REFRACTOMETER AND METHOD FOR DETERMINING THE REFRACTIVE INDEX OF A PROCESS MEDIUM USING A REFRACTOMETER

DE502020011379D1Active Publication Date: 2025-07-31ENDRESS HAUSER DIGITAL SOLUTIONS (DEUTSCHLAND) GMBH
View PDF 0 Cites 0 Cited by

Patent Information

Application Number
DE502020011379
Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
Priority Date
2019-04-02
Filing Date
2020-03-12
Publication Date
2025-07-31
Estimated Expiration
2040-03-12

AI Technical Summary

Technical Problem

Conventional refractometers require two access points to the process medium, making them unsuitable for applications with small diameters, and temperature-sensitive components face challenges in high-temperature environments.

Method used

A refractometer design featuring a probe unit with a measuring prism and optical fibers that separates temperature-sensitive components from the process medium, allowing for single-sided access and thermal insulation, with optical fibers guiding light to and from the process medium.

Benefits of technology

Enables refractometer use in small-diameter process accesses and withstands high temperatures, providing accurate refractive index measurements while protecting sensitive components.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader
Need to check novelty before this filing date? Find Prior Art
No text content released.