Particle beam system with multi-source system and multi-beam particle microscope

Abstract

Particle beam system (1) comprising the following: a multi-source system (500), comprising a particle multi-source (501, 502, 503, 504) configured to generate a plurality of charged single-particle beams (3) by field emission; a first multi-aperture plate (521) with a plurality of first openings which are at least partially penetrated by the single-particle beams (3); a first multi-lens array (523) which has a plurality of individually adjustable particle lenses and which is arranged in the beam path after the first multi-aperture plate (521) such that the single particle beams (3) which pass through the first multi-aperture plate (521) also pass through the first multi-lens array (523); a second multi-aperture plate (522) with a plurality of second apertures, which is arranged in the beam path after the first multi-lens array (523) such that the single-particle beams (3) passing through the first multi-lens array (523) also pass through the second multi-aperture plate (522); and a beam current limiting multi-aperture plate (524) with a plurality of beam current limiting openings, which is arranged in the beam path after the second multi-aperture plate (522) such that the single-particle beams (3) partially strike the beam current limiting multi-aperture plate (524) and are absorbed there, and partially pass through the openings of the beam current limiting multi-aperture plate (524); and a control (10) which is set up to supply an individually adjustable voltage to the particle lenses of the first multi-lens array (523) and thus to individually adjust the focusing of the associated particle lens for each individual particle beam (3) and thereby to individually adjust blocked components of the individual particle beams (3) at the beam current limiting multi-aperture plate (524).

Description

Field of invention

[0001] The invention relates to particle beam systems that operate with a multitude of particle beams. State of the art

[0002] Multi-beam particle microscopes, like single-beam particle microscopes, can be used to analyze objects on a microscopic scale. For example, these particle microscopes can capture images of an object that represent its surface. In this way, the surface structure can be analyzed. While a single-beam particle microscope uses a single beam of charged particles, such as electrons, positrons, muons, or ions, to analyze the object, a multi-beam particle microscope uses multiple beams. These multiple beams, also called beams, are directed simultaneously at the object's surface, allowing a significantly larger area of ​​the object's surface to be scanned and analyzed in the same amount of time compared to a single-beam particle microscope.

[0003] From WO 2005 / 024 881 A2, a multi-particle beam system in the form of an electron microscopy system is known, which operates with a multitude of electron beams to scan an object under investigation with a parallel beam of electron beams. The beam of electron beams is generated by directing an electron beam produced by an electron source onto a multi-aperture plate, which has a multitude of openings. Part of the electrons of the electron beam strikes the multi-aperture plate and is absorbed there, and another part of the beam passes through the openings of the multi-aperture plate, so that an electron beam is formed in the beam path behind each opening, the cross-section of which is defined by the cross-section of the opening.Furthermore, appropriately selected electric fields, provided in the beam path before and / or after the multi-aperture plate, cause each aperture in the plate to act as a lens on the electron beam passing through it. This focuses the electron beams into a plane located at a distance from the multi-aperture plate. The plane in which the electron beam foci are formed is then imaged onto the surface of the object under investigation by a subsequent optical system, so that the individual electron beams, as primary beams, strike the object. There, they generate interaction products emanating from the object, such as backscattered electrons or secondary electrons, which are shaped into secondary beams and directed by a further optical system onto a detector.There, each of the secondary beams strikes a separate detector element, so that the electron intensities detected by this element provide information about the object at the location where the corresponding primary beam strikes the object. The bundle of primary beams is systematically scanned across the surface of the object to generate an electron microscopic image of the object in the manner typical for scanning electron microscopes.

[0004] For the described multi-particle beam system, high resolution and high throughput are of paramount importance for satisfactory and successful practical application. In this context, it is necessary, among other things, to adjust the intensity of the particle beams.

[0005] US 2017 / 0025241 A1 discloses a multi-beam particle beam system in which the current density in the particle beams is variable. Specifically, the illumination density is adjusted before the primary electron beam is used to generate the multi-beams. According to US 2017 / 0025241 A1, a double collimator is used to adjust the illumination density. This collimator is positioned directly behind the electron source in the beam direction. By varying the lens excitations of the double collimator, the current density of the electrons passing through the apertures of a multi-aperture plate downstream of the double collimator can be varied.

[0006] The multi-beam particle beam system described above reaches its limits when the number of particle beams used is further increased. To obtain sufficient beam currents for the individual beams, as many particles as possible from the particle source must be used. However, this makes the emission characteristics of the particle source increasingly important, specifically the uniformity of the emission characteristics across the entire emission angle. When using larger emission angles, the emission characteristics of particle sources, such as thermal field emission sources (TFEs), are no longer uniform. Consequently, the illuminance at a multi-aperture plate in a corresponding particle beam system is also no longer uniform, and greater variations in the current densities of different individual beams occur.However, for multi-particle inspection systems, it is a system requirement that there is only a small variation in current intensities between the different individual beams, typically less than a few percent, so that all individual image fields of the multi-image field are scanned with an equivalent number of particles or electrons per pixel. This is, for example, a prerequisite for obtaining individual images with approximately the same brightness.

[0007] For inspection systems that operate with multi-beam particle beam systems, the use of particle sources with high beam angles and simultaneously high requirements for the current per individual beam therefore presents a challenge due to the varying beam characteristics.

[0008] Multi-beam particle beam systems that utilize multiple sources already exist. This approach also increases the number of individual particle beams available for the multi-beam particle beam system. Photocathodes and cold field emission arrays (cold FEAs) are generally known as multi-sources. However, a disadvantage of using photocathodes is their unstable emission characteristics, short lifetime, and low luminance (brightness). In contrast, cold field emission arrays offer relatively high luminance and a small virtual source size. They can also be fabricated using methods common in microstructure technology, such as combining lithography with subsequent etching and / or deposition processes (MEMS techniques; microelectromechanical systems techniques).However, the radiation pattern of cold field emission arrays is still not uniform, and it is difficult to produce the individual tips for emission with reproducible characteristics and specifications, especially with regard to their radiation pattern, their total current, and their virtual source diameter.

[0009] US 2014 / 0057212 A1 discloses a lithography system that operates with a multitude of single-particle beams. It does not have a multi-source but a single source.

[0010] US 2016 / 0111251 A1 discloses a multi-beam electron microscope that also operates with a single source and not with a multi-source. Furthermore, various methods for field curvature correction are disclosed.

[0011] DE 10 2014 008 083 A1 discloses a particle beam system with a single source. Various arrangements of multi-aperture plates for beam shaping are disclosed, in particular field generators for generating multipole fields.

[0012] US 2012 / 0295203 A1 discloses a lithography system that operates with a single source. In the area near the source, a two-stage system with successive single lenses is disclosed, which is used to adjust the position of a crossover.

[0013] US 2014 / 0042334 A1 discloses a single-source lithography system.

[0014] US 8 618 496 B2 discloses various field generators for manipulating single-particle beams. No multi-source system is disclosed.

[0015] WO 2007 / 028595 A2 discloses a particle beam system with a single source. Various multi-aperture plate arrangements are shown, including plates with curved surfaces and thus varying distances between them.

[0016] US 2013 / 0344700 A1 reveals another lithography system that works with a single source.

[0017] US 8 384 051 B2 reveals another lithography system that works with a single source. A focus of the cited text is on detection issues.

[0018] WO 2005 / 024881 A2 discloses a multi-particle beam system operating with a single source. Arrangements of multi-aperture plates are disclosed and aspects of image field correction are discussed. Description of the invention

[0019] The object of the present invention is therefore to provide a particle beam system operating with a plurality of individual beams, which ensures a high degree of beam uniformity between the individual beams even when using a large number of individual beams and simultaneously a high beam current for each individual beam. In particular, the particle beam system should also be suitable for multi-beam inspection systems.

[0020] Another objective of the invention is to increase the throughput in a particle beam system.

[0021] Another objective of the invention is to make multi-sources more usable for multi-beam particle beam systems.

[0022] Another objective of the invention is to reduce imaging errors as much as possible in the particle beam system.

[0023] The problem is solved by the independent patent claims. Advantageous embodiments of the invention are described in the dependent patent claims.

[0024] The invention is based on the following consideration: It is possible to use existing particle multi-sources that generate electrons by cold field emission for particle beam systems with high resolution and high throughput if the source-related inhomogeneities in the beam flux density of the individual particle beams are compensated for or eliminated before the actual particle optical imaging takes place. According to the invention, it is therefore proposed to first coarsely shape the individual particle beams close to the multi-source, whereby MEMS techniques can be used for the fabrication of the lenses, deflectors, stigmators, etc., used in this process. The actual final beam shaping, in which the individual particle beams are formed for high-resolution particle optical imaging, takes place later in the particle beam system.Near the multi-source, the energy of the individual particle beams is still relatively low, and influencing or deflecting these beams can be achieved with relatively low voltages or currents. Low voltages or currents, in turn, are ideal for the low-risk design of MEMS devices, which have relatively high requirements for the insulation of the conductor tracks on them.

[0025] This two-stage shaping of the single-particle beams also makes it possible to pre-thin the single-particle beams originally emitted by the multi-source near its source, which reduces the Coulomb effect, which is detrimental to high resolution.

[0026] Specifically, according to a first aspect, the invention relates to a particle beam system comprising the following: a multi-source system, encompassing - a particle multi-source, in particular an electron emitter array, which is or is set up to generate a plurality of charged single-particle beams by field emission, in particular cold field emission; - a first multi-aperture plate with a multitude of first openings that are at least partially penetrated by the single-particle beams; - a first multi-lens array, which has a multitude of individually adjustable particle lenses and which is arranged in the beam path after the first multi-aperture plate in such a way that the single-particle beams that pass through the first multi-aperture plate also pass through the first multi-lens array; - a second multi-aperture plate with a plurality of second apertures, which is arranged in the beam path after the first multi-lens array such that the single-particle beams passing through the first multi-lens array also pass through the second multi-aperture plate; and - a beam-limiting multi-aperture plate with a plurality of beam-limiting openings, which is arranged in the beam path after the second multi-aperture plate such that the single-particle beams partially strike the beam-limiting multi-aperture plate and are absorbed there, and partially pass through the openings of the beam-limiting multi-aperture plate; and - a control system designed to supply individually adjustable excitation to the particle lenses of the first multi-lens array, thereby individually adjusting the focusing of the associated particle lens for each individual particle beam and thereby individually adjusting blocked portions of the individual particle beams at the beam current limiting multi-aperture plate.

[0027] The particle multi-source of the multi-source system generates electrons or emits electron beams. This particle multi-source can be configured as an electron emitter array in which the individual emitters or tips are arranged in a regular pattern. They can be arranged, for example, in a checkerboard or hexagonal pattern. Such an electron emitter array can be fabricated using MEMS technology, combining, for example, lithography with subsequent etching and / or deposition processes. Suitable emitters for the electron emitter arrays include, for example, metallic emitters, silicon-based emitters, and / or carbon nanotube-based emitters.

[0028] In the multi-source system, the first multi-aperture plate, the first multi-lens array, and the second multi-aperture plate are arranged in that order in the beam path following the particle multi-source. Throughout this patent application, a distinction is consistently made between multi-aperture plates on the one hand and multi-lens arrays on the other. A multi-aperture plate is a plate with a multitude of openings. It is possible that a voltage is applied to this multi-aperture plate as a whole. This may be the case, but it is not mandatory. In any case, all openings in a multi-aperture plate are at a uniform, globally identical electrical potential.In contrast to a multi-aperture plate, a multi-lens array within the scope of this patent application is a more complex component: A multi-lens array within the scope of this patent application has a multitude of lenses arranged essentially parallel to each other, each of which can be individually and independently adjusted, so that the individual lenses of the multi-lens array can have different refractive powers and these refractive powers can be varied independently for each lens.

[0029] According to an advantageous embodiment, a multi-lens array has the following characteristics: - a lens multi-aperture plate with a multitude of apertures; and - a multitude of electrodes arranged around the multitude of openings of the lens multi-aperture plate to individually influence the single-particle beam passing through each opening.

[0030] The electrodes can be, for example, ring electrodes, but other designs are also possible. For instance, it is possible to apply the same voltage to azimuthally divided electrodes, such as a quadrupole or octupole. Furthermore, the focusing effect can be achieved by coils that enclose each aperture of the lens multi-aperture plate in a plane perpendicular to the beam direction. This is described for deflecting coils in DE 10 2014 008 083 B4.

[0031] Preferably, the openings of the first multi-aperture plate, the second multi-aperture plate, and the first multi-lens array are circular, and the individual openings are arranged in a hexagonal structure, although other arrangements are also possible. The number of openings in the first multi-aperture plate, the second multi-aperture plate, and the first multi-lens array can be matched to the number of individual particle beams or to the number of emitters or tips of the particle multi-source. It is advantageous if the number of individual particle beams generated is 3n (n - 1) + 1, where n is any natural number, in the case of a hexagonal arrangement. Alternatively, it is also possible for multiple individual particle beams to be generated from a single emitter.This can be achieved, for example, by having the first multi-aperture plate have more openings, specifically m openings per emitter. However, it is then advantageous that the number of openings in the first multi-aperture plate, the second multi-aperture plate, and the first multi-lens array are identical. Furthermore, the openings should be centered and aligned vertically in the beam path of the single-particle beams. It is advantageous if the diameter of the openings in the first multi-aperture plate is smaller than the diameter of the openings in the first multi-lens array and the second multi-aperture plate. Unlike the first multi-lens array and the second multi-aperture plate, the first multi-aperture plate is at least partially penetrated by the single-particle beams, meaning that the first multi-aperture plate can also block electrons emitted by the emitters.

[0032] A sequence of apertures in the first multi-aperture plate, the first multi-lens array, and the second multi-aperture plate forms a single lens. An essentially identical initial voltage U1 is applied to both the first and second multi-aperture plates, although this voltage can also be zero. In contrast, the individually adjustable voltages U2 + V i The voltage at the first multi-lens array differs substantially from the first voltage U1. The notation V i This expresses that the adjustable voltages vary around the value U2; U2 is therefore an average or reference value.

[0033] Depending on the excitations of the individually adjustable particle lenses, the sequence of apertures in the first multi-aperture plate, the first multi-lens array, and the second multi-aperture plate has a different focusing effect. Thus, after passing through the individual lenses, the single-particle beams exhibit different divergences and, after a short drift distance, are expanded to varying degrees. These differently expanded single-particle beams then strike the beam-limiting multi-aperture plate, which has a multitude of beam-limiting apertures. Some particles from the single-particle beams partially strike the beam-limiting multi-aperture plate and are absorbed there, while others pass through the apertures. In this way, the beam current intensity can be individually adjusted for each single-particle beam within the multi-source system.It is therefore particularly possible to compensate for different emission characteristics or current intensities of the individual sources or peaks through this adjustment process. In this way, conventional electron-emitter array-based particle multi-sources can also be used for high-resolution particle beam systems. The final beam shaping of the individual particle beams for the actual particle-optical imaging only takes place later in the particle beam system. Preferably, immediately after passing through the beam current-limiting multi-aperture plate, the following relationship applies to deviations δ of the individual beam currents from an arithmetic mean of the beam currents: δ ≤ 5%, preferably δ ≤ 2%, and most preferably δ ≤ 1%.

[0034] The control system, which is designed to supply individually adjustable excitation to the particle lenses of the first multi-lens array and thus individually adjust the focusing of the corresponding particle lens for each individual particle beam, can be identical to the control system for the entire particle beam system. However, this does not have to be the case. The adjustable excitations are primarily voltages and / or currents.

[0035] The openings of the beam-limiting multi-aperture plate are preferably aligned centrally with the openings of the first multi-aperture plate, the first multi-lens array, and the second multi-aperture plate. The diameter of the beam-limiting openings is smaller than the opening diameter of the second multi-aperture plate and the first multi-lens array.

[0036] The second multi-aperture plate and the beam current limiting multi-aperture plate can also be functionally combined or integrated. Therefore, the second multi-aperture plate and the beam current limiting multi-aperture plate are not necessarily two separate components. However, physical separation offers advantages in electron optics.

[0037] According to a preferred embodiment of the invention, the particle beam system further comprises the following: a final beam-shaping system arranged in the beam path downstream of the multi-source system, by means of which the individual particle beams are shaped for subsequent particle-optical imaging. The term "final beam-shaping" indicates that the individual particle beams are shaped by means of the final beam-shaping system and are ultimately used for the actual relevant particle-optical imaging. During final beam shaping, parameters such as a homogeneous individual particle beam current density, rotation, telecentricity, (to be eliminated) astigmatism, etc., are taken into account or adjusted for the subsequent particle-optical imaging. Due to these adjustments, particle-optical imaging with high resolution and high throughput is possible.Individual constructive components of the final beam-shaping system will be discussed in more detail below within the scope of this patent application.

[0038] According to a preferred embodiment of the invention, the first multi-aperture plate is configured as an extractor electrode; and / or the second multi-aperture plate is configured as a counter electrode; and / or the (final) beam current-limiting multi-aperture plate is configured as an anode. This embodiment is based on the fact that existing particle multi-sources, which generate a multitude of charged single-particle beams by field emission, already have various electrodes in the form of perforated plates. An identical voltage can be applied to the extractor electrode and the counter electrode. The same or a different voltage can also be applied to the anode as to the extractor electrode and / or the counter electrode.

[0039] According to a preferred embodiment of the invention, the following relationship applies to a distance A between the particle multi-source and the beam-limiting multi-aperture plate: 0.1 mm ≤ A ≤ 30 mm, preferably 0.1 mm ≤ A ≤ 20 mm, and most preferably 0.1 mm ≤ A ≤ 10 mm. The beam-limiting multi-aperture plate is thus arranged very close to the particle multi-source. The distance A is measured from the tip of the particle emitter to the surface of the beam-limiting multi-aperture plate facing the particle multi-source. The thickness of the multi-source system in the direction of the optical axis Z of the particle beam system is therefore less than 30 mm, preferably less than 20 mm, and most preferably less than 10 mm. The multi-source system may also include other components that contribute to its overall thickness or dimensions.

[0040] According to a further embodiment of the invention, the multi-source system also includes a suppressor electrode. A voltage is applied to this electrode such that it pushes the electrons out of the source region of the particle multi-source.

[0041] According to a further embodiment of the invention, the multi-source system comprises a second multi-lens array, wherein the second multi-lens array has a plurality of individually adjustable and focusing particle lenses and is arranged in the beam path downstream of the beam-limiting multi-aperture plate such that the particles of the individual particle beams passing through the beam-limiting multi-aperture plate also pass substantially through the second multi-lens array. Furthermore, the control system is configured to supply the particle lenses of the second multi-lens array with individually adjustable excitation and thus to individually adjust the focusing of the corresponding particle lens for each individual particle beam. The first and second multi-lens arrays can, in particular, be identical in construction; this simplifies the fabrication of the particle beam system.The first and second multi-lens arrays can, however, have different configurations. Furthermore, what has already been said about the first multi-lens array also applies to the second. The second multi-lens array can individually adjust the focal lengths for the respective individual particle beams through its individually adjustable excitations. When the first multi-lens array passed through, the focal length for the individual particle beams changed slightly due to the different lens excitations. These deviations can now be corrected by using the second multi-lens array. It is also possible to use the second multi-lens array to perform field curvature correction for the subsequent particle-optical imaging.If the subsequent field curvature – caused by the subsequent particle-optical imaging – is known, it can be compensated by appropriately exciting the particle lenses of the second multi-lens array.

[0042] According to a further preferred embodiment of the invention, the multi-source system further comprises a first multi-deflector array, which is penetrated by the single-particle beams and is arranged in the beam path downstream of the beam current-limiting multi-aperture plate. The control system is further configured to supply individually adjustable excitations to the first multi-deflector array and thus to deflect the single-particle beams individually. The multi-deflector array serves, for example, as a direction corrector for the single-particle beams. Any beam drift that may occur, for example, due to misaligned openings of the multi-aperture plate resulting from manufacturing tolerances, can be compensated for. The structure of multi-deflector arrays is known in principle (see, for example, DE 10 2014 008 083 B9); they preferably consist of electrostatic deflection fields in openings of the multi-deflector array.For example, azimuthally divided electrodes can be provided, which can be controlled in pairs for a corresponding direction correction.

[0043] According to a preferred embodiment of the invention, the multi-source system further comprises a multi-stigmator array through which the single-particle beams are penetrated. The control system is further configured to supply the multi-stigmator array with an adjustable excitation. The stigmators of the multi-stigmator array provide multipole fields that depend on their excitation and can be used to change the positions and angles at which the single-particle beams strike an object under investigation. It is also possible to influence the astigmatism of each individual-particle beam. Imaging errors in the particle-optical imaging can be corrected.

[0044] According to a preferred embodiment of the invention, the multi-source system is at least partially manufactured using MEMS technology. It is also possible that all components of the multi-source system are manufactured using MEMS technology.

[0045] According to a preferred embodiment of the invention, the particle multi-source comprises at least one of the following emitter types: metallic emitters, silicon-based emitters, carbon nanotube-based emitters.

[0046] According to a further preferred embodiment of the invention, the particle beam system further comprises a magnetic field generating means arranged such that the particle multi-source is located within a magnetic field. In particular, the emitter plane, in which the tips of the multi-source are located, is situated within a magnetic field. The charged particles or electrons thus start within a magnetic field in the particle beam system; they are, so to speak, born in the magnetic field. By selectively arranging the magnetic field relative to the emitter plane, it is possible to impose a defined launch angle distribution on the electrons. Their launch velocity vector, projected onto the emitter plane, therefore has a specific direction, namely orthogonal to the respective applied magnetic field. This embodiment is advantageous because it offers the possibility of controlling landing angles in the object plane.Correcting on the test: Generally, image aberrations occurring in the object plane are proportional to the image-side focal length. To achieve a short focal length of the objective lens, which leads to smaller aberrations, magnetic immersion can be used. However, this results in the object plane still being within the magnetic field. Individual particle beams striking the object plane or the object itself therefore experience Larmor rotation, which is proportional, for example, to the radius R or the distance from the optical axis Z. The individual particle beams thus possess angular momentum with respect to the optical axis Z. This angular momentum can be compensated at the source by providing a suitably shaped magnetic field. This enables the individual particle beams to land telecentrically in the object plane.This is particularly necessary when investigating so-called HAR structures (“High Aspect Ratio Structures”), where the ratio of width to depth can be approximately 1:100 or more.

[0047] According to a preferred embodiment of the invention, the magnetic field generated by the magnetic field generating means has a component perpendicular and / or a component parallel to the emission direction of the charged particles from the multi-source. The perpendicular component causes a deflection or the imprinting of a generalized angular momentum onto the electrons in the magnetic field.

[0048] According to a further preferred embodiment, the magnetic field generating means is designed such that the initial angle distribution of the charged particles after exiting the particle source, caused by the magnetic field, depends on the radial distance of the respective particle source to the optical axis of the particle beam system. This enables a particularly advantageous correction of the Larmor rotation occurring within the object plane, which is proportional to the distance r of the point of impact from the optical axis Z.

[0049] The magnetic field generating devices can be designed as single or multiple components. They can, for example, have pole pieces in which coils are suitably arranged. It is advantageous to position the magnetic field generating devices on the side of the particle beam system facing away from the beam path, for example, above the particle multi-source or above the entire multi-source system.

[0050] According to a further preferred embodiment of the invention, the particle beam system further comprises the following: - a condenser lens system arranged in the direction of the beam path after the multi-source system and in front of the final beam-shaping system; - a field lens system arranged in the direction of the beam path downstream of the final beam-shaping system; and - an objective lens system arranged downstream of the field lens system in the direction of the beam path, wherein an intermediate image plane is formed between the final beam-shaping system and the field lens system.

[0051] The final beam-shaping system is positioned in the beam path – as previously explained – after the multi-source system and serves to shape the individual particle beams for the subsequent particle-optical imaging. The shaping of the individual particle beams by the final beam-shaping system occurs at relatively high energies of the individual particle beams and thus with high precision. This precision is crucial for the quality of the subsequent particle-optical imaging from the intermediate image plane to the object plane. The images of the multi-sources lie in the intermediate image plane; they can therefore be considered virtual particle sources for the subsequent imaging from the intermediate image plane to the object plane.

[0052] According to a preferred embodiment, the final beam-shaping system has the following features: - a final multi-aperture plate with a multitude of openings, arranged such that the single-particle beams partially strike the final multi-aperture plate and are absorbed there, and partially pass through the openings of the final multi-aperture plate, and - a third multi-lens array, which has a multitude of adjustable particle lenses and which is arranged in the beam path after the final multi-aperture plate such that the single-particle beams that pass through the final multi-aperture plate also essentially pass through the third multi-lens array, the control system is further configured to supply adjustable excitation to the particle lenses of the third multi-lens array.

[0053] It is possible for all lenses of the third multi-lens array to experience the same excitation, but it is also possible for the lenses of the multi-lens array to be excited individually and differently. Only the portions of the individual particle beams suitable or determined for particle-optical imaging pass through the final multi-aperture plate. The individual particle beams are thus geometrically shaped by the final multi-aperture plate. In contrast, the individual particle beams are focused by the third multi-lens array and, in particular, imaged onto an intermediate image plane.

[0054] According to another embodiment of the invention, the final beam-shaping system alternatively comprises the following: a final multi-aperture plate with a multitude of openings, arranged such that the single-particle beams partially hit the final multi-aperture plate and are absorbed there, and partially pass through the openings of the final multi-aperture plate; a multi-lens plate with a multitude of apertures, arranged in the beam path after the final multi-aperture plate such that the single-particle beams passing through the final multi-aperture plate also pass through the multi-lens plate; and at least one first aperture plate having a single opening and arranged in the beam path after the multi-lens plate such that the single-particle beams passing through the multi-lens plate also pass through the opening of the at least first aperture plate; and The control system is further configured to supply an adjustable excitation to at least one first aperture plate. Two, three, four, or more aperture plates can also be provided, each of which can then be supplied with an adjustable excitation by the control system.

[0055] Preferably, the particle beam system further comprises a second multi-deflector array, which is arranged in the beam path close to the final multi-aperture plate, wherein the control system is further configured to supply individually adjustable excitations to the second multi-deflector array and thus to deflect the individual particle beams individually.

[0056] This design variant allows the spacing between individual particle beams in the intermediate image plane to be influenced. Specifically, by designing the global electrostatic electrode(s) below the multi-lens plate, it is possible to generate negative field curvature in the intermediate image plane. The magnitude of this negative field curvature can be selected to precisely compensate for any subsequent (positive) field curvature occurring during particle-optical imaging from the intermediate image plane to the object plane. Therefore, no further field curvature correction is required.

[0057] According to a further embodiment of the invention, the condenser lens system comprises one or more global condenser lenses, in particular an electrostatic or magnetic double condenser. However, it is also possible for the condenser lens system to comprise a condenser lens array with a plurality of apertures through which the single-particle beams pass. Thus, with regard to the condenser lens system, there is a choice between a global lens system and a microlens system.

[0058] According to a further preferred embodiment of the invention, the objective lens system comprises a global magnetic objective lens. In this case, all individual particle beams pass through the same (large) opening of the magnetic objective lens. Alternatively, the objective lens system can also comprise an objective lens array with a plurality of openings, arranged in the beam path such that the individual particle beams pass through the openings of the objective lens array. In this case, the objective lens array essentially represents a single-lens array. Other embodiments are also possible. In any case, the objective lens array, as an example of a microlens array, can again be fabricated using MEMS technology. The preceding field lens system has a focusing effect on the individual particle beams.This means that the individual particle beams form a crossover point when traveling towards the objective lens system. Advantageously, this crossover point is located in front of the objective lens. If an objective lens array is used instead of a global magnetic objective lens, the crossover of the individual particle beams, which is otherwise necessary in the particle-optical beam path, can be omitted. This has advantages due to the Coulomb effect. The objective lens array is positioned shortly before the otherwise present crossover point of the individual particle beams, which, however, results in the aperture spacing in the objective lens array being significantly smaller than the spacing of the individual particle beams in the intermediate image plane. Preferably, therefore, no crossover of the individual particle beams is provided between the field lens system and the object plane. In particular, no crossover is then provided in the region of the objective lens system.

[0059] According to a further aspect of the invention, it relates to a multi-beam particle microscope with a particle beam system, as described above in several embodiments. The multi-beam particle microscope can, in a manner known per se, have a beam splitter to separate primary particle beams from secondary particle beams. Furthermore, it can, in a manner known per se, have a detection unit that enables spatially resolved detection of secondary electron beams.

[0060] The invention will be better understood with reference to the accompanying figures. These show: Fig. Figure 1 shows a schematic representation of a multi-beam particle microscope; Fig. Figure 2 shows a multi-source system according to the invention in schematic representation; Fig. Figure 3 shows a schematic representation of a particle beam system with a multi-source system and other system components; Fig. Figure 4 shows a schematic representation of a particle beam system with a multi-source system, an objective lens array, and other system components; Fig. Figure 5 shows a particle beam system for correcting the direction of single-particle beams; Fig. Figure 6 shows a magnetic field generating device above a particle multi-source according to a first example; Fig. Figure 7 shows magnetic field generating means at the level of a particle multi-source according to a second example; and Fig. Figure 8 shows magnetic field generating means above a particle multi-source according to a third example.

[0061] Fig. Figure 1 is a schematic representation of a particle beam system 1 in the form of a multi-beam particle microscope 1, which employs a multitude of particle beams. The particle beam system 1 generates a multitude of particle beams that strike an object under investigation to generate interaction products, e.g., secondary electrons, which emanate from the object and are subsequently detected. The particle beam system 1 is of the scanning electron microscope (SEM) type, which employs several primary particle beams 3 that strike a surface of the object 7 at multiple locations 5, generating several spatially separated electron beam spots. The object 7 under investigation can be of any type, e.g., a semiconductor wafer or a biological sample, and may comprise an array of miniaturized elements or the like.The surface of object 7 is arranged in a first plane 101 (object plane) of an objective lens 102 of an objective lens system 100.

[0062] The enlarged section I1 of the Fig. Figure 1 shows a top view of the object plane 101 with a regular rectangular field 103 of impact points 5, which are formed in the first plane 101. Fig. In this example, the number of impact points is 25, forming a 5 x 5 field of 103. The number 25 impact points is chosen for the sake of simplicity. In practice, the number of rays, and therefore the number of impact points, can be significantly larger, such as 20 x 30, 100 x 100, and so on.

[0063] In the illustrated embodiment, the field 103 of impact locations 5 is a substantially regular rectangular field with a constant distance P1 between adjacent impact locations. Exemplary values ​​of the distance P1 are 1 micrometer, 10 micrometers, and 40 micrometers. However, it is also possible for the field 103 to have other symmetries, such as hexagonal symmetry.

[0064] The diameter of the beam spots formed in the first plane 101 can be small. Examples of this diameter are 1 nanometer, 5 nanometers, 10 nanometers, 100 nanometers, and 200 nanometers. The particle beams 3 are focused to form the beam spots 5 by the objective lens system 100.

[0065] The primary particles striking the object generate interaction products, such as secondary electrons, backscattered electrons, or primary particles that have undergone a reversal of motion for other reasons, which originate from the surface of object 7 or from the first plane 101. The interaction products emanating from the surface of object 7 are shaped into secondary particle beams 9 by the objective lens 102. The particle beam system 1 provides a particle beam path 11 to direct the multitude of secondary particle beams 9 to a detector system 200. The detector system 200 comprises a particle optic with a projection lens 205 to focus the secondary particle beams 9 onto a particle multi-detector 209.

[0066] The section I2 in Fig. Figure 1 shows a top view of plane 211, in which individual detection areas of the particle multi-detector 209 are located. The secondary particle beams 9 strike these areas at locations 213. The impact locations 213 lie within a field 217 at regular intervals P2. Example values ​​for the interval P2 are 10 micrometers, 100 micrometers, and 200 micrometers.

[0067] The primary particle beams 3 are generated in a beam-generating device 300, which comprises at least one particle source 301 (e.g., an electron source), at least one collimating lens 303, a multi-aperture arrangement 305, and a field lens 307, or a field lens system consisting of several field lenses. The particle source 301 generates at least one diverging particle beam 309, which is collimated, or at least largely collimated, by the at least one collimating lens 303 to form a beam 311 that illuminates the multi-aperture arrangement 305.

[0068] The section I3 in Fig. Figure 1 shows a top view of the multi-aperture arrangement 305. The multi-aperture arrangement 305 comprises a multi-aperture plate 313, which has a plurality of openings or apertures 315 formed therein. The centers 317 of the openings 315 are arranged in a field 319, which is projected onto the field 103 formed by the beam spots 5 in the object plane 101. The distance P3 between the centers 317 of the apertures 315 can have exemplary values ​​of 5 micrometers, 100 micrometers, and 200 micrometers. The diameters D of the apertures 315 are smaller than the distance P3 between the centers of the apertures. Exemplary values ​​of the diameters D are 0.2 x P3, 0.4 x P3, and 0.8 x P3.

[0069] Particles of the illuminating particle beam 311 pass through the apertures 315 and form particle beams 3. Particles of the illuminating beam 311 that hit the plate 313 are intercepted by it and do not contribute to the formation of the particle beams 3.

[0070] The multi-aperture arrangement 305 focuses each of the particle beams 3 due to an applied electrostatic field such that beam foci 323 are formed in a plane 325. Alternatively, the beam foci 323 can be virtual. The diameter of the beam foci 323 can be, for example, 10 nanometers, 100 nanometers, and 1 micrometer.

[0071] The field lens 307 and the objective lens 102 provide a first imaging particle optic to image the plane 325, in which the beam foci 323 are formed, onto the first plane 101, so that a field 103 of impact points 5 or beam spots is created there. If a surface of the object 7 is arranged in the first plane, the beam spots are formed accordingly on the object surface.

[0072] The objective lens 102 and the projection lens arrangement 205 provide a second imaging particle optic to image the first plane 101 onto the detection plane 211. The objective lens 102 is thus a lens that is part of both the first and the second particle optic, while the field lens 307 belongs only to the first particle optic and the projection lens 205 only to the second particle optic.

[0073] A beam splitter 400 is arranged in the beam path of the first particle optics between the multi-aperture arrangement 305 and the objective lens system 100. The beam splitter 400 is also part of the second optics in the beam path between the objective lens system 100 and the detector system 200.

[0074] Further information on such multi-beam particle beam systems and components used therein, such as particle sources, multi-aperture plates and lenses, can be obtained from the international patent applications WO 2005 / 024881 A2, WO 2007 / 028595 A3, WO 2007 / 028596 A1, WO 2011 / 124352 A1 and WO 2007 / 060017 A2 and the German patent applications DE 10 2013 016 113 A1 and DE 10 2013 014 976 A1, the disclosure of which is incorporated in full by reference into the present application.

[0075] The multi-particle beam system further comprises a computer system 10, which is configured both for controlling the individual particle-optical components of the multi-particle beam system and for evaluating and analyzing the signals acquired with the multi-detector 209. The computer system 10 can be composed of several individual computers or components. It can also include the control system according to the invention.

[0076] Fig. Figure 2 shows a schematic representation of a multi-source system 500 according to the invention. The multi-source system 500 comprises a particle multi-source, which in the illustrated example is represented by particle sources 501, 502, 503, and 504. The particle multi-source is an electron emitter array manufactured using MEMS technology. The emitted charged particles are electrons, which are generated, for example, by field emission. They form the individual particle beams 3. The individual particle beams 3 are pre-shaped in the multi-source system 500 because the luminance of the individual sources 501, 502, 503, and 504 can differ from one another. Specifically, the beam flux of the individual particle beams 3 is adjusted by means of the multi-source system 500. Further (coarse or preliminary) beam shaping is also possible and is schematically illustrated.

[0077] Specifically, the electrons leave the tips of sources 501, 502, 503 and 504, with tips 511, 512, 513 and 514 indicated by the tip of the “V”.

[0078] After emission, the single-particle beams 3 pass through the first multi-aperture plate 521, to which a voltage U1 is applied in the illustrated example. The first multi-aperture plate 521 serves as an extractor electrode. The openings of the first multi-aperture plate 521 are selected such that the first aperture plate 521 blocks parts of the emitted single-particle beams.

[0079] In the beam path after the first multi-aperture plate 521, a first multi-lens array 523 is arranged. This array has a multitude of individually adjustable particle lenses, which are arranged in Fig. 2 are indicated by the flat cylinders. These could, for example, be ring electrodes. In the example shown, a voltage U2 + V is applied to the first multi-lens array 523.i The particle lenses of the first multi-lens array 523 can be controlled via the controller 10. The controller 10 is configured to supply the particle lenses with individually adjustable excitation, thus allowing the focusing of the corresponding particle lens to be individually adjusted for each individual particle beam 3. A second multi-aperture plate 522 is arranged in the beam path after the first multi-lens array 523. In the example shown, the voltage U1 is essentially applied to this plate. The first multi-aperture plate 521, the first multi-lens array 523, and the second multi-aperture plate 522 thus form a sequence of individual lenses for the individual particle beams 3. This results in an overall focusing effect on the individual particle beams.

[0080] Depending on how large the voltage V iDepending on the selected multi-aperture plate, the focusing effect on the individual particle beams differs. They are focused differently or expanded to varying degrees. This becomes apparent when considering the beam current limiting multi-aperture plate 524, which is arranged in the beam path downstream of the second multi-aperture plate 522. The openings of the beam current limiting multi-aperture plate 524 are smaller in diameter than the openings in the second multi-aperture plate 522 and in the first multi-lens array 523. However, all plates and arrays are arranged such that their openings are centered on top of each other. According to an alternative embodiment of the invention, the second multi-aperture plate 522 and the beam current limiting multi-aperture plate 524 can also be functionally combined or integrated.

[0081] In the example shown, the voltage V1 is chosen such that the corresponding lens is strongly excited, or rather, the single-particle beam 3 is strongly focused. It passes almost completely through the beam-current-limiting multi-aperture plate 524. In contrast, the second and fourth lenses of the first multi-lens array 523 are less strongly excited, and the single-particle beam 3 passing through them is more dilated. Consequently, a larger proportion of the corresponding single-particle beams 3 are blocked at the beam-current-limiting multi-aperture plate 524. The third lens in the first multi-lens array 523 is the least excited, and the corresponding single-particle beam 3 is most dilated. Accordingly, large portions of the single-particle beam 3 are blocked at the beam-current-limiting multi-aperture plate 524.The voltages applied to the lenses in the first multi-lens array 523 can now be selectively chosen such that the beam current of the individual particle beams 3 is approximately equal after passing through the beam current-limiting multi-aperture plate 524. In this way, the different luminances of the sources 501, 502, 503, and 504 can be corrected or pre-corrected for the subsequent particle-optical imaging. Preferably, immediately after passing through the beam current-limiting multi-aperture plate 524, the following relationship applies to deviations δ of the individual beam currents from an arithmetic mean of the beam currents: δ ≤ 5%, preferably δ ≤ 2%, and most preferably δ ≤ 1%.

[0082] A multi-deflector array 525 is provided in the beam path below the beam current limiting multi-aperture plate 524. This multi-deflector array can also be excited by the controller 10. It is possible to selectively and individually apply a voltage U2 to each aperture in the array 525. Depending on the applied voltage and the direction of the electric field in the deflector, the direction of the individual particle beams 3 can be corrected. This is particularly important if the beam 3 does not strike the beam current limiting multi-aperture plate 524 exactly parallel to the optical axis Z (not shown). This can occur if the sequence of plates is not precisely aligned with each other; the precision of the alignment of the plates is limited in practice, which can lead, for example, to tilted beam axes.The correction function of a deflector of the multi-deflector array 525 is shown as an example for the single-particle beam 3 on the far right, which originates from the source 504: The single-particle beam 3 is strongly deflected to the left here.

[0083] In addition, the multi-source system 500 in the example shown has a multi-stigmator array 526.

[0084] In the example shown, all components of the multi-source system 500 can be controlled by the controller 10. The controller 10 can be identical to the overall controller of a multi-beam particle microscope 1. However, it can also be a separate controller 10.

[0085] The dimensions of the multi-source system 500 are relatively small in the direction of the optical axis Z (not shown): The total extent in the direction of the optical axis Z can be less than 20 mm in the example shown.

[0086] Fig. Figure 3 shows a schematic representation of a particle beam system 1 with a multi-source system 500 and other system components. The beam paths are greatly simplified. Specifically, it shows Fig. 3. Integration of the multi-source system 500 according to the invention into existing particle beam systems 1. A plurality of individual particle beams 3 are generated by means of the multi-source system 500, and the individual particle beams 3 are subjected to pre-shaping. In particular, the different luminance of the sources 501, 502, 503 is compensated. A condenser lens system CL1..N is arranged in the beam path after the multi-source system 500. This can be a multiple condenser lens system. However, it would also be possible to replace the global condenser lenses CL1..N with a condenser lens array.

[0087] The final beam-shaping system 600 is located in the beam path following the condenser lens system CL1..N. This system is shown only schematically and in a highly simplified manner. It comprises the final multi-aperture plate. However, it may also include further particle-optical components, such as a third multi-lens array or a stigmator array. The important point is that the final beam-shaping system 600 performs the final beam shaping for the individual particle beams 3, enabling high-quality imaging. The final multi-aperture plate clips the individual particle beams, allowing only the centrally located individual particle beam components to pass through the final multi-aperture plate. Aberrations that occurred during beam shaping in the multi-source system 500, or that will occur further down the beam path, can thus be eliminated or compensated for.After the final beam-shaping system 600 has passed through, the individual particle beams 3 are focused into the intermediate image plane 325. The representation in this respect is as follows: Fig. 3 is also greatly simplified to ensure clarity. The individual particle beams 3, focused into the intermediate image plane 325, are then imaged into the object plane 101 by the subsequent particle-optical imaging. For this purpose, they first pass through a field lens system FL1..N, by which the individual particle beams 3 are focused. The individual particle beams 3 cross over in the crossover 401 before being focused by the global objective lens 102, here a global magnetic objective lens 102, and imaged at impact points 5 onto the sample 7 in the object plane 101. Secondary electron beams 9 originate from the impact points 5 and are separated from the primary beams 3 by means of a beam splitter 400. The detection system 200 with a particle multi-detector 209 is in Fig. 3 is not shown for the sake of simplicity.

[0088] In summary, it shows Fig. 3 the combination of the multi-source system 500 according to the invention and the final beam-shaping system 600 with global lens elements.

[0089] Fig. Figure 4 shows another particle beam system 1 with a multi-source system 500 and further system components in a schematic representation. The beam paths are greatly simplified. Identical reference symbols in the figures denote identical elements. The following discussion focuses only on the differences between the Fig. 3 and Fig. 4 discussed in more detail. Unlike in Fig. 3 includes Fig. 4 an objective lens array 102a. This is shown schematically and can, for example, be implemented by a single lens array. Unlike in Fig. In Figure 3, the particle beam system 1 does not have a crossover 401. The objective lens array 102a is positioned so high up or forward in the particle beam path that it is located in front of the (potential) crossover 401. Omitting the crossover 401 offers advantages in suppressing the Coulomb effect. Overall, this shows Fig. 4, a combination of the multi-source system 500 according to the invention and the final beam-shaping system 600, both with global lens elements (condenser lens system CL1..N and field lens system FL1..N) and with a further microlens system, which is in the form of the objective lens array 102a. The objective lens array 102a can be configured differently. For example, it can comprise several sequentially arranged multi-aperture plates, which are energized in a suitable manner, and in particular by means of the control unit 10. Additionally or alternatively, the objective lens array 102a can comprise a further multi-lens array. It is in the Fig. In the variant shown in section 4, it is also possible to provide a detection unit in the area of ​​the objective lens array 102a with segmented detectors instead of the beam switch 400 in combination with the projection path to the detection unit (the latter two are not shown).

[0090] Fig. Figure 5 shows a schematic and highly simplified representation of a particle beam system 1 for correcting the direction of single-particle beams 3. The multi-source system 500, with its sources 501, 502, 503, and 504, is shown in combination with the final beam-shaping system 600. The final beam-shaping system 600 has a final multi-lens plate 601 through which single-particle beams 3a, 3b, 3c, and 3d pass. A final multi-aperture plate is arranged above the multi-lens plate 601 (not shown). Furthermore, the final beam-shaping system 600 includes aperture plates 620, 630, and 640, to which, for example, global electric fields can be applied. This allows the electrostatic field in the region of the final beam-shaping system 600 to be shaped in a targeted manner. Alternatively, magnetic fields can also be used for this purpose.

[0091] Specifically, the electromagnetic fields also influence the extraction field near the final multi-aperture plate: Depending on the voltage applied to electrodes 620, 630, and 640, the lens field in the multi-lens plate 601 can vary in strength, thus affecting the focusing effect on the individual beams. In particular, it is possible to make the lens field in the outer region (3a, 3d) less focused on the individual particle beams than in the inner region (3b, 3c) by applying suitable voltages to electrodes 620-640. This makes it possible to compensate for any field curvature that may be present, whose focus distribution in the image field exhibits the opposite pattern. In this case, however, the field distribution at electrodes 620-640 also reduces the size of the intermediate image, i.e., the beam spacing between the beams in the intermediate image plane becomes smaller.A multi-deflector array 610, positioned between the multi-source system 500 and the final beam-shaping system 600, helps to correct the beam spacing of the individual particle beams 3a, 3b, 3c, and 3d in the intermediate image (not shown). In the example shown, the individual particle beams 3a and 3b are deflected to the left, while the individual particle beams 3c and 3d are deflected to the right by appropriate control of the deflectors in the multi-deflector array 610. This configuration allows the spacing between the individual particle beams 3 in the intermediate image plane to be influenced. Specifically, it is possible to generate a negative field curvature in the intermediate image plane. The magnitude of this negative field curvature can be selected to precisely compensate for any subsequent (positive) field curvature occurring during particle-optical imaging from the intermediate image plane to the object plane.Therefore, no further field curvature correction is required.

[0092] Generating a magnetic field in the region of the particle multi-source allows the emitted particles or electrons to be selectively imprinted with a generalized angular momentum, which, after passing through the particle beam system, contributes to a telecentric collision of the individual particle beams in the object plane 101. It is possible to compensate for Larmor rotation caused by magnetic immersion in the region of the objective lens. Fig. 6, Fig. 7 to Fig. 8 shows some examples: Fig. Figure 6a shows magnetic field generating device 700 for generating a divergent magnetic field. For this purpose, a plurality of coil windings 702 are provided in a pole shoe 701 that is rotationally symmetrical about the optical axis Z. The magnetic field B is oriented according to reference numeral 703. Projected onto the emitter plane of the multi-source system 500, the magnetic field B has a component perpendicular to the optical axis Z. Electrons emitted perpendicular to this radial direction experience a corresponding initial angle distribution. Fig. Figure 6b schematically shows an initial velocity vector projected onto the emitter plane by the arrows.

[0093] Fig. Figure 7a shows a magnetic field generating device for producing a homogeneous magnetic field. This magnetic field essentially has no orthogonal component to the starting direction of the emitted electrons. A corresponding starting angle distribution is therefore localized or non-existent (compare Figure 7a). Fig. 7b).

[0094] Fig. Figure 8a shows another example of magnetic field shaping to impose a specific starting angle distribution on the emitted electrons within the magnetic field. Two concentric pole pieces 701 and 701a are shown, each with a plurality of coil windings 702 and 702a, respectively. The direction of the magnetic field lines is indicated by 703. They are oriented in opposite directions between the two pole pieces 701 and 701a. Accordingly, an opposite starting angle distribution is also obtained for the emitted electrons (compare Figure 8a). Fig. 8b).

[0095] In general, it is possible to selectively influence the starting angle distribution for the electrons emitted from the multi-sources by providing a magnetic field of a specific shape, in order to ensure telecentric impact conditions when the electrons later strike an object 7 in the particle beam system 1. This particularly enables the effective inspection of HRA structures. Reference symbol list 1 multi-beam particle microscope 3 primary particle beams (single-particle beams) 5 beam spots, points of impact 7 objects 9 secondary particle beams 10 Computer system, control 100 lens system 101 Object level 102 lens 102a Objective lens array 103 Field 200 detector system 205 Projection lens 209 particle multi-detector 211 Detection level 213 impact locations 217 Field 300 beam generating device 301 Particle source 303 Condenser lens system 305 Multi-aperture arrangement 313 Multi-aperture plate 315 openings of the multi-aperture plate 317 Center points of the openings 319 Field 307 Field lens system 309 diverging particle beam 311 illuminating particle beam 323 beam foci 325 Intermediate image plane 400 beam switch 401 Cross-Over 500 Multi-source system 501 first particle source 502 second particle source 503 third particle source 504 fourth particle source 511 first peak 512 second peak 513 third peak 514 fourth top 520 Suppressor electrode 521 first multi-aperture plate, extractor 522 second multi-aperture plate, counter electrode 523 first multi-lens array 524 beam current limiting multi-aperture plate 525 Multi-Deflector Array 526 Multi-Stigmator Array 600 final beam-shaping system 601 Multi-lens plate 602 third multi-lens array 610 Multi-Deflector Array 620 Aperture plate 630 Aperture plate 640 aperture plate 650 electric field lines 700 magnetic field generating devices 701 Polschuh 702 coil 703 Magnetic field Z optical axis

Claims

[1] Particle beam system (1) comprising: a multi-source system (500), comprising a particle multi-source (501, 502, 503, 504) configured to generate a plurality of charged single-particle beams (3) by field emission; a first multi-aperture plate (521) with a plurality of first openings which are at least partially penetrated by the single-particle beams (3); a first multi-lens array (523) which has a plurality of individually adjustable particle lenses and which is arranged in the beam path after the first multi-aperture plate (521) such that the single particle beams (3) which pass through the first multi-aperture plate (521) also pass through the first multi-lens array (523); a second multi-aperture plate (522) with a plurality of second apertures, which is arranged in the beam path after the first multi-lens array (523) such that the single-particle beams (3) passing through the first multi-lens array (523) also pass through the second multi-aperture plate (522); and a beam current limiting multi-aperture plate (524) with a plurality of beam current limiting openings, which is arranged in the beam path after the second multi-aperture plate (522) such that the single-particle beams (3) partially strike the beam current limiting multi-aperture plate (524) and are absorbed there, and partially pass through the openings of the beam current limiting multi-aperture plate (524); and a control (10) which is set up to supply an individually adjustable voltage to the particle lenses of the first multi-lens array (523) and thus to individually adjust the focusing of the associated particle lens for each individual particle beam (3) and thereby to individually adjust blocked components of the individual particle beams (3) at the beam current limiting multi-aperture plate (524). [2] Particle beam system (1) according to the preceding claim, further comprising: a final beam-shaping system (600) which is arranged in the beam path after the multi-source system (500) and by means of which the single-particle beams (3) are finally shaped for a subsequent optical imaging. [3] Particle beam system (1) according to any one of the preceding claims, wherein the first multi-aperture plate (521) is configured as an extractor electrode; and / or wherein the second multi-aperture plate (522) is configured as a counter electrode; and / or wherein the beam current limiting multi-aperture plate (524) is designed as the anode. [4] Particle beam system (1) according to any one of the preceding claims, wherein an identical first voltage (U1) is applied to the first multi-aperture plate (521) and to the second multi-aperture plate (522), and where the individually adjustable voltages (U2+V i ) at the first multi-lens array (523) are different from the first voltage (U1). [5] Particle beam system (1) according to one of the preceding claims, wherein for a distance A between the particle multi-source (501, 502, 503, 504) and the beam current limiting multi-aperture plate (524) the following applies: 0.1 mm ≤ A ≤ 30 mm, in particular 0.1 mm ≤ A ≤ 20 mm and / or 0.15 mm ≤ A ≤ 10 mm. [6] Particle beam system (1) according to one of the preceding claims, wherein immediately after passing through the beam current limiting multi-aperture plate (524) the following relation applies for deviations δ of the individual beam currents from an arithmetic mean of the beam currents: δ ≤ 5%, in particular δ ≤ 2% and / or δ ≤ 1%. [7] Particle beam system (1) according to one of the preceding claims, wherein the multi-source system (500) further comprises a suppressor electrode (520). [8] Particle beam system (1) according to any one of the preceding claims, wherein the multi-source system (500) comprises a second multi-lens array, the second multi-lens array comprising a plurality of individually adjustable and focusing particle lenses, and which is arranged in the beam path downstream of the beam-limiting multi-aperture plate (524) such that the particles of the single-particle beams (3) passing through the beam-limiting multi-aperture plate (524) also substantially pass through the second multi-lens array; and wherein the control (10) is further configured to supply an individually adjustable voltage to the particle lenses of the second multi-lens array and thus to individually adjust the focusing of the associated particle lens for each individual particle beam. [9] Particle beam system (1) according to any one of the preceding claims, wherein the multi-source system (500) further comprises a first multi-deflector array (610) which is penetrated by the single-particle beams (3) and which is arranged in the beam path downstream of the beam current limiting multi-aperture plate (524); and wherein the control (10) is further configured to supply individually adjustable excitations to the first multi-deflector array (610) and thus to deflect the individual particle beams (3) individually. [10] Particle beam system (1) according to any one of the preceding claims, wherein the multi-source system (500) further comprises a multi-stigmator array permeated by the single-particle beams, and wherein the control (10) is further configured to supply an adjustable excitation to the multi-stigmator array. [11] Particle beam system (1) according to one of the preceding claims, wherein the multi-source system (500) is at least partially manufactured using MEMS technology. [12] Particle beam system (1) according to one of the preceding claims, wherein the particle multi-source (501, 502, 503, 504) is an electron emitter array. [13] Particle beam system (1) according to one of the preceding claims, wherein the particle multi-source (500) comprises at least one of the following emitter types: metallic emitters, silicon-based emitters, carbon nanotube-based emitters. [14] Particle beam system (1) according to one of the preceding claims, which further comprises a magnetic field generating means (700) arranged such that the particle multi-source (501, 502, 503, 504) is arranged in a magnetic field (703). [15] Particle beam system (1) according to the preceding claim, wherein the magnetic field (703) generated by the magnetic field generating means (700) has a component perpendicular and / or a component parallel to the emission direction of the charged particles from the multi-source (501, 502, 503, 504). [16] Particle beam system (1) according to one of claims 14 to 15, wherein the magnetic field generating means (700) is configured such that a starting angle distribution of the charged particles caused by the magnetic field (703) after exiting the particle source (501, 502, 503, 504) depends on the radial distance of the respective particle source (501, 502, 503, 504) to the optical axis of the particle beam system (1). [17] Particle beam system (1) according to any one of claims 2 to 16, further comprising: a condenser lens system (CL1..N) that is arranged in the direction of the beam path after the multi-source system (500) and in front of the final beam-shaping system (600); a field lens system (FL1..N) arranged in the direction of the beam path after the final beam-shaping system (600); and an objective lens system (102, 102a) which is arranged in the direction of the beam path after the field lens system (FL1..N), wherein an intermediate image plane (325) is formed between the final beam-shaping system (600) and the field lens system (FL1..N). [18] Particle beam system (1) according to the preceding claim, wherein the final beam-shaping system (600) comprises: a final multi-aperture plate with a multitude of openings, arranged such that the single-particle beams (3) partially strike the final multi-aperture plate and are absorbed there, and partially pass through the openings of the final multi-aperture plate, and a second multi-lens array, which has a multitude of adjustable particle lenses and which is arranged in the beam path after the final multi-aperture plate such that the single particle beams (3) passing through the final multi-aperture plate also pass through the second multi-lens array to a substantial extent. [19] Particle beam system (1) according to any one of claims 2 to 18, wherein the final beam-shaping system (600) comprises: a final multi-aperture plate with a multitude of openings, arranged such that the single-particle beams partially hit the final multi-aperture plate and are absorbed there, and partially pass through the openings of the final multi-aperture plate; a multi-lens plate (601) with a plurality of apertures, which is arranged in the beam path after the final multi-aperture plate such that the single-particle beams (3) passing through the final multi-aperture plate also pass through the multi-lens plate (601); and at least one first aperture plate (620, 630, 640) having a single opening and arranged in the beam path after the multi-lens plate (601) such that the single-particle beams (3) passing through the multi-lens plate (601) also pass through the opening of the at least first aperture plate (620, 630, 640); and wherein the control is further arranged to supply an adjustable excitation to the at least one first aperture plate (620, 630, 640). [20] Particle beam system (1) according to the preceding claim, further comprising: a second multi-deflector array (610) which is arranged in the beam path close to the final multi-aperture plate; and wherein the control is further configured to supply individually adjustable excitations to the second multi-deflector array (620) and thus to deflect the single-particle beams (3) individually. [21] Particle beam system (1) according to any one of claims 17 to 20, wherein the condenser lens system (CL1..N) comprises one or more global condenser lenses, in particular an electrostatic or magnetic double condenser. [22] Particle beam system (1) according to any one of claims 17 to 20, wherein the condenser lens system (CL1..N) comprises a condenser lens array with a plurality of openings through which the single particle beams (3) are penetrated. [23] Particle beam system (1) according to any one of claims 17 to 22, wherein the objective lens system (102) comprises a global magnetic objective lens (102). [24] Particle beam system (1) according to any one of claims 17 to 22, wherein the objective lens system (102) has an objective lens array (102a) with a plurality of openings, which is arranged in the beam path such that the individual particle beams (3) pass through the openings of the objective lens array (102a). [25] Particle beam system (1) according to the preceding claim, wherein no crossover of the individual particle beams (3) is provided between the field lens system (FL1..N) and the object plane (101). [26] Multi-beam particle microscope (1) comprising a particle beam system (1) according to one of the preceding claims.

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