An electrical measuring system for a silicon controlled photocoupler

Abstract

The utility model discloses a controllable silicon photoelectric coupler's electric measuring system, include: industrial computer, series type matrix switch, controllable silicon photoelectric coupler testing machine, and controllable silicon photoelectric coupler testing machine is connected with series type matrix switch through controllable silicon photoelectric coupler, and the controllable silicon photoelectric coupler of waiting and examining is connected with controllable silicon photoelectric coupler testing machine through series type matrix switch, controllable silicon photoelectric coupler testing machine includes: high low pressure mixed formula source unit, low voltage source unit, signal control card, bus conversion card, the input of bus conversion card is connected with industrial computer, and the output of bus conversion card is connected with high low pressure mixed formula source unit, low voltage source unit, signal control card respectively, the utility model discloses a controllable silicon photoelectric coupler's electric measuring system can output high voltage, drive large current, test speed is fast, carry out arbitrary pin switching and power on channel - compatible different pin's controllable silicon photoelectric coupler's test.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, specifically to an electrical measurement system for a silicon controlled rectifier optocoupler. Background Technology

[0002] In recent years, with the rapid development of the domestic new energy vehicle industry, the demand for thyristor optocouplers used in power control, electric vehicle charging piles, battery management systems (BMS) and other equipment has increased. The quality of thyristor optocoupler chips will directly affect the safety of power equipment.

[0003] Chip packaging manufacturers conduct electrical testing on high-voltage thyristor optocouplers during the packaging stage to ensure production quality. Therefore, there is an urgent need to develop an electrical measurement system for thyristor optocouplers used in the packaging and testing phase. Utility Model Content

[0004] This invention overcomes the shortcomings of the prior art and provides an electrical measurement system for silicon controlled rectifier (SCR) optocouplers. This system can output high voltage, drive large current, and has a fast testing speed. It can switch power channels at any pin position and is compatible with testing SCR optocouplers with different pin positions. It does not require manual switching of the instrument probe lines.

[0005] To achieve the above objectives, the technical solution adopted by this utility model is as follows: an electrical measurement system for a thyristor optocoupler, comprising: an industrial control computer, a series matrix switch, and a thyristor optocoupler tester, wherein the industrial control computer is connected to the series matrix switch through the thyristor optocoupler tester, and the thyristor optocoupler under test is connected to the thyristor optocoupler tester through the series matrix switch; The thyristor optocoupler tester includes: a high-low voltage hybrid source unit, a low voltage source unit, a signal control card, and a bus conversion card; the input end of the bus conversion card is connected to an industrial control computer, and the output end of the bus conversion card is connected to the high-low voltage hybrid source unit, the low voltage source unit, and the signal control card respectively.

[0006] Preferably, the industrial control computer includes a computer system and a PCI-E expansion card interconnected with the computer system. The PCI-E expansion card is connected to the bus conversion card of the thyristor optocoupler tester via a PCI-E bus. The bus conversion card is used to convert the PCI-E bus into a parallel bus and interconnect with the high-low voltage hybrid source unit, the low-voltage source unit, and the signal control card via the parallel bus.

[0007] Preferably, the high-low voltage hybrid source unit includes: a timing control and data processing circuit one, which is connected to several sets of current-voltage measuring circuits and voltage-current measuring circuits respectively through an analog-to-digital converter chip and a digital-to-analog converter chip. The several sets of current-voltage measuring circuits and voltage-current measuring circuits include current-voltage measuring circuits and voltage-current measuring circuits suitable for high voltage, and current-voltage measuring circuits and voltage-current measuring circuits suitable for low voltage. The low-voltage source unit includes: a timing control and data processing circuit two, which is connected to a current-to-voltage measurement circuit and a voltage-to-current measurement circuit suitable for low voltage through an analog-to-digital converter chip and a digital-to-analog converter chip, respectively. The signal control card includes signal processing chips that are connected to the industrial control computer and the serial matrix switch, respectively.

[0008] Preferably, the high- and low-voltage hybrid source unit, low-voltage source unit, and signal control card of the thyristor optocoupler tester are connected to a series matrix switch via several test lines and control lines; the series matrix switch is connected to the thyristor optocoupler under test via ports P1~P4 and S1~S4.

[0009] Preferably, the current-to-voltage measurement circuit includes: a current source connected to the digital-to-analog converter chip, and an instrumentation amplifier connected to the analog-to-digital converter chip; One output terminal of the current source is led out as the HOT terminal, and the output terminal of the current source is connected to one end of the follower. The other end of the follower is connected to resistor R6. The other end of resistor R6 is connected to the inverting input terminal of the instrumentation operational amplifier. One end of resistor R7 is connected to the inverting input terminal of the instrumentation operational amplifier, and the other end of resistor R7 is grounded. The non-inverting input terminal of the instrumentation operational amplifier is connected to resistor R8. The other end of resistor R8 is the COM terminal. One end of resistor R9 is connected to the non-inverting input terminal of the instrumentation operational amplifier, and the other end of resistor R9 is grounded.

[0010] Preferably, the voltage-to-current measurement circuit includes: a voltage source connected to the digital-to-analog converter chip, an instrumentation operational amplifier connected to the analog-to-digital converter chip, and a ground terminal serving as the COM terminal; The output terminal of the voltage source is connected to one end of the sampling resistor R5. The other end of the sampling resistor R5 is led out as the HOT terminal. The connection point between the sampling resistor R5 and the voltage source is connected to the inverting input of the instrumentation operational amplifier through resistor R1. Resistor R2 is connected to the inverting input of the instrumentation operational amplifier, and the other end of resistor R2 is grounded. One end of the follower is connected to the HOT terminal, and the other end is connected to resistor R3. The other end of resistor R3 is connected to the non-inverting input of the instrumentation operational amplifier. One end of resistor R4 is connected to the non-inverting input of the instrumentation operational amplifier, and the other end is grounded.

[0011] Preferably, the control line is connected to a series matrix switch and independently controls the switches in the series matrix switch to control the on / off state of the corresponding switches; The HOT terminal of test lead one in the test leads is connected to one end of switch K5. The other end of switch K5 is connected to port P1 via switch K15, to port P2 via switch K19, to port P3 via switch K17, and to port P4 via switch K21. The COM terminal of test line 1 is connected to one end of switch K6. The other end of switch K6 is connected to port P1 via switch K20, to port P2 via switch K16, to port P3 via switch K22, and to port P4 via switch K18. The HOT terminal of test lead 2 in the test lead is connected to one end of switch K3. The other end of switch K3 is connected to port S1 via switch K7, to port S2 via switch K11, to port S3 via switch K9, and to port S4 via switch K13. The COM terminal of test line 2 is connected to one end of switch K4. The other end of switch K4 is connected to port S1 via switch K12, to port S2 via switch K8, to port S3 via switch K14, and to port S4 via switch K10. The HOT terminal of test lead 3 in the test lead is connected to one end of switch K1. The other end of switch K3 is connected to port S1 via switch K7, to port S2 via switch K11, to port S3 via switch K9, and to port S4 via switch K13. The COM terminal of test line 3 is connected to one end of switch K2. The other end of switch K4 is connected to port S1 via switch K12, to port S2 via switch K8, to port S3 via switch K14, and to port S4 via switch K10.

[0012] Preferably, the timing control and data processing circuit one and the timing control and data processing circuit two are respectively adopted as programmable gate array chips, and the programmable gate array chip model is EPM240T100C5N; The digital-to-analog converter chip used is model AD5422BREZ-REEL; the analog-to-digital converter chip used is model AD7705BRZ-REEL. The voltage and current sources use OPA548 chips.

[0013] This utility model solves the defects existing in the technical background, and the beneficial technical effects of this utility model are: This invention relates to an electrical measurement system for a silicon controlled rectifier (SCR) optocoupler, which can output high voltage, drive large current, test quickly, and switch power channels at any pin position—compatible with testing SCR optocouplers with different pin positions, without the need for manual switching of the instrument probe lines. Attached Figure Description

[0014] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0015] Figure 1 This is a schematic diagram of the overall circuit structure of an electrical measurement system with a silicon controlled rectifier optocoupler according to a preferred embodiment of the present invention. Figure 2 This is a circuit diagram of the voltage and current measurement circuit of an electrical measurement system with a silicon controlled rectifier optocoupler according to a preferred embodiment of the present invention. Figure 3 This is a circuit diagram of the current-voltage measurement circuit of an electrical measurement system with a silicon controlled rectifier optocoupler according to a preferred embodiment of the present invention. Figure 4 This is a wiring diagram of the four-pin thyristor optocoupler material of an electrical measurement system based on a preferred embodiment of the present invention. Figure 5 This is a wiring diagram of a six-pin thyristor optocoupler material for an electrical measurement system based on a preferred embodiment of this utility model. Figure 6 This is a test diagram of an electrical measurement system for a silicon controlled rectifier (SCR) optocoupler according to a preferred embodiment of the present invention. Figure 7 This is a preferred embodiment of the electrical measurement system for a silicon controlled rectifier optocoupler, which uses an oscilloscope to measure the waveform of the high-voltage circuit output. Detailed Implementation

[0016] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. These drawings are simplified schematic diagrams, which are only used to illustrate the basic structure of the present invention in a schematic manner, and therefore only show the components related to the present invention.

[0017] It should be noted that if directional indicators (such as up, down, bottom, top, etc.) are involved in the embodiments of this utility model, the directional indicators are only used to explain the relative positional relationship and movement of the components in a specific posture. If the specific posture changes, the directional indicators will also change accordingly. The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, features defined with "first" and "second" may explicitly or implicitly include one or more of that feature. Unless otherwise explicitly specified and limited, the terms "set," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal connection of two components. For those skilled in the art, the specific meaning of the above terms in this utility model can be understood according to the specific circumstances.

[0018] Example 1, as Figures 1-3 As shown, an electrical measurement system for a thyristor optocoupler is characterized by comprising: an industrial control computer, a series matrix switch, and a thyristor optocoupler tester. The industrial control computer is connected to the series matrix switch via the thyristor optocoupler tester, and the thyristor optocoupler under test is connected to the thyristor optocoupler tester via the series matrix switch. The thyristor optocoupler tester includes: a high-low voltage hybrid source unit, a low voltage source unit, a signal control card, and a bus conversion card; the input end of the bus conversion card is connected to an industrial control computer, and the output end of the bus conversion card is connected to the high-low voltage hybrid source unit, the low voltage source unit, and the signal control card respectively.

[0019] Preferably, the industrial control computer includes a computer system and a PCI-E expansion card interconnected with the computer system. The PCI-E expansion card is connected to the bus conversion card of the thyristor optocoupler tester via a PCI-E bus. The bus conversion card is used to convert the PCI-E bus into a parallel bus and interconnect with the high-low voltage hybrid source unit, the low-voltage source unit, and the signal control card via the parallel bus.

[0020] Preferably, the high-low voltage hybrid source unit includes: a timing control and data processing circuit one, which is connected to several sets of current-voltage measuring circuits and voltage-current measuring circuits respectively through an analog-to-digital converter chip and a digital-to-analog converter chip. The several sets of current-voltage measuring circuits and voltage-current measuring circuits include current-voltage measuring circuits and voltage-current measuring circuits suitable for high voltage, and current-voltage measuring circuits and voltage-current measuring circuits suitable for low voltage. The low-voltage source unit includes: a timing control and data processing circuit two, which is connected to a current-to-voltage measurement circuit and a voltage-to-current measurement circuit suitable for low voltage through an analog-to-digital converter chip and a digital-to-analog converter chip, respectively. The signal control card includes signal processing chips that are connected to the industrial control computer and the serial matrix switch, respectively.

[0021] Preferably, the high- and low-voltage hybrid source unit, low-voltage source unit, and signal control card of the thyristor optocoupler tester are connected to a series matrix switch via several test lines and control lines; the series matrix switch is connected to the thyristor optocoupler under test via ports P1~P4 and S1~S4.

[0022] Example 2, as Figures 1-3 As shown, based on Embodiment 1, the control line is connected to a series matrix switch and independently controls the switches in the series matrix switch to control the open / closed state of the corresponding switches. The HOT terminal of test lead one in the test leads is connected to one end of switch K5. The other end of switch K5 is connected to port P1 via switch K15, to port P2 via switch K19, to port P3 via switch K17, and to port P4 via switch K21. The COM terminal of test line 1 is connected to one end of switch K6. The other end of switch K6 is connected to port P1 via switch K20, to port P2 via switch K16, to port P3 via switch K22, and to port P4 via switch K18. The HOT terminal of test lead 2 in the test lead is connected to one end of switch K3. The other end of switch K3 is connected to port S1 via switch K7, to port S2 via switch K11, to port S3 via switch K9, and to port S4 via switch K13. The COM terminal of test line 2 is connected to one end of switch K4. The other end of switch K4 is connected to port S1 via switch K12, to port S2 via switch K8, to port S3 via switch K14, and to port S4 via switch K10. The HOT terminal of test lead 3 in the test lead is connected to one end of switch K1. The other end of switch K3 is connected to port S1 via switch K7, to port S2 via switch K11, to port S3 via switch K9, and to port S4 via switch K13. The COM terminal of test line 3 is connected to one end of switch K2. The other end of switch K4 is connected to port S1 via switch K12, to port S2 via switch K8, to port S3 via switch K14, and to port S4 via switch K10.

[0023] Preferably, both the timing control and data processing circuit one and the timing control and data processing circuit two employ programmable gate array (PGA) chips, specifically the EPM240T100C5N; the digital-to-analog converter (DAC) uses the AD5422BREZ-REEL; the DAC uses the AD7705BRZ-REEL; and the voltage and current sources use the OPA548 chips. The series-connected matrix switch uses several reed relays, model SWQ14 / 12-1H16-001.

[0024] In this embodiment, the high voltage range includes -1000~1000VDC, ±0.01nA~±1mA; the low voltage range includes -24~24VDC, ±0.0001uA~±2A.

[0025] Example 3, based on Example 1 or Example 2, such as Figure 2 The voltage-to-current measurement circuit includes: a voltage source connected to a digital-to-analog converter chip, an instrumentation operational amplifier connected to an analog-to-digital converter chip, and a ground terminal serving as the COM terminal. The output terminal of the voltage source is connected to one end of a sampling resistor R5, and the other end of the sampling resistor R5 is led out as the HOT terminal. The connection point between the sampling resistor R5 and the voltage source is connected to the inverting input of the instrumentation operational amplifier through resistor R1. Resistor R2 is also connected to the inverting input of the instrumentation operational amplifier, and the other end of resistor R2 is grounded. One end of a follower is connected to the HOT terminal, and the other end is connected to resistor R3. The other end of resistor R3 is connected to the non-inverting input of the instrumentation operational amplifier. One end of resistor R4 is connected to the non-inverting input of the instrumentation operational amplifier, and the other end is grounded.

[0026] Example 4, based on Example 1 or Example 2, such as Figure 3 The current-voltage measurement circuit includes: a current source connected to a digital-to-analog converter chip, and an instrumentation operational amplifier connected to an analog-to-digital converter chip; one output terminal of the current source is led out as a HOT terminal, and the output terminal of the current source is connected to one end of a follower, the other end of the follower is connected to resistor R6, the other end of resistor R6 is connected to the inverting input terminal of the instrumentation operational amplifier, one end of resistor R7 is connected to the inverting input terminal of the instrumentation operational amplifier, and the other end of resistor R7 is grounded. The non-inverting input terminal of the instrumentation operational amplifier is connected to resistor R8, the other end of resistor R8 is the COM terminal, one end of resistor R9 is connected to the non-inverting input terminal of the instrumentation operational amplifier, and the other end of resistor R9 is grounded. Furthermore, in this embodiment, the voltage source and current source use OPA548 chips.

[0027] Specifically, even for the high-voltage unit, its module input is still controlled by an analog value of 0~10V. The main controller EPM240T100C5N can send an analog value of 0~10V to the input of the high-voltage unit through a digital-to-analog converter chip, and the high-voltage unit outputs high voltage according to the corresponding ratio.

[0028] Specifically, the high- and low-voltage hybrid unit is test station B, and the low-voltage unit is test station A. As shown in the figure, test station B applies voltage to the output terminal of the thyristor under test, corresponding to pins 3 and 4 of the material in the figure (-24~24V voltage corresponds to VINH, IFT, VTM, etc., and -1000~1000V voltage corresponds to IDRM, IDRM2, etc.); test station A applies voltage to the input terminal light source of the thyristor under test, corresponding to pins 1 and 2 of the material in the figure (-24~24V voltage corresponds to VF, IR, etc.).

[0029] Specifically, regardless of whether the analog circuit is a high-voltage unit or a low-voltage unit, the digital circuit section is the same. The main control chip generates corresponding digital signals to control the output of different analog circuits.

[0030] Specifically, when high voltage is applied and measured, the detection circuit has a voltage divider, corresponding to... Figure 2 or Figure 3 In this structure, R1 and R2, through resistor voltage division, ensure that the voltage drops to within 10V when the sampled value reaches the digital circuit, thus preventing damage to the digital circuit.

[0031] Example 5: Based on any of Examples 1 to 3, in this example, the central control computer sends instructions to the PCI-E expansion card through its internal computer system. The PCI-E expansion card then transmits the instructions to the PCI-E bus to parallel bus converter card via the PCI-E bus. Finally, the instructions are sent via the parallel bus to the high-low voltage hybrid source unit and the low-voltage source unit, along with instructions to apply test parameters. The high-low voltage hybrid source unit and the low-voltage source unit transmit the test values ​​back to the PCI-E bus to parallel bus converter card via the parallel bus. The test values ​​are then transmitted via the PCI-E bus to the PCI-E expansion card of the industrial control computer, and finally transmitted back to the computer system from the PCI-E expansion card.

[0032] The high- and low-voltage hybrid source and the low-voltage source are independent of each other and are controlled only by an industrial control computer.

[0033] The control computer sends instructions to the PCI-E expansion card through its internal computer system. The PCI-E expansion card then transmits the instructions to the PCI-E bus to parallel bus converter card via the PCI-E bus. The instructions are then sent to the signal control card via the parallel bus to control the opening / closing of the low-leakage series matrix switch. After receiving and processing the instructions, the signal control card sends the control signals to the corresponding switches in the low-leakage series matrix switch to control the corresponding switches to be turned on or off, thereby achieving the purpose of selecting different channels according to different test items.

[0034] Example 6: The system of this invention is compatible with testing SCR optocouplers with different pin configurations. For example, when testing a four-pin SCR optocoupler, Figure 4 For the probe holder of the gravity-type machine tool, connect the cables of the P1~P4 ports and S1~S4 ports of the low-leakage series matrix switch to the probe holder in sequence. The gravity-type machine tool uses existing technology; specific models are not listed here, as long as they can basically achieve the functions required by this invention. During material unloading, due to gravity, the four-pin optocouplers will fall onto ports P3, P4, S3, and S4. Therefore, the industrial control computer issues a command to turn on the switches selected at ports P3, P4, S3, and S4. P3 as HOT port: K5+K17 are on; P4 as COM port: K6+K18 are on; S3 as HOT port (low voltage test): K3+K9 are on; S3 as HOT port (high voltage test): K1+K9 are on; S4 as COM port (low voltage test): K4+K10 are on; S4 as COM port (high voltage test): K2+K10 are on.

[0035] Example 7: The system of this invention is compatible with testing SCR optocouplers with different pin configurations. For example, when testing a six-pin SCR optocoupler, such as... Figure 5For the probe holder of the gravity-type machine tool, connect the cables of the low-leakage series matrix switch P1~P4 ports and S1~S4 ports to the probe holder in sequence. The gravity-type machine tool uses existing technology; specific models are not listed here, as long as they can basically achieve the functions required by this invention. During material unloading, due to gravity, the six-pin optocoupler will fall onto ports P2, P3, P4, S2, S3, and S4. According to the standard package of the six-pin thyristor optocoupler, generally P2, P3, S2, and S4 are active. Therefore, the industrial control computer issues a command to turn on the selected switches at ports P2, P3, S2, and S4. P2 as HOT port: K5+K19 are on; P3 as COM port: K6+K22 are on; S2 as HOT port (low voltage test): K3+K11 are on; S2 as HOT port (high voltage test): K1+K11 are on; S4 as COM port (low voltage test): K4+K10 are on; S4 as COM port (high voltage test): K2+K10 are on.

[0036] Example 8, as Figure 6 As shown, the electrical measurement system of the thyristor optocoupler used in Embodiment 3 or Embodiment 4 was employed for testing. The tested product model was 3061 thyristor optocoupler with a withstand voltage of 600V. VF represents the on-state voltage of the light source of the tested material; IR represents the leakage current measured by applying a reverse voltage to the light source of the tested material; corresponding to the "low-voltage SMU unit" in the structural diagram. IDRM and IDRM-N correspond to applying 600V and -600V voltages to the output terminal of the tested material, respectively. The leakage currents of the two materials tested at the two stations in the diagram are measured to be 8 and 10nA, respectively. This corresponds to the "high-low voltage hybrid unit" in the structural diagram. IFT, IFT-N, VTM, etc., correspond to the synchronous testing of the "low-voltage SMU unit" and "high-low voltage hybrid unit" in the structural diagram, i.e., simultaneously powering the input (light source) and output terminals of the tested thyristor material and measuring its output characteristics.

[0037] Working principle: This utility model discloses an electrical measurement system for a silicon controlled rectifier optocoupler, such as... Figure 7 As shown, the electrical measurement system for SCR optocouplers uses an oscilloscope to measure the waveform of the high-voltage circuit output; the output is set to +1000V and the duration is set to 15ms. This invention is an electrical measurement system for SCR optocouplers that can output high voltage (voltage range up to 1000V), drive high current (current range up to 2A), has fast testing speed, and allows for switching of power channels at any pin position—compatible with testing SCR optocouplers with different pin positions, without the need for manual switching of the instrument probe lines.

[0038] The above specific embodiments are specific support for the proposed solution concept of this utility model, and should not be used to limit the protection scope of this utility model. Any equivalent changes or modifications made on the basis of this technical solution in accordance with the technical concept proposed by this utility model shall still fall within the protection scope of this utility model.

Claims

1. An electrical measurement system using a silicon controlled rectifier (SCR) optocoupler, comprising: An interconnected industrial control computer, a series matrix switch, and a thyristor optocoupler tester; characterized in that: the industrial control computer is connected to the series matrix switch via the thyristor optocoupler tester, and the thyristor optocoupler under test is connected to the thyristor optocoupler tester via the series matrix switch; The thyristor optocoupler tester includes: a high-low voltage hybrid source unit, a low voltage source unit, a signal control card, and a bus conversion card; the input end of the bus conversion card is connected to an industrial control computer, and the output end of the bus conversion card is connected to the high-low voltage hybrid source unit, the low voltage source unit, and the signal control card respectively.

2. The electrical measurement system of a silicon controlled rectifier optocoupler according to claim 1, characterized in that: The industrial control computer includes a computer system and a PCI-E expansion card interconnected with the computer system. The PCI-E expansion card is connected to the bus conversion card of the thyristor optocoupler tester via a PCI-E bus. The bus conversion card is used to convert the PCI-E bus into a parallel bus and interconnects with the high-low voltage hybrid source unit, the low-voltage source unit, and the signal control card via the parallel bus.

3. The electrical measurement system of a silicon controlled rectifier optocoupler according to claim 2, characterized in that: The high-low voltage hybrid source unit includes: a timing control and data processing circuit 1, which is connected to several sets of current-voltage measuring circuits and voltage-current measuring circuits respectively through analog-to-digital converter chips and digital-to-analog converter chips. The several sets of current-voltage measuring circuits and voltage-current measuring circuits include current-voltage measuring circuits and voltage-current measuring circuits suitable for high voltage, and current-voltage measuring circuits and voltage-current measuring circuits suitable for low voltage. The low-voltage source unit includes: a timing control and data processing circuit two, which is connected to a current-to-voltage measurement circuit and a voltage-to-current measurement circuit suitable for low voltage through an analog-to-digital converter chip and a digital-to-analog converter chip, respectively. The signal control card includes signal processing chips that are connected to the industrial control computer and the serial matrix switch, respectively.

4. The electrical measurement system of a silicon controlled rectifier optocoupler according to claim 3, characterized in that: The high- and low-voltage hybrid source unit, low-voltage source unit, and signal control card of the thyristor optocoupler tester are connected to the series matrix switch through several test lines and control lines, respectively; the series matrix switch is connected to the thyristor optocoupler under test through ports P1 to P4 and ports S1 to S4.

5. The electrical measurement system of a silicon controlled rectifier optocoupler according to claim 4, characterized in that: The current-to-voltage measurement circuit includes: a current source connected to the digital-to-analog converter chip, and an instrumentation amplifier connected to the analog-to-digital converter chip; One output terminal of the current source is led out as the HOT terminal, and the output terminal of the current source is connected to one end of the follower. The other end of the follower is connected to resistor R6. The other end of resistor R6 is connected to the inverting input terminal of the instrumentation operational amplifier. One end of resistor R7 is connected to the inverting input terminal of the instrumentation operational amplifier, and the other end of resistor R7 is grounded. The non-inverting input terminal of the instrumentation operational amplifier is connected to resistor R8. The other end of resistor R8 is the COM terminal. One end of resistor R9 is connected to the non-inverting input terminal of the instrumentation operational amplifier, and the other end of resistor R9 is grounded.

6. The electrical measurement system of a silicon controlled rectifier optocoupler according to claim 5, characterized in that: The voltage-to-current measurement circuit includes: a voltage source connected to the digital-to-analog converter chip, an instrumentation amplifier connected to the analog-to-digital converter chip, and a ground terminal serving as the COM terminal; The output terminal of the voltage source is connected to one end of the sampling resistor R5, and the other end of the sampling resistor R5 is led out as the HOT terminal. The connection point of the sampling resistor R5 and the voltage source is connected to the inverting input of the instrumentation operational amplifier through resistor R1. Resistor R2 is connected to the inverting input of the instrumentation operational amplifier, and the other end of resistor R2 is grounded. One end of the follower is connected to the HOT terminal, and the other end is connected to resistor R3. The other end of resistor R3 is connected to the non-inverting input of the instrumentation operational amplifier. One end of resistor R4 is connected to the non-inverting input of the instrumentation operational amplifier, and the other end is grounded.

7. The electrical measurement system of a silicon controlled rectifier optocoupler according to claim 6, characterized in that: The control line connects to the series matrix switch and independently controls the switches in the series matrix switch to control the on / off state of the corresponding switches; The HOT terminal of test lead one in the test leads is connected to one end of switch K5. The other end of switch K5 is connected to port P1 via switch K15, to port P2 via switch K19, to port P3 via switch K17, and to port P4 via switch K21. The COM terminal of test line 1 is connected to one end of switch K6. The other end of switch K6 is connected to port P1 via switch K20, to port P2 via switch K16, to port P3 via switch K22, and to port P4 via switch K18. The HOT terminal of test lead 2 in the test lead is connected to one end of switch K3. The other end of switch K3 is connected to port S1 via switch K7, to port S2 via switch K11, to port S3 via switch K9, and to port S4 via switch K13. The COM terminal of test line 2 is connected to one end of switch K4. The other end of switch K4 is connected to port S1 via switch K12, to port S2 via switch K8, to port S3 via switch K14, and to port S4 via switch K10. The HOT terminal of test lead 3 in the test lead is connected to one end of switch K1. The other end of switch K3 is connected to port S1 via switch K7, to port S2 via switch K11, to port S3 via switch K9, and to port S4 via switch K13. The COM terminal of test line 3 is connected to one end of switch K2. The other end of switch K4 is connected to port S1 via switch K12, to port S2 via switch K8, to port S3 via switch K14, and to port S4 via switch K10.

8. The electrical measurement system of a silicon controlled rectifier optocoupler according to claim 7, characterized in that: The timing control and data processing circuit one and the timing control and data processing circuit two respectively adopt programmable gate array chips, and the model of the programmable gate array chip is EPM240T100C5N. The digital-to-analog converter chip used is model AD5422BREZ-REEL; the analog-to-digital converter chip used is model AD7705BRZ-REEL. The voltage source and current source use OPA548 chips. The series matrix switch uses several reed relays, model number SWQ14 / 12-1H16-001.

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