thermofield emission scanning electron microscope (8200)
CN309977169SActive Publication Date: 2026-05-12BEIJING ZHONGKE KEYI OPTOELECTRONICS TECH CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- BEIJING ZHONGKE KEYI OPTOELECTRONICS TECH CO LTD
- Filing Date
- 2025-11-14
- Publication Date
- 2026-05-12
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Figure 000007_ABST
Abstract
1. The name of the design product: hot field emission scanning electron microscope (8200). 2. The use of the design product: precision scientific instrument for high-resolution topography observation and microstructure analysis of sample surface at nanometer scale. 3. The design points of the design product: in shape. 4. The picture or photo that best indicates the design points: perspective view.
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