A multi-channel chip testing mechanism

Abstract

The utility model relates to chip testing technical field, concretely relates to a kind of multi-channel chip testing mechanism, including workstation, workstation test assembly, test assembly includes test seat, multiple feeding channel ports are equipped on test seat circumferentially distribution, each feeding channel port place respectively has the feeding conveyor for conveying chip loading, and still be equipped with transfer receiving assembly, transfer receiving assembly is located at the collection of multiple feeding conveyor, for receiving chip from the feeding conveyor to be detected, and moving its power device to test assembly place. By multiple feeding channel ports circumferentially distribution in test seat, and make each channel respectively communicate independent feeding conveyor, multi-channel parallel loading, and single-channel independent replenishment operation mode is realized, when the chip test of certain channel is completed, other staff can carry out the re-feeding of this channel under the condition that equipment does not stop, reduce downtime, improve work efficiency.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically to a multi-channel chip testing mechanism. Background Technology

[0002] Chip testing refers to a series of testing activities, such as functional testing, reliability testing, performance testing, and power consumption testing, performed on integrated circuit chips. These tests can verify whether the chip's design and manufacturing meet the specifications, ensuring the chip's quality and performance. The main goal of chip testing is to discover potential problems and defects that may occur during chip use, so that the design can be repaired or adjusted in a timely manner.

[0003] For example, Chinese utility model patent with publication number CN217060401U discloses a chip testing device with automatic conveying function. A testing frame is fixedly connected to the upper end of the testing platform. A cylinder is fixedly connected to the upper inner side wall of the testing frame. A moving stage is fixedly connected to the telescopic end of the cylinder. Slide grooves corresponding to the moving stage are opened on the opposite inner side walls of the testing frame. A sliding rod is fixedly connected in the slide groove. A sliding opening corresponding to the sliding rod is provided on the moving stage. A mounting frame is fixedly connected to the bottom of the moving stage. A testing head body is provided at the bottom of the mounting frame. Fixed sleeves are fixedly connected to both ends of the mounting frame. A fixing mechanism is provided in the fixed sleeves. A conveyor belt is provided at the upper end of the testing platform. A chip body corresponding to the testing head body is provided at the upper end of the conveyor belt.

[0004] The aforementioned chip testing equipment with automatic conveying function only transports the chips to be tested through a single conveyor belt, requiring the machine to be stopped and wait for reloading, resulting in low work efficiency. Summary of the Invention

[0005] In view of the above-mentioned technical problems in the existing technology, this utility model provides a multi-channel chip testing mechanism.

[0006] To achieve the above objectives, this utility model provides the following technical solution:

[0007] A multi-channel chip testing mechanism is provided, including a worktable with a testing component for testing chips. The testing component includes a test holder with multiple feed channels distributed circumferentially along the test holder, and each feed channel is connected to a feeding conveyor for feeding chips. The worktable also includes a transfer receiving component located at the convergence point of the multiple feeding conveyors. The transfer receiving component includes a receiving device for receiving chips to be tested one by one from the feeding conveyors, and a power device for driving the receiving device and moving the chips on the receiving device to the testing component.

[0008] Preferably, the receiving device includes a base plate, a rotating shaft on the top of the base plate and a mounting plate arranged opposite to it, multiple rotating shafts arranged along the length direction of the mounting plate, and a conveyor belt wound on the multiple rotating shafts; it also includes a first drive motor, the output shaft of the first drive motor being drivenly connected to one of the rotating shafts.

[0009] Preferably, the power unit includes a bearing seat located within the worktable, a lifting cylinder rotatably mounted on the bearing seat, the output shaft of the lifting cylinder extending out of the worktable and connected to the base plate; it also includes a rotating component for driving the lifting cylinder to rotate circumferentially around the bearing seat, the rotating component including a second drive motor, the output shaft of the second drive motor being fitted with a drive gear, and the main body of the lifting cylinder being fitted with a driven gear meshing with the drive gear.

[0010] Preferably, the feeding and conveying device includes a first support frame, a first belt conveyor is provided on the top of the first support frame, a chip placement seat is placed on the first belt conveyor, and the chip to be tested is placed in the chip placement seat; the conveying surface of the first belt conveyor is provided with limiting protrusions, two limiting protrusions extend along the conveying direction of the first belt conveyor, and the chip placement seat is located between the two limiting protrusions.

[0011] Preferably, the chip placement base has multiple chip slots along its height for placing chips, and the chip slots are arranged linearly with their sizes decreasing from top to bottom; the top of the test base has a through hole slightly larger than the chip placement base, so that after the relay receiving component receives the chip placement base, the top of the chip placement base can pass through the through hole to exit the test base.

[0012] Preferably, the chip placement base has outwardly extending pins at both ends, and the test claws are provided on the inner wall of the test base through the perforation corresponding to the pin positions; when the top of the chip placement base protrudes through the perforation of the test base, the pins are in contact with the test claws.

[0013] Preferably, the testing assembly further includes a pressing device, which includes a mounting frame with a first fixed plate on the mounting frame. The first fixed plate has a pressing member, which includes a drive rod, a connecting rod, a first pressing rod, and a second pressing rod. One end of the drive rod is hinged to the first fixed plate. The first pressing rod is located below the drive rod and is connected to the drive rod through the connecting rod. The second pressing rod is located at the bottom of the first pressing rod and is used to press the chip placed in the chip slot. The assembly also includes a guide sleeve, which is mounted on the first fixed plate and sleeved on the first pressing rod to guide the first pressing rod to make linear movements.

[0014] Preferably, the cross-sectional dimensions of the second pressure bar are adapted to the slot size of the smallest chip slot in the chip placement seat.

[0015] Preferably, the test assembly further includes a visual positioning device, which includes a second fixed plate and a positioning camera. The second fixed plate is fixedly mounted on the mounting bracket, and the positioning camera is rotatably mounted on the second fixed plate.

[0016] Preferably, the test stand is also provided with a discharge channel, which is connected to a feeding conveyor; the feeding conveyor includes a second support frame and a second belt conveyor located on top of the second support frame.

[0017] The beneficial effects of this utility model are:

[0018] This utility model discloses a multi-channel chip testing mechanism. By distributing multiple feeding channels around the test socket and connecting each channel to an independent feeding and conveying device, it achieves a multi-channel parallel feeding and single-channel independent replenishment operation mode. When the chip testing of a certain channel is completed, other personnel can re-feed the chip in that channel without stopping the equipment, while the other channels continue to be tested, reducing downtime and improving work efficiency. Attached Figure Description

[0019] Figure 1 This is a three-dimensional view of a multi-channel chip testing mechanism in one of the embodiments.

[0020] Figure 2 This is a perspective view of the relay receiving component in the embodiment.

[0021] Figure 3 This is a perspective view of the receiving device in the embodiment.

[0022] Figure 4 A perspective view of the pressing device in the embodiment.

[0023] Figure 5 This is a perspective view of the feeding and unloading conveying devices in the embodiment.

[0024] Figure 6 for Figure 5 Enlarged view of point A in the middle.

[0025] Figure 7 This is a perspective view of the chip placement bracket in the embodiment.

[0026] Reference numerals: 1. Workbench; 10. Receiving device; 100. Base plate; 101. Rotating shaft; 102. Mounting plate; 103. Conveyor belt; 104. First drive motor; 11. Power unit; 110. Shaft seat; 111. Lifting cylinder; 112. Second drive motor; 113. Driving gear; 114. Driven gear; 2. Test assembly; 20. Test seat; 201. Feed channel; 202. Perforation; 203. Discharge channel; 21. Pressing device; 211. Mounting frame 212. First fixing plate; 213. Drive rod; 214. Connecting rod; 215. First pressure rod; 216. Second pressure rod; 217. Guide sleeve; 22. Visual positioning device; 221. Second fixing plate; 222. Positioning camera; 3. Feeding conveyor; 30. First support frame; 31. First belt conveyor; 32. Limiting protrusion; 4. Discharging conveyor; 40. Second support frame; 41. Second belt conveyor; 5. Chip placement seat; 50. Chip slot; 51. Pin. Detailed Implementation

[0027] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0028] This embodiment provides a multi-channel chip testing mechanism, such as... Figures 1 to 7 As shown, the device includes a workbench 1, on which a test assembly 2 for testing chips is provided. The test assembly 2 includes a test base 20, on which a feed channel 201 is provided. Multiple feed channels 201 are distributed around the test base 20, and each feed channel 201 is connected to a feeding conveyor 3 for conveying chips.

[0029] In addition, a transfer receiving component is provided on the workbench 1. The transfer receiving component is located at the convergence point of multiple feeding conveyors 3. It is used to receive the chips to be tested from the feeding conveyors 3 one by one. After the transfer receiving component receives the chip to be tested, it can move the chip to be tested to the test component 2, and then test the chip through the test component 2.

[0030] Furthermore, the transfer receiving component includes a receiving device 10 for receiving chips to be tested one by one from the feeding conveyor 3. The receiving device 10 includes a base plate 100, a rotating shaft 101 and a mounting plate 102 arranged opposite to it on the top of the base plate 100. Multiple rotating shafts 101 are arranged along the length direction of the mounting plate 102, and a conveyor belt 103 is wound around the multiple rotating shafts 101. In addition, the receiving device 10 also includes a first drive motor 104. The output shaft of the first drive motor 104 is connected to one of the rotating shafts 101. When the first drive motor 104 rotates, the first drive motor 104 can drive the rotating shaft 101 to rotate, thereby driving the conveyor belt 103 on the rotating shaft 101 to move, so that after the receiving device 10 receives the chip to be tested, it can drive the chip to be tested to move to a predetermined position.

[0031] Furthermore, the relay receiving component also includes a power unit 11 for driving the receiving device 10 and moving the chip on the receiving device 10 to the testing component 2. The power unit 11 includes a bearing 110 disposed in the worktable 1, and a lifting cylinder 111 is rotatably mounted on the bearing 110. The output shaft of the lifting cylinder 111 extends out of the worktable 1 and is connected to the base plate 100. When the receiving device 10 receives the chip to be tested, the lifting cylinder 111 can drive the receiving device 10 to rise, thereby moving the chip to be tested to the testing component 2.

[0032] In addition, the power unit 11 also includes a rotating component for driving the lifting cylinder 111 to rotate circumferentially around the shaft seat 110. The rotating component includes a second drive motor 112, with a drive gear 113 sleeved on the output shaft of the second drive motor 112, and a driven gear 114 meshing with the drive gear 113 sleeved on the main body of the lifting cylinder 111. By setting the rotating component, when one of the feeding conveyors 3 has finished feeding, the rotating component can drive the lifting cylinder 111 to rotate around the shaft seat 110, so that the receiving device 10 can receive the chips from other feeding conveyors 3.

[0033] Furthermore, the feeding and conveying device 3 includes a first support frame 30, and a first belt conveyor 31 is provided on the top of the first support frame 30. A chip placement seat 5 is placed on the first belt conveyor 31, and the chip to be tested is placed in the chip placement seat 5. It should be noted that the chip placement seat 5 has multiple chip slots 50 for placing chips along its height direction. The chip slots 50 are arranged linearly and their size decreases from top to bottom. This design allows the chip placement seat 5 to adapt to chips of different sizes, improving the practicality of the device.

[0034] In addition, the conveying surface of the first belt conveyor 31 is provided with limiting protrusions 32, and the two limiting protrusions 32 extend along the conveying direction of the first belt conveyor 31. The chip placement seat 5 is located between the two limiting protrusions 32. This design can prevent the chip placement seat 5 from shifting laterally during the conveying process, so that it always travels stably along the conveying direction of the first belt conveyor 31.

[0035] In use, after the chip holder 5 containing the chip is conveyed to the receiving device 10 by the first belt conveyor 31, the power unit 11 drives the chip holder 5 to move upward, causing part of the chip holder 5 to pass through the test holder 20. In order to allow the chip holder 5 to pass smoothly through the test holder 20, a through hole 202 is provided at the top of the test holder 20, and the size of this through hole 202 is slightly larger than the size of the chip holder 5.

[0036] In addition, the chip placement base 5 has outwardly extending pins 51 at both ends. The inner wall of the through hole 202 of the test base 20 is provided with test claws corresponding to the pins 51. When the top of the chip placement base 5 passes through the through hole 202 and exits the test base 20, the pins 51 contact the test claws to achieve an electrical connection between the chip and the test base 20.

[0037] Furthermore, the test assembly 2 also includes a pressing device 21, which is used to apply downward pressure to the chip placed in the chip placement seat 5 after the chip placement seat 5 extends out of the test seat 20, so as to prevent the chip placement seat 5 from shaking due to equipment shaking, thereby causing test failure.

[0038] The pressing device 21 includes a mounting frame 211 mounted on the worktable 1. A first fixing plate 212 is provided on the mounting frame 211, and a pressing member is provided on the first fixing plate 212. The pressing member includes a drive rod 213, a connecting rod 214, a first pressing rod 215, and a second pressing rod 216. One end of the drive rod 213 is hinged to the first fixing plate 212. The first pressing rod 215 is located below the drive rod 213 and is connected to the drive rod 213 through the connecting rod 214. The second pressing rod 216 is located at the bottom of the first pressing rod 215 and is used to press the chip placed in the chip slot 50. It should be noted that the cross-sectional dimensions of the second pressing rod 216 are adapted to the slot opening size of the smallest chip slot 50 in the chip placement seat 5 so that it can press the chip in the smallest chip slot 50.

[0039] In addition, the pressing device 21 also includes a guide sleeve 217, which is disposed on the first fixed plate 212, and the first pressing rod 215 passes through the guide sleeve 217 along the height direction of the guide sleeve 217. With this design, when the driving rod 213 drives the first pressing rod 215 to move, the first pressing rod 215 can make linear motion under the action of the guide sleeve 217.

[0040] Furthermore, the test assembly 2 also includes a visual positioning device 22, which includes a second fixing plate 221 and a positioning camera 222. The second fixing plate 221 is fixedly mounted on the mounting bracket 211, and the positioning camera 222 is rotatably mounted on the second fixing plate 221 with its lens facing the test base 20. In this design, when the receiving device 10 receives the chip placement base 5, the positioning camera 222 identifies the position of the chip placement base 5 and sends a signal to the receiving device 10 and the power device 11 to drive the receiving device 10 and the power device 11 to correct the position of the chip placement base 5, so that it can smoothly pass through the through hole 202 of the test base 20.

[0041] Furthermore, the multi-channel chip testing mechanism also includes a feeding conveyor 4 for unloading the chip after testing. The feeding conveyor 4 includes a second support frame 40 and a second belt conveyor 41 located on top of the second support frame 40. The test stand 20 is also provided with a discharge channel 203, which is connected to the feeding conveyor 4. In use, after the chip in the chip placement seat 5 has completed testing, the power unit 11 of the transfer receiving component drives the receiving device 10 to remove the chip placement seat 5 from the through hole 202 of the test stand 20. Then, it drives the lifting cylinder 111 to rotate so that the receiving device 10 is aligned with the discharge channel 203 of the test stand 20. Finally, the first drive motor 104 in the receiving device 10 drives the rotating shaft 101 to rotate. The rotation of the rotating shaft 101 drives the conveyor belt 103 to run, conveying the chip placement seat 5 from the discharge channel 203 to the second belt conveyor 41, which then conveys it to the unloading station.

[0042] In the description of this utility model, it is obvious that the described embodiments are only a part of the embodiments of this utility model, and not all of them. The components of the embodiments of this utility model described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0043] Therefore, the above detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0044] In the description of this utility model, it should be noted that the terms "middle," "upper," "lower," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product is in use. They are used only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first," "second," etc., are only used to distinguish descriptions and should not be construed as indicating or implying relative importance.

[0045] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "set," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection. They can refer to a mechanical connection or an electrical connection. They can refer to a direct connection or an indirect connection through an intermediate medium, or a connection within two components. For those skilled in the art, the specific meaning of the above terms in this utility model can be understood according to the specific circumstances.

Claims

1. A multi-channel chip testing mechanism, characterized in that, The system includes a workbench (1), on which a test assembly (2) for testing chips is provided. The test assembly (2) includes a test stand (20), on which a feeding channel (201) is provided. Multiple feeding channels (201) are distributed around the test stand (20), and each feeding channel (201) is connected to a feeding conveyor (3) for feeding chips. The workbench (1) is also provided with a transfer receiving assembly, which is located at the convergence point of multiple feeding conveyors (3). The transfer receiving assembly includes a receiving device (10) for receiving chips to be tested from the feeding conveyors (3) one by one, and a power device (11) for driving the receiving device (10) and moving the chips on the receiving device (10) to the test assembly (2).

2. The multi-channel chip testing mechanism according to claim 1, characterized in that, The receiving device (10) includes a base plate (100), the top of which is provided with a rotating shaft (101) and a mounting plate (102) arranged opposite to it. Multiple rotating shafts (101) are arranged along the length direction of the mounting plate (102), and a conveyor belt (103) is wound around the multiple rotating shafts (101). It also includes a first drive motor (104), the output shaft of which is connected to one of the rotating shafts (101) in a transmission connection.

3. The multi-channel chip testing mechanism according to claim 2, characterized in that, The power unit (11) includes a bearing seat (110) located in the workbench (1), a lifting cylinder (111) rotatably mounted on the bearing seat (110), and the output shaft of the lifting cylinder (111) passing through the workbench (1) and connected to the base plate (100); it also includes a rotating component for driving the lifting cylinder (111) to rotate circumferentially around the bearing seat (110), the rotating component including a second drive motor (112), the output shaft of the second drive motor (112) being fitted with a drive gear (113), and the main body of the lifting cylinder (111) being fitted with a driven gear (114) meshing with the drive gear (113).

4. The multi-channel chip testing mechanism according to claim 1, characterized in that, The feeding and conveying device (3) includes a first support frame (30), a first belt conveyor (31) is provided on the top of the first support frame (30), a chip placement seat (5) is placed on the first belt conveyor (31), and the chip to be tested is placed in the chip placement seat (5); the conveying surface of the first belt conveyor (31) is provided with limiting protrusions (32), the two limiting protrusions (32) extend along the conveying direction of the first belt conveyor (31), and the chip placement seat (5) is located between the two limiting protrusions (32).

5. A multi-channel chip testing mechanism according to claim 4, characterized in that, The chip placement base (5) has multiple chip slots (50) for placing chips along the height direction. The chip slots (50) are arranged linearly and their size decreases from top to bottom. The top of the test base (20) is provided with a through hole (202) slightly larger than the chip placement base (5). After the relay receiving component receives the chip placement base (5), the top of the chip placement base (5) can partially pass through the through hole (202) to exit the test base (20).

6. The multi-channel chip testing mechanism according to claim 5, characterized in that, The chip placement base (5) has outwardly extending pins (51) at both ends. The inner wall of the through hole (202) of the test base (20) is provided with test claws corresponding to the pins (51). When the top of the chip placement base (5) passes through the through hole (202) and extends out of the test base (20), the pins (51) are in contact with the test claws.

7. A multi-channel chip testing mechanism according to claim 6, characterized in that, The test assembly (2) also includes a pressing device (21), which includes a mounting frame (211). The mounting frame (211) is provided with a first fixing plate (212), and the first fixing plate (212) is provided with a pressing member. The pressing member includes a drive rod (213), a connecting rod (214), a first pressing rod (215), and a second pressing rod (216). One end of the drive rod (213) is hinged to the first fixing plate (212). The first pressing rod (215) is located below the drive rod (213) and is connected to the drive rod (213) through the connecting rod (214). The second pressing rod (216) is located at the bottom of the first pressing rod (215) and is used to press the chip placed in the chip slot (50). It also includes a guide sleeve (217), which is located on the first fixing plate (212) and sleeved on the first pressing rod (215) to guide the first pressing rod (215) to make linear movements.

8. A multi-channel chip testing mechanism according to claim 7, characterized in that, The cross-sectional dimensions of the second pressure bar (216) are adapted to the slot size of the smallest chip slot (50) in the chip placement seat (5).

9. A multi-channel chip testing mechanism according to claim 7, characterized in that, The test component (2) also includes a visual positioning device (22), which includes a second fixing plate (221) and a positioning camera (222). The second fixing plate (221) is fixed on the mounting bracket (211), and the positioning camera (222) is rotatably mounted on the second fixing plate (221).

10. A multi-channel chip testing mechanism according to claim 1, characterized in that, The test stand (20) is also provided with a discharge channel (203), which is connected to a feeding conveyor (4); the feeding conveyor (4) includes a second support frame (40) and a second belt conveyor (41) located on the top of the second support frame (40).

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