Integrated Electronic Creep Testing Machine
CN310068515SActive Publication Date: 2026-07-03CHANGCHUN KEXIN TESTING INSTR CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Designs(China)
- Current Assignee / Owner
- CHANGCHUN KEXIN TESTING INSTR CO LTD
- Filing Date
- 2025-12-22
- Publication Date
- 2026-07-03
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Figure 000001_ABST
Abstract
1. Name of the product in this design: Electronic Creep Duration Tester (Integrated Type). 2. Purpose of this design: This design is used to test the creep, durability, and relaxation of metallic and non-metallic materials under high temperature conditions, and to develop and verify the performance of metallic and non-metallic materials under high temperature and high pressure. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.
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