Wafer inspection equipment
CN309091634SActive Publication Date: 2025-01-28NANJING OPTICS ROBOT TECH CO LTD
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Patent Information
- Application Number
- CN202430394281.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-06-26
- Publication Date
- 2025-01-28
- Estimated Expiration
- 2039-06-26
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Figure 000001_ABST
Abstract
1. The name of the product of this design: wafer inspection equipment. 2. Purpose of this design product: used to detect wafer appearance defects. 3. The design key point of this appearance design product lies in the shape. 4. The picture or photo that best illustrates the design points: three-dimensional picture.
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