Roughness measuring instrument with waveform and parameter display graphical user interface
CN309715328SActive Publication Date: 2026-01-02QUANZHOU PRECISION DRILLING MEASUREMENT TECH CO LTD
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Patent Information
- Application Number
- CN202530065364.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-14
- Publication Date
- 2026-01-02
- Estimated Expiration
- 2040-02-14
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Figure 000002_ABST
Abstract
1. The name of the design product: roughness measuring instrument with wave form and parameter display graphical user interface. 2. The use of the design product: for measuring micro-texture of metal and all hard surfaces. 3. The design points of the design product: the shape of the front view, graphical user interface. 4. The picture or photo that best indicates the design points: front view. 5. The use of the graphical user interface: for full data display, wave form and data display at the same time. 6. The change state description of the graphical user interface: the interface state diagram is the home page interface, and human-computer interaction operation is carried out through the operation button below the interface. 7. Other circumstances that need to be explained: the content of the text and numbers in the interface diagram is not limited, and the wave form and parameters are referred to the interface state reference diagram.
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