A multi-package high-low temperature test fixture device

Abstract

The application relates to the field of jig testing, in particular to a high-low temperature test jig device suitable for multiple packages. A circular groove is arranged on a base for adapting a heat shield, so that a sliding mechanism, an adapter plate and a locking seat arranged on the base are placed in the heat shield, an external temperature control device is connected through the heat shield, the temperature in the heat shield is rapidly raised and lowered, and a device to be tested can rapidly reach and stabilize at a specified temperature point. The adapter plate can slide on the sliding mechanism, the distance between the two adapter plates can be adjusted, that is, the distance between the two test seats can be adjusted, the test demand of different size components can be met, the application has the advantages of simple structure, convenient operation, wide temperature resistance range, strong universality and the problem of ice and frost in the prior art can be solved. High-low temperature electrical performance test can be carried out on different specified packaging products.

Description

Technical Field

[0001] This application relates to the field of device testing, and in particular to a fixture for high and low temperature testing of multi-package devices. Background Technology

[0002] Three-temperature electrical characteristics are key performance indicators for electronic components. To ensure that electronic components can operate normally and perform their intended functions under specified operating conditions, they typically undergo three-temperature electrical parameter testing before leaving the factory. This includes testing at room temperature, at the highest rated operating temperature, and at the lowest rated operating temperature. Depending on their application, components may have different operating temperature ranges, such as -40℃ to 85℃, -40℃ to 100℃, or -55℃ to 125℃. Generally, it is required that the tested component can stably maintain the specified temperature point during testing at the extreme temperature points.

[0003] Currently, the industry commonly uses in-chamber testing for high and low temperature testing of electronic components. This involves placing the test sample and testing fixture inside a high and low temperature chamber and maintaining the temperature at a specified point for a specified time before testing. This method is suitable for single-sample testing. However, in batch testing, the chamber needs to be opened to change samples, causing a drastic change in the internal temperature environment. Each sample change requires waiting for the temperature to stabilize again, resulting in low testing efficiency. Furthermore, frequent opening of the chamber door during low-temperature testing can easily cause frost to form on the surface of samples in the storage area, affecting the insulation effect.

[0004] Therefore, finding a suitable high and low temperature testing fixture is a problem that urgently needs to be solved by those skilled in the art. Utility Model Content

[0005] Based on this, in order to solve the problem of poor test results mentioned in the prior art, this application provides a multi-package high and low temperature test fixture device, including a base, a sliding mechanism, at least two adapter plates, a locking seat and a heat flow hood; the base, sliding mechanism, adapter plates and locking seat are connected in sequence in the longitudinal direction; The base has an annular groove on the side near the sliding mechanism, and the annular groove is adapted to the heat flow shroud; An accommodating groove is provided extending from the center of the annular groove. The sliding mechanism is disposed in the accommodating groove. The connecting plate is slidably connected to the sliding mechanism. The locking seat is fixedly connected to the adapter plate to form a double-row straight-insertion device under test position.

[0006] Furthermore, the sliding mechanism includes guide rails and sliders. There are two guide rails and four sliders. Two sliders are provided on one guide rail. A transition plate is connected to the guide rail through the upper slider of the adjacent guide rail, so that the transition plate can move on the guide rail through the slider to adjust the distance between adjacent transition plates.

[0007] Furthermore, the outer diameter of the annular groove is designed with an oblique angle.

[0008] Furthermore, the locking seat and the adapter plate are connected by welding, and the locking seat is made of PFA material.

[0009] Furthermore, the base is made of fiberglass.

[0010] Furthermore, the heat flow hood covers the annular groove to form a temperature measurement space, and the device under test, positioned by the locking seat, is placed in the temperature measurement space.

[0011] Furthermore, the inner wall of the annular groove is provided with an elastic material.

[0012] Compared with existing technologies, the beneficial effects of this application are as follows: This application aims to improve the high and low temperature testing efficiency of dual in-line package (DIP) electronic components. A dedicated test fixture with a double-row locking test socket and a heat flow hood is designed. By mounting the insulated test sample onto this fixture and utilizing the rapid heating and cooling characteristics of the heat flow hood, the device under test can quickly reach and stabilize at the specified temperature point, improving testing efficiency by more than 50% compared to chamber testing. By adjusting the spacing between the two adapter plates (test sockets), the fixture can meet the testing requirements of components of different sizes. This invention features simple operation, a wide temperature range, and strong versatility. Attached Figure Description

[0013] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0014] Figure 1 This is one of the partial structural schematic diagrams of a multi-package high and low temperature test fixture device in one embodiment; Figure label: 100, base; 110, annular groove; 120, receiving groove; 200, guide rail; 300, slider; 400, adapter plate; 500, locking seat. Detailed Implementation

[0015] To enable those skilled in the art to better understand the technical solutions in this application, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0016] This application provides a multi-package high and low temperature test fixture device, including a base 100, a sliding mechanism, at least two adapter plates 400, a locking seat 500, and a heat flow hood; the base 100, sliding mechanism, adapter plates 400, and locking seat 500 are connected sequentially in the longitudinal direction. The base 100 is provided with an annular groove 110 on the side near the sliding mechanism, and the annular groove 110 is adapted to the heat flow shroud; An accommodating groove 120 is provided extending from the center of the annular groove 110. The sliding mechanism is disposed in the accommodating groove 120. The connecting plate is slidably connected to the sliding mechanism. The locking seat 500 is fixedly connected to the adapter plate 400 to form a double-row straight-insertion device under test position.

[0017] Specifically, an annular groove 110 is provided on the base 100 to accommodate the heat flow hood, allowing the sliding mechanism, adapter plate 400, and locking seat 500 mounted on the base 100 to be placed within the heat flow hood. The heat flow hood connects to an external temperature control device, enabling rapid temperature rise and fall within the hood, allowing the device under test to quickly reach and stabilize at the specified temperature. The adapter plate 400 slides along a track on the sliding mechanism, allowing adjustment of the distance between the two adapter plates 400, i.e., the distance between the two test seats, to meet the testing needs of components of different sizes. This application features a simple structure, convenient operation, a wide temperature range, strong versatility, and solves the problem of frost formation common in existing technologies. It can perform heat flow hood electrical performance testing on products with different specified packages. The operating temperature of this device can reach -65℃ to 200℃.

[0018] For example, the base 100 mainly serves as support and heat insulation. To increase the actual placement volume while ensuring positioning effectiveness and airtightness, the center of the circular island is recessed to create a receiving groove 120. The receiving groove 120 has a side length of 97.5mm and a height of 20mm. The main base 100 has dimensions of 220*220*100mm. The guide rail 200 can have dimensions of 7*100*4.8mm.

[0019] In one embodiment, the sliding mechanism includes guide rails 200 and sliders 300. There are two guide rails 200 and four sliders 300. Two sliders 300 are provided on one guide rail 200. A transition plate 400 is connected to the guide rail 200 through the upper slider 300 of the adjacent guide rail 200, so that the transition plate 400 can move on the guide rail 200 through the sliders 300 to adjust the distance between adjacent transition plates 400.

[0020] Specifically, two adapter plates 400 form a dual-row test position. For example, this allows for electrical performance testing of dual-row through-hole products with a column spacing of 2.54mm. The column spacing is typically 15~35mm and infinitely adjustable. The slider 300 can be 17*22.5*4.8mm in size. The two adapter plates 400 have four pairs of 8mm-spaced through holes for locking screws, enabling the adapter plates 400 and locking seats 500 to move along the guide rail 200. Electrical connections use a four-wire configuration to reduce errors caused by line loss. External connections use aviation connectors (J30J-25) to ensure reliable insertion and removal.

[0021] In one embodiment, the annular groove 110 has an oblique outer diameter design.

[0022] Specifically, the beveled design of the 110mm outer diameter of the annular groove can assist in positioning.

[0023] The locking seat 500 is connected to the adapter plate 400 by welding, and the locking seat 500 is made of PFA material.

[0024] In one embodiment, the base 100 is made of fiberglass.

[0025] Specifically, it serves as a heat insulation agent.

[0026] In one embodiment, the heat flow hood covers the annular groove 110 to form a temperature measurement space, and the device under test, positioned by the locking seat 500, is placed in the temperature measurement space.

[0027] In one embodiment, the inner wall of the annular groove 110 is provided with an elastic material.

[0028] Specifically, the inner wall of the annular groove 110 can be filled with an elastic material for better airtightness.

[0029] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on or indirectly set on the other component; when a component is referred to as being "connected to" another component, it can be directly connected to or indirectly connected to the other component.

[0030] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" or "several" means two or more, unless otherwise explicitly specified.

[0031] It should be noted that the structures, proportions, sizes, etc., shown in the accompanying drawings of this specification are only for the purpose of assisting those skilled in the art in understanding and reading the content disclosed in the specification, and are not intended to limit the conditions under which this application can be implemented. Therefore, they have no substantial technical significance. Any modifications to the structure, changes in the proportions, or adjustments to the size should still fall within the scope of the technical content disclosed in this application, provided that they do not affect the effects and purposes that this application can produce.

[0032] The above description of the disclosed embodiments enables those skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A fixture device for high and low temperature testing of multi-packaged equipment, characterized in that, It includes a base, a sliding mechanism, at least two adapter plates, a locking seat, and a heat flow hood; the base, sliding mechanism, adapter plates, and locking seat are connected sequentially in the longitudinal direction; The base has an annular groove on the side near the sliding mechanism, and the annular groove is adapted to the heat flow shroud; An accommodating groove is provided extending from the center of the annular groove. The sliding mechanism is disposed in the accommodating groove. The adapter plate is slidably connected to the sliding mechanism. The locking seat is fixedly connected to the adapter plate to form a double-row straight-insertion device under test position.

2. The adaptable high and low temperature test fixture device for multiple packages according to claim 1, characterized in that, The sliding mechanism includes guide rails and sliders. There are two guide rails and four sliders. Two sliders are provided on one guide rail. A transition plate is connected to the guide rail through the upper slider of the adjacent guide rail, so that the transition plate can move on the guide rail through the slider to adjust the distance between adjacent transition plates.

3. The adaptable high and low temperature test fixture device for multiple packages according to claim 1, characterized in that, The outer diameter of the annular groove is designed with an oblique angle.

4. The adaptable high and low temperature test fixture device for multiple packages according to claim 1, characterized in that, The locking seat and the adapter plate are connected by welding, and the locking seat is made of PFA material.

5. The adaptable high and low temperature test fixture device for multiple packages according to claim 1, characterized in that, The base is made of fiberglass.

6. The adaptable high and low temperature test fixture device for multiple packages according to claim 1, characterized in that, The heat flow hood covers the annular groove to form a temperature measurement space, and the device under test, positioned by the locking seat, is placed in the temperature measurement space.

7. The adaptable high and low temperature test fixture device for multiple packages according to claim 1, characterized in that, The inner wall of the annular groove is provided with an elastic material.

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