System for measuring length changes in vacuum
Patent Information
- Application Number
- DE102017003084
- Authority / Receiving Office
- DE · DE
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2017-03-31
- Publication Date
- 2025-07-17
- Estimated Expiration
- 2037-03-31
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Abstract
Description
[0001] The present invention relates to a system for measuring changes in length of a measuring object in a vacuum.
[0002] Measurement methods in general, and optical measurement methods in particular, are already well known in the art. For example, it is common practice to measure distances using an optical measurement method. A laser is typically used for this purpose. There are three basic variants of this type of laser measurement. A first alternative to distance measurement is time-of-flight measurement. In this method, a temporal light pulse is emitted. The so-called pulse time of flight is measured. In conjunction with the speed of light, the pulse time of flight can be used to determine the distance between the light source and the measurement object.
[0003] Another measurement alternative is phase shift measurement. The phase shift of the reflected light beam relative to the emitted beam depends on the distance traveled. The distance is determined using the measured phase shift.
[0004] Another method for distance measurement is laser triangulation. In this method, a laser beam is focused on a target and observed with a camera located in a sensor, a spatially resolving photodiode, or a CCD array. If the distance of the target from the sensor changes, the angle at which the light spot is observed also changes, and thus the position of its image on the photoreceptor. Using the triangular functions, the distance of the object from the laser source can be calculated.
[0005] A general problem with such measurement methods is the dependence of light on refractive indices. For example, when measuring distances under atmospheric conditions, the refractive index depends on air pressure, temperature, and humidity, among other factors. All of these factors can distort the measurement result, which is why these factors must be measured at all times to account for the changing refractive index when calculating the distance.
[0006] Furthermore, devices are known that can measure objects within closed temperature chambers in order to measure the effects of temperature on the object. The measuring device is usually located outside the temperature chamber to prevent exposure to the temperatures inside the chamber, as this could, for example, damage the sensors. For this reason, the temperature chambers are equipped with viewing windows through which, for example, a light beam can be directed onto the object.
[0007] However, this presents the problem that the light beam must pass through various media. This can lead to increased measurement inaccuracy, as the refractive index changes depending on the medium and temperature. In this common method, the light beam must pass through the air outside the temperature chamber, through the viewing window, and then through the air inside the temperature chamber. As the temperature inside the chamber changes, the refractive index of the air also changes. Furthermore, the different temperatures inside and outside the chamber can lead to changes in the material of the viewing window, which in turn changes the refractive index of the viewing window. Such deformation of glass, for example, due to different temperatures is very difficult to determine, which makes error correction in this type of arrangement complicated.
[0008] Furthermore, vacuum chambers are also generally known from the prior art, in which a specific negative pressure can be generated using a vacuum pump. Such a chamber must be completely sealed. When conducting measurements or experiments within such chambers, a problem can arise that, depending on the complexity of the measuring equipment, several access points through the chamber wall for cables, sensors, viewing windows, etc. must be sealed. This means that the more complex the system design, the more difficult it becomes to achieve complete sealing.
[0009] US 5 644 137 A, DE 10 2007 036 814 A1, US 2006 / 0290943 A1, US2005 / 0225770 A1 and US 9 069 265 B2 show a system with a vacuum chamber and a vacuum pump.
[0010] J. Cordero et al.: Interferometry-based high-precision dilatometry for dimensional characterization of highly stable materials. Measurement Science and Technology, Vol. 20, No. 9 (2009) concerns an optical dilatometer for measuring the linear coefficient of thermal expansion. The measuring apparatus is located within a chamber, as is the object. Vacuum values are not specified.
[0011] G. Bianchini, et al.: Interferometric dilatometer for thermal expansion coefficient determination. Measurement Science and Technology, Vol. 20, No. 9 (2006) concerns a measuring device for length measurement based on temperature changes.
[0012] The object of the invention is therefore to provide a system for measuring changes in length of a measuring object in a vacuum, which solves the problems mentioned above and provides a simple and reliable measuring system.
[0013] The object is achieved according to the invention by a system according to claim 1. Further advantageous embodiments are the subject of the subclaims.
[0014] According to the invention, a system comprising at least one first chamber, in particular a vacuum chamber, a vacuum pump, viewing windows and apparatus connected to the first vacuum chamber via flanges, and a measurement object arranged in the first vacuum chamber is provided. According to the invention, an optical measuring device is provided for measuring a change in length due to temperature changes under vacuum conditions of a measurement object arranged in the first vacuum chamber.
[0015] The optical measuring system preferably uses at least one light beam to measure the change in length. In this embodiment, the measuring device is preferably arranged entirely within the vacuum chamber. This offers the advantage that the light beam is always held in the same medium and a change in the refractive index due to different media does not occur. Furthermore, a device for generating different temperatures is provided in this vacuum chamber. Such a device can, for example, project thermal radiation directly onto the measurement object in order to heat it. It would also be conceivable for the temperature to be variable in the entire chamber. However, it is preferred that the temperature can only be varied in one part of the vacuum chamber, namely only in the part around the measurement object.This could be achieved, among other things, by inserting capillary tube mats into the wall sections of one half of the chamber, which can be heated or cooled as desired. Given sufficient proximity to the measurement object, the heat or cold can be transferred to the measurement object, and a change in the length of the measurement object in the vacuum can be observed. It would also be conceivable to equip one half of the chamber with temperature control plates to achieve the desired temperature change. These temperature control plates can be operated electrically or via a fluid.
[0016] Further apparatuses connected to the at least first vacuum chamber may include, inter alia, temperature sensors, connection elements for supplying energy to the laser or various means for transmitting data, which may, for example, transmit the values measured by the sensor to a computing unit 5 arranged outside the chamber.
[0017] Alternatively, it is also conceivable to surround the measurement object with a temperature control sleeve. This would be particularly advantageous because it would allow the temperature to be transferred directly to the measurement object and allow expansion to be controlled in a specific direction. This would simplify the measurement of the measurement object's expansion.
[0018] In a preferred embodiment, an additional chamber is arranged within the first chamber. The measuring device, for example, can be arranged in this additional chamber. This is advantageous because it allows the temperature influence on the measuring device to be reduced or at least minimized.
[0019] In a further advantageous embodiment, an additional chamber is arranged directly adjacent to the first chamber. The two chambers are connected only via an opening for the light beam. Otherwise, the two chambers can be viewed and controlled separately with regard to the existing vacuum and the temperature to be set. This type of design also allows the temperature effects on the measuring equipment to be prevented or at least reduced.
[0020] In a particularly preferred embodiment, the measurement object is arranged on a rotating plate. This is particularly advantageous because it simplifies the design of the measuring apparatus, since, for example, not all sides of the measurement object need to be measured simultaneously and a single light beam is sufficient. With a statically arranged measurement object, the light beam would have to be split several times to ensure a comprehensive measurement of the measurement object, which in turn requires a complex measuring apparatus.
[0021] The measurement object is arranged within a temperature chamber. This arrangement is advantageous because it allows for more direct heating of the measurement object and prevents the influence of temperature on the measuring device. The temperature chamber has an opening on the side facing the measuring device, allowing the measurement object to be measured using the optical measuring device.
[0022] Temperatures in the temperature chamber can be adjusted in a range from -300 °C to 800 °C, preferably from -180 °C to 300 °C.
[0023] The optical measuring device is particularly preferably an interferometer. Various types of interferometers are conceivable. The interferometer is preferably selected from one of the following two-beam interferometers: Bath interferometer, Michelson interferometer, or white light interferometer.
[0024] As an alternative to interferometers, it would also be conceivable to use a geometric light beam method. One possibility here is to perform a so-called temporal light section. In this method, a laser beam is deflected by a rotating polygon mirror in such a way that the measurement object is scanned sequentially. Furthermore, a lens optics is provided for this purpose, by means of which the light can be guided parallel and focused on a detector on the opposite side. From the detector signal, the reduction in intensity caused by the shadowing can be used to read the diameter, for example, which is proportional to the shadowing time.
[0025] Alternatively, such a geometric light beam method could be implemented using a light curtain and a diode array camera. In contrast to the temporal 25 light section, the object is not scanned over time; instead, a light curtain is generated by a lens system that simultaneously images the measurement object onto a diode array. Such geometric light beam methods are advantageous because they allow a larger area to be measured, thus easily detecting a change in length or expansion of the measurement object. This would require the measurement object to be positioned between the light source and the associated sensor.
[0026] Another alternative to interferometers is the so-called triangulation method. In this method, a laser beam is focused onto the measurement object via a lens, creating a light spot. This light spot is viewed at a fixed angle using a position detector or a camera. If the light spot shifts, the distance between the light source and the measurement object can be determined, for example. In the case according to the invention, a shift in the light spot can occur if the measurement object expands or contracts due to the prevailing temperature, thereby increasing or decreasing the distance. The change in distance can then be used to determine the extent of the measurement object, for example. Such an arrangement would be advantageous because, among other things, no mirrors or external sensors would have to be used, and the measuring device could therefore be designed more simply.
[0027] In another particularly preferred alternative optical phase measurement method, unlike an interferometer, the phase shift of an intensity modulation is measured, not the phase shift of the light wave itself. The light is used merely as a carrier, and the light emitted by the laser is transmitted modulated at a frequency f by a modulator. After reflection, the light is received by a photodetector, which converts the optical signal into an electrical signal with the frequency f. The alternating current is amplified and compared with the phase of the reference signal from the oscillator using a phase meter. The advantage here is that the measurement is independent of refractive indices, since the light acts merely as a carrier medium. In this way, more precise measurements can be carried out even under less than optimal conditions.
[0028] Furthermore, the measuring device is preferably arranged at least partially within the first chamber or within another chamber. In this case, parts of the optical measuring device, such as the sensors, are flanged directly to the chamber and thus not arranged within the chamber. However, other parts, such as mirrors or beam splitters, can still be arranged within the chamber.
[0029] Further advantages, objects, and features of the present invention will become apparent from the following description of the accompanying figures. Similar components may have the same reference numerals in the various embodiments.
[0030] The figures show: Fig. 1 is a schematic view of a preferred embodiment of the system; Fig. 2 is a schematic view of another preferred embodiment of the system; Fig. 3 a schematic view of another preferred embodiment of the system.
[0031] Fig. 1 shows a schematic view of a preferred embodiment of the system 1 according to the invention. The system 1 comprises a first chamber 3 and a further chamber 7. In the first chamber 3, a laser 2, a mirror 6, a sensor 4 and the further chamber 7 are arranged, which has an opening or gap on the side facing the laser 2. In the further chamber 7, the measurement object 5 is arranged on a turntable 9. The turntable 9 is rotatably mounted on a base element 8. A vacuum can be generated in the two chambers 3 and 7 via a vacuum pump V. Furthermore, two temperature control devices T1 and T2 are provided. T1 controls the temperature in the first chamber 3 and T2 the temperature in the further chamber 7, which in this case is designed as a temperature chamber. In this illustration, a laser beam L is emitted by the laser 2 in the direction of the measurement object 5.The laser beam L passes through a semi-transparent mirror 6 and is reflected by the measuring object 5 and guided via the mirror 6 to a sensor 4. The arrangement of the measuring object in a separate chamber has the advantage that temperature transfer to the measuring apparatus can be prevented.
[0032] Fig. Figure 2 shows a schematic view of a further preferred embodiment of the system 1. This figure also shows a first chamber 3 and a further chamber 7. In this illustration, the two chambers are arranged adjacent to one another and are only connected by a gap through which the laser beam L can pass. Here, too, a laser beam L is emitted by the laser 2 in the direction of the measurement object and is reflected by it. The reflected beam L is then guided into a sensor 4. In the two chambers 3, 7, as in Fig. 1 a vacuum is generated via one or more vacuum pumps V.
[0033] Fig. Figure 3 shows a further schematic view of another preferred embodiment of the system 1. In this illustration, the laser 2 and the sensor 4 are arranged outside the first chamber 3 and connected to the chamber 3 via flanges 10. The measurement object 5 is located in a further chamber 7, which in this case is also designed as a temperature chamber.
[0034] All features disclosed in the application documents are claimed as essential to the invention, provided that they are new, individually or in combination, compared to the prior art. List of reference symbols 1 system 2 lasers 3 first vacuum chamber 4 Sensor 5 Measuring object 6 mirrors 7 additional chambers 8 Basic element 9 turntables 10 Flange V vacuum pump T1 Temperature controller of the first chamber T2 temperature controller of the second chamber L laser beam
Claims
[1] System (1) comprising at least one first vacuum chamber (3), a vacuum pump (V), viewing windows and apparatus connected to the first vacuum chamber (3) via flanges (10), and a measurement object (5), characterized by that an optical measuring device for measuring a change in length due to temperature changes under vacuum conditions of a measuring object (5) is arranged, wherein the measuring object (5) is arranged within a temperature chamber, wherein temperatures in a range of -300 ° C to 800 ° C can be set in the temperature chamber (7) and the temperature chamber (7) has a gap on the side. [2] System (1) according to claim 1, characterized by that the temperature chamber (7) is arranged within the first vacuum chamber (3). [3] System (1) according to claim 1, characterized by that the temperature chamber (7) is arranged directly adjacent to the first vacuum chamber (3). [4] System (1) according to one of the preceding claims, characterized by that the measuring object (5) is arranged on a turntable (9). [5] System (1) according to one of the preceding claims, characterized by that the optical measuring device is an interferometer. [6] System (1) according to one of the preceding claims, characterized by that the measuring device is arranged at least partially within the first vacuum chamber (3) or within the temperature chamber (7).
Citation Information
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