone to electrical connection failure or increased contact resistance due to the insulating properties of the oxide layer. However, the piercing tip 211 can directly pierce the oxide layer during the pressing of the pressure plate 2, relying on the contact pressure provided by the aforementioned elastic element, so that the first post can directly contact the internal metal substrate of the pin 31. This effectively avoids the interference of the oxide layer on the transmission of electrical signals and ensures a stable and low-impedance electrical connection between the second probe 21 and the pin 31.

[0073] The 211 puncture tip structure is particularly suitable for capacitance testing scenarios where the device is stored for a long time or used in environments prone to oxidation such as high humidity and high dust. It can significantly improve the reliability of the testing process and avoid data deviation or misjudgment caused by oxide layer problems.

[0074] In practical applications, the puncture tip 211 can be designed as a detachable structure, and different tips with different sharpness or hardness can be replaced according to the oxide layer thickness or the material of the pin 31 (such as tungsten carbide tips for high-hardness oxide layers), thereby improving the adaptability of the device to diverse detection scenarios.

[0075] According to one embodiment of this application, such as Figure 1 and Figure 7 As shown, a limiting block 14 is provided on the base plate 1, which is used to limit the distance between the base plate 1 and the pressure plate 2.

[0076] The limiting block 14 physically restricts the distance between the base plate 1 and the pressure plate 2, ensuring that the pressure plate 2 does not move excessively close to the base plate 1 during movement. This prevents the lead 31 of the capacitor under test from deforming or being damaged due to excessive pressure, providing reliable mechanical protection for the testing process. The limiting block 14 also ensures that the pressure plate 2 maintains a constant downward pressure distance when contacting the capacitor lead 31, ensuring uniform contact pressure between the second probe 21 and the lead 31. This avoids problems such as poor contact and unstable signal transmission caused by excessive or insufficient pressure, thereby improving the repeatability and accuracy of the test results. Furthermore, the limiting block 14 simplifies the operation process. Testers do not need to manually control the movement distance of the pressure plate 2; standardized probe contact actions can be achieved through the preset position of the limiting block 14, reducing the impact of human error on the testing process. This is particularly suitable for maintaining consistency in testing conditions during batch testing.

[0077] In some cases, snap-fit ​​fastening components can be installed at the edges of the base plate 1 and the pressure plate 2. After the base plate 1 and the pressure plate 2 are pressed into place, the snap-fit ​​fastening components act as limiters, preventing the base plate 1 and the pressure plate 2 from separating and locking them together. This ensures that the second probe 21 mounted on the pressure plate 2 makes good contact with the pin 31 of the capacitor 3 to be tested mounted on the base plate 1, ensuring the accuracy of the capacitance test results. Furthermore, the snap-fit ​​fastening components can be used in conjunction with limit blocks to precisely limit the relative position of the pressure plate 2 and the base plate 1.

[0078] In practical applications, the height of the limit block 14 can be flexibly adjusted through transmission mechanisms such as threaded connection, slider slot or gear rack to adapt to different capacitors 3 to be tested or second probes 21 of different specifications.

[0079] According to one embodiment of this application, such as Figure 4 and Figure 5 As shown, the capacitor to be tested 3 includes two pins 31; the first probes 11 on the two pins 31 are staggered, and / or the second probes 21 on the two pins 31 are staggered.

[0080] The first probe 11 and the second probe 21 are staggered to form an asymmetrical probe layout structure, which effectively increases the spatial distance between adjacent probes and avoids contact between conductive parts or insufficient insulation spacing caused by probes being too close together. This significantly reduces the risk of short circuits during the detection process and improves the safety and reliability of the device.

[0081] In practical testing scenarios, the spacing of capacitor pins 31 may vary depending on the model. The staggered probe layout can accommodate variations in pin 31 spacing within a certain range, eliminating the need for separate probe layout designs for each spacing and enhancing the compatibility of the capacitor testing auxiliary device with capacitors of different specifications. Furthermore, the staggered probe layout provides more operating space for the pins 31 and the probes, reducing the risk of accidental probe contact due to human touch or component installation deviations during testing, further ensuring the stability of the testing process.

[0082] In practical applications, insulating isolation components (such as insulating partitions or insulating sleeves) can be used to wrap the base of the second probe 21. By increasing the insulating material, electrical insulation between adjacent second probes 21 can be ensured, thereby achieving a better short-circuit protection effect.

[0083] According to one embodiment of this application, the base plate 1 and the pressure plate 2 are made of glass fiber, polytetrafluoroethylene, bakelite, nylon, or epoxy resin. The aforementioned materials (e.g., glass fiber) have good insulation and thermal stability.

[0084] In this application, the base plate 1 and the pressure plate 2 are made of polytetrafluoroethylene, nylon, or epoxy resin, forming a main structure that combines excellent insulation performance with reliable mechanical strength. These materials can maintain stable insulation in high humidity, highly corrosive, or extreme temperature environments, preventing interference with the detection signal or short circuit risks caused by conductivity or moisture in the base plate 1 and pressure plate 2. This makes them suitable for high-precision capacitance detection or long-term use in harsh environments.

[0085] Of course, the above materials can be composited or other materials can be used according to actual needs. For example, glass fiber can be added to nylon to form reinforced nylon material, which further improves mechanical strength and dimensional stability, making it suitable for heavy-duty or high-precision testing scenarios; thermally conductive fillers can be filled into epoxy resin to improve the heat dissipation performance of base plate 1 and pressure plate 2, avoiding material aging or testing errors caused by local heating during capacitor testing; the surface of polytetrafluoroethylene can also be hydrophilically treated to optimize its bonding stability with the capacitor 3 to be tested, reducing capacitor displacement problems caused by the smoothness of the material surface. FR-4 glass fiber epoxy resin board can be used as the material for base plate 1 and pressure plate 2; ABS engineering plastic can also be used.

[0086] The capacitor-assisted testing device provided in this application can improve the production capacity and cost-effectiveness ratio, solve the problems of low production testing efficiency and inability to store and trace test data, prevent mistakenly burning out the testing device or the capacitor under test, ensure the safety of testing personnel, prevent test misjudgments, and intercept potential product quality problems. It can effectively reduce the size of the device, making it easy to stack on an aging vehicle for batch aging tests; and it can switch between various capacitor testing methods to meet diverse needs.

[0087] According to a second aspect embodiment of this application, a capacitance testing system includes a capacitance testing instrument and the aforementioned capacitance testing auxiliary device; a first probe 11 and a second probe 21 are electrically connected to the capacitance testing instrument. Figure 5 As shown, the first probe 11 (two metal plates) and the second probe 21 at the left pin 31 can be connected together to the negative terminal of the capacitance tester; the first probe 11 (two metal plates) and the second probe 21 at the right pin 31 can be connected together to the positive terminal of the capacitance tester.

[0088] The capacitance testing system provided in this application embodiment electrically connects the capacitance testing auxiliary device with the capacitance testing instrument (such as a standard voltmeter, standard ammeter, etc.) to form a complete capacitance performance testing link. The base plate 1 of the capacitance testing auxiliary device is provided with a placement area 12 for accommodating multiple capacitors 3 to be tested and is equipped with multiple sets of first probes 11 and second probes 21, which can simultaneously realize the batch clamping and contact of multiple capacitors 3 to be tested with the probes. The capacitance testing instrument, through electrical connection with the first probes 11 and the second probes 21, can collect the electrical parameters of the capacitor (such as capacitance value, voltage, current, etc.) in real time and perform analysis and processing.

[0089] The capacitance testing system provided in this application embodiment changes the inefficient mode of single-point connection between the instrument and the capacitor in traditional manual testing. By utilizing the automated probe contact structure of the capacitance testing auxiliary device, the signal connection time between the testing instrument and the capacitor is significantly shortened, especially in batch testing, where it can significantly improve overall testing efficiency. Simultaneously, the dual-contact design of the first probe 11 and the second probe 21 in the auxiliary device (such as simultaneous testing or separate execution of charging and electrical parameter measurements), combined with the high-precision acquisition function of the capacitance testing instrument, can cover multiple performance indicators such as the capacitor's charging and discharging characteristics, aging state, and leakage current, avoiding detection blind spots caused by a single probe or single instrument function, making the test results more comprehensive and objective.

[0090] A micro switch 23 can also be installed on the capacitance testing auxiliary device to control the connection and disconnection of the voltmeter and ammeter circuits.

[0091] According to one embodiment of this application, the capacitance testing system further includes a charging module connected to the first probe 11 for charging the capacitor 3 to be tested.

[0092] The charging module is connected to the first probe 11 to form a built-in charging structure for the capacitor 3 under test. It can directly provide a stable DC power input to the capacitor pin 31 through the first probe 11 without relying on external temporary wiring or manual connection of charging equipment, which significantly simplifies the charging operation process.

[0093] During the testing process, the charging module can automatically charge the capacitor 3 under test according to preset charging parameters (such as voltage, current, and time). This is especially suitable for scenarios that require evaluation of capacitor charging and discharging performance or aging characteristics. For example, in aging tests, the charging module continuously provides a stable current to the capacitor to simulate long-term working conditions. In conjunction with the second probe 21 and the capacitor testing instrument, the voltage changes can be monitored in real time, and key parameters such as the internal resistance and leakage current of the capacitor during the charging process can be comprehensively analyzed. This avoids wiring errors or charging instability caused by manual external power supply in traditional methods.

[0094] This integrated design synchronizes the charging and testing processes, reducing interruptions and manual interventions in the testing steps, improving the continuity and efficiency of the testing process. At the same time, the fixed connection of the first probe 11 ensures the stability of the charging signal transmission, avoiding charging abnormalities or data fluctuations caused by poor contact of external wires.

[0095] The charging module can be in the form of adjustable parameters, and the charging voltage, current and charging cut-off conditions (such as voltage reaching the rated value, charging time exceeding the time limit, etc.) can be dynamically set through knobs, buttons or control systems to adapt to the capacitors under test with different rated voltages and capacities (such as farad capacitors, electrolytic capacitors, etc.), thus broadening the application range of the capacitor testing system.

[0096] The capacitance testing system provided in this application embodiment includes the following steps in its testing method:

[0097] 1. Separate the pressure plate 2 of the handheld part from the base plate 1, and place the test material (i.e., the capacitor to be tested 3) with an appropriate tape length and a reasonable number of capacitors in the base plate 1 in the placement area 12. Note that after the test material is placed stably, all the supercapacitors to be tested in the test material should be placed exactly on the tray at the corresponding position of each capacitor, and the positive and negative leads 31 of the capacitors should be just lifted by the first probe 11 of the corresponding test position.

[0098] 2. The linear guide post 22 fixed on the hand-held pressure plate 2 and the linear bearing 13 fixed on the base plate 1 cooperate with each other. At this time, the hand-held pressure plate 2 and the base plate 1 can move smoothly up and down through the sliding guide structure composed of "linear guide post 22 + linear bearing 13".

[0099] 3. Press the pressure plate 2 and the base plate 1 together, and use the edge hinges to lock the two parts of the pressure plate 2 and the base plate 1. At this time, the second probe 21 should be in close contact with the positive and negative leads 31 of the capacitor.

[0100] IV. If no aging test is required, simply connect the capacitance testing auxiliary device to a standard farad capacitance testing instrument. The instrument controls the auxiliary device to charge and discharge the capacitor. The readings on the instrument determine whether the material meets the requirements. If aging testing is required, connect the auxiliary device to the standard farad capacitance testing instrument, then connect the auxiliary device to a dedicated aging test chamber. Set the parameters of the aging chamber as needed, such as temperature, humidity, and time. After aging is complete, the readings on the instrument determine whether the material meets the requirements.

[0101] 5. Remove the test capacitor tape and discard any defective products from tape 32 to complete the testing process.

[0102] Finally, it should be noted that the above embodiments are only used to illustrate this application and are not intended to limit this application. Although this application has been described in detail with reference to the embodiments, those skilled in the art should understand that various combinations, modifications, or equivalent substitutions of the technical solutions of this application do not depart from the spirit and scope of the technical solutions of this application and should be covered within the scope of the claims of this application.

Claims

1. A capacitance testing auxiliary device, characterized in that, include: The base plate (1) is provided with a placement area (12) for placing the capacitor (3) to be tested. The placement area (12) extends along the length of the base plate (1) to accommodate multiple capacitors (3) to be tested. The base plate (1) is provided with multiple sets of first probes (11), and the first probes (11) are connected to the pins (31) of the capacitor (3) to be tested. The pressure plate (2) is equipped with multiple sets of second probes (21); the pressure plate (2) moves toward the base plate (1) so that the second probes (21) contact the pins (31) of the capacitor (3) to be tested.

2. The capacitance testing auxiliary device according to claim 1, characterized in that, The base plate (1) is provided with a through hole (16), the first probe (11) is installed in the through hole (16), and the upper end extends out of the upper part of the through hole (16) to connect with the pin (31) of the capacitor (3) to be tested, and the lower end extends out of the lower part of the through hole (16) to connect with the preset device. The base plate (1) is provided with a limiting groove (17) on the side where the capacitor (3) to be tested is installed. The limiting groove (17) is connected to the through hole (16) so that the lower part of the first probe (11) is located in the limiting groove (17) to restrict the first probe (11) from rotating in the through hole (16).

3. The capacitance testing auxiliary device according to claim 1, characterized in that, One of the base plate (1) and the pressure plate (2) is provided with a guide post (22), and the other is provided with a linear bearing (13). The guide post (22) cooperates with the linear bearing (13) to make the pressure plate (2) move vertically and move closer to or away from the base plate (1).

4. The capacitance testing auxiliary device according to claim 1, characterized in that, The second probe (21) includes a first column and a second column, the second column being partially sleeved on the outside of the first column, and the first column and the second column being movable relative to each other; The second column is provided with an elastic element, which abuts against the first column; The free end of the first column is in contact with the pin (31) of the capacitor (3) to be tested; The free end of the first column is provided with a puncture tip (211).

5. The capacitance testing auxiliary device according to claim 1, characterized in that, The first probe (11) is a clip-on probe.

6. The capacitance testing auxiliary device according to any one of claims 1 to 5, characterized in that, The capacitor to be tested (3) includes two pins (31); The first probes (11) on the two pins (31) are staggered, and / or the second probes (21) on the two pins (31) are staggered.

7. The capacitance testing auxiliary device according to any one of claims 1 to 5, characterized in that, The base plate (1) and the pressure plate (2) are made of glass fiber, polytetrafluoroethylene, bakelite, nylon or epoxy resin.

8. A capacitance testing system, characterized in that, Includes a capacitance testing instrument and a capacitance testing auxiliary device as described in any one of claims 1 to 7; The first probe (11) and the second probe (21) are electrically connected to the capacitance testing instrument.

9. The capacitance testing system according to claim 8, characterized in that, It also includes a charging module, which is connected to the first probe (11) and is used to charge the capacitor (3) to be tested.

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