Plug-in structure and testing device

Abstract

The application relates to a plug-in structure and a testing device. The testing device comprises a signal generating part and the plug-in structure. The plug-in structure comprises a plug-in assembly and a signal shielding part. The plug-in assembly comprises a probe wrapping part and a probe group. The probe wrapping part is made of insulating material. The probe group is arranged in the probe wrapping part, so that the probe wrapping part wraps at least part of the probe group around the four sides of the probe group. One end of the probe group is connected to the signal generating part. The other end is used for connecting to a to-be-plugged part of a product to be tested. The signal shielding part is made of metal material and is provided with a first mounting hole. The plug-in assembly is arranged in the first mounting hole, so that the signal shielding part wraps the probe wrapping part around the four sides of the probe wrapping part. The probe group can be isolated from the external environment. The probe group and the signal shielding part are prevented from being in conduction, so that signal leakage is avoided. The signal attenuation from the signal generating part to the product to be tested is low to the maximum extent, and the requirement of precise testing is met.

Description

Technical Field

[0001] This application relates to the field of product testing technology, and in particular to a plug-in structure and testing device. Background Technology

[0002] With the development of technology, the technical requirements for electronic products are getting higher and higher, especially the clarity of display modules, which poses a greater challenge. However, in order to ensure that the finished display module is free of defects and that the clarity reaches the expected level, before the electronic product leaves the factory, the connector of the display module needs to be connected to the interface of the signal generator of the test device to make the display module conductive, so that a series of index tests can be performed on the display module.

[0003] Typically, signal generators have multiple connectors, each containing a probe for signal transmission. Probes in different connectors can transmit different signals. However, interference can occur between probes used to transmit different signals, and probes are also susceptible to interference from external environmental factors such as eddy currents and electromagnetic signals. This affects the stability and accuracy of signal transmission, leading to significant signal attenuation during transmission. Utility Model Content

[0004] Based on this, in order to address the problems of signal interference between probes used to transmit different signals in existing testing devices, and the fact that probes are easily affected by external environmental interference, resulting in significant signal attenuation during transmission, this application provides a plug-in structure and a testing device including the plug-in structure, aiming to reduce maintenance costs and improve maintenance efficiency.

[0005] According to one aspect of this application, a plug-in structure is provided, comprising:

[0006] A plug-in assembly, the plug-in assembly including a probe wrapper and a probe group, the probe wrapper being made of an insulating material, the probe group being disposed through the probe wrapper such that the probe wrapper covers at least a portion of the probe group around the probe group;

[0007] The signal shield is made of metal and has a first mounting hole. The plug-in assembly is disposed in the first mounting hole so that the signal shield surrounds the probe package.

[0008] In one embodiment, the plug-in structure further includes a mounting block disposed on one side of the signal shield, and the mounting block has a second mounting hole for accommodating the plug-in component.

[0009] In one embodiment, the mounting block is elastically connected to the signal shield by a plurality of elastic elements, so that the mounting block can float relative to the signal shield.

[0010] In one embodiment, the signal shield is provided with a limiting member, and the end of the limiting member away from the signal shield has a limiting portion, which is used to abut against the signal shield when the mounting block floats relative to the signal shield, so as to limit the floating distance of the mounting block.

[0011] In one embodiment, the probe package includes a body and a base plate, with opposite ends of the probe group exposed outside the body, the base plate disposed at the bottom of the body, and the base plate surrounding the bottom end of the probe group.

[0012] In one embodiment, the probe group includes multiple probes spaced apart, the main body has multiple slots extending through its top and bottom sides, each probe passes through a corresponding slot, and the top end of each probe is defined as a plug-in end for connecting to the connector to be plugged in, the plug-in end being exposed in the slot.

[0013] In one embodiment, the cross-sectional profile of the plug end matches the profile of the slot near the plug end, such that the slot wall surrounds a portion of the plug end's surface.

[0014] In one embodiment, the slot extends through the side wall of the body, such that the slot has a side opening on the side wall of the body, and the plug assembly further includes a signal shielding plate attached to the side wall of the body to close the side opening of the slot.

[0015] In one embodiment, the signal shield has a wrapping portion on its top side, the first mounting hole penetrates the wrapping portion, one end of the probe group for connecting to the connector is exposed outside the probe wrapping portion, and the wrapping portion covers the outer peripheral surface of the end of the probe group for connecting to the connector.

[0016] According to another aspect of this application, a testing apparatus is provided, comprising:

[0017] Signal generator;

[0018] As described in any of the above embodiments, the probe group of the plug-in structure is connected to the signal generator.

[0019] The aforementioned plug-in structure and testing device, by setting a probe wrapper made of insulating material to surround the probe group, and by setting a signal shield made of metal material to surround the probe wrapper, isolates the probe group from the external environment, preventing signal leakage during signal transmission. This avoids interference between the signal and other external signals. Furthermore, because the probe group is isolated by the insulating material signal wrapper and the metal material signal shield, contact between the probe group (also made of metal) and the signal shield is prevented. This avoids signal leakage caused by the probe group conducting electricity with the signal shield, thus ensuring smooth signal transmission and preventing the stability and accuracy of signal transmission from being affected. Attached Figure Description

[0020] Figure 1 This is a schematic diagram of the appearance of a plug-in structure provided in an embodiment of this application.

[0021] Figure 2 This is an exploded view of a plug-in structure provided in an embodiment of this application.

[0022] Figure 3 This is an exploded view of a plug-in structure provided in another embodiment of this application.

[0023] Figure 4 This is a schematic diagram of the structure of a probe package provided in an embodiment of this application.

[0024] Figure 5 This is a cross-sectional view of a probe packaged with a probe according to an embodiment of this application.

[0025] Figure 6 This is a schematic diagram of the main body of a probe package provided in another embodiment of this application.

[0026] Figure 7 A cross-sectional view of a probe packaged with a probe according to another embodiment of this application.

[0027] Explanation of reference numerals in the attached figures:

[0028] 100, Signal generator; 200, Plug-in structure; 210, Plug-in assembly; 211, Probe group; 2111, Probe; 2111a, Plug-in end; 212, Probe wrapping; 2121, Main body; 2121a, Slot; 2122, Base plate; 2123, Signal shielding plate; 220, Signal shielding component; 221, First mounting hole; 222, Wrapping part; 230, Mounting block; 231, Second mounting hole; 240, Elastic component; 250, Limiting component; 251, Limiting part. Detailed Implementation

[0029] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.

[0030] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0031] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0032] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0033] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0034] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.

[0035] One embodiment of this application provides a plug-in structure and a testing device. The testing device includes a signal generator and a plug-in structure. The plug-in structure is used to plug into a plug-in component on the product under test (e.g., a display module) before the product under test leaves the factory, so that the product under test can be electrically connected to the signal generator, thereby enabling the function of the product under test to be checked and tested, so as to ensure that the product under test is a qualified product when it reaches the user after leaving the factory.

[0036] The following description uses a plug-in structure for a testing device as an example to illustrate the structure of the plug-in structure in this application. This embodiment is only used as an example and does not limit the technical scope of this application. It is understood that in other embodiments, the plug-in structure of this application is not limited to use only in testing devices, but can also be used in any device that needs to conduct electricity, and is not limited here.

[0037] See Figures 1 to 3 , Figure 1 A schematic diagram of a plug-in structure 200 provided in one embodiment of this application is shown. Figure 2 An exploded view of a plug-in structure 200 provided in an embodiment of this application is shown. Figure 3An exploded view of a plug-in structure 200 provided in another embodiment of this application is shown. The plug-in structure 200 provided in this application includes a plug-in assembly 210. The plug-in assembly 210 includes a probe group 211 having multiple probes 2111. One end of the probe group 211 is connected to a signal generator 100 of a testing device, and the other end is used to connect to a component to be plugged into on a product under test, so that the product under test can communicate with the signal generator 100, and the signal from the signal generator 100 can be transmitted to the product under test, thereby enabling the product under test to be powered on and tested.

[0038] In some embodiments, the signal generator 100 is provided with multiple probe groups 211, and different probe groups 211 are used to transmit different types of signals so that the product under test can receive different types of signals and perform different tests. However, as described in the background art, there will be signal interference between the probes 2111 used to transmit different signals, and the probes 2111 are also susceptible to interference from eddy currents and electromagnetic signals in the external environment, which affects the stability and accuracy of signal transmission, and thus greatly affects the result of signal transmission.

[0039] Therefore, in order to solve the above problems, in the embodiments of this application, the plug-in structure 200 includes a signal shield 220, and the plug-in assembly 210 also includes a probe wrapper 212, with the probe group 211 passing through the probe wrapper 212 so that the probe wrapper 212 wraps around at least a portion of the probe group 211; the signal shield 220 has a first mounting hole 221 that passes through opposite sides in its thickness direction, and the plug-in assembly 210 is disposed in the first mounting hole 221 so that the signal shield 220 wraps around the probe wrapper 212.

[0040] In the embodiments of this application, the signal shield 220 is made of a metal material. This utilizes the electromagnetic shielding properties of metal to shield external signals, preventing external signals from interfering with the signal transmitted through the probe 2111 and preventing signal leakage during signal transmission. The probe enclosure 212 is made of insulating materials such as engineering plastics or resins, allowing the probe assembly 211, which is also made of a metal material, to be isolated from the signal shield 220 through the probe enclosure 212. This prevents the probe assembly 211 from contacting the signal shield 220, thus preventing signal leakage caused by the probe assembly 211 conducting electricity with the signal shield 220. This ensures smooth signal transmission and avoids affecting the stability and accuracy of signal transmission.

[0041] For further information, please refer to [link / reference]. Figure 2 and Figure 3Based on the above embodiments, the insertion structure 200 further includes a mounting block 230. The mounting block 230 is disposed on the side of the signal shield 220 away from the signal generator 100, and the mounting block 230 has a second mounting hole 231 for accommodating the component to be inserted into the product under test. By providing the mounting block 230, the mounting block 230 can surround the component to be inserted, thereby protecting the component and also providing some shielding for the transmitted signal. Optionally, the mounting block 230 is made of an anti-static material with conductivity between that of metals and non-metals. By selecting an anti-static material for the mounting block 230, when the component to be inserted into the product under test is accommodated in the second mounting hole 231, the mounting block 230 can remove static electricity from the component.

[0042] Preferably, the testing device has a pressure head (not shown in the figure) located on the side of the mounting hole away from the signal shield 220, and the mounting block 230 is elastically connected to the signal shield 220 by a plurality of elastic elements 240, such as springs. In this case, under the elastic force provided by the elastic elements 240, the mounting block 230 can maintain a distance from the signal shield 220, and the mounting block 230 can float relative to the signal shield 220.

[0043] Thus, when the component to be inserted into the second mounting hole 231 of the mounting block 230 is placed, the component can initially not contact the probe group 211. When the component needs to contact the probe group 211, the pressure head continuously applies pressure to the product under test, causing the elastic element 240 to compress and generate elastic potential energy. At this time, the component slowly contacts the probe group 211 under the resistance of the elastic potential energy, thereby preventing accidental damage to the component when it contacts the probe group 211. When it is necessary to detach the component from the probe group 211, simply lifting the pressure head allows the elastic potential energy generated by the elastic element 240 to push the mounting block 230 away from the signal shield 220, thereby detaching the component from the probe group 211. This eliminates the need for manual removal of the component to detach from the probe group 211 and avoids damage to the component and probe group 211 due to improper removal.

[0044] Furthermore, when the elastic member 240 springs up the mounting block 230, in order to limit the spring height of the mounting block 230, the signal shield 220 is provided with a limiting member 250. The end of the limiting member 250 away from the signal shield 220 has a limiting part 251. The limiting part 251 is used to abut against the signal shield 220 when the mounting block 230 floats relative to the signal shield 220, so as to limit the floating distance of the mounting block 230. In the embodiment shown in the figure, the limiting member 250 is a limiting screw, and the limiting part 251 is the nut of the limiting screw. At this time, the limiting screw passes through the mounting block 230 and the signal shield 220, which not only limits the floating height of the mounting block 230, but also plays a guiding role, so that the mounting block 230 can only float in the vertical direction shown in the figure when it floats relative to the signal shield 220. Therefore, it can avoid damage to the connector or probe assembly 211 caused by the tilting of the mounting block 230 when it floats.

[0045] See Figure 4 and Figure 5 Regarding the structure of the probe wrapper 212, the probe wrapper 212 includes a main body 2121 and a base plate 2122. The two ends of the probe group 211 are exposed outside the main body 2121. The base plate 2122 is located at the bottom of the main body 2121, that is, on the side of the main body 2121 away from the mounting block 230. The base plate 2122 has through holes that penetrate through the two sides of its own thickness. The end of the probe group 211 used to connect with the signal generator 100 is exposed outside the main body and located in the through hole, so that the base plate 2122 wraps around the bottom end of the probe group 211 (that is, the end used to connect with the signal generator 100) around the probe group 211, thereby preventing the bottom of the probe group 211 from contacting and conducting with the external metal, which would cause signal loss.

[0046] For the main body 2121, the main body 2121 can be injection molded or machined. Specifically, such as Figure 4 and Figure 5 In the illustrated embodiment, the main body 2121 is injection molded using an injection molding process, such as... Figure 3 , Figure 6 and Figure 7 In the illustrated embodiment, the main body 2121 is manufactured by machining. In both embodiments, the main body 2121 has multiple slots 2121a that penetrate its top and bottom sides. The probe group 211 includes multiple spaced probes 2111, each probe 2111 passing through a corresponding slot 2121a, and both ends of each probe 2111 are exposed outside the slot 2121a. The top end of the probe 2111 is defined as a plug-in end 2111a for connecting with the component to be plugged in.

[0047] The difference between the two embodiments is that, Figure 4 and Figure 5 In the illustrated embodiment, the cross-sectional profile of the insertion end 2111a matches the profile of the slot 2121a near the insertion end 2111a, such that the slot wall of the slot 2121a surrounds a portion of the surface of the insertion end 2111a. In this case, each slot 2121a can also accommodate each probe 2111 in the horizontal direction (i.e., Figure 4 and Figure 5 Limiting is performed in the X direction (of the circuit). Figure 3 , Figure 6 and Figure 7 In the illustrated embodiment, the slot 2121a also extends through the side wall of the body 2121, so that the slot 2121a has a side opening on the side wall of the body 2121. In order to prevent signals from leaking out from the side opening, in this embodiment, the plug-in assembly 210 further includes a signal shielding plate 2123, which is attached to the side wall of the body 2121 to close the side opening of the slot 2121a.

[0048] It is worth noting that in the latter embodiment (i.e., the embodiment where the main body 2121 is a machined part), the slot 2121a cannot limit the probe 2111 in the horizontal direction. Therefore, in this case, when the insertion end 2111a is connected to the insertion part of the product under test, the insertion end 2111a is located in the second mounting hole 231 of the mounting block 230. Therefore, the hole wall of the second mounting hole 231 can abut against the outer peripheral surface of the probe group 211, thereby enabling the mounting block 230 to limit the insertion end 2111a of the probe 2111.

[0049] Furthermore, in embodiments where the main body 2121 is machined, since the end of the probe assembly 211 used to connect with the component to be plugged in (i.e., the plugging end 2111a of the probe 2111) is exposed outside the main body 2121 of the probe cover 212, and since the slot 2121a penetrates the side wall of the main body 2121, resulting in a relatively long and narrow top opening of the slot 2121a, if the portion of the plugging end 2111a exposed outside the main body 2121 is not covered, signal leakage may occur. Therefore, to overcome this problem, such as Figure 3 and Figure 7 As shown, in this embodiment, the top side of the signal shield 220 (i.e. the side near the mounting block 230) has a wrapping portion 222, and the first mounting hole 221 penetrates the wrapping portion 222. The wrapping portion 222 wraps the outer peripheral surface of the probe group 211 used to connect with the connector, so that the signal can be prevented from leaking when it passes through the end of the probe group 211 used to connect with the connector.

[0050] It is understandable that in embodiments where the main body 2121 is an injection molded part, the signal shield 220 may also be provided with a wrapping part 222, which is not limited here.

[0051] As can be seen, the plug-in structure 200 provided in this application, by setting up components such as signal shielding component 220 and probe wrapping component 212, and by making special designs on the probe wrapping component 212, can basically completely wrap the outer peripheral surface of the probe group 211. Therefore, at the signal transmission level, it can ensure that the signal attenuation between the signal generator 100 and the product under test is low to the greatest extent, thereby meeting the requirements of precision testing.

[0052] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0053] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A plug-in structure, characterized in that, include: A plug-in assembly (210) includes a probe wrapper (212) and a probe group (211), the probe wrapper (212) being made of an insulating material, and the probe group (211) being disposed through the probe wrapper (212) such that the probe wrapper (212) wraps around at least a portion of the probe group (211); The signal shield (220) is made of metal material and has a first mounting hole (221). The plug-in assembly (210) is disposed in the first mounting hole (221) so that the signal shield (220) wraps around the probe wrapper (212).

2. The plug-in structure according to claim 1, characterized in that, The plug-in structure (200) further includes a mounting block (230), which is disposed on one side of the signal shield (220) and has a second mounting hole (231) for accommodating the plug-in component.

3. The plug-in structure according to claim 2, characterized in that, The mounting block (230) is elastically connected to the signal shield (220) by a number of elastic elements (240) so that the mounting block (230) can float relative to the signal shield (220).

4. The plug-in structure according to claim 3, characterized in that, The signal shield (220) is provided with a limiting member (250), and the end of the limiting member (250) away from the signal shield (220) has a limiting part (251). The limiting part (251) is used to abut against the signal shield (220) when the mounting block (230) floats relative to the signal shield (220) to limit the floating distance of the mounting block (230).

5. The plug-in structure according to claim 1, characterized in that, The probe package (212) includes a main body (2121) and a base plate (2122). The two ends of the probe group (211) are exposed outside the main body (2121). The base plate (2122) is located at the bottom of the main body (2121) and the base plate (2122) wraps around the bottom end of the probe group (211).

6. The plug-in structure according to claim 5, characterized in that, The probe group (211) includes multiple probes (2111) spaced apart. The main body (2121) has multiple slots (2121a) that penetrate its top and bottom sides. Each probe (2111) passes through a corresponding slot (2121a), and the top end of each probe (2111) is defined as a plug-in end (2111a) for connecting with the component to be plugged in. The plug-in end (2111a) is exposed in the slot (2121a).

7. The plug-in structure according to claim 6, characterized in that, The cross-sectional profile of the plug end (2111a) matches the profile of the slot (2121a) near the plug end (2111a), so that the slot wall of the slot (2121a) wraps around a portion of the surface of the plug end (2111a) around the probe (2111).

8. The plug-in structure according to claim 6, characterized in that, The slot (2121a) extends through the side wall of the body (2121) so that the slot (2121a) has a side opening on the side wall of the body (2121). The plug-in assembly (210) also includes a signal shielding plate (2123), which is attached to the side wall of the body (2121) to close the side opening of the slot (2121a).

9. The plug-in structure according to claim 6, characterized in that, The signal shield (220) has a wrapping portion (222) on its top side, and the first mounting hole (221) passes through the wrapping portion (222). One end of the probe group (211) used to connect with the plug-in component is exposed outside the probe wrapping portion (212), and the wrapping portion (222) wraps the outer peripheral surface of the end of the probe group (211) used to connect with the plug-in component.

10. A testing apparatus, characterized in that, include: Signal generator (100); The plug-in structure (200) as described in any one of claims 1-9, wherein the probe group (211) of the plug-in structure (200) is connected to the signal generator (100).

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