The utility model discloses a memory card
time sequence testing device. The memory card
time sequence testing device comprises an upper computer; the test seat is provided with a
signal output interface, and the
signal output interface is connected with a
signal pin of the memory card to be tested; the
signal acquisition module is electrically connected with the signal output interface; the
signal acquisition module comprises an analog-to-
digital converter and an SPI controller arranged on the analog-to-
digital converter, the SPI controller is used for configuring the analog-to-
digital converter, and the analog-to-digital converter and the SPI controller are electrically connected with the upper computer. According to the utility model, the type of the current memory card to be tested is detected through the upper computer, and the analog-to-digital converter can be configured with different
signal acquisition modes according to different types of
memory cards to be tested through the SPI controller in the signal acquisition module, so that the
time sequence test of the memory card to be tested can be completed at the fastest speed; according to the invention,
automatic testing of different types of
memory cards to be tested is realized, manpower and
time cost are saved, and testing efficiency is improved.