Laser-based alignment support device, laser-based alignment support system, and an X-ray imaging system
Patent Information
- Application Number
- DE102024200638
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-01-24
- Publication Date
- 2025-07-24
- Estimated Expiration
- 2044-01-24
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Abstract
Description
[0001] The invention relates to a laser-based alignment assistance device for aligning an instrument for puncturing an object, in particular for an X-ray imaging system. The laser-based alignment assistance device, or "device" for short, comprises a first line laser for generating a first laser radiation in a first laser plane, which is configured to generate a first laser line on a first surface line of the instrument in a first cutting plane of the instrument when the first cutting plane coincides with the first laser plane. Furthermore, the device comprises a second line laser for generating a second laser radiation in a second laser plane intersecting the first laser plane. The invention further relates to a laser-based alignment assistance system, which additionally comprises the instrument for the puncture.Furthermore, the invention relates to an X-ray imaging system with an X-ray source, an X-ray detector and with the aforementioned alignment support device.
[0002] A laser-based alignment assistance device can be used in medical applications, among other applications, such as technical applications for material processing.
[0003] For example, for medical interventions, it may be necessary to insert a medical instrument, such as a medical needle or cannula, into an object, particularly percutaneously into a patient, in a targeted manner, i.e., along a planned and precisely defined puncture trajectory through an object's surface. Especially when treating the patient's body, for example, on the spine or internal organs, the precise guidance and alignment of the instrument along the planned trajectory is particularly important to ensure, on the one hand, the correct trajectory between tissue and bone and, on the other hand, the targeted treatment of the respective organ, vessel, or bone.
[0004] The precise guidance and alignment of the instrument can be supported and monitored, particularly using an X-ray imaging system, but only to a limited extent, since the X-ray imaging system can only provide a two-dimensional X-ray image of the X-ray detector plane. In particular, in a trajectory display position of the X-ray detector or X-ray source, where the trajectory of the instrument within the object can be displayed, a pivoting movement of the instrument into or away from the detector plane cannot be displayed, which can lead to hidden tilting of the instrument.
[0005] Line lasers of the laser-based alignment support device can be used to assist in aligning the instrument, generating laser radiation in intersecting laser planes. Before the puncture, for example, in a first position of the laser-based alignment support device, two intersecting laser lines can be projected on the object surface, for example, on the patient's skin, which can indicate the puncture entry point. Additionally, in the first position, the instrument can be aligned by pivoting the instrument about a first and a second pivot axis such that the intersecting laser beams are projected onto the instrument.In particular, the instrument has a first and a second cutting plane. The instrument is aligned according to the trajectory, i.e., correctly positioned and correctly oriented at the puncture entry point, when the first laser plane coincides with the first cutting plane and the second laser plane coincides with the second cutting plane of the instrument. In particular, the line lasers can be adjusted such that, with a correctly aligned instrument, the first cutting plane coincides with the first laser plane and the second cutting plane coincides with the second laser plane.
[0006] Accordingly, an adjustment device can be provided for the first and for the second line laser, which can be adjusted in particular automatically according to a predetermined puncture trajectory.
[0007] However, for or during the puncture of the object, it may be necessary, due to design reasons, for the device to be rotated from the first position to a second position, in particular in order to be able to bring the X-ray detector into the progress display position for the intervention.
[0008] The disadvantage of this is that in the second position the device can only be used to a limited extent for aligning the instrument, since due to its design the two laser planes can no longer be superimposed with the two cutting planes of the instrument. In particular, in the second position of the device the instrument can only be aligned with regard to the first cutting plane using the laser lines. In contrast the second laser plane, which is rotated, for example, relative to the second cutting plane, cannot provide any supporting information for aligning the second cutting plane in the prior art. Likewise the second cutting plane of the instrument cannot be aligned using the X-ray image, so that there is a risk of hidden tilting of the instrument perpendicular to the detector plane during the intervention.
[0009] Previously, this problem was solved by periodically rotating the device from the first position to the second position during the procedure, allowing both cutting planes of the instrument to be correctly aligned again. However, this disadvantageously interrupts the procedure, thus delaying it and increasing radiation exposure. Alternatively, a mechanical alignment support device can be provided, but its handling requires improvement.
[0010] The object of the invention is to propose an improved concept for a laser-based alignment support device, for a laser-based alignment support system and for an X-ray imaging system, so that a user of the instrument can be assisted in aligning both the first cutting plane of the instrument and the second cutting plane of the instrument according to a puncture trajectory during a puncture, in particular in a progression display position of the X-ray detector or a second position of the alignment support device.
[0011] The problem is solved by the subject matter of the independent patent claims. Advantageous developments of the invention are described by the dependent patent claims, the following description, and the figures.
[0012] A first aspect of the invention relates to a laser-based alignment support device for aligning an instrument for puncturing an object, wherein the alignment support device can be provided in particular for an X-ray imaging system.
[0013] The alignment support device comprises, in particular, a first line laser for generating a first laser radiation in a first laser plane. The first line laser is configured to generate a first laser line on a first surface line of the instrument in a first cutting plane of the instrument when the first cutting plane coincides with the first laser plane.
[0014] The alignment support device further comprises, in particular, a second line laser for generating a second laser radiation in a second laser plane intersecting the first laser plane. The second line laser, in particular, comprises a point-like shielding element, wherein a shadow line can be generated in the second laser plane by means of the shielding element. The second line laser is configured to image a shadow point of the shadow line on a second surface line of the instrument in a second cutting plane of the instrument when the first cutting plane and the second cutting plane are aligned.
[0015] Alignment can be understood, in particular, as positioning the instrument in its specified position and rotating and pivoting it in its specified orientation, in particular, as transverse displacement along the three spatial directions and rotation around the three spatial directions. In particular, alignment also includes correct alignment, in particular the correct alignment of the instrument with respect to a specified or planned puncture trajectory.
[0016] Support can be understood in particular to mean that the device does not carry out the alignment itself, but rather supports a user or another technical device in correctly aligning the instrument.
[0017] The invention can advantageously ensure that a user of the instrument can be assisted in correctly aligning both the first cutting plane of the instrument and the second cutting plane of the instrument according to a predetermined puncture trajectory during a puncture, in particular in a progression display position of the X-ray detector or a second position of the alignment support device. In particular, the user can visually perceive when the instrument is correctly aligned. In particular, the instrument is correctly aligned when both the first laser line is generated on the first surface line and the shadow point is imaged on the second surface line. The user can visually monitor this to ensure that the instrument is aligned according to the planned puncture trajectory.
[0018] In particular, the user cannot visually detect any deviation from the correct alignment of the instrument, especially if the first laser line is not on the first surface line and / or if the shadow point is not on the second surface line. In particular, the user may see a second laser line on the second surface line, crossing the second surface line at a point, if the instrument is not correctly aligned. In this case, the user can correctly align the instrument with the assistance of the device.
[0019] For correct alignment, the user can preferably proceed as follows. First, the user positions the instrument on a predetermined puncture entry point, for example with a needle tip of the instrument. The user then pivots the instrument about a first pivot axis until they visually perceive the first laser line on the instrument, whereby the pivot axis can run through the puncture entry point. The user can then pivot the instrument about the first pivot axis and rotate it about a rotation axis through the puncture entry point such that the first laser line is generated on the first surface line. The user can then pivot the instrument about a second pivot axis essentially perpendicular to the first pivot axis until the shadow point is imaged on the second surface line.
[0020] For a rotationally symmetrical instrument, such as a medical needle, the step of rotating around the rotation axis can be omitted. In particular, for such an instrument, a first line along the needle can represent the first surface line, and a second line along the needle, offset from the first line, can represent the second surface line.
[0021] When inserting the instrument along the predetermined puncture trajectory, it can be provided in particular that the first laser line continues to be generated on the first object line and the shadow point moves on the second surface line.
[0022] A significant advantage of the device according to the invention is, in particular, that a user or an electromechanical device can be assisted in aligning both the first cutting plane and the second cutting plane of the instrument according to a predetermined alignment pose or a puncture trajectory. Such assistance can advantageously be ensured even if the second line laser cannot emit the second laser radiation in the laser plane that would coincide with the second cutting plane of the aligned instrument, for example due to its inevitable positioning during a puncture. This can be the case, for example, if the line lasers are arranged on the housing of the X-ray detector or the X-ray source of the X-ray imaging system. In this case, it can be provided that in a first position of the device, orIn a top view position of the X-ray imaging system, the line lasers can be arranged in such a way that they can produce a laser cross on the object surface and a laser cross on the instrument, but in this position the path of the instrument as it penetrates the body cannot be monitored.
[0023] To monitor the instrument's path, it may be necessary to rotate the X-ray imaging system into a path display position, which inevitably rotates the device into a second position. In the second position, it may be the case that the instrument can only be aligned with respect to the first cutting plane using the first line laser, whereas the second line laser, without generating the shadow line, could no longer provide any supporting information for aligning the instrument with respect to the second cutting plane.
[0024] In particular, by means of the point-like shielding element according to the invention, the instrument itself can be aligned in the second position of the device with respect to the second cutting plane, so that handling of the instrument is made considerably easier and the puncture can be carried out in a considerably more targeted manner.
[0025] A further advantage is that existing devices without such a shielding element according to the invention can be retrofitted with a shielding element particularly easily and cost-effectively through minimal modification, thereby generating significant additional benefits. Advantageously, the shielding element also does not restrict any other function of the device, particularly in the top-view position, so that no negative side effects arise from the shielding element.
[0026] It may be provided that the instrument must be aligned manually by a user, in particular by hand, or by means of an alignment or guidance device for the instrument, wherein the user is assisted in aligning the instrument by means of the laser-based device.
[0027] In particular, the instrument must be aligned according to a puncture trajectory planned before the puncture, along which the instrument is to be guided through the object surface into the object.
[0028] A puncture can be understood in particular as the insertion of a sharp instrument or a sharp part of an instrument through the surface of the object into the object. In this context, puncture need not be limited to medical punctures, but can also be used in the mechanical processing of objects.
[0029] In medical puncture, it may be provided that a medical needle, a cannula, a trocar or the like is inserted into a human or animal body, in particular percutaneously, in order, for example, to specifically inject fluids or to remove body fluids.
[0030] Accordingly, the instrument can be a medical instrument such as a medical needle, cannula, trocar, drill, or the like; the object surface can be the skin, and the object can be a body. In the broadest sense, the instrument can be a technical instrument such as a drill, screwdriver, chisel, or the like, which is suitable for puncture.
[0031] The instrument can, in particular, have three virtual cutting planes, comparable to the main planes of a human body. The three cutting planes can, in particular, each be orthogonal to one another and, for example, intersect at a common intersection point, in particular at a center of the instrument. The first cutting plane and the second cutting plane can, in particular, run in a direction of the longitudinal axis of the instrument, for example, along the needle. In particular, the first and second cutting planes can intersect in the longitudinal axis. The longitudinal axis can, in particular, run through the needle center of the instrument.
[0032] The first surface line and / or the second surface line may be visible on the instrument, for example, in the form of a notch or a color-coded line. Likewise, the first and / or second surface line may already be predetermined by the instrument, for example, if the instrument is a medical needle or handle.
[0033] In particular, the device can be used additionally to support a medical intervention, for example percutaneous vertebroplasty, with the supportive use of an X-ray imaging system.
[0034] A line laser is a laser with special optics that can generate a laser line on a surface instead of a laser spot like a laser pointer. To achieve this, the line laser emits laser radiation in a fan-like pattern into a laser plane, which creates the line when it hits a surface. A laser plane is specifically defined as the plane spanned by the vectors of the laser beams. In particular, the two laser planes intersect in a laser cutting line. In particular, it can be provided that the laser cutting line at least approximately intersects the intersection line of the first and second cutting planes of the aligned instrument.
[0035] In particular, the line lasers are designed to emit laser radiation continuously over time. In particular, the laser radiation is therefore also emitted when the instrument is not yet aligned or is only partially aligned. In particular, the first laser line can be displayed at an angle or off-axis from the first surface line if the instrument is not correctly aligned with respect to the first cutting plane, or the shadow point can be displayed off-axis from the second surface line if the instrument is not correctly aligned with respect to the second cutting plane.
[0036] The line lasers can be adjusted and / or calibrated for an individual puncture so that they can be used to assist in correctly aligning the instrument along the puncture trajectory.
[0037] The device can be configured, in particular in the first position, to indicate a puncture point on the object surface by means of a laser line cross and to align the instrument with respect to the first and second cutting planes even without the shielding element.
[0038] In the second position of the device, the second laser plane of the second line laser can no longer be aligned with the second cutting plane of the aligned instrument due to its position. Rather, the second laser plane can be positioned perpendicular to the aligned second cutting plane, for example, at a right angle to each other, or at an angle of 30 degrees to 150 degrees to each other.
[0039] The shielding element can preferably be arranged directly at an exit point or in an exit region of the second line laser. "Point-like" can be understood in particular to mean that the shielding element can represent a point in the second laser plane, or that the shielding element intersects the second laser plane at a point.
[0040] In particular, the shielding element is designed to shield the second laser radiation at a single point. As a result, the point in the second laser plane creates a shadow line that extends linearly within the second laser plane. For technical or optical reasons, the shadow line may fan out slightly over time.
[0041] The shadow point can be understood, in particular, as a hidden point or a hidden area of the second laser line on the instrument. In particular, by pivoting the instrument around the second pivot axis, the second laser line can be visually perceived on the instrument, and the shadow point as a hidden area between two partial lines of the second laser line.
[0042] In particular, it can be provided that the shadow line of the second laser plane intersects the first laser plane at an intersection point, wherein this intersection point can correspond at least approximately to a point on the intersection line of the first and second cutting planes.
[0043] At least one embodiment provides that the shielding element is an adjustable shielding element. Accordingly, an adjustment device for the shielding element can be provided, which can be adjusted, in particular automatically, according to the predetermined or planned puncture trajectory. Advantageously, the shielding element can be adjusted, in particular set and calibrated, for each individual puncture intervention. For example, the adjustment device can be used to change a geometric position of the physical shielding element.
[0044] The shielding element can also correspond to a tint of photochromic glass or a darkening of electrochromic glass, which is penetrated by the second laser radiation. In particular, the shielding element can be adjusted by applying an electrical voltage to the electrochromic glass. Furthermore, the shielding element can be technically implemented using a liquid crystal element.
[0045] At least one embodiment provides that the second line laser has an imaging optic configured to sharpen a contour of the shadow point. A sharpened shadow point advantageously allows the instrument to be aligned even more precisely around the second pivot axis. In particular, the imaging optics can sharpen the ends of the partial lines of the second laser line that delimit the shadow point. Preferably, the imaging optics are configured to guide the ends of the partial lines as close to each other as possible, but visually perceived as being spaced apart, so that the shadow point is as small as possible.
[0046] The imaging optics can in particular comprise various lenses and apertures, which can preferably be adjustable and in particular focusable.
[0047] At least one embodiment provides for the shielding element to be a filament that intersects the second laser plane at a single point. A filament allows the shielding element to be implemented particularly easily and cost-effectively, or retrofitted to existing devices without a shielding element.
[0048] A filament can be understood, in particular, as a thread, a fiber, a cord, a fine wire, or the like. The filament is preferably linear. In particular, the filament can run substantially orthogonally to the second laser plane, or at least at an intersection angle of 60 degrees to 120 degrees.
[0049] At least one embodiment provides that the laser-based alignment support device has a housing on which the first line laser and the second line laser are arranged separately from one another. The shared housing advantageously allows the precise positioning of the two line lasers relative to one another. Advantageously, the fixed position of the two line lasers relative to one another allows a common laser coordinate system to be used to align the line lasers. Furthermore, the housing can be precisely aligned in space, and thus the two line lasers can also be precisely aligned, simplifying their adjustment or calibration.
[0050] At least one embodiment provides that the housing has a main extension surface, wherein the first line laser is formed on a longitudinal side of the main extension surface and the second line laser is formed on a transverse side of the main extension surface. In particular, the line lasers are arranged at an edge of the main extension surface.
[0051] Preferably, the housing can also be provided for other purposes, in particular for the arrangement of an X-ray detector or an X-ray source, wherein the main extension surface can correspond to the detector surface.
[0052] At least one embodiment provides that the first line laser is configured to generate the first laser radiation in the first laser plane, which extends substantially perpendicular to the main extension surface, and the second line laser is configured to generate the second laser radiation in the second laser plane, which extends substantially perpendicular to the main extension surface and perpendicular to the first laser plane. In particular, the laser planes can each be parallel to an orthogonal line of the main extension surface, and, for example, parallel to a central projection beam of the X-ray detector. In this way, the laser planes arranged in this way can advantageously be used to assist in aligning the instrument.
[0053] At least one embodiment provides that the laser-based alignment support device has a positioning device on which the housing is arranged. In particular, the housing can be connected to the rotating device in a fixed or rotatable manner. In particular, the housing can be positioned by means of the positioning device. The positioning device can be mounted such that the housing can be positioned along a path, for example, along a circular path.
[0054] Preferably, the rotating device is configured to position the housing relative to the object at least in a first position and in a second position, for example, along a circular path around the object. The first position and the second position can be offset from each other on the circular path, for example, substantially by a circular angle of 90 degrees, or within a range of 60 degrees to 120 degrees.
[0055] In the first position, the first line laser and the second line laser are preferably configured so that the first laser line intersects the second laser line at a puncture entry point on the object surface. This allows the device to assist the user in positioning the instrument at the puncture entry point. Furthermore, the crossed lines can also be used to correctly orient the instrument.
[0056] However, the first position may be unsuitable for puncture intervention, particularly because in this position the X-ray imaging system cannot be positioned in a tracking position to follow the path of the instrument within the object.
[0057] In the second position, in which the X-ray imaging system can be in the progression display position, the first line laser is configured to generate the first laser line on the first surface line of the instrument positioned at the puncture entry point when the first cutting plane coincides with the first laser plane. Likewise, in the second position, the second line laser is configured to image the shadow point on the second surface line of the instrument positioned at the puncture entry point when the first cutting plane and the second cutting plane are aligned.
[0058] In this way, the device can assist the user in at least two positions in correctly aligning the instrument according to the specified puncture trajectory.
[0059] Another aspect of the invention relates to a laser-based alignment assistance system for assisting in the alignment of an instrument for puncturing an object.
[0060] The laser-based alignment assistance system comprises the laser-based alignment assistance device according to the invention, as well as the instrument having a marking along the second surface line, wherein the second cutting plane is aligned when the shadow point is imaged on the marked second line.
[0061] In other words, a marking is provided on the instrument that visually identifies the second surface line for the user. Particularly with complex instruments where the surface lines are not determined by the geometry of the instrument itself, this marking, or the marked second surface line, can advantageously assist the user in mapping the shadow point on the second surface line by pivoting the instrument, ensuring the instrument is correctly aligned.
[0062] Preferably, the marking is on the second surface line, especially for narrow instruments.
[0063] The marking may, for example, be a colored marking and / or a notch or protruding ridge on the surface of the instrument.
[0064] In particular, the first surface line may also be marked, provided that the first surface line is not already determined from the geometry of the instrument.
[0065] The system according to the invention can advantageously ensure that a user of the instrument can be supported in correctly aligning both the first cutting plane of the instrument and the second cutting plane of the instrument according to a predetermined puncture trajectory during a puncture, in particular in a trajectory display position of the X-ray detector or a second position of the alignment support device. In particular, the user can visually perceive when the instrument is correctly aligned, which is additionally ensured by the marking. The instrument is correctly aligned in particular when both the first laser line is generated on the first surface line and the shadow point is imaged on the marked, second surface line. The user can visually monitor this to ensure that the instrument is aligned according to the planned puncture trajectory.
[0066] At least one embodiment of the alignment support system provides that the instrument comprises a handle having the marking for the second surface line. The handle may be particularly suitable for applying the marking, as it may have a certain size. In particular, a needle for puncture may be arranged on the handle, whereby the user can, for example, grasp the handle and thus insert the needle into the object.
[0067] At least one embodiment of the alignment support system provides that, depending on the thickness of the instrument, the marking is offset from the second surface line. In particular, the marking can run parallel along the second surface line. This advantageously allows for the angle of incidence of the second laser radiation onto the instrument to be taken into account.
[0068] A further aspect of the invention relates to an X-ray imaging system, at least comprising an X-ray source and an X-ray detector, as well as the laser-based alignment support device or the laser-based alignment support system according to the invention.
[0069] At least one embodiment of the X-ray imaging system provides that the first line laser and the second line laser are arranged on a housing of the X-ray detector or on a housing of the X-ray source. In particular, the positioning of the line lasers relative to the X-ray detector or X-ray source can thus be fixedly specified.
[0070] This, and especially the shared housing of the line lasers with the detector or X-ray sources, makes it particularly easy to couple an X-ray coordinate system of the X-ray detector with a laser coordinate system of the line lasers. This allows the line lasers to be adjusted in a simplified manner depending on a planned trajectory within an X-ray image of the X-ray detector.
[0071] In particular, the common housing directly couples the first position of the alignment support device to the top view position of the X-ray imaging system, and the second position of the alignment support device to the gradient display position of the X-ray imaging system.
[0072] At least one embodiment of the X-ray imaging system provides that the first line laser is designed to generate the first laser radiation in the first laser plane, which extends substantially parallel to a projection direction of the X-ray imaging system, and the second line laser is designed to generate the second laser radiation in the second laser plane, which extends substantially parallel to the projection direction and perpendicular to the first laser plane.
[0073] At least one embodiment of the X-ray imaging system provides that the X-ray imaging system has a rotatable C-arm as a positioning device. The C-arm is configured to rotate the X-ray source and the X-ray detector relative to the object at least into the top view position and the trajectory display position.
[0074] In the plan view position, the first line laser and the second line laser are configured such that the first laser line and the second laser line intersect at the puncture entry point on the object surface, and in the gradient display position, the first line laser is configured to generate the first laser line on the instrument positioned at the puncture entry point on the first surface line when the first cutting plane coincides with the first laser plane, and the second line laser is configured to image the shadow point on the second surface line of the instrument positioned at the puncture entry point when the first cutting plane and the second cutting plane are aligned.
[0075] Regardless of the grammatical gender of a particular term, persons with male, female or other gender identities are included.
[0076] Exemplary embodiments of the invention are described below. These are shown in: Fig. 1 is a schematic representation of an embodiment of an X-ray imaging system according to the invention in a plan view position; Fig. 2 a schematic representation of a detector image from the top view position; Fig. 3 is a schematic representation of an embodiment of an X-ray detector with a laser-based alignment support device according to the invention in a first position; Fig. 4 is a schematic representation of an embodiment of an X-ray imaging system according to the invention in a progression display position; Fig. 5 a schematic representation of a detector image from the history display position; Fig. 6 is a schematic sketch representation of a laser-based alignment support device according to the invention in a second position; Fig. 7 is a schematic sketch illustration of a laser-based alignment assistance device according to the invention in a second position with a medical needle; Fig. 8 an enlarged schematic representation of the medical needle; Fig. 9 is a schematic sketch view of a laser-based alignment support system according to the invention in a second position; Fig. 10 a first schematic representation of an instrument with a marking; Fig. 11 a second schematic representation of an instrument with a marking Fig. 12 a schematic representation of a second line laser with a shielding element.
[0077] In Fig. 1 shows a schematic representation of an embodiment of an X-ray imaging system 4 according to the invention in a top view position P11. In the example shown, the X-ray imaging system 4 has an X-ray source 31 and an X-ray detector 32, which can generate a detector image 36 of an object 3, here a patient 34. For this purpose, the patient 34 can lie on a patient couch 35 of the system 4. For example, the X-ray imaging system 4 can provide imaging support during a puncture of the patient 34, for example, during a percutaneous vertebroplasty. An instrument 2 can be designed as a medical instrument 2, for example, as a medical needle. In the top view position P11, however, the path of the instrument 2 in the patient cannot be displayed, in particular not the penetration depth of the instrument 2 into the patient 34, cf. Fig. 2. In this respect, the X-ray imaging system 4 in the top view position P11 cannot be used advantageously during the medical intervention.
[0078] The detector can in particular be mounted on a positioning device 25 designed as a rotatable C-arm 33, which is designed to rotate the X-ray source 31 and the X-ray detector 32 with respect to the object 3 from the plan view position P11, for example, into a progression display position P22, compare Fig. 4. For this purpose, the C-arm 33 can be mounted on a pivot bearing 40.
[0079] A housing 21 of the X-ray detector 32 can serve, in particular, as a common housing 21 for the X-ray detector 32 and a laser-based alignment support device 1. The device 1 can, in particular, have a first line laser 5 and a second line laser 6, which can be arranged separately from one another on the housing 21.
[0080] In the top view position P11, the device 1 can be aligned in particular in a first position P1, since this can be coupled to the position of the X-ray imaging system 4 due to the common housing 21.
[0081] Fig. Figure 2 shows a schematic representation of a detector image 36 of an object 3, for example, the patient 34, from the top view position P11. In particular, a vertebra 37 and the instrument 2, which may have a handle 30, can be seen. Although the positioning of the instrument 2 in the detector plane can be determined from the top view position P11, the penetration depth of the instrument 2, which would be of interest to the user, for example, the attending physician, cannot be detected.
[0082] In Fig. Figure 3 shows a schematic representation of an embodiment of an X-ray detector 32 with a laser-based alignment support device 1 according to the invention for assisting in the alignment of the instrument 2 for a puncture in a first position P1. In this example, the first line laser 5 is provided on a longitudinal side 23 of the main extension surface 22 and the second line laser 6 is provided on a transverse side 24 of the main extension surface 22, so that they are mounted outside the detector plane and do not interfere with the detector image.
[0083] The first line laser 5 can be designed to generate a first laser radiation in a first laser plane 7, which can extend substantially perpendicular to a main extension surface 22 of the housing 21, which can correspond in particular to the detector plane of the X-ray detector 32. The second line laser 6 can be designed to generate a second laser radiation in a second laser plane 8, which can extend substantially perpendicular to the main extension surface 22 and perpendicular to the first laser plane 7. When the laser radiation strikes a surface, for example an object surface 27 of the object 3, the first line laser 5 can generate a first laser line 14, and the second line laser 6 can generate a second laser line 15.
[0084] In the first position P1, the first line laser 5 and the second line laser 6 can be adjusted and configured accordingly so that the first laser line 14 and the second laser line 15 intersect at a puncture entry point 26 on the object surface 27.
[0085] Fig. Figure 4 shows a schematic representation of an embodiment of an X-ray imaging system 4 according to the invention in a progression display position P22. In particular, the X-ray source 31 and the X-ray detector 32, together with the device 1, can be rotated by approximately 90 degrees from the plan view position P11 into this progression display position P22 by means of the C-arm 33 (not shown).
[0086] This progression display position P22 can be particularly advantageous for the user in that he can recognize the penetration depth of the instrument 2 into the patient 34 on the detector image 36, compare Fig. 5, so that during the intervention system 4 is primarily used in the progress display position P22.
[0087] At the history display position P22, the laser-based alignment assistance device 1, which is coupled to the position of the system 4, is in a second position P2, which may be offset by approximately 90 degrees from the first position P1.
[0088] In Fig. Figure 5 shows a schematic representation of a detector image 36 from the progression display position P22. This advantageously allows the attending physician to show the penetration depth of the instrument 2, for example, a medical needle, into the object 3, for example, into the patient's vertebra 37. However, the disadvantage is that tilting of the instrument 2 into or out of the detector plane cannot be detected in this detector image 37. Likewise, this cannot be detected using a prior art alignment support device in the second position P2.
[0089] Fig. Figure 6 shows a schematic sketch of a laser-based alignment support device 1 according to the invention in the second position P2. Here, the first line laser 5 can be configured and adjusted such that it generates the first laser radiation in the first laser plane 7, which coincides with a first, virtual, first cutting plane 11 of the instrument 2 (not shown), correctly aligned according to a planned puncture trajectory.
[0090] Due to the arrangement of the second line laser 6 shown and described, it cannot be adjusted such that the second laser plane 8 coincides with a second, virtual, second cutting plane 12 of the instrument 2, which is correctly aligned according to the planned puncture trajectory. In particular, the second laser plane 8 may be approximately at a right angle to the second cutting plane 12, so that the instrument 2 cannot be aligned with respect to the second cutting plane 12 without additional aids.
[0091] To solve this problem, a point-like shielding element 16 of the second line laser 6 can be provided, which generates a shadow line 17 in the second laser plane 8. The second line laser 6 can then be configured and adjusted such that the shadow line 17 at least approximately crosses a virtual intersection line 41 of the first intersection plane 11 and the second intersection plane 12. In this context, "approximately" can be understood to mean that the shadow line 17 can run slightly adjacent to the intersection line 41, depending on the thickness of the instrument 2, so that the instrument 2 can be correctly aligned.
[0092] The shielding element 16 is preferably an adjustable shielding element 16, which can be adjusted depending on the puncture trajectory and thickness of the instrument 2, preferably automatically by an adjustment device and corresponding software.
[0093] In the example, the shielding element 16 can be a filament 19, for example a thin metal wire, which intersects the second laser plane 8 in a point 20 in a “point-like” manner.
[0094] In particular, the second line laser 6 may have an imaging optics (not shown) which is configured to sharpen a contour of the shadow line 17.
[0095] For the sake of completeness, the Fig. 6 and the other Fig. 7 and Fig. 8 also the third cutting plane 13 of the instrument 2.
[0096] In Fig. Figure 7 shows a schematic sketch of the laser-based alignment support device 1 according to the invention in the second position P2 with a medical needle as the instrument 2. The instrument 2 is positioned in particular at the puncture entry point 26 on the object surface 27.
[0097] The first line laser 5 can be configured such that the first laser line 14 is generated on a first surface line 9 of the instrument 2 in a first cutting plane 11 of the instrument 2 when the first cutting plane 11 coincides with the first laser plane 7.
[0098] The second line laser 6 can be configured to image a shadow point 18 of the shadow line 17 on a second surface line 10 of the instrument 2 in a second cutting plane 12 of the instrument 2 when the first cutting plane 11 and the second cutting plane 12 are correctly aligned according to the puncture trajectory.
[0099] Fig. 8 shows an enlarged, schematic representation of the instrument 2 designed as a medical needle, in particular in a section of the needle. The user can visually perceive when the first laser line 9 appears on the first, virtual surface line 9, wherein the first surface line 9 can correspond to a partial area of the needle's jacket. The second, virtual surface line 10 can also correspond to a partial area of the needle's jacket, but offset from the first surface line 9. Likewise, the second laser line 15 can be imaged on the needle transversely to a needle's longitudinal axis, wherein the shadow point 18 is located between a first partial line 38 and a second partial line 39 of the second laser line 15. In particular, the instrument 2 is also aligned in the second cutting plane 12 when the instrument 2 is pivoted such that the shadow point 18 is imaged on the second surface line 10.
[0100] However, with thin needles or large shadow points 18, it may be the case that the second laser line 15 cannot be seen when the instrument 2 is aligned, particularly if the shadow diameter of the shadow point 18 is larger than the diameter of the needle. For example, in this case, the needle is aligned if the second laser line 15 is not visible on the needle.
[0101] In Fig. Figure 9 shows a schematic sketch of a laser-based alignment support system 28 according to the invention in the second position P2. In particular, the instrument 2 of the system 28 has a marking 29 along the second surface line 10, wherein the second section plane 12 is aligned when the shadow point 18 is imaged onto the marking 29.
[0102] The instrument 2 may comprise a needle and a handle 30, wherein the handle 30 may have the marking 29. Depending on the thickness of the instrument 2 or the handle 30, the marking 29 may be slightly offset from the second surface line 10 to compensate for a flat irradiation angle.
[0103] Fig. 10 shows a first schematic representation of an embodiment of an instrument 2, in particular with a marking 29 on the second surface line 10. The instrument 2 has a handle 30 and a needle for puncture. On the instrument 2 aligned at the puncture entry point 26 and in the cutting planes 12, 13, it can be seen that the first laser line runs along the first surface line 9 and, beyond that, also on the object surface 27 of the object 3. Furthermore, the first partial line 38 and the second partial line 39 of the second laser line 15 can be seen, with the shadow point 18 on the marking 29 being between the partial lines 38, 39.
[0104] In Fig. 11 shows a second schematic representation of an embodiment of instrument 2 with a marking 29 from a different perspective.
[0105] Fig.Figure 12 shows a schematic representation of a second line laser 6 with a shielding element 16 formed as a filament 19. In this example, the second line laser 6 is arranged on the common housing 21 of the X-ray detector 32. The line laser 6 can be retrofitted with the shielding element 16 relatively easily on such a housing 21.
Claims
[1] Laser-based alignment support device (1) for supporting the alignment of an instrument (2) for puncturing an object (3), in particular for an X-ray imaging system (4), comprising - a first line laser (5) for generating a first laser radiation in a first laser plane (7), which is configured to generate a first laser line (14) on a first surface line (9) of the instrument (2) in a first cutting plane (11) of the instrument (2) when the first cutting plane (11) coincides with the first laser plane (7), and - a second line laser (6) for generating a second laser radiation in a second laser plane (8) crossing the first laser plane (7) characterized by - a point-like shielding element (16) of the second line laser (6) for generating a shadow line (17) in the second laser plane (8), wherein the second line laser (6) is configured to image a shadow point (18) of the shadow line (17) on a second surface line (10) of the instrument (2) in a second cutting plane (12) of the instrument (2) when the first cutting plane (11) and the second cutting plane (12) are aligned. [2] Laser-based alignment support device (1) according to claim 1, characterized by that the shielding element (16) is an adjustable shielding element (16). [3] Laser-based alignment support device (1) according to claim 1 or 2, characterized by that the second line laser (6) has an imaging optics which is designed to sharpen a contour of the shadow point (18). [4] Laser-based alignment support device (1) according to one of the preceding claims characterized bythat the shielding element (16) is a filament (19) which intersects the second laser plane (8) at a point (20). [5] Laser-based alignment support device (1) according to one of the preceding claims, characterized by a housing (21) on which the first line laser (5) and the second line laser (6) are arranged separately from one another. [6] Laser-based alignment support device (1) according to claim 5, characterized by that the housing (21) has a main extension surface (22), wherein the first line laser (5) is formed on a longitudinal side (23) of the main extension surface (22) and the second line laser (6) is formed on a transverse side (24) of the main extension surface (22). [7] Laser-based alignment support device (1) according to claim 6, characterized byin that the first line laser (5) is designed to generate the first laser radiation in the first laser plane (7), which extends substantially perpendicular to the main extension surface (22), and the second line laser (6) is designed to generate the second laser radiation in the second laser plane (8), which extends substantially perpendicular to the main extension surface (22) and perpendicular to the first laser plane (7). [8] Laser-based alignment support device (1) according to one of claims 5 to 7, characterized by a positioning device (25) on which the housing (21) is arranged, wherein the positioning device (25) is arranged to rotate the housing (21) with respect to the object (3) at least into a first position (P1) and into a second position (P2), wherein - in the first position (P1), the first line laser (5) and the second line laser (6) are arranged such that the first laser line (14) and a second laser line (15) generated by the second line laser (6) intersect at a puncture entry point (26) on an object surface (27) of the object (3), and - in the second position, the first line laser (5) is configured to generate the first laser line (14) on the first surface line (9) of the instrument (2) positioned at the puncture entry point (26) when the first cutting plane (11) coincides with the first laser plane (7), and the second line laser (5) is configured to image the shadow point (18) on the second surface line (10) of the instrument (2) positioned at the puncture entry point (26) when the first cutting plane (11) and the second cutting plane (12) are aligned. [9] Laser-based alignment support system (28) for assisting the alignment of an instrument (2) for puncturing an object (3), characterized by - a laser-based alignment support device (1) according to one of the preceding claims, and - the instrument (2) having a mark (29) along the second surface line (10), wherein the second cutting plane (12) is aligned when the shadow point (18) is imaged on the mark (29). [10] Laser-based alignment support system (28) according to claim 9, characterized by that the instrument (2) comprises a handle (30) which has the marking (29). [11] Laser-based alignment support system (28) according to claim 9 or 10, characterized by that depending on a thickness of the instrument (2) the marking (29) is arranged offset from the second surface line (10). [12] X-ray imaging system (4) comprising an X-ray source (31) and an X-ray detector (32), characterized by a laser-based alignment assistance device (1) according to one of claims 1 to 8. [13] X-ray imaging system (4) according to claim 12, characterized by that the first line laser (5) and the second line laser (6) are arranged on a housing (21) of the X-ray detector (32) or on a housing (21) of the X-ray source (31). [14] X-ray imaging system (4) according to claim 13, characterized by , that the first line laser (5) is designed to generate the first laser radiation in the first laser plane (7), which extends substantially parallel to a projection direction of the X-ray imaging system (4), and the second line laser (6) is designed to generate the second laser radiation in the second laser plane (8), which extends substantially parallel to the projection direction and perpendicular to the first laser plane (7). [15] X-ray imaging system (4) according to claim 14, characterized by a rotatable C-arm (33) as a positioning device (25), on which the X-ray source (31) and the X-ray detector (32) are arranged, wherein the C-arm (33) is designed to rotate the X-ray source (31) and the X-ray detector (32) with respect to the object (3) at least into a plan view position (P11) and into a progression display position (P22), wherein - in the plan view position (P11), the first line laser (5) and the second line laser (6) are arranged such that the first laser line (14) and a second laser line (15) generated by the second line laser (6) intersect at a puncture entry point (26) on an object surface (27) of the object (3), and - in the progression display position (P22), the first line laser (5) is configured to generate the first laser line (14) on the first surface line (9) of the instrument (2) positioned at the puncture entry point (26) when the first cutting plane (11) coincides with the first laser plane (7), and the second line laser (6) is configured to image the shadow point (18) on the second surface line (10) of the instrument (2) positioned at the puncture entry point (26) when the first cutting plane (11) and the second cutting plane (12) are aligned.
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