An installation and test fixture assembly for a photoelectric leak sensor

Abstract

The utility model discloses a kind of installation and test fixture assembly of photoelectric leakage sensor, the component includes photoelectric probe installation fixture, main control board installation fixture and test fixture;Among them, photoelectric probe installation fixture includes: first bearing main body and clamping device, first bearing main body is equipped with several first bearing sites to bear the circuit board of photoelectric probe, clamping device can be fixed pinout, and pinout and the circuit board welding spot of electric probe can be made to realize contact;The second bearing main body of main control board installation fixture is equipped with several second bearing sites, for photoelectric probe and main control board placement and through pinout welding form photoelectric leakage sensor;The test station of test fixture can place second bearing main body and connect test device, to detect photoelectric leakage sensor.The utility model can realize the quick installation and batch detection of photoelectric leakage sensor, effectively improve its production and detection efficiency.

Description

Technical Field

[0001] This utility model relates to the field of fixture technology, specifically to a fixture assembly for installing and testing a photoelectric leakage sensor. Background Technology

[0002] In many fields such as industrial production, chemical storage, and electronic equipment maintenance, real-time detection and early warning of liquid leaks are crucial for ensuring production safety and preventing equipment damage and environmental hazards. Photoelectric leak sensors, as a core device for detecting liquid leaks based on optical signals, are widely used in these scenarios due to their advantages such as fast response speed, high detection accuracy, and strong adaptability, becoming an important component of liquid leak monitoring systems. With the increasing demand for safety monitoring in related fields, the market demand for photoelectric leakage sensors continues to grow, which places higher demands on the efficiency and quality of their manufacturing process. However, the current assembly and testing process for photoelectric leakage sensors in the industry generally adopts the traditional operation mode of manual welding and manual component assembly. In manual welding, operators need to weld key parts such as circuit contacts and optical element pins inside the sensor one by one. This not only requires a high level of technical proficiency from the operators, but is also prone to problems such as welding point misalignment, incomplete welding, and missed welding due to factors such as human operational stability and operator fatigue. This directly affects the circuit conductivity and overall structural stability of the sensor, resulting in large fluctuations in assembly quality and difficulty in effectively controlling the defect rate. Meanwhile, during manual assembly, operators must manually position and install multiple components such as photoelectric probes and main control circuit boards. The assembly accuracy between components depends entirely on manual judgment, making it difficult to guarantee that the relative positional accuracy between components meets design standards. This can lead to deviations in the sensor's optical signal transmission path, affecting its leakage detection sensitivity and accuracy. Furthermore, in manual operation mode, the assembly process for individual sensors is cumbersome and time-consuming, with a lack of efficient coordination between each process, resulting in low overall production efficiency and making it difficult to meet market demands for large-scale, mass production of photoelectric leakage sensors.

[0003] More importantly, after the existing manual assembly process is completed, the testing of whether the photoelectric leakage sensor is functioning properly also relies on manual inspection using scattered testing instruments. The testing process lacks systematicity, which not only further prolongs the production cycle, but may also lead to some sensor defects not being effectively identified due to the randomness of the testing operation, thus affecting the quality of the product leaving the factory. Utility Model Content

[0004] In view of the shortcomings of the prior art, this utility model proposes an installation and testing fixture assembly for a photoelectric leakage sensor to solve the technical problems mentioned in the background.

[0005] The technical solution of this utility model is implemented as follows: An assembly for mounting and testing a photoelectric leakage sensor, comprising: A photoelectric probe mounting fixture includes: a first supporting body and a clamping device. The first supporting body is provided with a plurality of first supporting positions for supporting the circuit board of the photoelectric probe. The clamping device is located above the first supporting body and is used to fix the pin header and the circuit board of the photoelectric probe, and to make the pin header contact the solder joints of the circuit board of the photoelectric probe. The main control board mounting fixture includes: a second supporting body, the second supporting body having a plurality of second supporting positions, the second supporting positions being used to place the photoelectric probe and the main control board, so that the photoelectric probe and the main control board can be soldered through the pin header to form a photoelectric leakage sensor; The test fixture includes a test stand and a test device. The test stand is used to place the second support body and fix the test device. The test device is connected to the test stand and is used to test the photoelectric leakage sensor on the second support body.

[0006] Furthermore, the clamping device includes: a first cover plate and a second cover plate, the first cover plate being located between the first supporting body and the second cover plate for fixing the circuit board of the photoelectric probe, the first cover plate being provided with a plurality of pin fixing positions for supporting the pins; the second cover plate being located above the first cover plate for fixing the pins, so that the pins can contact the solder joints on the circuit board of the photoelectric probe.

[0007] Furthermore, the first cover plate and the second cover plate are connected by a hinge.

[0008] Furthermore, the photoelectric probe mounting fixture also includes: a plurality of fixing structures, which are disposed on the first supporting body and are used to fix the first cover plate on the first supporting body.

[0009] Furthermore, the fixing structure includes: a column and an annular slider, the column passing through the first cover plate and the first supporting body, and the annular slider being sleeved on the column and slidably connected to the column.

[0010] Furthermore, the second bearing body is provided with a plurality of unloading grooves, which are adjacent to the second bearing position.

[0011] Furthermore, the test bench includes a test base and a side plate bracket. The test base is used to place the second supporting body, and the side plate bracket is disposed on the test base and connected to the test device for fixing the test device.

[0012] Furthermore, the test base is provided with several limiting blocks, which are used to fix the second bearing body.

[0013] Furthermore, the testing device includes a test plate and a pressing structure, the pressing structure being connected to the test plate and used to adjust the distance between the test plate and the test base, so that the test probe below the test plate can contact the main control board on the second supporting body.

[0014] Furthermore, the pressing structure includes a pressing member, a connecting member, and a column member, wherein the pressing member and the column member are connected by the connecting member, and the column member is connected to the test plate.

[0015] Compared with the prior art, the present invention has the following advantages: This utility model discloses an installation and testing fixture assembly for a photoelectric leakage sensor, comprising: A photoelectric probe mounting fixture includes: a first supporting body and a clamping device. The first supporting body has a plurality of first supporting positions for supporting the circuit board of the photoelectric probe. The clamping device is located above the first supporting body and is used to fix the pin header and the circuit board of the photoelectric probe, and to make contact between the pin header and the solder joints of the circuit board of the photoelectric probe. A main control board mounting fixture includes: a second supporting body with a plurality of second supporting positions for placing the photoelectric probe and the main control board, so that the photoelectric probe and the main control board can be soldered through the pin header to form a photoelectric leakage sensor. A testing fixture includes a testing table and a testing device. The testing table is used to place the second supporting body and fix the testing device. The testing device is connected to the testing table and is used to test the photoelectric leakage sensor on the second supporting body. This invention enables rapid installation of photoelectric leakage sensors through photoelectric probe mounting fixtures and main control board mounting fixtures. Furthermore, it enables batch testing of photoelectric leakage sensors through testing fixtures. In summary, the installation and testing fixture components of this invention significantly improve the overall efficiency of photoelectric leakage sensor production and testing. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1This is a schematic diagram of the photoelectric probe mounting fixture in this utility model; Figure 2 This is a structural schematic diagram of the photoelectric probe mounting fixture from another perspective in this utility model; Figure 3 This is a schematic diagram of another structure of the photoelectric probe mounting fixture in this utility model; Figure 4 This is a schematic diagram of the main control board mounting fixture in this utility model; Figure 5 This is a schematic diagram of the test fixture in this utility model; Figure 6 This is a schematic diagram of the pressing structure in this utility model; Figure 7 This is a schematic diagram of the structure of the test fixture with the main control board mounted on it in this utility model.

[0018] Attached image labels: 100. Photoelectric probe mounting fixture; 101. First bearing body; 1011. First bearing position; 102. Clamping device; 1021. First cover plate; 10211. Pin fixing position; 1022. Second cover plate; 103. Fixing structure; 1031. Column; 1032. Annular slider; 200. Main control board mounting fixture; 201. Second bearing body; 2011. Second bearing position; 2012. Unloading groove; 300. Test fixture; 301. Test table; 3011. Test base; 30111. Limiting block; 3012. Side plate bracket; 302. Test device; 3021. Test plate; 3022. Pressing structure; 30221. Pressing component; 30222. Connecting component; 30223. Column component; 400, pin header; 500. Hinges. Detailed Implementation

[0019] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present utility model.

[0020] It should be noted that when an element is said to be "fixed" to another element, it can be directly on the other element or there may be an intervening element. When an element is said to be "connected" to another element, it can be directly connected to the other element or there may be an intervening element. Conversely, when an element is said to be "directly" on another element, there is no intervening element. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0021] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0022] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0023] The terminology used in one or more embodiments of this invention is for the purpose of describing particular embodiments only and is not intended to limit the scope of one or more embodiments of this invention. The singular forms “a,” “the,” and “the” used in one or more embodiments of this invention are also intended to include the plural forms unless the context clearly indicates otherwise.

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein in the template description is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0025] See Figures 1 to 7 This utility model discloses an installation and testing fixture assembly for a photoelectric leakage sensor, comprising: The photoelectric probe mounting fixture 100 includes: a first supporting body 101 and a clamping device 102. The first supporting body 101 is provided with a plurality of first supporting positions 1011 for supporting the circuit board of the photoelectric probe. The size of the first supporting positions 1011 is set to be the same as the size of the circuit board of the photoelectric probe, so that the circuit board of the photoelectric probe can be embedded in the first supporting positions 1011 and achieve the function of fixing the circuit board of the photoelectric probe.

[0026] The clamping device 102 is located above the first supporting body 101 and is used to fix the pin header 400 and the circuit board of the photoelectric probe, so that the pin header 400 contacts the solder joints of the circuit board of the photoelectric probe.

[0027] It should be noted that the photoelectric probe mounting fixture 100 is a fixture used to assist in connecting the probe part and the circuit board part of the photoelectric probe. In this embodiment, by using the photoelectric probe mounting fixture 100, the traditional lead wire soldering method is replaced by the pin header 400 soldering method. It can be understood that the pin header 400 is easier to fix than the lead wire, and multiple pin headers 400 can be fixed at the same time by the clamping device 102. This makes the soldering more efficient and faster, thereby improving the installation efficiency of the photoelectric probe.

[0028] In a preferred embodiment, the clamping device 102 includes a first cover plate 1021 and a second cover plate 1022. The first cover plate 1021 is located between the first support body 101 and the second cover plate 1022, and is used to fix the circuit board of the photoelectric probe. The first cover plate 1021 is provided with a plurality of pin fixing positions 10211 for supporting pins 400. The area of ​​the first cover plate 1021 needs to completely cover all the first support positions 1021 so that the first cover plate 1021 can completely fix the circuit board of the photoelectric probe and prevent the circuit board of the photoelectric probe from becoming loose during subsequent soldering. The second cover plate 1022 is located above the first cover plate 1021 and is used to fix the pins 400 so that the pins 400 can contact the solder joints on the circuit board of the photoelectric probe.

[0029] It should be noted that in this embodiment, the pin header 400 has a right-angle structure. One side of the pin header 400 is fixed between the first cover plate 1021 and the second cover plate 1022 through the combined action of the pin header fixing position 10211 and the second cover plate 1022. The other end of the pin header 400 contacts the solder joint on the circuit board of the photoelectric probe to facilitate subsequent soldering.

[0030] In a preferred embodiment, the first cover plate 1021 and the second cover plate 1022 are connected by a hinge 500.

[0031] It is understood that in this embodiment, by connecting the first cover plate 1021 and the second cover plate 1022 through the hinge 500, the process of repeatedly disassembling and installing the first cover plate 1021 during testing is avoided.

[0032] As a preferred embodiment, the photoelectric probe mounting fixture 100 further includes: a plurality of fixing structures 103, which are disposed on the first supporting body 101 and are used to fix the first cover plate 1021 on the first supporting body 101.

[0033] Understandably, in order to prevent the first cover plate 1021 from sliding on the first support body 101 during installation, in this embodiment, a number of fixing structures 103 are provided on the first support body 101 so that the first cover plate 1021 can be fixed on the first support body 101.

[0034] In a preferred embodiment, the fixing structure 103 includes a column 1031 and an annular slider 1032. The column 1031 passes through the first cover plate 1021 and the first supporting body 101. The annular slider 1032 is sleeved on the column 1031 and is slidably connected to the column 1031.

[0035] Specifically, in this embodiment, the tightness between the first cover plate 1021 and the first supporting body 101 is adjusted by moving the annular slider 1032 up and down the column 1031.

[0036] The main control board mounting fixture 200 includes: a second supporting body 201, on which a plurality of second supporting positions 2011 are provided. The second supporting positions 2011 are used to place the photoelectric probe and the main control board, so that the photoelectric probe and the main control board can be soldered through the pin header 400 to form a photoelectric leakage sensor.

[0037] It should be noted that the main control board mounting fixture 200 is a fixture used to assist in connecting the photoelectric probe and the main control board. In this embodiment, a second bearing position 2011 for placing the photoelectric probe and the main control board is provided on the second bearing body 201. The second bearing position 2011 enables the pin header 400 on the photoelectric probe to contact the solder joints on the main control board, thereby enabling the photoelectric probe and the main control board to be soldered through the pin header 400 to form a photoelectric leakage sensor.

[0038] In a preferred embodiment, the second bearing body 201 is provided with a plurality of unloading grooves 2012, which are adjacent to the second bearing position 2011.

[0039] Specifically, in this embodiment, since the second bearing position 2011 and the main control board are relatively close, disassembly is time-consuming. Therefore, several unloading grooves 2012 are provided on the second bearing body 201 to facilitate the quick disassembly of the main control board from the second bearing body 201.

[0040] The test fixture 300 includes a test table 301 and a test device 302. The test table 301 is used to place the second support body 201 and fix the test device 302. The test device 302 is connected to the test table 301 and is used to test the photoelectric leakage sensor on the second support body 201.

[0041] It should be noted that the test fixture 300 is a fixture used to perform functional tests on the installed photoelectric leakage sensor. Specifically, in this embodiment, after the photoelectric leakage sensor is installed on the second support body 201, the second support body 201 is placed on the test table 301, and then the photoelectric leakage sensor on the second support body 201 is functionally tested by the test device 302.

[0042] In a preferred embodiment, the test bench 301 includes a test base 3011 and a side plate bracket 3012. The test base 3011 is used to place the second supporting body 201. The side plate bracket 3012 is disposed on the test base 3011 and connected to the test device 302 for fixing the test device 302.

[0043] Specifically, in this embodiment, the testing device 302 can be fixed to the side plate bracket 3012 by means of bolts or screws.

[0044] In a preferred embodiment, the test base 3011 is provided with a plurality of limiting blocks 30111, which are used to fix the second bearing body 201.

[0045] Specifically, in this embodiment, a plurality of limiting blocks 30111 are provided on the test base 3011 to fix the second bearing body 201, thereby preventing the second bearing body 201 from moving on the test base 3011 during the test.

[0046] In a preferred embodiment, the testing device 302 includes a testing plate 3021 and a pressing structure 3022. The pressing structure 3022 is connected to the testing plate 3021 and is used to adjust the distance between the testing plate 3021 and the testing base 3011, so that the testing probe under the testing plate 3021 can contact the main control board on the second supporting body 201.

[0047] It should be noted that the test board 3021 is a test circuit board dedicated to testing the photoelectric leakage sensor. A plurality of test probes are arranged below the test board 3021, and the test board 3021 is connected to an external power supply. The photoelectric leakage sensor is detected when powered on. Meanwhile, in order to quickly identify whether the photoelectric leakage sensor is good or bad, an indicator light is arranged on the test board 3021 to indicate whether the photoelectric leakage sensor is a qualified product. For example, green light can be set for qualified products and red light for unqualified products.

[0048] Specifically in this embodiment, the distance between the test board 3021 and the test base 3011 can be adjusted through the pressing structure 3022, so that the test probes under the test board 3021 can contact the photoelectric leakage sensor on the second carrying body 201, thereby realizing the detection of the photoelectric leakage sensor.

[0049] As a preferred embodiment, the pressing structure 3022 includes: a pressing member 30221, a connecting member 30222 and a column member 30223. The pressing member 30221 and the column member 30223 are connected through the connecting member 30222, and the column member 30223 is used for fixing and connecting the test board 3021.

[0050] Specifically, in this embodiment, the pressing member 30221 and the connecting member 30222 are hinged, and the connecting member 30222 and the column member 30223 are also hinged. The column member 30223 is used for fixing and connecting the test board 3021. When the pressing member 30221 is pressed, the column member 30223 moves downward under the driving of the connecting member 30222, thereby driving the test board 3021 to move downward, so that the probes under the test board 3021 contact the photoelectric leakage sensor for detection, and finally实现 the function detection of the photoelectric leakage sensor.

[0051] In all examples shown and described herein, any specific value should be construed as merely exemplary, and not as a limitation. Therefore, other examples of the exemplary embodiment can have different values.

[0052] It should be noted that like reference numerals and letters refer to like items in the following drawings. Therefore, once an item is defined in one drawing, no further definition or explanation is required in subsequent drawings.

[0053] The above description is only the preferred embodiment of the present utility model, and is not intended to limit the present utility model. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model shall be included in the protection scope of the present utility model.

Claims

1. A fixture assembly for mounting and testing a photoelectric leakage sensor, characterized in that, include: The photoelectric probe mounting fixture (100) includes: a first support body (101) and a clamping device (102). The first support body (101) is provided with a plurality of first support positions (1011) for supporting the circuit board of the photoelectric probe. The clamping device (102) is located above the first support body (101) for fixing the pin header (400) and the circuit board of the photoelectric probe, and for making the pin header (400) contact the solder joints of the circuit board of the photoelectric probe. The main control board mounting fixture (200) includes: a second supporting body (201), the second supporting body (201) is provided with a plurality of second supporting positions (2011), the second supporting positions (2011) are used to place the photoelectric probe and the main control board, so that the photoelectric probe and the main control board can be welded through the pin header (400) to form a photoelectric leakage sensor; The test fixture (300) includes a test stand (301) and a test device (302). The test stand (301) is used to place the second support body (201) and fix the test device (302). The test device (302) is connected to the test stand (301) and is used to test the photoelectric leakage sensor on the second support body (201).

2. The installation and testing fixture assembly according to claim 1, characterized in that, The clamping device (102) includes: a first cover plate (1021) and a second cover plate (1022). The first cover plate (1021) is located between the first support body (101) and the second cover plate (1022) and is used to fix the circuit board of the photoelectric probe. The first cover plate (1021) is provided with a plurality of pin fixing positions (10211) for supporting the pins (400). The second cover plate (1022) is located above the first cover plate (1021) and is used to fix the pins (400) so that the pins (400) can contact the solder joints on the circuit board of the photoelectric probe.

3. The installation and testing fixture assembly according to claim 2, characterized in that, The first cover plate (1021) and the second cover plate (1022) are connected by a hinge (500).

4. The installation and testing fixture assembly according to claim 2, characterized in that, The photoelectric probe mounting fixture (100) further includes: a plurality of fixing structures (103), the fixing structures (103) being disposed on the first supporting body (101) for fixing the first cover plate (1021) on the first supporting body (101).

5. The installation and testing fixture assembly according to claim 4, characterized in that, The fixing structure (103) includes: a column (1031) and an annular slider (1032). The column (1031) passes through the first cover plate (1021) and the first bearing body (101). The annular slider (1032) is sleeved on the column (1031) and slidably connected to the column (1031).

6. The installation and testing fixture assembly according to claim 1, characterized in that, The second bearing body (201) is provided with a plurality of unloading grooves (2012), which are adjacent to the second bearing position (2011).

7. The installation and testing fixture assembly according to claim 1, characterized in that, The test bench (301) includes a test base (3011) and a side plate bracket (3012). The test base (3011) is used to place the second bearing body (201). The side plate bracket (3012) is disposed on the test base (3011) and connected to the test device (302) for fixing the test device (302).

8. The installation and testing fixture assembly according to claim 7, characterized in that, The test base (3011) is provided with a plurality of limiting blocks (30111), which are used to fix the second bearing body (201).

9. The installation and testing fixture assembly according to claim 8, characterized in that, The testing device (302) includes a test plate (3021) and a pressing structure (3022). The pressing structure (3022) is connected to the test plate (3021) and is used to adjust the distance between the test plate and the test base (3011) so that the test probe under the test plate (3021) can contact the main control board on the second support body (201).

10. The installation and testing fixture assembly according to claim 9, characterized in that, The pressing structure (3022) includes: a pressing member (30221), a connecting member (30222), and a column member (30223). The pressing member (30221) and the column member (30223) are connected by the connecting member (30222), and the column member (30223) is connected to the test plate (3021).

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