probe station
CN309907175SActive Publication Date: 2026-04-10泰克半导体装备(深圳)有限公司
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- 泰克半导体装备(深圳)有限公司
- Filing Date
- 2025-10-13
- Publication Date
- 2026-04-10
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Figure 000007_ABST
Abstract
1. The name of the design product: probe station. 2. The use of the design product: the whole of the design product is used for testing equipment for testing semiconductor chips. 3. The design points of the design product: in shape. 4. The picture or photo that best shows the design points: perspective view 1.
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