Test equipment
CN309998130SActive Publication Date: 2026-05-26SHENZHEN JINGZHIDA SEMICONDUCTOR TECHNOLOGY CO LTD
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Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- SHENZHEN JINGZHIDA SEMICONDUCTOR TECHNOLOGY CO LTD
- Filing Date
- 2025-12-08
- Publication Date
- 2026-05-26
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Figure 000007_ABST
Abstract
1. Name of the product in this design: Testing Equipment. 2. Purpose of this design: For testing the electrical performance of semiconductor devices. 3. The key design features of this product are its shape. 4. The image or photograph that best illustrates the design's key points: 3D view 1. 5. Other situations requiring explanation: The cable at the top of this product is of variable length, so the length of the cable is omitted in the drawing.
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