3D Laser Measurement Instrument (SLAM RTK)
CN309808487SActive Publication Date: 2026-02-24GUANGZHOU HI TARGET SURVEYING INSTRUMENT CO LTD
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Patent Information
- Application Number
- CN202530379075.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-30
- Publication Date
- 2026-02-24
- Estimated Expiration
- 2040-06-30
Smart Images
Figure 000007_ABST
Abstract
1. Name of the product in this design: 3D Laser Measurement Instrument (SLAM RTK). 2. Application of this design: It is used for three-dimensional data measurement in fields such as architectural plan, elevation and section, mining survey, highway survey, emergency mapping, and forestry survey. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: 3D rendering 1.
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