Test probe head
CN309370168SActive Publication Date: 2025-07-04LEENO IND INC
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Patent Information
- Application Number
- CN202430624677.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-30
- Publication Date
- 2025-07-04
- Estimated Expiration
- 2039-09-30
Smart Images
Figure 000001_ABST
Abstract
1. Name of the design product: Test probe head. 2. Use of the design product: A test probe head for testing the electrical properties of substrates or semiconductors used in the field of information technology (IT). 3. Design key points of the design product: Lies in the shape. 4. Picture or photo that best shows the design key points: Perspective view.
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