A test device for a memory card

Abstract

The utility model discloses a kind of testing device for memory card, including adapter plate and spring test needle;The first face of the adapter plate is provided with card slot, the card slot is used for inserting memory card;The second face of the adapter plate opposite the first face is provided with conductive area and fixed plate;The spring test needle includes fixed part and the movable needle scalable connection with the fixed part;The fixed part is fixed on the fixed plate, and with the conductive area abuts;The movable needle is arranged in the conductive area, and the movable needle is used for with the sending data point of the memory card abuts.The utility model can realize the detachable connection of test needle and TX point, improve test efficiency and the reliability of test result.

Description

Technical Field

[0001] This utility model relates to the field of testing device technology, and in particular to a testing device for memory cards. Background Technology

[0002] With the rapid development of digital technology, memory cards (such as SD cards, MicroSD cards, CF cards, etc.) have become widely used as portable storage media in various fields, including electronic devices, industrial equipment, automotive systems, and the Internet of Things. During the production of memory cards, a series of rigorous tests must be conducted before shipment to ensure their performance and quality meet predetermined requirements. Among these tests, capturing and deeply analyzing the memory card's test logs is a crucial step.

[0003] However, existing methods for capturing memory card test logs have several problems. First, to extract the test logs, it is usually necessary to solder wires to the transmit data point (TX point) of the memory card. This operation is not only time-consuming but also requires a significant investment of operator effort, resulting in extremely low testing efficiency. Second, to expose the TX point, the plastic coating on the surface of the memory card needs to be manually scraped off. Manual operation makes it difficult to precisely control the scraped area, and inaccurate positioning is prone to occur when soldering wires. This can not only cause the wires to connect with other test points, leading to short circuits, but also seriously affect the accuracy and safety of the test. Furthermore, during the test, the insertion and removal of the memory card can easily break the soldered wires, and repeated soldering can cause irreversible damage to the TX point, further reducing the reliability of the test. These problems severely restrict the improvement of memory card testing efficiency and the accuracy and reliability of test results. Utility Model Content

[0004] The technical problem to be solved by this utility model is to provide a testing device for memory cards, which can realize the detachable connection between the test probe and the TX point, thereby improving testing efficiency and the reliability of test results.

[0005] To solve the above-mentioned technical problems, the present invention adopts the following technical solution: A testing device for memory cards includes an adapter board and a spring test probe; The first surface of the adapter plate is provided with a card slot for inserting a memory card. The adapter plate has a conductive area and a fixing plate on its second surface opposite to the first surface. The spring test probe includes a fixing member and a movable probe that is retractably connected to the fixing member; The fastener is fixed to the fixing plate and abuts against the conductive area; The movable pin passes through the conductive area and is used to contact the data transmission point of the memory card.

[0006] Furthermore, the projection area of ​​the card slot on the second surface covers the conductive area.

[0007] Furthermore, the conductive area is provided with a first through hole that communicates with the card slot; The movable pin passes through the first through hole and is used to abut against the data transmission point of the memory card.

[0008] Furthermore, the fixing plate includes a U-shaped plate; The two legs of the U-shaped plate are fixed to the adapter plate respectively, so that the middle part of the U-shaped plate is parallel to the conductive area.

[0009] Furthermore, a second through hole opposite to the first through hole is provided on the middle part of the U-shaped plate; The fixing member has a tenon at one end away from the movable pin, and the tenon is inserted into the second through hole; The end of the fixing member near the movable pin abuts against the conductive area, so that the spring test pin is set perpendicular to the adapter plate.

[0010] Furthermore, there are multiple first through holes and multiple second through holes, and the number of first through holes is equal to the number of second through holes.

[0011] Furthermore, the adapter board is provided with a pin header, and the pin header is electrically connected to the conductive area.

[0012] Furthermore, extension plates are provided on both legs of the U-shaped plate; The extension plate is fixed to the adapter plate.

[0013] Furthermore, the extension plate is provided with threaded holes; The threaded hole is used to engage a screw, so that the extension plate is fixed to the adapter plate.

[0014] Furthermore, the threaded hole includes a first threaded hole and a second threaded hole; The diameter of the first threaded hole is larger than the diameter of the second threaded hole.

[0015] The beneficial effects of this invention are as follows: Through the collaborative design of the adapter plate and the spring test pin, a non-removable welded structure is transformed into a detachable mechanical structure. The slot on the first side of the adapter plate directly supports the memory card, while the second side of the adapter plate has a conductive area that forms an electrical connection basis with the spring test pin. The rigid connection between the spring test pin's fixing component and the fixing plate ensures stable fixation. The movable pin of the spring test pin and the fixing component achieve a retractable fit, adaptively compressing when the memory card is inserted, ensuring stable contact with the memory card's TX point while avoiding pin damage caused by rigid contact. The conductive area serves as an intermediate conductive layer, connecting the movable pin of the spring test pin to the external test circuit. Simultaneously, the movable pin of the spring test pin abuts against the memory card, enabling signal transmission between the memory card and the external test circuit. The entire device replaces the traditional welding process with a mechanical structure, eliminating the risk of wire detachment and welding damage. Attached Figure Description

[0016] Figure 1 A schematic diagram of a testing device for a memory card provided in an embodiment of this utility model; Figure 2 for Figure 1 A bottom view; Figure 3 This is a schematic diagram of the structure of a fixing plate provided in an embodiment of the present utility model; Figure 4 An installation diagram of a testing device for a memory card provided in an embodiment of this utility model; Figure 5 A schematic diagram of the structure of a spring test probe provided in an embodiment of this utility model; Figure 6 An installation diagram of a fastener provided for an embodiment of this utility model; Figure 7 for Figure 6 Schematic diagram of the structure at point A; Figure 8 A schematic diagram illustrating the installation of a movable pin according to an embodiment of this utility model; Label Explanation: 1. Testing device for memory cards; 11. Adapter plate; 111. Conductive area; 1111. First through hole; 12. Spring test pin; 121. Fixing member; 122. Movable pin; 1211. Tenon; 13. Card slot; 14. Fixing plate; 141. U-shaped plate; 1411. Leg of U-shaped plate; 1412. Middle part of U-shaped plate; 1413. Second through hole; 142. Extension plate; 1421. First threaded hole; 1422. Second threaded hole; 15. Pin header; 2. Memory card; 3. Screw. Detailed Implementation

[0017] To explain in detail the technical content, objectives, and effects of this utility model, the following description is provided in conjunction with the embodiments and accompanying drawings.

[0018] An embodiment of this utility model provides a testing device for memory cards, including an adapter plate and a spring test probe; The first surface of the adapter plate is provided with a card slot for inserting a memory card. The adapter plate has a conductive area and a fixing plate on its second surface opposite to the first surface. The spring test probe includes a fixing member and a movable probe that is retractably connected to the fixing member; The fastener is fixed to the fixing plate and abuts against the conductive area; The movable pin passes through the conductive area and is used to contact the data transmission point of the memory card.

[0019] As described above, the beneficial effects of this invention are as follows: through the collaborative design of the adapter plate and the spring test pin, the non-removable welded structure is transformed into a detachable mechanical structure. The slot on the first side of the adapter plate directly supports the memory card, while the second side of the adapter plate has a conductive area that forms an electrical connection basis with the spring test pin. The rigid connection between the spring test pin's fixing component and the fixing plate ensures stable fixation. The movable pin of the spring test pin and the fixing component achieve a retractable fit, adaptively compressing when the memory card is inserted, ensuring stable contact with the memory card's TX point while avoiding pin damage caused by rigid contact. The conductive area serves as an intermediate conductive layer, connecting the movable pin of the spring test pin to the external test circuit. Simultaneously, the movable pin of the spring test pin abuts against the memory card, enabling signal transmission between the memory card and the external test circuit. The entire device replaces the traditional welding process with a mechanical structure, eliminating the risk of wire detachment and welding damage.

[0020] Furthermore, the projection area of ​​the card slot on the second surface covers the conductive area.

[0021] As described above, by ensuring that the projection area of ​​the card slot on the second side of the adapter completely covers the conductive area, it is guaranteed that after the memory card is inserted into the card slot, the pin distribution area will necessarily form a spatial correspondence with the conductive area. This means that when the memory card is inserted, there is no need to manually adjust its position, and its pins can automatically align with the test points in the conductive area, eliminating the poor contact caused by misalignment between the card slot and the conductive area.

[0022] Furthermore, the conductive area is provided with a first through hole that communicates with the card slot; The movable pin passes through the first through hole and is used to abut against the data transmission point of the memory card.

[0023] As described above, the first through-hole communicating with the card slot in the conductive area precisely limits the movement path of the movable pin, preventing contact deviation between the movable pin and the memory card. The through-hole design ensures reliable physical contact between the test probe and the memory card pins, while the guiding effect of the through-hole's inner wall ensures precise alignment of the contact position. This through-hole structure replaces the traditional method of soldering wires, fundamentally eliminating the risk of short circuits caused by soldering operations.

[0024] Furthermore, the fixing plate includes a U-shaped plate; The two legs of the U-shaped plate are fixed to the adapter plate respectively, so that the middle part of the U-shaped plate is parallel to the conductive area.

[0025] As described above, the two legs of the U-shaped plate are fixed to both sides of the adapter plate, ensuring that its central area remains parallel to the conductive area, thus providing uniform support for the spring test probe's fixing component. This structural design enhances the overall rigidity of the fixing plate and avoids the problem of poor contact between the spring test probe and the conductive area caused by the fixing plate tilting or deforming. The layout of the U-shaped plate's central section parallel to the conductive area further ensures the precise vertical alignment of the spring test probe, making the contact between the movable probe and the data transmission point of the memory card more reliable and effectively improving the transmission stability of the test signal.

[0026] Furthermore, a second through hole opposite to the first through hole is provided on the middle part of the U-shaped plate; The fixing member has a tenon at one end away from the movable pin, and the tenon is inserted into the second through hole; The end of the fixing member near the movable pin abuts against the conductive area, so that the spring test pin is set perpendicular to the adapter plate.

[0027] As described above, a second through hole is provided in the middle of the U-shaped plate, which engages with the tenon at the end of the fastener. This mechanical limiting structure ensures that the fastener is positioned along a preset direction during installation, preventing lateral displacement. By inserting the tenon into the second through hole, the fastener achieves dual positioning in the Z-axis direction: on one hand, the tenon forms a radial constraint with the wall of the second through hole; on the other hand, the contact between the end of the fastener and the conductive area forms an axial constraint. This dual constraint mechanism forces the axis of the fastener to remain perpendicular to the adapter plate, thus ensuring that the movable pin always moves vertically during extension and retraction. When the memory card is inserted into the card slot, the contact angle between the movable pin and the memory card pin is strictly controlled at 90 degrees, avoiding insufficient contact pressure caused by oblique contact.

[0028] Furthermore, there are multiple first through holes and multiple second through holes, and the number of first through holes is equal to the number of second through holes.

[0029] As described above, the number of the first and second through holes is equal and there are multiple through holes, ensuring that the spring test probes at different positions can obtain independent positioning channels. Different types of memory cards have varying TX point positions; the array distribution of multiple through holes can meet the testing requirements of the TX point at different positions, improving the applicability of the testing device to different memory card types.

[0030] Furthermore, the adapter board is provided with a pin header, and the pin header is electrically connected to the conductive area.

[0031] As described above, the header pins, as fixed conductive interfaces, can directly interface with external testing equipment. The design of the header pins and conductive area electrically connecting allows the data transmission points of the memory card to form a complete circuit through the spring test pins, conductive area, and header pins after insertion into the card slot, automatically establishing a test signal path without manual soldering. This eliminates the risk of damage to the physical structure of the memory card caused by soldering, avoids signal interruption due to poor wire contact, and simplifies the connection complexity between testing equipment and external instruments.

[0032] Furthermore, extension plates are provided on both legs of the U-shaped plate; The extension plate is fixed to the adapter plate.

[0033] As described above, the extension plate creates an expanded contact area between the U-shaped plate and the adapter plate, effectively dispersing the mechanical stress generated during testing by increasing the fixed contact area. The connection method of directly fixing the extension plate to the adapter plate not only strengthens the mechanical connection between the U-shaped plate and the adapter plate but also prevents displacement or loosening of the U-shaped plate during repeated testing through multi-point fixing. This double-reinforced structural design ensures stable contact between the spring test probe and the conductive area, and also improves the structural reliability of the entire testing device during long-term use.

[0034] Furthermore, the extension plate is provided with threaded holes; The threaded hole is used to engage a screw, so that the extension plate is fixed to the adapter plate.

[0035] As described above, threaded holes are provided in the contact areas of the adapter plate and the extension plate, allowing screws to pass through the extension plate and be screwed into the threaded holes. Compared to traditional adhesive or snap-fit ​​connections, threaded connections offer the advantages of detachability and high repeatability, facilitating the disassembly and adjustment of the fixing plate during maintenance, while avoiding the risk of connection failure due to adhesive aging.

[0036] Furthermore, the threaded hole includes a first threaded hole and a second threaded hole; The diameter of the first threaded hole is larger than the diameter of the second threaded hole.

[0037] As can be seen from the above description, the difference in diameter between the first and second threaded holes achieves a foolproof design, avoiding incorrect pre-installation orientation of the fixing plate.

[0038] The above-described testing device for memory cards is applicable to memory card testing scenarios. It enables detachable connection and precise positioning of the memory card's TX signal point and test probes. The following detailed embodiments illustrate this device: Please refer to Figures 1 to 8 Embodiment 1 of this utility model is as follows: like Figure 1 and Figure 2 As shown, a testing device 1 for a memory card includes an adapter plate 11 and a spring test pin 12. A card slot 13 is provided on the first surface of the adapter plate 11 for inserting a memory card 2. In some embodiments, the memory card 2 inserted in the card slot 13 is parallel to the adapter plate 11, so that the TX signal point of the memory card 2 can fully abut against the spring test pin 12.

[0039] A conductive area 111 and a fixing plate 14 are provided on the second surface of the adapter plate 11 opposite to the first surface. A pin header 15 is provided on the adapter plate 11, and the pin header 15 is electrically connected to the conductive area 111. In some embodiments, the adapter plate 11 is a printed circuit board, and the conductive area 111 is formed in a specific area by etching copper foil. The conductive area 111 and the pin header 15 are electrically connected by wires formed by etching copper foil.

[0040] Specifically, the projection area of ​​the card slot 13 on the second surface covers the conductive area 111. The fixing plate 14 is suspended above the conductive area 111, so that the projections of the U-shaped plate 141, the conductive area 111, and the card slot 13 on the same horizontal plane overlap, ensuring that the spring test probe 12 can be accurately positioned on the TX point of the memory card 2.

[0041] Specifically, such as Figure 3 and Figure 4As shown, the fixing plate 14 includes a U-shaped plate 141, with two legs 1411 of the U-shaped plate 141 respectively fixed to the adapter plate 11, such that the middle portion 1412 of the U-shaped plate 141 is parallel to the conductive area 111. Each leg 1411 of the U-shaped plate 141 is provided with an extension plate 142, which is fixed to the adapter plate 11. The extension plate 142 has threaded holes for engaging screws 3, thus fixing the extension plate 142 to the adapter plate 11. The threaded holes include a first threaded hole 1421 and a second threaded hole 1422, with the diameter of the first threaded hole 1421 being larger than the diameter of the second threaded hole 1422. Furthermore, the area of ​​the adapter plate 11 opposite to the extension plate 142 also has a first threaded hole 1421 and a second threaded hole 1422 for engaging screws 3 to fix the U-shaped plate 141.

[0042] like Figure 5 As shown, the spring test probe 12 includes a fixing member 121 and a movable needle 122 retractably connected to the fixing member 121. A tenon 1211 is provided at the end of the fixing member 121 away from the movable needle 122. In some embodiments, the fixing member 121 is hollow and contains a spring; the fixing member 121 is sleeved on the movable needle 122, allowing the movable needle 122 to retractably connect within the fixing member 121. Both the fixing member 121 and the movable needle 122 of the spring test probe 12 are made of metal.

[0043] like Figure 6 and Figure 7 As shown, the fastener 121 is fixed to the fixing plate 14 and abuts against the conductive area 111. Specifically, a second through hole 1413 opposite to the first through hole 1111 is provided on the middle part 1412 of the U-shaped plate 141, and the tenon 1211 is inserted into the second through hole 1413.

[0044] like Figure 7 and Figure 8 As shown, the movable pin 122 passes through the conductive area 111 and is used to abut against the data transmission point of the memory card 2. Specifically, the conductive area 111 is provided with a first through hole 1111 that communicates with the card slot 13, and the movable pin 122 passes through the first through hole 1111 to abut against the data transmission point of the memory card 2.

[0045] One end of the fixing member 121 near the movable pin 122 abuts against the conductive area 111, so that the spring test pin 12 is perpendicular to the adapter plate 11. In some embodiments, one end of the fixing member 121 is provided with a tenon 1211 that is inserted into the second through hole 1413 of the fixing plate 14, and the other end of the fixing member 121 is connected to the movable pin 122 and abuts against the conductive area 111, so that the fixing member 121 is snapped between the fixing plate 14 and the conductive area 111.

[0046] like Figure 7 As shown, there are multiple first through holes 1111 and second through holes 1413, and the number of first through holes 1111 is equal to the number of second through holes 1413. The positions of the first through holes 1111 and the second through holes 1413 correspond one-to-one. In actual testing, usually only one first through hole 1111 and one second through hole 1413 are used to fix the position of the spring test pin 12, ensuring that the spring test pin 12 can accurately contact the TX point of the memory card 2.

[0047] The testing principle of this utility model is as follows: When the memory card 2 is inserted into the card slot 13, the movable pin 122 of the spring test pin 12 retracts under the pressure of the memory card 2; when the memory card 2 reaches the correct position in the card slot 13, the TX point on the memory card 2 abuts against the movable pin 122 of the spring test pin 12; at this time, the test log of the TX point on the memory card 2 will be transmitted to the pin header 15 in sequence through the spring test pin 12 and the conductive area 111; finally, the test log is transmitted to the test platform through the serial port tool connected to the pin header 15, thereby realizing the acquisition of the test log.

[0048] In summary, this invention provides a testing device for memory cards. Through the coordinated design of the adapter plate and spring test pins, a detachable mechanical structure replaces the traditional welding process, eliminating the risks of wire detachment and welding damage. The spatial correspondence between the card slot and the conductive area, as well as the through-hole structure design, ensures precise alignment of the pins and test pins when the memory card is inserted, avoiding contact deviation and short-circuit risks. The structure of the U-shaped plate and its extension plate enhances the rigidity and stability of the fixing plate, preventing poor contact or loosening due to mechanical stress. The threaded connection facilitates disassembly and adjustment, while the use of threaded holes of different diameters provides a foolproof design, further improving the reliability and maintainability of the device. The pin header simplifies the connection with external testing equipment and improves testing efficiency. This device improves the transmission stability of test signals, enhances applicability to different memory card types, and simplifies the testing process.

[0049] The above description is merely an embodiment of this utility model and does not limit the patent scope of this utility model. Any equivalent modifications made based on the content of this utility model specification and drawings, or direct or indirect applications in related technical fields, are similarly included within the patent protection scope of this utility model.

Claims

1. A testing apparatus for memory cards, characterized in that, Includes adapter plate and spring test probe; The first surface of the adapter plate is provided with a card slot for inserting a memory card. The adapter plate has a conductive area and a fixing plate on its second surface opposite to the first surface. The spring test probe includes a fixing member and a movable probe that is retractably connected to the fixing member; The fastener is fixed to the fixing plate and abuts against the conductive area; The movable pin passes through the conductive area and is used to contact the data transmission point of the memory card.

2. The testing apparatus for a memory card according to claim 1, characterized in that, The projection area of ​​the card slot on the second surface covers the conductive area.

3. The testing apparatus for a memory card according to claim 2, characterized in that, The conductive area is provided with a first through hole that communicates with the card slot. The movable pin passes through the first through hole and is used to abut against the data transmission point of the memory card.

4. The testing apparatus for a memory card according to claim 3, characterized in that, The fixing plate includes a U-shaped plate; The two legs of the U-shaped plate are fixed to the adapter plate respectively, so that the middle part of the U-shaped plate is parallel to the conductive area.

5. A testing apparatus for a memory card according to claim 4, characterized in that, A second through hole, opposite to the first through hole, is provided on the middle part of the U-shaped plate; The fixing member has a tenon at one end away from the movable pin, and the tenon is inserted into the second through hole; The end of the fixing member near the movable pin abuts against the conductive area, so that the spring test pin is set perpendicular to the adapter plate.

6. The testing apparatus for a memory card according to claim 5, characterized in that, There are multiple first through holes and second through holes, and the number of first through holes is equal to the number of second through holes.

7. The testing apparatus for a memory card according to claim 1, characterized in that, The adapter board is provided with a pin header, and the pin header is electrically connected to the conductive area.

8. A testing apparatus for a memory card according to claim 4, characterized in that, The U-shaped plate has extension plates on both legs; The extension plate is fixed to the adapter plate.

9. A testing apparatus for a memory card according to claim 8, characterized in that, The extension plate is provided with threaded holes; The threaded hole is used to engage a screw, so that the extension plate is fixed to the adapter plate.

10. A testing apparatus for a memory card according to claim 9, characterized in that, The threaded hole includes a first threaded hole and a second threaded hole; The diameter of the first threaded hole is larger than the diameter of the second threaded hole.

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