A probe interface
By designing the probe interface with an insulating base and electrode structure, the problems of low measurement accuracy and poor applicability of passive single-ended probes in electrical measurements are solved, realizing high-precision and convenient probe testing, which is suitable for the field of electrical measurement.
Patent Information
- Application Number
- CN202521949758.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-10
- Publication Date
- 2026-08-25
- Estimated Expiration
- 2035-09-10
AI Technical Summary
Existing passive single-ended probes suffer from low measurement accuracy and poor applicability in electrical measurements. In particular, during high-voltage testing, the distance between the probe and the test point affects the detection accuracy, and different modules under test require different test fixtures, resulting in insufficient applicability.
A probe interface was designed, including an insulating base, a crown connector, and electrodes. The structural design of the insulating base and electrodes ensures that the distance between the probe and the test point on the PCB board is minimized, reducing loop parasitic inductance. The crown connector holds the probe in place, facilitating probe insertion and removal and making it highly versatile.
The measurement accuracy of the probe has been improved, the parasitic inductance in the loop has been reduced, the convenience of testing and replacement of the probe has been ensured, and its applicability has been enhanced.
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Figure CN224682280U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of electrical measurement technology, specifically to a probe interface. Background Technology
[0002] Passive single-ended probes are common tools in electrical measurement. They typically connect to an oscilloscope interface at one end and need to be stably placed on the test point of the circuit under test at the other end. Considering the varying voltages in circuits, ensuring the electrical safety of the passive single-ended probe during testing requires improved voltage withstand capability. The core of high-voltage single-ended probes lies in their ability to attenuate kilovolt-level high-voltage signals to a safe voltage range (±5V) acceptable to the measuring equipment while maintaining signal integrity. Currently, the interfaces connecting high-voltage passive probes to test points are expensive and their voltage withstand capability is insufficient; connection to the board also presents significant challenges. With the rapid development of the semiconductor industry and the increasing demand for IGBT / SiC MOS, probes are invaluable tools for reading voltages during testing, especially high-voltage components. The distance between the passive single-ended probe and the test point of the circuit under test directly affects the probe's detection accuracy. During testing, the distance between the probe and the test point is crucial, directly impacting the test results. Excessive distance introduces parasitic parameters, compromising measurement accuracy. Furthermore, different modules under test require different test fixtures, resulting in poor applicability. Utility Model Content
[0003] The technical problem to be solved by this utility model is how to improve measurement accuracy and applicability.
[0004] To solve the above-mentioned technical problems, this utility model provides the following technical solution:
[0005] A probe interface includes an insulating base, a crown connector, and electrodes; the insulating base has a through hole, and the crown connector is disposed within the through hole;
[0006] The electrode includes an electrode base and an electrode sleeve. The electrode sleeve is placed on the electrode base and passes through the electrode base. The electrode base is wrapped around an insulating base, causing the electrode sleeve to be coaxially arranged with the through hole.
[0007] This probe interface ensures that the distance between the probe on the probe and the test point on the PCB board is minimized, thereby reducing parasitic inductance in the loop and improving the measurement accuracy of the probe. Furthermore, the probe probe is secured by the crown connector, making it convenient to insert and remove the probe during testing and replacement, thus enhancing its applicability.
[0008] Preferably, the insulating base includes an insulating base body and an insulating sleeve, the insulating sleeve is disposed on the insulating base body, and the crown connector is disposed in a through hole that passes through the insulating sleeve and the insulating base body.
[0009] Preferably, the insulating base has a disc-shaped structure.
[0010] Preferably, the edge of the insulating base has multiple circumferentially spaced cross-sections.
[0011] Preferably, both the upper and lower ends of the through hole are funnel-shaped.
[0012] Preferably, the insulating base is a PEEK insulating base.
[0013] Preferably, the crown connector includes a connector body and a crown, wherein the end of the connector body away from the insulating base is provided with a crown for engaging the probe probe.
[0014] Preferably, the electrode holder has a disc-shaped structure.
[0015] Preferably, multiple legs are circumferentially spaced at the edge of the electrode holder.
[0016] Preferably, the end of the electrode sleeve away from the electrode base has multiple circumferentially spaced cuts.
[0017] Compared with the prior art, the beneficial effects of this utility model are:
[0018] 1. This probe interface ensures that the distance between the probe on the probe and the test point on the PCB board is minimized, thereby reducing parasitic inductance in the loop and improving the measurement accuracy of the probe; and the probe probe is secured by the crown connector, making it convenient to insert and remove the probe during testing and replacement, and it is highly applicable.
[0019] 2. By setting the cut surface at the edge of the insulating base, the legs can fit against the cut surface, preventing the electrodes from rotating on the insulating base.
[0020] 3. The flared opening at the upper end of the through hole can provide coarse positioning for the probe, facilitating probe insertion and ensuring that the probe on the probe can be smoothly inserted into the crown connector. The flared opening at the lower end of the through hole can provide coarse positioning for the crown connector, facilitating the installation of the insulating seat on the crown connector.
[0021] 4. The slit design allows the electrode sleeve to open or retract at this end, ensuring that the electrode sleeve can contact the metal on the probe. Attached Figure Description
[0022] Figure 1 This is an exploded view of an embodiment of the present utility model;
[0023] Figure 2 This is a schematic diagram of the structure after installation in an embodiment of this utility model;
[0024] Figure 3 This is a schematic diagram of the structure of the insulating base according to an embodiment of the present invention;
[0025] Figure 4This is a cross-sectional view of the insulating base according to an embodiment of the present invention;
[0026] Figure 5 This is a schematic diagram of the crown connector according to an embodiment of the present utility model;
[0027] Figure 6 This is a schematic diagram of the electrode structure in an embodiment of the present invention. Detailed Implementation
[0028] To facilitate understanding of the technical solution of this utility model by those skilled in the art, the technical solution of this utility model will now be further described in conjunction with the accompanying drawings.
[0029] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a communication connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0030] In this application, unless otherwise expressly specified and limited, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying contradictory importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise expressly and specifically limited.
[0031] See Figure 1 and Figure 2 This embodiment discloses a probe interface, including an insulating base 1, a crown connector 2, and an electrode 3.
[0032] See Figure 3 and Figure 4 The insulating base 1 has a through hole 101, and the crown connector 2 is disposed in the through hole 101. Specifically, the insulating base 1 includes an insulating body 11 and an insulating sleeve 12. The insulating body 11 has a disc-shaped structure, the insulating sleeve 12 is disposed on the insulating body 11, and the crown connector is disposed in the through hole 101 that penetrates the insulating sleeve 12 and the insulating body 11. In this embodiment, the insulating base 1 is an insulating base made of PEEK material. PEEK material has high temperature resistance, good dimensional stability during machining, and good insulation performance.
[0033] See Figure 5The crown connector 2 includes a connector body 21 and a crown 22. The crown 22, for engaging the probe on the probe 4, is located at the end of the connector body away from the insulating base 1. In this embodiment, the crown connector 2 is made of brass with a gold-plated surface to improve current carrying capacity and meet design requirements. Its total length is 14mm, shortening the distance to the test point, reducing parasitic inductance in the test point loop, and improving the accuracy of measurement data. A Ф0.8 crown spring 22 is placed inside the connector body 21. The crown spring 22 is made of beryllium copper, possessing high elasticity, strength, and good conductivity. When the probe on the probe 4 is inserted into the crown spring 22, the crown spring 22 uses its elasticity to clamp the probe, ensuring proper contact. After testing, the probe 4 can be directly removed, facilitating replacement. The beryllium copper crown spring 22 has strong fatigue resistance, greatly improving its service life. Specifically, the crown connector 2 and the through hole 101 on the insulating base 1 are fitted with a small clearance. After installation, the end of the connector body 21 away from the crown 22 is soldered to the PCB board 5.
[0034] See Figure 6 Electrode 3 includes an electrode base 31, an electrode sleeve 32, and legs 33. The electrode base 31 has a disc-shaped structure. The electrode sleeve 32 is mounted on and passes through the electrode base 31, so that the electrode base 31 wraps around the insulating base 11, and the insulating sleeve 12 is fitted inside the electrode sleeve 32. The electrode sleeve 32 is axially aligned with the through hole 101. Multiple legs 33 for electrical connection to the PCB board 5 are circumferentially spaced along the edge of the electrode base 31. In this embodiment, three legs are provided, evenly spaced along the circumference of the electrode base 31. Multiple slits 321 are circumferentially spaced at the end of the electrode sleeve 32 away from the electrode base 31. In this embodiment, there are four slits 321. The slits 321 allow the electrode sleeve 32 to open or retract at this end, ensuring that the electrode sleeve 32 can make contact with the metal on the probe 4. In this embodiment, the electrode 3 is made of brass, which ensures both structural strength and improved conductivity.
[0035] Specifically, the three legs 33 are embedded into the corresponding slots on the PCB board 5 and securely soldered with solder wire to increase the stability of the bottom. The three legs 33 are assembled with the grounding holes on the PCB board 5. During testing, the upper end of the electrode sleeve 32 contacts the metal on the probe 4. Grounding is established before the probe on the probe 4 is inserted into the crown connector 2, thus ensuring the safety of the probe 4 even if the voltage at the test point is high.
[0036] For further details, please refer to [link / reference]. Figure 3 The edge of the insulating base 11 is provided with circumferentially spaced cut surfaces 111 corresponding to the number and position of the legs, so that the legs 33 can fit on the cut surfaces 111, thereby preventing the electrode base 31 from rotating on the insulating base 1.
[0037] For further details, please refer to [link / reference]. Figure 4 Both the upper and lower ends of the through hole 101 are flared. The flared end of the upper end of the through hole 101 can provide coarse positioning for the probe 4, making it easier to insert the probe 4 and ensuring that the probe on the probe 4 can be smoothly inserted into the crown connector 2. The flared end of the lower end of the through hole 101 can provide coarse positioning for the crown connector 2, making it easier for the insulating seat 1 to fit the crown connector 2.
[0038] The working principle of this embodiment is as follows: First, the insulator 1 is installed into the electrode 3. The insulating sleeve 12 extends into the electrode sleeve 32 and fits with it with a small gap to support the electrode 3. At the same time, the three legs 33 are respectively attached to the three cut surfaces 111 to prevent the electrode 3 from rotating on the insulating seat 1. Then, the crown spring connector 2 is installed into the through hole 101 on the insulator 1. The transition fit between the crown spring connector 2 and the through hole 101 ensures that the crown spring connector 2 can be vertically soldered to the PCB board 5. Vertical soldering of the crown spring connector 2 ensures that the distance between the probe on the probe 4 and the test point on the PCB board 5 is the shortest. This reduces the parasitic inductance in the loop, thereby improving the measurement accuracy of the probe 4. Then, the three legs 33 are... The probe 4 is soldered onto the PCB board 5 to form a test point. Finally, the probe 4 is inserted into the insulating sleeve 12. It will first touch the inner surface of the end of the electrode sleeve 32. Since the three legs 33 are soldered onto the PCB board 5 and are grounded, this ensures that the probe 4 forms a ground loop with the circuit first, and the protection mechanism is activated first. The flared mouth at the top of the through hole 101 can provide coarse positioning for the probe 4, making it easy to insert the probe 4 and ensuring that the probe on the probe 4 can be smoothly inserted into the crown connector 2. The crown spring 22 inside the crown connector 2 elastically deforms and holds the probe of the probe 4, realizing a circuit. Because it is an elastically deformed engagement, this connection method is very convenient for testing and replacing probes and has strong applicability.
[0039] In summary, the probe interface in this embodiment ensures that the distance between the probe on the probe and the test point on the PCB board 5 is minimized, thereby reducing parasitic inductance in the loop and improving the measurement accuracy of the probe 4. Furthermore, by using the crown connector 2 to hold the probe of the probe 4 in place, the probe can be easily inserted and removed during testing and replacement, making it highly applicable.
[0040] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within this invention, and no reference numerals in the claims should be construed as limiting the scope of the claims.
[0041] The above-described embodiments are merely examples of implementation methods of the utility model. The scope of protection of this utility model is not limited to the above-described embodiments. For those skilled in the art, several modifications and improvements can be made without departing from the concept of this utility model, and these all fall within the scope of protection of this utility model.
Claims
1. A probe interface, characterized in that: It includes an insulating base, a crown connector, and electrodes; the insulating base has a through hole, and the crown connector is disposed inside the through hole; The electrode includes an electrode base and an electrode sleeve. The electrode sleeve is placed on the electrode base and passes through the electrode base. The electrode base is wrapped around an insulating base, causing the electrode sleeve to be coaxially arranged with the through hole.
2. The probe interface according to claim 1, characterized in that: The insulating base includes an insulating base body and an insulating sleeve. The insulating sleeve is disposed on the insulating base body, and the crown connector is disposed in a through hole that passes through the insulating sleeve and the insulating base body.
3. A probe interface according to claim 2, characterized in that: The insulating base has a disc-shaped structure.
4. A probe interface according to claim 3, characterized in that: Multiple cross-sections are circumferentially spaced along the edge of the insulating base.
5. A probe interface according to claim 1, characterized in that: Both the upper and lower ends of the through hole are funnel-shaped.
6. A probe interface according to claim 1, characterized in that: The insulating base is a PEEK insulating base.
7. A probe interface according to claim 1, characterized in that: The crown connector includes a connector body and a crown. The crown is located inside the connector body at the end away from the insulating base for engaging the probe probe.
8. A probe interface according to claim 1, characterized in that: The electrode holder has a disc-shaped structure.
9. A probe interface according to claim 1, characterized in that: Multiple legs are spaced circumferentially along the edge of the electrode holder.
10. A probe interface according to claim 1, characterized in that: The end of the electrode sleeve away from the electrode base has multiple circumferentially spaced cuts.