Roughness measuring instrument with waveform and parameter display graphical user interface

CN309715328SActive Publication Date: 2026-01-02QUANZHOU PRECISION DRILLING MEASUREMENT TECH CO LTD
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Patent Information

Application Number
CN202530065364.7
Authority / Receiving Office
CN · China
Patent Type
Designs(China)
Current Assignee / Owner
Filing Date
2025-02-14
Publication Date
2026-01-02
Estimated Expiration
2040-02-14

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Abstract

1. The name of the design product: roughness measuring instrument with wave form and parameter display graphical user interface. 2. The use of the design product: for measuring micro-texture of metal and all hard surfaces. 3. The design points of the design product: the shape of the front view, graphical user interface. 4. The picture or photo that best indicates the design points: front view. 5. The use of the graphical user interface: for full data display, wave form and data display at the same time. 6. The change state description of the graphical user interface: the interface state diagram is the home page interface, and human-computer interaction operation is carried out through the operation button below the interface. 7. Other circumstances that need to be explained: the content of the text and numbers in the interface diagram is not limited, and the wave form and parameters are referred to the interface state reference diagram.
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