Semiconductor chip testing machine
CN309611147SActive Publication Date: 2025-11-18吴崇正
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Patent Information
- Application Number
- CN202530195038.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-11
- Publication Date
- 2025-11-18
- Estimated Expiration
- 2040-04-11
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Figure 000007_ABST
Abstract
1. Name of the design product: semiconductor chip testing machine. 2. Use of the design product: equipment for testing semiconductor chips. 3. Design points of the design product: in shape. 4. Picture or photograph best indicating the design points: perspective view 1.
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