Multi-acupoint chip detection jig

Abstract

This utility model discloses a multi-aperture chip detection fixture, relating to the field of chip detection technology, and mainly solves the problems of low efficiency, complex operation, and unstable signals in existing technologies. It includes a test PCB board, a multi-aperture chip fixing structure mounted on the test PCB board, and a driving structure for applying pressure. The multi-aperture chip fixing structure achieves precise positioning and signal transmission through an upper needle plate, a multi-aperture chip limiting guide plate, a lower needle plate, and test probes; the driving structure provides controllable pressure through a knob, a threaded ring, a movable plate, and a pressure block. This utility model can efficiently detect multiple chips simultaneously, ensuring stable signal transmission and convenient operation, enabling batch testing and solving the low efficiency problem caused by traditional fixtures that can only detect a single chip at a time.

Description

Technical Field

[0001] This utility model relates to the field of chip detection technology, specifically to a multi-acupoint chip detection fixture. Background Technology

[0002] In the field of chip testing technology, with the miniaturization and integration of electronic components, the application of multi-pin chips is becoming increasingly widespread. These chips typically have multiple pins or contact points, requiring efficient and accurate electrical performance testing during their production and use to ensure product quality and reliability. However, in actual testing, existing testing fixtures have many shortcomings and are unable to meet the demands for high-precision and high-efficiency testing.

[0003] Traditional chip testing fixtures typically use a single probe or a simple fixing structure to connect the chip to the test circuit. This design often exhibits limitations when dealing with multi-cavity chips. For example, due to the large number and small spacing of chip pins, traditional fixtures are prone to poor contact and signal interference, leading to inaccurate test results. Furthermore, existing fixtures lack flexibility in chip fixation and pressure application, failing to adapt to the testing requirements of chips of different sizes, especially when dealing with arrayed multi-cavity chips, resulting in complex and inefficient operation. Simultaneously, the design of existing drive structures is relatively simple, making it difficult to achieve uniform pressure distribution, potentially damaging the chip or affecting test stability due to excessively high or low local pressure.

[0004] Therefore, developing a multi-aperture chip testing fixture that can effectively solve the above problems is particularly important. An ideal testing fixture should possess precise chip positioning capabilities, reliable signal connectivity, and a flexible pressure application mechanism, thereby improving testing efficiency and accuracy and meeting the development needs of modern chip testing technology. This invention addresses the shortcomings of existing technologies by proposing an innovative multi-aperture chip testing fixture, aiming to provide a more efficient and reliable solution for chip testing. Utility Model Content

[0005] The purpose of this utility model is to provide a multi-acupoint chip detection fixture, which mainly solves the technical problems of low detection efficiency, complex operation and unstable signal transmission in the existing technology.

[0006] To achieve the above objectives, the technical solution adopted by this utility model is as follows: A multi-aperture chip testing fixture includes a test PCB board, a multi-aperture chip fixing structure disposed on the test PCB board and connected to the test PCB board via signal, and a driving structure disposed on the multi-aperture chip fixing structure for applying pressure to the test chip.

[0007] Furthermore, in this utility model, the multi-acupoint chip fixing structure includes an upper needle plate, a multi-acupoint chip limiting guide plate fixed on the upper needle plate, a lower needle plate fixed to the test PCB board by a positioning pin and cooperating with the upper needle plate, and a test probe fixed inside the upper needle plate, whose upper end contacts and conducts with the multi-acupoint chip limiting guide plate and conducts with the test PCB board through the lower needle plate.

[0008] Furthermore, in this utility model, the multi-aperture chip limiting guide plate is provided with a plurality of limiting cavities arranged in an array, and each limiting cavity is provided with a chip clamping groove on one of its side walls.

[0009] Furthermore, in this utility model, the driving structure includes an outer frame fixed to the upper needle plate by screws, an upper shell cover rotatably connected to one side of the outer frame by a pin and having a central thread, a threaded ring that is threadedly engaged with the upper shell cover, a movable plate connected to the lower end of the threaded ring, a pressure block fixedly connected to the lower end of the movable plate for contacting the surface of the test chip, and a knob fixed to the upper end of the threaded ring.

[0010] Furthermore, in this utility model, a buckle is movably connected to the outer frame, and the outer edge of the outer frame and the upper needle plate together form a groove for buckle engagement.

[0011] Compared with the prior art, the present invention has the following beneficial effects: (1) The array arrangement of the limiting cavity on the multi-acupoint chip limiting guide plate of this utility model can accommodate multiple chips at the same time, realize batch detection, and solve the problem of low efficiency caused by traditional fixtures that can only detect a single chip at a time.

[0012] (2) The test probe of this utility model is connected to the test PCB board through the upper and lower needle plates. The upper end of the probe is precision ground and the lower end is connected by a spring mechanism, which ensures reliable contact between the chip and the test circuit and solves the problem of unstable test results caused by poor contact and signal interference in traditional fixtures.

[0013] (3) The driving structure of this utility model realizes manual pressure adjustment through knob, threaded ring and movable plate, which can adapt to the detection needs of chips of different thicknesses and specifications, and solves the problem of the traditional fixture having a single pressure application method and being unable to be flexibly adjusted.

[0014] (4) The chip clamping slot on the side wall of the limiting cavity of this utility model facilitates quick chip picking and placing, avoiding the cumbersome operation problem caused by the complex positioning of traditional fixtures.

[0015] (5) The buckles and slots on the outer frame of this utility model can lock the position of the upper cover, ensuring that the pressure remains uniform and stable during the testing process, thus avoiding chip damage or test deviation caused by excessive or insufficient local pressure in traditional fixtures.

[0016] (6) The upper needle plate and the lower needle plate of this utility model are fixed by positioning pins. The outer frame is made of high-strength aluminum alloy. The overall structure is compact and rigid, which reduces the positioning offset or poor contact caused by structural deformation. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the exploded structure of this utility model; Figure 2 This is a detailed drawing of the multi-aperture chip limiting guide plate of this utility model; Figure 3 This is an assembly diagram of the overall structure of this utility model.

[0018] The names corresponding to the reference numerals in the attached figures are as follows: 1. Test PCB board; 2. Multi-aperture chip fixing structure; 3. Drive structure; 4. Upper needle plate; 5. Multi-aperture chip limiting guide plate; 6. Lower needle plate; 7. Test probe; 8. Limiting cavity; 9. Chip clamping slot; 10. Outer frame; 11. Pin shaft; 12. Upper shell cover; 13. Threaded ring; 14. Movable plate; 15. Pressure block; 16. Buckle; 17. Slot; 18. Knob; 19. Chip under test. Detailed Implementation

[0019] The present invention will be further described below with reference to the accompanying drawings and embodiments. The embodiments of the present invention include, but are not limited to, the following embodiments.

[0020] Example

[0021] like Figure 1 , 3 As shown, the overall structure of this utility model includes a test PCB board 1, a multi-aperture chip fixing structure 2, and a driving structure 3. The test PCB board 1 serves as the basic platform for the entire fixture, supporting other components and enabling signal connection with external devices. The multi-aperture chip fixing structure 2 is mounted on the test PCB board 1 and is connected to it for signal transmission. The core components of the multi-aperture chip fixing structure 2 include an upper needle plate 4, a multi-aperture chip limiting guide plate 5, a lower needle plate 6, and a test probe 7. The upper needle plate 4 and the lower needle plate 6 are fixed to the test PCB board 1 by positioning pins, forming a stable clamping space to ensure the rigidity and stability of the overall structure.

[0022] like Figure 2As shown, the multi-aperture chip limiting guide plate 5 is fixed on the upper needle plate 4, and has several arrayed limiting cavities 8. Each limiting cavity 8 has a chip clamping slot 9 on one side wall for precise placement and fixation of the chip to be tested 19. The design of the chip clamping slot 9 allows the operator to quickly insert or remove the chip into or remove the limiting cavity 8, thereby improving testing efficiency. The test probe 7 is fixed inside the upper needle plate 4, with its upper end in contact with the multi-aperture chip limiting guide plate 5 and its lower end connected to the test PCB board 1 through the lower needle plate 6, thus achieving accurate signal transmission. The upper contact surface of the test probe 7 is precision ground to ensure conductivity. The lower end of the test probe 7 is connected to the lower needle plate 6 through a spring mechanism to accommodate chips of different thicknesses and ensure reliable contact. The lower needle plate 6 is fixed to the test PCB board 1 with screws to achieve signal connection with external devices.

[0023] The drive structure 3 is mounted on the multi-aperture chip fixing structure 2 and is used to apply pressure to the test chip. The core components of the drive structure 3 include an outer frame 10, an upper cover 12, a threaded ring 13, a movable plate 14, a pressure block 15, and a knob 18. The outer frame 10 is fixed to the upper needle plate 4 with screws, providing support and protection for the drive structure 3. The upper cover 12 is rotatably connected to one side of the outer frame 10 via a pin 11, with a central thread that engages with the threaded ring 13. The lower end of the threaded ring 13 is connected to the movable plate 14, and the lower end of the movable plate 14 is fixed to the pressure block 15 for applying pressure to the surface of the test chip. The knob 18 is fixed to the upper end of the threaded ring 13 for easy manual adjustment of the pressure. A snap fastener 16 is also movably connected to the outer frame 10, engaging with a slot 17 formed by the outer edges of the outer frame 10 and the upper needle plate 4, for locking the position of the upper cover 12 and ensuring stability during operation. The outer frame 10 is made of high-strength aluminum alloy, possessing high rigidity and resistance to deformation. The threaded pair between the upper cover 12 and the threaded ring 13 is surface-treated to reduce the coefficient of friction and improve service life. The movable plate 14 and the pressure block 15 are connected by bolts for easy disassembly and maintenance.

[0024] In actual operation, the chips to be tested 19 are first placed one by one into the limiting cavity 8 of the multi-cavity chip limiting guide plate 5. The limiting cavity 8 adopts an array arrangement design, which can accommodate multiple chips for testing at the same time, thereby greatly improving the testing efficiency. The chip clamping slot 9 is designed so that the chip can be accurately positioned and fixed, avoiding testing failure due to chip position displacement. Next, the knob 18 is rotated, which drives the movable plate 14 downward through the threaded ring 13, so that the pressure block 15 contacts the chip surface and applies appropriate pressure. The pressure can be flexibly adjusted by rotating the knob 18 to adapt to the testing requirements of different types of chips. When the pressure reaches the set value, the locking buckle 16 is locked to fix the position of the upper shell cover 12 to ensure that the pressure remains stable during the testing process. At this time, the test probe 7 is conductive to the chip surface, and the signal is transmitted to the test PCB board 1 through the test probe 7, and finally transmitted to the external equipment for analysis and judgment. After the test is completed, the locking buckle 16 is unlocked, the knob 18 is rotated in the opposite direction to release the pressure and remove the chip.

[0025] The operating principle of this invention lies in the simultaneous detection of multiple chips via an array of limiting cavities 8 arranged on the multi-cavity chip limiting guide plate 5, significantly improving detection efficiency. The drive structure 3 employs a knob 18 and a threaded ring 13, allowing for flexible adjustment of the applied pressure to adapt to different types of chip detection needs and enhancing operational convenience. The test probe 7 achieves conductivity with the test PCB board 1 via the upper needle plate 4 and lower needle plate 6, ensuring reliable and stable signal transmission. The overall structure is compact and rationally designed, with close cooperation between components, ensuring the stability and safety of the fixture. The design of the outer frame 10 and the buckle 16 further enhances the safety performance of the equipment.

[0026] This invention has a wide range of practical applications, especially in production environments requiring batch testing of large numbers of chips. For example, in chip manufacturing plants, technicians can use the fixture of this invention to quickly test multiple chips, significantly shortening testing time and improving production efficiency. Furthermore, this invention can also be applied in R&D laboratories, helping engineers perform functional verification and performance testing on newly developed chips. Because the drive structure 3 provides flexible and controllable pressure adjustment, this invention is also suitable for testing chips of different thicknesses, meeting diverse testing needs.

[0027] In summary, this invention solves the problems of low efficiency, complex operation, and unstable signal transmission in existing technologies by optimizing the structure and improving the function of the multi-acupoint chip detection fixture. The fixture not only significantly improves detection efficiency but also offers advantages such as convenient operation, stable signal transmission, and a compact structure. These features give this invention significant application value and technological advantages in the field of chip detection.

[0028] The above embodiments are merely one of the preferred embodiments of this utility model and should not be used to limit the scope of protection of this utility model. Any modifications or refinements made to the main design concept and spirit of this utility model that are not of substantial significance, but solve the same technical problem as this utility model, should be included within the scope of protection of this utility model.

Claims

1. A multi-acupoint chip detection fixture, characterized in that, It includes a test PCB board (1), a multi-aperture chip fixing structure (2) disposed on the test PCB board (1) and connected to the test PCB board (1) for signal connection, and a driving structure (3) disposed on the multi-aperture chip fixing structure (2) for applying pressure to the test chip.

2. The multi-acupoint chip detection fixture according to claim 1, characterized in that, The multi-acupoint chip fixing structure (2) includes an upper needle plate (4), a multi-acupoint chip limiting guide plate (5) fixed on the upper needle plate (4), a lower needle plate (6) fixed on the test PCB board (1) by a positioning pin and cooperating with the upper needle plate (4), and a test probe (7) fixed inside the upper needle plate (4) with its upper end in contact with the multi-acupoint chip limiting guide plate and connected to the test PCB board (1) through the lower needle plate (6).

3. The multi-acupoint chip detection fixture according to claim 2, characterized in that, The multi-aperture chip limiting guide plate (5) has several arrayed limiting cavities (8), and each limiting cavity (8) has a chip clamping slot (9) on one of its side walls.

4. The multi-acupoint chip detection fixture according to claim 3, characterized in that, The drive structure (3) includes an outer frame (10) fixed to the upper needle plate (4) by screws, an upper shell cover (12) rotatably connected to one side of the outer frame (10) by a pin (11) and having a central thread, a threaded ring (13) that is threadedly engaged with the upper shell cover (12), a movable plate (14) connected to the lower end of the threaded ring (13), a pressure block (15) fixedly connected to the lower end of the movable plate (14) for contacting the surface of the test chip, and a knob (18) fixed to the upper end of the threaded ring (13).

5. A multi-acupoint chip detection fixture according to claim 4, characterized in that, The outer frame (10) is also movably connected with a buckle (16), and the outer edge of the outer frame (10) and the upper needle plate (4) together form a buckle groove (17) for buckle engagement.

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