High current high voltage test probe

Abstract

The utility model provides a kind of high current high voltage test probe, including probe body, the front end of probe body is connected with the probe of ball head probe plunger and plate, spring is placed on the ball head probe plunger, and the spring is placed between the front end of probe body and probe.The beneficial effects of the utility model are reflected in that: the contact surface of the contact point of the product to be detected can be more stable, and the silver plating layer of the contact point will not be damaged during contact, which can better protect the product.

Description

Technical Field

[0001] This utility model belongs to the field of electrical performance testing technology, specifically relating to a high-current, high-voltage test probe. Background Technology

[0002] In industrial production, many products require electrical performance testing, typically using standard probes manufactured by specialized companies. However, for electrical products in specialized fields, operating currents can reach 600A or even higher, rendering commercially available standard probes inadequate. Furthermore, standard probes may fail to eject. When multiple standard probes are used, the number of tests increases, leading to more probes failing to eject. Since equipment struggles to detect such situations, all remaining probes eventually burn out after exceeding their rated current. Additionally, the multiple silver contacts at electrical joints have inherent machining and assembly tolerances. For products with high precision requirements, conventional contact probes can easily result in inaccurate test results, hindering successful testing. Utility Model Content

[0003] To address the shortcomings of existing technologies, this invention provides a high-current, high-voltage test probe.

[0004] The objective of this utility model is achieved through the following technical solution: A high-current, high-voltage test probe includes a probe body, the front end of which is connected to a plate-shaped probe via a ball-head probe plunger, and a spring is fitted on the ball-head probe plunger, with the spring positioned between the front end of the probe body and the probe.

[0005] Preferably, a retaining ring is provided between the upper end of the ball-head probe plunger and the front end of the probe body.

[0006] Preferably, the ball-head probe plungers are evenly distributed on the probe, the probe is provided with a probe cover plate, and the ball head of the ball-head probe plunger is placed in the spherical cavity of the probe.

[0007] Preferably, the ball-head probe plunger is a copper-type ball-head plunger.

[0008] Preferably, the probe and the probe cover are fastened together by screws.

[0009] Preferably, the retaining ring is a steel wire retaining ring for shafts.

[0010] The beneficial effects of this utility model are reflected in the following aspects: it can have a more stable contact surface with the contact point of the product to be tested, has self-adaptability during contact, will not damage the silver plating layer of the contact point, and can better protect the product. At the same time, it can change the number and diameter of the ball probe plunger to adapt to the testing requirements of high current and high voltage products, and has a wide range of applications and strong practicality. Attached Figure Description

[0011] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0012] Figure 1 : A schematic diagram of the structure of this utility model.

[0013] Figure 2 : Schematic diagram of the cross-sectional structure of this utility model. Detailed Implementation

[0014] This utility model proposes a high-current, high-voltage test probe. To make the purpose, technical solution, and advantages of this utility model clearer, the following description, in conjunction with the appendix, is provided. Figures 1-2 The present invention will be further described in detail below with reference to embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present invention and are not intended to limit the present invention.

[0015] The high-current, high-voltage test probe can be used to test the electrical performance of connectors in electrical products that carry high current and high voltage. The test probe includes a probe body 1 and a flat probe 12 disposed below the front end 11 of the probe body. The front end 11 of the probe body and the probe 12 are connected by a ball-head probe plunger 21, which is a copper-column type ball-head plunger.

[0016] Specifically, the top of the ball-head probe plunger 21 protrudes from the front top surface of the probe body and is axially limited by a retaining spring 23, which is a axial wire retaining spring. The ball head of the ball-head probe plunger 21 is placed in the spherical cavity inside the probe 12. To facilitate the installation and positioning of the ball head of the ball-head probe plunger 21 inside the probe, a probe cover plate 13 is also provided above the probe 12. The probe 12 and the probe cover plate 13 are connected and fastened by screws.

[0017] A spring 22 is fitted onto the ball-head probe plunger 21 between the front end 11 of the probe body and the probe 12. When the bottom of the probe 12 is pressed, the ball-head probe plunger 21 can adjust the probe in a floating manner. That is, the ball head will rotate within the spherical cavity of the probe, and the spring 22 will also be compressed and deformed. Therefore, the probe 12 has an adaptive adjustment capability when in contact with the contact point. The planar contact can achieve a more stable fit with the contact point being tested, thus improving the electrical performance testing. At the same time, the adaptive structure of the probe 12 will not damage the silver plating of the contact point being tested and can also absorb the tolerances during contact processing and assembly, making the test results more accurate.

[0018] The ball-head probe plungers 21 are evenly distributed on the probe 12. In this embodiment, the front end of the probe 12 has a clearance opening 24, and the ball-head probe plungers 21 surround the clearance opening 24. The clearance opening 24 corresponds to the female head position on the connector to be tested. Of course, the specific shape of the clearance opening 24 can be varied according to actual needs. The shape of the ball-head probe plungers 21 matches the shape of the contact point.

[0019] The ball-head probe plunger 21 is a copper plunger. By adjusting the number and diameter of the copper plungers, the maximum current that the probe can detect can be adjusted, thereby meeting the requirements of high-current, high-voltage testing. When this invention is used to monitor 600A high-current products, the copper plungers are made of T2 oxygen-free copper to improve conductivity.

[0020] Furthermore, the copper plunger in this invention is easy to replace, the parts are small in size, and the cost is low, allowing for a slight reduction in durability requirements. Since the probe body 1 is more expensive and has a relatively large diameter and strong current-carrying capacity, CuBe2 can be preferred to reduce replacement frequency and lower operating costs.

[0021] If other or larger current detection is required, adjustments can be made according to the following formula: i = Δt × rth × a / (ρ × l). Where: Δt: allowable temperature rise (°C), rth: thermal resistance coefficient (°C·m / W), a: conductor cross-sectional area (square meters), ρ: resistivity (Ω·m), l: wire length (meters).

[0022] Finally, it should be noted that the terms "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used solely for the convenience of describing this utility model and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0023] Furthermore, the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it; although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A high-current, high-voltage test probe, characterized in that: The device includes a probe body, the front end of which is connected to a plate-shaped probe via a ball-head probe plunger. A spring is fitted on the ball-head probe plunger and is positioned between the front end of the probe body and the probe.

2. The high-current, high-voltage test probe as described in claim 1, characterized in that: A retaining ring is provided between the upper end of the ball-head probe plunger and the front end of the probe body.

3. The high-current, high-voltage test probe as described in claim 2, characterized in that: The ball-head probe plungers are evenly distributed on the probe, and the probe is provided with a probe cover plate. The ball head of the ball-head probe plunger is placed in the spherical cavity of the probe.

4. The high-current, high-voltage test probe as described in claim 1, characterized in that: The ball-head probe plunger is a copper-type ball-head plunger.

5. The high-current, high-voltage test probe as described in claim 3, characterized in that: The probe and the probe cover are fastened together by screws.

6. The high-current, high-voltage test probe as described in claim 2, characterized in that: The retaining ring is a steel wire retaining ring for shafts.

Images