THZ MEASURING METHOD AND THZ MEASURING DEVICE FOR MEASURING A MEASURING OBJECT, IN PARTICULAR A PIPE

Description

[0001] The invention relates to a THz measuring method and a THz measuring device for measuring a measuring object, in particular a pipe made of a plastic or rubber.

[0002] THz measurement methods and devices can be used, in particular, for measuring continuous profiles, especially single- or multi-layer pipe profiles made of a material permeable to THz radiation, such as plastic or rubber. The THz radiation is partially reflected at interfaces between materials with different refractive indices, particularly at the outer and inner surfaces of a pipe profile, and then reflected back to the emitting THz sensor, allowing the time of flight of the THz measurement signal to be determined. In air or vacuum, the known speed of light allows for direct assignment of travel distances and thus distances to the time of flight. In a plastic material, a time of flight and thus a distance can also be assigned accordingly if the refractive index is known.

[0003] Two basic methods are known for measuring pipes: In a one-sided measurement, radially through a pipe against an opposite reflector, one or more sensors are arranged, each with an opposing mirror or reflector, for example, in a rotational manner around a pipe. From the known idle time within the measuring device and the transit times of the reflection measurement signals or reflection peaks, which are generated by reflection from the pipe or the outer or inner surface of the pipe, transit time differences can be determined, and from these, wall thicknesses can be determined using the refractive index.

[0004] In this case, deviations in the shape of the pipe being measured can prevent analysable back reflection, especially in the area of ​​the second wall thickness of the pipe. Another disadvantage is that with larger wall thicknesses or absorbing additives, the THz radiation is absorbed so strongly that the reflected signals are too small to be reliably evaluated.

[0005] In a simple one-sided measurement radially through the pipe wall, several sensors are generally arranged, e.g. rotationally around a pipe, e.g. opposite each other. The THz sensors or THz transceivers send a THz beam along the optical axis radially through the pipe wall and measure reflected radiation or reflection peaks, from which the diameter of the pipe and the wall thickness of the pipe can be determined. From this, for example, four or eight THz sensors can be used, from whose information the diameter can be calculated, e.g. in the event of an incorrect position. In order to reliably calculate the wall thickness, knowledge of the material or its refractive index is required, whereby the refractive index is determined by the ratio of the speed of light in the material to the speed of light in a vacuum (or air).

[0006] However, the refractive index is generally dependent on the material or material batch, as well as on temperature. Therefore, a correct measurement generally requires determining a reference refractive index on a material sample.

[0007] DE 20 2016 008 526 U1 describes a device for measuring the diameter and / or wall thickness of a strand with a substantially circular cross-section and guided through the device in the direction of its longitudinal axis by means of guide means. This device includes a transmitter for emitting terahertz radiation with a radiation optics and a reflector opposite the transmitter. An evaluation device is configured to determine the diameter and / or wall thickness of the strand based on the measurement signals.

[0008] DE 10 2018 128 248 A1 describes a method for determining the refractive index of a tubular body. A transmitting device irradiates measuring radiation within a measuring area, which is reflected at its boundary surfaces and detected by a receiving device. The optical wall thickness of a wall section is determined based on the reflected measuring radiation, and the refractive index is subsequently determined by comparing the outer and inner diameters with the optical wall thickness.

[0009] DE 10 2018 124 175 A1 describes a method and a device for controlling a production plant for plate-shaped or strand-shaped bodies, in which the body is conveyed along a conveying direction through a measuring area and irradiated by means of measuring radiation which penetrates at least partially into the body and measuring radiation reflected by the body is detected, wherein a refractive index determination and / or an absorption determination of at least one production parameter of a production plant is carried out.

[0010] The invention is therefore based on the object of creating a THz measuring device and a THz measuring method which enable a reliable measurement of a measuring object.

[0011] This object is achieved by a THz measurement method and a THz measurement device according to the independent claims. The subclaims describe preferred developments.

[0012] The THz measuring device according to the invention can be used in particular for carrying out the THz measuring method according to the invention; the THz measuring method according to the invention can be carried out in particular with a THz measuring device according to the invention.

[0013] According to the invention, a measurement is thus provided over a measuring range from two opposite measuring positions. The measurements are performed by a sensor arrangement with at least two sensors, with the sensor arrangement performing the measurements from a first measuring position and a second measuring position.

[0014] It is provided that the sensor arrangement comprises a pair of two opposing sensors, ie a first sensor at the first measuring position and a second sensor at the second measuring position, which thus define an idle distance between them in the empty measuring device, ie without a measuring object being recorded.

[0015] The two sensors can be provided with a fixed angle setting. In the embodiment with two opposing sensors, these are thus advantageously located on a common optical axis. This design with rigidly arranged sensors is particularly advantageous if the measurement object can subsequently be positioned precisely on the optical axis or in the idle section.

[0016] Alternatively, the sensors can be mounted in a pivotable manner in their measuring positions, thus lying in a basic position on a common optical axis and being adjusted from this basic position at a specific angle. This design with pivotable sensors is particularly advantageous for subsequent measurement of measurement objects with decentralized positioning, in which a center point of the measurement object is possibly positioned outside the open-loop distance, so that the sensors in their basic position would no longer transmit the THz transmission beams perpendicularly to the outer surface of the measurement object. This pivotability allows the sensors to be pivoted away from the basic position after the calibration step.

[0017] InIn a calibration measurement, which can in particular already be carried out at the factory, an idle time of the measuring signal through the idle section or between the two measuring positions is first determined.

[0018] In the inventive design with two measuring positions, i.e. a pair of sensors, the calibration can be carried out according to one embodiment by means of a calibration reflector temporarily introduced into the measuring area or the reference distance, e.g. a precision sheet with a precisely known thickness and two reflective outer surfaces, so that an idle partial time can be determined from both sides or both measuring positions, and thus in particular twice the determined running time of both measuring positions, in particular plus a distance compensation of the reflector thickness, can be used to determine the idle time and the idle distance or reference distance.

[0019] As an alternative to a calibration reflector, another calibration object with a known thickness and, for example, fully or partially reflective interfaces can be introduced, e.g., a precision tube made of, for example, plastic, which is partially reflective on its outer surfaces, so that the reflection peaks can be used in a conventional manner, with a known thickness between the reflective outer surfaces. A calibration tube is particularly advantageous in this case because, on the one hand, no reflectors are required and all installed sensors can be calibrated using the common central calibration tube, especially with a precisely round and precisely known calibration tube, e.g., made of plastic or ceramic.

[0020] This calibration can be performed at the factory. Subsequently, to determine the wall thickness and, for example, the overall diameter of a profile to be measured, especially a pipe profile, measurements are taken from both sides or a reciprocal measurement, i.e., from the first and second measuring positions, e.g., from the left and right. This results in: a first measurement of a first external travel time from the first measuring position, ie the first sensor, to an outer surface of the measuring object, a first wall travel time through the adjoining wall area of ​​the measuring object to its interior and an internal travel time through the interior, and correspondingly a second measurement of the corresponding second external travel time between the second measuring position and the outer surface of the measuring object, a second wall travel time through a second wall area of ​​the measuring object and optionally also a further internal travel time, ie e.g. as a further measurement of the value of the internal travel time already determined in the first measurement.

[0021] In the embodiment with two opposite measuring positions, e.g. two sensors, two corresponding direct measurements of these transit times can thus be carried out; the internal transit time of the THz transmission beam through the interior, ie between the inner surfaces of the wall areas, can thus be carried out from at least the first measuring position; in the embodiment with two opposite measuring positions, corresponding measurements can in particular be carried out from both sides, with subsequent averaging of the values ​​thus measured.

[0022] Subsequently, a total running time can be calculated from the determined running times—i.e., the two external running times, the two wall running times, and the (directly measured or averaged) internal running time. The difference between the total running time and the idle time determined during calibration can then be determined. This difference represents an additional material running time, which represents the material-related total time delay.

[0023] If it is ensured during the first and second measurement that the measuring object lies with its center on the idle distance between the measuring positions, the two measurements can be carried out with the rigid sensors along the common optical axis, whereby the two outer travel times, the two wall travel times and the one or two inner travel times can be measured directly.

[0024] If, however, the measuring object can be positioned off-center in the first and second measurements, the design with pivoting sensors allows the sensors to be aligned by pivoting them in the measuring plane so that the optical axes of both sensors are perpendicular to the outer surface of the measuring object. The first and second measurements then take place. When determining the transit times, it is taken into account that the outer transit times, i.e., the transit times from the measuring positions to the outer surface, are increased according to the setting angles; this is thus compensated for during the determination.

[0025] Subsequently, a more detailed calculation or determination can be performed based on this material-related total delay and the individual propagation times, particularly the wall propagation times. The external propagation times and the internal propagation times essentially already correspond to the corresponding values ​​from the calibration measurement, so that the material-related total delay can be assigned to the wall areas. From this, an equivalent air propagation time in the pipe wall area can then be determined, which corresponds to the propagation time of the measurement signal in the - unknown - entire section of the pipe wall, assuming this had the same refractive index as the surrounding medium, i.e., air.

[0026] Since the idle time and the idle distance are known from the calibration, a total wall thickness (sum of the thicknesses of the tube walls) can be determined according to the invention without having to use a material-specific value such as the refractive index or the material-specific speed of light.

[0027] Thus, the total thickness of the pipe walls can be determined from the current measurement of the pipe and the previous calibration, from which the idle time and idle distance are known, as well as this determination of the quotients or ratios, without having to use the refractive index or the speed of light in the material as a parameter. Rather, by forming these ratios or quotients, the total length of the pipe walls can be determined directly from the measurement signals measured on the common optical axis and the calibration, regardless of the material.

[0028] Subsequently, the individual wall thicknesses or pipe wall thicknesses can be determined as proportions, and thus also as absolute values ​​of the wall thicknesses, from a distribution or the ratio of the wall running times or from the previously determined equivalent pipe wall area.

[0029] Calibration can be performed at the factory and subsequently repeated if necessary, so that a wall thickness can be determined from current time-of-flight measurements without knowledge of the refractive index or the speed of light in the material.

[0030] The additional effort required according to the invention is minimal; calibration can be performed in advance, and subsequent measurements are possible without significant additional effort.

[0031] Several pairs of sensors can be provided, arranged around the measuring area.

[0032] According to one embodiment, a method is provided in which the THz sensor arrangement has one or more pairs of THz sensors rotating continuously around the measuring area, which perform the THz measurements at the measuring positions during the rotation, in particular continuously during the rotation, preferably for forming helically arranged, overlapping measurements on the outer circumference of the measuring object for a complete measurement of the measuring object.

[0033] For example, an arrangement of multiple rotating sensors achieves better coverage of a measuring object conveyed in one conveying direction than with just one rotating sensor, allowing for a higher conveying speed. Furthermore, a lower rotation speed can be set, thus causing less stress.

[0034] By continuously measuring during rotation, the THz transmission beam or the multiple THz transmission beams can circulate helically (helically) around the outer circumference of the measurement object, in particular with overlapping measurements or helical measurement tracks for a complete measurement of the measurement object.

[0035] A key advantage of the invention is that it is possible to determine the wall thickness and the total diameter of the pipe without knowing the refractive index, which can vary depending on the material batch and temperature. Furthermore, the refractive index itself can then be determined using the wall thicknesses determined in this way and the wall transit times of the measurement signal. This can be used to evaluate the material quality at any time. The constancy of the refractive index determined in this way can, for example, be used to demonstrate or check that the material batch has not changed and that the material mix is ​​homogeneous. This is particularly advantageous when measuring pipes which are output from an extruder, for example when granulated material or granulate made from different starting materials is fed in, and which may, for example, contain varying amounts of additives.In particular, a pipe can be continuously measured in the measuring device after its extrusion, in particular with a transport axis or conveyor axis perpendicular through the measuring device or perpendicular to the optical axes of the sensors.

[0036] If a precise evaluation of the transit time for the inner diameter is not possible during the measurement field recording due to severe deformations and the associated destructive reflection of the measurement signal, the wall thicknesses can be determined solely by the transit time within the pipe walls using the most recently determined refractive index. In this case, it can initially be assumed that the material structure does not change significantly within short time intervals or remains essentially unchanged. Thus, a total wall thickness can be determined from the measurement signal. From this, the individual wall thicknesses can then be estimated, even if, for example, a measurement signal or measurement peak is missing.

[0037] If, for example, material accumulations are present only on one wall, the temperature may differ between the left and right walls. This changes the refractive index as a material-specific behavior. This can be provided as additional information to the system operator, since the measurements will not be completely valid. Previous methods generally assume, in a simplified manner, that the refractive index is constant within a cross-section of a homogeneous material.

[0038] To avoid mutual interference between the two sensor beams of the two opposing THz sensors, the transmitted beams are in different frequency ranges and / or offset in time and / or are emitted in different polarity.

[0039] THz radiation according to this invention is understood to mean terahertz radiation, radar radiation, and / or microwave radiation. The frequency range can be, in particular, between 5 GHz and 50 THz, e.g., 10 GHz and 5 THz, particularly with fully electronic THz receivers, e.g., with direct time-of-flight measurement, frequency utilization, and / or pulsed radiation.

[0040] By determining the refractive index, it is possible to determine the ratio of the material composition of the starting materials when processing several starting materials. whereupon, for example, the conveyor screws of the material feed can be controlled relative to each other, ie the composition is controlled by measuring the refractive index and controlling the material feed, without, for example, requiring precise knowledge of the individual feed rates of the material feed.

[0041] The invention is explained below with reference to some embodiments and the accompanying drawings. They show: Fig. 1 shows a THz measuring device according to a first embodiment; Fig. 2 shows the THz measuring device from Fig. 1 during calibration; Fig. 3 the THz measuring device from Fig. 1,2 during the subsequent measurement of a single-walled pipe as a measurement object; Fig. 4 shows an arrangement for the production and measurement of profiles and / or pipes with a THz measuring device in side view; Fig. 5 shows a flow diagram of a THz measuring method according to the embodiment; Fig. 6 shows one of the Fig. 3 corresponding representation for an embodiment with THZ sensors pivoting in the measuring plane and decentralized measuring object. Fig. 7 the subsequent determination of the partial distances according to Fig. 6 , to correct the inclination compared to Fig. 3

[0042] A THz measuring device 3 has, according to the embodiment of the Figures 1 to 3a first, here left THz sensor 1 and a second, here right THz sensor 2, which define a measuring range 4 between them with an idle distance (idle distance, reference distance) s0 of, for example, 1 to 2 m. The two THz sensors 1, 2 are designed as THz transceivers, i.e., transmitting and receiving devices, in particular fully electronic with a THz receiver chip. The THz sensors 1, 2 are aligned on a common optical axis A in the measuring range 4; minor deviations from the common optical axis A are not relevant here, as long as these settings are not subsequently changed. According to the side view of Figure 6, the THz sensors 1, 2 can in particular be accommodated on a common, for example, cylindrical housing 5 and aligned in the measuring range 4 defined between them, which is open at the sides in particular for measuring continuous measuring objects, in particular pipes 6. Thus, according to Fig. 7 After the start in step St0, this measuring device 3 is formed in a preparatory step St1.

[0043] This is followed by a calibration step St2, in which, in this embodiment, the idle distance s0, i.e., the distance between the THz sensors 1, 2, and the idle time t0 as the propagation time of the THz radiation in the idle distance s0 are calibrated. For this purpose, a double-sided calibration reflector 7 is positioned in the measuring area 4 perpendicular to the optical axis A, so that its two side surfaces 7a, 7b are perpendicular to the optical axis A. For example, a precision sheet with a very precisely known thickness, e.g., s7 = 0.507 mm, can be used as the calibration reflector 7.

[0044] This is followed by the empty measurement or reference measurement, in which the first THz sensor 1 emits a first THz calibration beam 11 along the optical axis A and detects the THz radiation reflected by the reflector surface 7a, from which the first (left) idle partial time t0-1 is precisely determined, i.e. the travel time over the distance or empty section s0-1 between the first sensor 1 and the first reflector surface 7a. Correspondingly, the second THz sensor 2 emits a second THz calibration beam 2 along the optical axis A into the measuring area 4, which is reflected by the second reflector surface 7b and in turn detected by the THz sensor 2, so that the second idle partial time t0-2 is precisely measured, i.e. the travel time over the second empty section s0-2 between the second sensor 2 and the second reflector surface 7b.

[0045] The THz sensors 1 and 2 emit THz radiation along the optical axis and detect reflected THz radiation, measuring the corresponding time-of-flight (t). Direct time-of-flight measurements can be performed, detecting reflection peaks. Accordingly, measurements with frequency modulation can also be performed, with corresponding evaluation in the frequency domain and conversion to corresponding time-of-flight values.

[0046] The idle time t0 for each of the THz sensors 1, 2, ie the travel time of the THz radiation from each THz sensor 1, 2 over the idle distance s0 to the other THz sensor 2, 1, then basically corresponds to twice the averaged idle time t0-1, t0-2 of both sensor measurements plus a distance compensation of the reflector thickness s7, ie a distance compensation s7 / c0.

[0047] The idle time t0 can be converted very precisely into an idle distance s0 in vacuum and correspondingly in air due to the very precisely known speed of light c0 = 299,792,458 m / s, ie s0= t0*c0.

[0048] Alternatively, the idle distance s0 can also be calculated directly from the idle partial time t0-1, t0-2 and the reflector thickness s7, ie s0 = (t0-1 + t0-2)*c0 + s7.

[0049] After this calibration, the calibration reflector 7 is preferably removed again so that subsequent measurements of the measurement objects 6 can be performed. The THz sensors 1, 2 are no longer adjusted after this calibration; if an adjustment is made, a subsequent calibration is required. Adjustments of the entire measuring device 1 relative to the measurement object 6 do not affect the calibration. In principle, the calibration reflector can also remain permanently installed.

[0050] Instead of a calibration reflector 7 (whether temporarily or permanently installed), a known and precisely measured calibration object, e.g. a calibration tube with known dimensions, i.e. in particular a known reference thickness and / or layer thickness, e.g. made of plastic or e.g. ceramic, can be introduced between the measuring positions or, in the case of two THz sensors, between the two THz sensors 1, 2, so that an idle time t0-1, t0-2 is measured from each of the two measuring positions MP1, MP2 up to the interfaces of the calibration object, and the idle time t0 and preferably the idle distance s0 are subsequently determined from the idle time t0-1, t0-2 determined in this way, the known speed of light c0 and the known reference thickness. This is described in more detail below. The calibration object can then be removed.

[0051] According to Figure 3As the measuring object 6, a single-walled tube made of plastic or rubber is guided through the measuring area 4, in particular with its transport axis B perpendicular to the optical axis A. The lateral position of the measuring object 6, however, is generally not fixed, whereby the measuring object 6 or also the measuring device 3 (without adjusting the sensors 1, 2 relative to one another) can be adjusted laterally in order to center the measuring object 6.

[0052] From the calibration or idle measurement of the Figure 1, 2 The idle time t0 and the idle distance s0 are therefore already known, which are subsequently used for the calculation in the measurements of measuring objects 6.

[0053] In the measuring arrangement according to Figure 3The measurement object 6 is then conveyed along the conveying axis B through the THz measuring device 1 and continuously measured. In a first measuring step St4, the first THz sensor 1 again transmits a first THz transmission beam 20-1 along the optical axis A into the measuring area 4, ie, essentially in the direction of the conveying axis B, and detects first THz reflection beams 21-1.

[0054] Thus, the first THz transmission beam 20-1 travels from the first THz sensor 1 through a first outer space (here the left outer space) sL1 to the outer surface 6a of the tube 6, with a measured first outer transit time tL1, then the first THz transmission beam 20-1 passes through the outer surface 6a, so that at a time tL1, a first measurement peak is generated in the first THz reflection beam 21-1, whereupon the first THz transmission beam 20-1 subsequently passes through the material of the tube wall 6d with the refractive index n6. The first THz transmission beam 20-1 traverses the first wall region with a first wall thickness sR1 and subsequently, after a first internal travel time tR1, generates a reflection peak upon passing through the inner surface 6b of the tube 6; then the first THz transmission beam 20-1 passes through the interior 6c of the tube 6, i.e., through the inner diameter sL2, until it reaches the inner surface 6a again, where a first internal travel time tL2-1 is measured.

[0055] Thus, in this first measurement step, the transit times tL1, tR1, tL2-1 are measured; however, the refractive index n6 is still unknown, so that the first internal transit time tR1 cannot initially be directly converted into the first wall thickness sR1.

[0056] Accordingly, in a second measurement step St5, the second THz transmission beam 20-2 is output from the second THz sensor 2 into the measurement area 4. After passing through the second (right) outer space sL3, it outputs a measurement peak and enters the outer surface 6a of the tube 6. After passing through the second (right) wall region of the tube 6 with a second wall thickness sR2, upon impact with the inner surface 6b, it generates a measurement peak as a partial reflection, which is detected as a measurement signal in the second THz reflection beam 20-2. Here, too, the second wall travel time tR2 cannot be directly converted into the second wall thickness sR2 due to the unknown refractive index n6. Subsequently, the second THz transmission beam 20-1 also enters the interior space 6c, ie through a first wall thickness R1 with the transit time tR1 of the tube 6 and thus emits a measurement peak after crossing the inner diameter L2 after the second inner transit time tL2-2.

[0057] In Figure 3The propagation times thus determined are shown, ie, the first measurement signal SS1 contains the propagation times tL1, tR1, and tL2-1, and the second measurement signal SS2 contains the propagation times t-L3, tR2, and tL2-2. These measurement signals SS1 and SS2 are recorded by a control and evaluation device 100, which can store the calibration values, for example, in an internal or external memory 101.

[0058] Thus, the internal transit times tL2-1 and tL2-2 are advantageously determined from both THz sensors 1 and 2. These should be the same if the measurement is correct; this can be used to validate the measurement result. In the event of deviations due to measurement inaccuracy, the average value can preferably be used as the internal transit time tL2. However, it is generally sufficient if the internal transit time is determined from only one side.

[0059] Subsequently, in step St6, the total running time tges_R is determined according to equation GL1: tges _ R = tL 1 + tR 1 + tL 2 + tR 2 + tL 3

[0060] A material running time difference Δt to the idle time t0 is: Δt = tges _ R − t 0

[0061] An equation can therefore be applied below in which the total running time tges_R according to equation GL1 with the pipe 6 to be measured can be expressed with equivalent running times, ie a first (left) equivalent running time tRLA1, and correspondingly a second equivalent running time tRLA2, whereby these equivalent running times correspond in a pure air distance, plus the running time difference Δt: tges _ R = tL 1 + tRLA 1 + tL 2 + tRLA 2 + tL 3 + Δt

[0062] This total running time tges_R of equation GL3 can now be equated with the corresponding value of the total running time tges-R from equation GL1: tL 1 + tR 1 + tL 2 + tR 2 + tL 3 = tL 1 + tRLA 1 + tL 2 + tRLA 2 + tL 3 + Δt This results in the following after shortening equal summands tL1, tL2, tL3, which ultimately take place in the calibration measurement and the measurement steps in air and are therefore equal, tR 1 + tR 2 = tRLA 1 + tRLA 2 + Δt

[0063] A change to tRLA1 + tRLA2 results in tRLA 1 + tRLA 2 = tR 1 + tR 2 − Δt and thus summarized according to the equivalent total air flow time tRLA1,2 in the pipe wall area, which represents the sum of the two equivalent flow times, ie with tRLA1,2 = tRLA1 + tRLA2: tRLA 1 , 2 = tR 1 + tR 2 − Δt

[0064] The equivalent total air travel time tRLA1, 2 thus corresponds to the travel time of the THz transmission beam 20-1 (or 20-2) in the entire tube wall area 6d or as the sum of the two tube walls if they had the same refractive index n0 = 1 or the same speed of light c0 as the surrounding medium, ie air.

[0065] The quotient of equation GL5 and the idle time t0 forms the equivalent distance portion XL, from which, with the reference distance s0, the equivalent distance sLA can be calculated, which is required by the entire pipe wall area 6d or the two pipe walls together. xL = tRLA 1 , 2 / t 0 sLA = xL * s 0

[0066] The distribution of the running times is used to calculate the first and second wall thickness components xR1 and xR2 from the total distance or cumulative distance: xR 1 = tR 1 / tR 1 + tR 2 und xR 2 = tR 2 / tR 1 + tR 2 and above as result step St 7 the absolute values ​​for the wall thicknesses sRi sR 1 = xR 1 * sLA und sR 2 = xR 2 * sLA

[0067] Accordingly, for step St7, an overall equation GL10 can also be determined from: sR 1 = tR 1 * c 0 * t 0 − tL 1 − tL 2 − tL 3 / ( tR 1 + tR 2 und sR 2 = tR 2 * c 0 * t 0 − tL 1 − tL 2 − tL 3 / ( tR 1 + tR 2 , which directly describes a determination from the measured values ​​without the intermediate steps mentioned above.

[0068] Thus, according to the invention, determinations of the wall thicknesses sR1, SR2 of the tube 6 are possible without knowledge of the refractive index n6.

[0069] From the internal transit times tR1 and tR2 and the wall thicknesses or wall thickness calculation values ​​SR1 and SR2 thus determined, the speed of light C6 in the pipe material and thus also the average refractive index n6 can be determined in a step St8 as: n 6 = c 0 / c 6 = c 0 * tR 1 + tR 2 / sR 1 + sR 2 and correspondingly the first and second refractive indices n6-1 and n6-2 of the first and second wall thicknesses sR1, sR2, if these are to be considered separately, as n 6 − 1 = c 0 / c 6 − 1 = c 0 * tR 1 / sR 1 n 6 − 2 = c 0 / c 6 − 2 = c 0 * tR 2 / sR 2

[0070] In the embodiment with a calibration tube, appropriate formulas for the calibration measurement can be used in the calibration described above: for example, with an outer diameter OD_Messrohr of the calibration tube, the following can be used: s 0 = OD Messrohr + c 0 t L 1 + t L 2 s 0 = c 0 t L 1 + t L 2 + t L 3 + c R t R 1 + t R 2 or the idle time t 0 as: t 0 = s 0 / c 0 mit obigen s 0

[0071] Below is an example calculation with measured values ​​when measuring a pipe 6 made of polyethylene according to the embodiment: Preliminary design of the measured values c0 299792458 [m / s] s0 1 [m] t0 3,33564E-09 [s] n6 1,59 [-] Wall thickness distances ti air [s] ti pipe [s] sL1 0,200 6,67128E-10 6,67128E-10 sR1 0,061 2,03474E-10 3,23524E-10 sL2 0,390 1,3009E-09 1,3009E-09 sR2 0,049 1,63446E-10 2,5988E-10 sL3 0,300 1,00069E-09 1,00069E-09 sum 3,33564E-09 3,55212E-09 Δt 2,16483E-10 [s] t Rges 3,55212E-09 [s]

[0072] Back calculation - evaluation using evaluated runtime information ti_pipe, t0, s0: runtime in the pipe section as if it were air (equivalent runtime in the entire pipe wall area 6d) tRA1,2 3,66921E-10 [s] Air content related to running time XL 0,110 [-] Equivalent air distance sLA 0,110 [m] Pipe proportions x R1 0,554545455 [-] x R2 0,445454545 [-] Pipe wall thicknesses s R1 0,061 [m] s R2 0,049 [m]

[0073] Fig. 4 shows an arrangement for producing and measuring a pipe 6 or pipe profile with an extruder 110, to which at least one granulate 111 is fed as starting material, a measuring device 3 or 103 and a conveying device 120 for conveying the pipe 6 along the conveying axis B.

[0074] In this case, the granulate 111 can contain different components, or several starting materials 111 can be fed in from several material feeds, e.g. screw conveyors, which are thus processed together by the extruder.

[0075] For all embodiments, further determinations can be made: Since the pipe 6 is continuously conveyed along its conveying axis B through the THz measuring device 3, these values ​​can be continuously calculated. Changes in the wall thickness can be detected, and changes in the external distances sL1, sL3 can be used for compensation by the conveying device 120, ie, the pipe 6 can be adjusted to the left or right, or the measuring device 3 can be adjusted relative to the pipe 6.

[0076] In particular, the refractive index n6 can be considered as a function of time, i.e. n6 (t), and the temporal constancy of the refractive index n6 determined in this way can be checked to see if it lies within the corresponding limit values ​​GW1, GW2, which correspond to the measurement accuracy and calculation accuracy, in order to prove that the material batch has not changed and the material mixture is homogeneous, which is particularly advantageous when measuring after an extrusion with different components. If, during measurement recording, due to very strong deformations and the associated destructive reflection of the measurement signal, the accurate evaluation of the transit time for the inner diameter (cf. tL2-1 and tL2-2 in Fig. 3If this is not possible, the wall thickness sR1, sR2 can be determined solely using the transit times tR1, tR2 within the tube walls with the most recently determined refractive index n6. Here, it is assumed that the material structure remains constant over shorter time intervals.

[0077] If, for example, material accumulations are present only on one wall, the temperature may differ between the left and right walls. This changes the first refractive index n6-1 and / or the second refractive index n6-2 as a material-specific behavior. This can be provided as additional information to the system operator, since the measurement may not be completely valid. All common methods to date have simplified the assumption that the refractive index is constant within a cross-section of a homogeneous material.

[0078] As described above, a first THz sensor 1 and an opposite second THz sensor 2 are provided.

[0079] Furthermore, designs are possible with: An n-fold arrangement of sensors (odd number of sensors), in particular for 100% coverage of the circumference or the outer surface 6a of the pipe 6, whereby two approximately opposite sensors are used for evaluation.

[0080] For this purpose, a computational vectorial adjustment of the measured values ​​relative to an axis can be performed, for example. Depending on their inclination angle, which deviates from 180°, the sensors will determine increasingly different measured values ​​for the transit time t L2_1 / 2, since the transit time, or rather the inner diameter, can vary due to the geometric boundary conditions on the pipe. This can serve as a reference for the validity of this measurement.

[0081] An n-fold arrangement of two opposing sensors (an even number of sensors), where each sensor is mounted for rotation, and the center position of the pipe is compensated for by adjusting the angle of the sensors. It is particularly important to note that both sensors can determine increasingly different measured values ​​for the transit time t L2_1 / 2 depending on their inclination angle, which deviates from 180°, since the transit time, or rather the inner diameter, can vary due to the geometric boundary conditions on the pipe. This can serve as a reference for the validity of this measurement.

[0082] Figs. 6 and 7 show an embodiment with sensors 1, 2, which are pivotable in the shown measuring plane E, ie the plane of the drawing. The measuring plane E lies on the conveyor axis B of the Fig. 3vertical, whereby the conveying axis B corresponds to the center point M of the pipe 6. The measuring plane E is thus defined by the common optical axis A and a second direction, here the vertical direction V.

[0083] The basic position of the sensors 1, 2 is again the alignment on the common optical axis A, whereby the sensors 1, 2 can be pivoted from this basic position in the measuring plane E by a first setting angle α1 and correspondingly a second setting angle α2.

[0084] By aligning the two sensors 1 and 2 in the basic position, ie on the common optical axis A according to Fig. 3 can again be used as in the first embodiment of the Figure 1, 2 In the calibration step the idle distance S0 is measured.

[0085] Subsequently, the tube 6 is introduced as the measuring object, which generally does not lie with its center M on the common optical axis A.

[0086] In an alignment step, the sensors are pivoted in their measuring positions MP1 and MP2 so that their optical axes A1 and A2 are perpendicular to the outer surface 6a of the tube 6. This can be done, for example, using the method described in DE 10 2015 122 105 A1, according to which sensors 1 and 2 are pivoted in both directions, and maximum values ​​of the reflection peaks on the outer surface 6a indicate the perpendicular alignment.

[0087] Thus, according to this representation, the distances between the measuring positions MP1, MP2 and the center point M are generally valid, with s0 being the idle distance between MP1 and MP2 and x ′ = Strecke MP 1 − M , und y ′ = Strecke MP 2 − M s 0 ≠ x ′ + y ′

[0088] If x denotes the projection of x' onto the optical axis A, ie onto the idle distance s0, and correspondingly y denotes the projection of y' onto the optical axis A, then it can be determined: x = x ′ * sinα 1 und y = y ′ * sinα 2

[0089] In principle, the wall sections sR1 and sR2 are Fig. 3 unchanged, since sensors 1 and 2 have been aligned perpendicularly to the outer surface of pipe 6. In principle, half the internal distances (sL2-1) / 2 and (sL2-2) / 2, whose double value is directly measured by sensors 1 and 2, can also be considered correct for an ideal round pipe 6.

[0090] On the other hand, the Fig. 7 The outer distances sL1 and sL3 shown in the figure are not directly measurable, but they can be calculated from the measured outer travel times or, when multiplied by the speed of light, the corresponding measured values ​​(sL1)' and (sL3)' of the Fig. 7and the setting angles α1 and α2 are determined as sL 1 = sL 1 ′ * sinα 1 und sL 3 = sL 3 ′ * sinα 2

[0091] Thus, a calculation can already be made according to the design of the Fig. 3 , ie with equations 1 to 11a, since the values ​​of sL1, sR1, sR2, sL3 can already be determined in this way, whereby the value (sL2-1) / 2 + (sL2-2) / 2, ie the average of the first and second measurement, can preferably be used as the inner diameter.

[0092] A more precise calculation takes into account that, especially in the case of ovality, a different calculation better determines the inner diameter: sL1 and sL3 are calculated using equation Gl16.

[0093] Furthermore, the lines x and y are Fig. 6 together from x = sL 1 + sR 1 + sL 2 − 1 / 2 y = sL 3 + sR 2 + sL 2 − 2 / 2

[0094] Furthermore, x ′ = x + Δx y ′ = y + Δy

[0095] Here, x' and y' can be calculated using the sine law from the measured idle distance s0 and the setting angles α1 and α2, since these three values ​​in Fig. 6 clearly define the triangle MP1, MP2, M. Aus GI 17 und GI 18 ergibt sich x ′ = sL 1 + sR 1 + sL 2 − 1 / 2 + Δx y ′ = sL 3 + sR 2 + sL 2 − 2 / 2 + Δy

[0096] From this, Δx and Δy can be calculated.

[0097] By determining the refractive index n, a relationship of the material composition of the starting materials 111 can also be determined when processing several starting materials 111, so that the composition can be controlled by measuring the refractive index n and controlling the material feed 112, without, for example, requiring precise knowledge of the individual feed rates of the material feed 112. List of reference symbols

[0098] 1THz sensor 2THz sensor 3THz measuring device 4Measuring range, ie range between the THz sensors 1, 2 or the first THz sensor 1 and the measuring reflector 102 5Housing 6Measurement object, pipe 6aOuter surface 6bInner surface 6cInterior of the pipe 6 6dPipe wall 7Calibration reflector, e.g. B. Precision sheet 11, 12First, second calibration radiation 20-1First THz transmission beam 20-2Second THz transmission beam 21-1First THz reflection beam 21-2Second THz reflection beam 100Control and evaluation device 101Memory for calibration values ​​111Starting material, e.g. granulate 112Material feed, e.g. hopper or one or more conveyor screws AOptical axis BConveyor axis c0Speed ​​of light in air / vacuum c6Material-specific speed of light MCenter point MP1Measuring position 1 MP2Measuring position 2 n6Refractive index of the pipe wall material SS1First measuring signal SS2Second measuring signal t0Idle time s0Idle distance t0-1, t0-2Idle partial times in Fig. 2tR1 first external travel time (is measured) tL1 first wall travel time (is measured) sL1 first wall thickness (is calculated) tL2-1 first internal travel time through the interior 6c (is measured) tL2-2 second internal travel time through the interior 6c (is measured) tL2 internal travel time (averaged measured value) through the interior 6c tL3 second external travel time from the second sensor 2 to the right outer surface 6a (is measured) tR2 second wall travel time, here through the right pipe wall area (is measured) ttotal travel time, ie sum of the travel times of the THZ radiation over the distance s0 during a measurement with the measuring object 6 Δt material travel time difference or material-specific travel time difference tRLA1 first (left) equivalent travel time, which is the theoretical travel time of the radiation through the first wall area (first wall thickness sR1) in the medium air orsurrounding medium describes tRLA2second (right) equivalent transit time, which describes the theoretical transit time of the radiation through the second wall area (second wall thickness sR2) in the medium air or surrounding medium tRLA1,2equivalent total air transit time in the pipe wall area, ie the theoretical transit time of the radiation through both wall areas in the medium air or surrounding medium.

Claims

1. THz measuring method for measuring a measured object (6), for example, a pipe made of a plastics or rubber, including at least the following steps: - preparatory step (St1), providing a THz sensor arrangement (1, 2) comprising two opposing THz sensors (1, 2) for emitting THz transmission beams (20-1, 20-2) and receiving reflected radiation (21-1, 21-2) from at least one first measuring position (MP1) of a measuring region (4) using the first THz sensor (1) and from a second measuring position (MP2) of the measuring region (4) using the second THz sensor (2), the measuring positions (MP1, MP2) being separated by an empty path (s0), - calibrating step (St2), measuring of an empty time of flight (t0) of at least one THz transmission beam (11, 12) through the empty path (s0) without the measured object (6) and determining the empty path (s0) distance, - positioning a measured object (6) inside the measuring region (4) between the first measuring position (MP1) and the second measuring position (MP2) (St3), - carrying out a first THz measurement by means of the first THz sensor (1) from the first measuring position (MP1) using a THz transmission beam (20-1) along a first optical axis (A1, A) while measuring a first exterior time of flight (tL1) up to an exterior surface (6a) of the measured object (6), a first wall time of flight (tR1) through a first wall region of the measured object (6) and an interior time of flight (tL2, tL2_1) through an interior space (6c) of the measured object, (St4), - carrying out a second THz measurement by means of the second THz sensor (2) from the second measuring position (MP1) along a second optical axis (A2, A) while measuring a second exterior time of flight (tL3) between the second measuring position (MP2) and the exterior surface (6a) of the measured object (6) and a second wall time of flight (tR2) through a second wall region of the measured object (6) facing the second THz sensor (2) (St5) - determining a total time of flight (tges_R) through the measuring region (4) with the measured object (St6) from the measured wall thicknesses (tR1. tR2), the measured interior time of flight (tL2, tL2_1) and the measured exterior times of flight (tL1, tL3), and - determining a first wall thickness (sR1) of the first wall region and a second wall thickness (sR2) of the second wall region from the measured wall times of flight (tR1. tR2), the measured interior time of flight (tL2, tL2_1) and the measured exterior times of flight (tL1, tL3) and possibly even the determined total time of flight (tges_R) (St7), where the first THz transmission beam (20-1) emitted from the first measuring position and the second THz transmission beam (20-2) emitted from the opposite second measuring position are emitted at different times and / or in different frequency ranges and / or in different polarity, so as to avoid mutual interference of the two THz transmission beams (20-1, 20-2) from the two opposite THz sensors (1, 2).

2. Method according to claim 1, characterized in that the determination of the wall thicknesses (sR1, sR2) is carried out without using a material specific value of the measured object (6), in particular, without a refraction index (n6) or a material specific speed of light (c6).

3. Method according to one of the above claims, characterized in that subsequently, from the determination of the wall thicknesses (sR1, sR2) and the wall times of flight (tR1, tR2) a material specific optical value of the material of the measured object (6), in particular, a refraction index (n6) of the measured object (6) is determined (St8).

4. Method according to one of the above claims, characterized in that the THz sensor arrangement comprises two THz sensors (1, 2; 1, 102) arranged around the measuring region (4) at the measuring positions (MP1, MP2), in particular, statically arranged THz sensors (1, 2; 1, 102), emitting the at least two THz transmission beams (20-1. 20-2) and carrying out the at least two THz measurements, where the THZ sensor arrangement comprises THZ-sensors (1, 2) received pivotably in their measuring positions (MP1, MP2) lying, in an initial position, on a common optical axis (A) and being respectively adjusted from this initial position thereby producing an adjustment angle between their optical axes (1, 2), where the THZ-sensors (1, 2) are pivoted away from the initial position subsequent to the calibrating step and / or prior to some of the THZ measurements.

5. Method according to one of the above claims, characterized in that in the calibrating step (St2) for measuring the empty time of flight (t0) - a calibrating reflector (7) with reflective surfaces (7a, 7b) on both sides and a known reference thickness (S7), e.g. a precision sheet (7), is introduced in-between the opposite measuring positions (MP1, MP2), - from both measuring positions (MP1, MP2) each an empty partial time of flight (t0-1, t0-2) up to one of the reflective surfaces (7a, 7b) is measured, and - subsequently, from the so determined empty partial times of flight (t0-1, t0-2), the known speed of light (c0) as well as the known reference thickness (S7) the empty time of flight (t0) and, preferably, the empty path (s0) distance are determined.

6. Method according to one of the claims 1 through 8, characterized in that in the calibrating step (St2) for measuring the empty time of flight (t0) - a calibration object transparent for THz radiation, e.g. a calibration pipe with a known reference thickness and / or layer thicknesses, is introduced in-between the opposite measuring positions (MP1, MP2), - from both measuring positions (MP1, MP2) each an empty partial time of flight (t0-1, t0-2) up to boundary surfaces of the calibration object is measured, and - subsequently, from the so determined empty partial times of flight (t0-1, t0-2), the known speed of light (c0) as well as the known reference thickness the empty time of flight (t0) and, preferably, the empty path (s0) distance are determined.

7. Method according to one of the above claims, characterized in that from the interior times of flight (tL2; tL2_1, tL2-1, tL2-2) of the interior space (6c) of the measured object (6) measured from opposite measuring positions and / or measured interior times of flight of the calibration object an averaging is carried out so as to determine an average (tL2) and / or a comparison to validate the measured interior times of flight tL2; tL2_1, tL2-1, tL2-2).

8. Method according to one of the above claims, characterized in that the determination of the total time of flight (tges-R) through the measuring region (4) is carried out via a summation of the first and second exterior times of flight (tL1, tL3), the two wall times of flight (tR1, tR2), and an interior time of flight (tL2, tL2-1, tL2-2).

9. Method according to one of the above claims, characterized in that the first and / or second wall thickness (sR1, sR2) are determined according to the following formula: sR 1 = tR 1 * c 0 * t 0 − tL 1 − tL 2 − tL 3 / tR 1 + tR 2 and sR 2 = tR 2 * c 0 * t 0 − tL 1 − tL 2 − tL 3 / tR 1 + tR 2 with the following variables: sR1: first wall thickness sR2: second wall thickness tR1: first wall time of flight, tR2: second wall time of flight, c0: speed of light in a vacuum or gas of the measuring region (4), t0: empty time of flight of the calibration step, tL1: first exterior time of flight, tL3: second exterior time of flight, tL2: interior time of flight,10. Method according to one of the above claims, characterized in that the measured object (6) is continuously transported through the measuring region (4), in particular, perpendicular to the optical axis (A), and the wall thicknesses (sR1, sR2) are continuously determined, preferably also to refraction indices (n6) of the measured object (6).

11. Method according to claim 10, characterized in that the wall thicknesses (sR1, sR2) are continuously temporally acquired and compared to one another, in particular, to determine temporal changes of the wall thicknesses and / or a temporal change of the material composition from a temporal change of the refraction index (n6).

12. Method according to one of the above claims, characterized in that upon detecting that reflections at the interior surface (6b) for measuring the wall times of flight (tR1, tR2) and / or the interior time of flight (tI2) are not or not accurately determined from the measuring signals (SS1, SS2), a destructive reflection of the THz transmission beam (20-1, 20-2) is inferred, and the wall thicknesses (sR1, sR2) are determined from the total time of flight (tR1, tR2) within the pipe walls with the last determined refraction index (n6).

13. Method according to one of the above claims, characterized in that the at least one THz transmission beam (11, 12 ; 20-1, 20-2) is emitted as terahertz radiation, microwave radiation or radar radiation, in particular, in a frequency range between 5 GHz and 50 THz, in particular 10 GHz and 5 THz, , e.g. with direct time of flight measurement, frequency modulation and / or pulsed radiation.

14. THz measuring device (3, 103) for measuring a measured object (6), e.g. a pipe made of plastics or rubber, comprising at least: a THz sensor arrangement (1, 2; 1, 102) including two opposing first THz sensors (1, 2; 1), adapted to carry out at least - one first THz measurement at a first measuring position (MP1) by emitting a first THz transmission beam (20-1) and receiving first reflected radiation (21-1) by means of the first THz sensor (1), and - one second THz measurement at a second measuring position (MP2) by emitting a second THz transmission beam (20-1) and receiving second reflected radiation (21-1) by means of the second THz sensor (2), - the first and second measuring positions (MP1, MP2) being separated by an empty path (s0), - a controller and evaluating device (100) for controlling the sensor arrangement (1, 2) and receiving at least one measuring signal (SS1, SS2) of the sensor arrangement, said controller and evaluating device (100) being configured to determine, from the measuring signals (SS1, SS2), - an empty time of flight (t0) measured in a calibration, a first and second exterior time of flight (tL1, tL3) between the measuring positions and an exterior surface of a measured object (6), a first wall time of flight (tR1) of the first THz transmission beam (20-1) in a first wall region of the measured object (6) facing the first THz sensor (1), a second wall time of flight (tR2) of the second THz transmission beam (20-1) in a second wall region of the measured object (6) facing the second THz sensor (1), and an interior time of flight (tL2, t2-1, tI2-2) in an interior space (6c) of the measured object (6), and - from the determined times of flight (t0, tL1, tL3, tL2, t2-1, tI2-2, tR1, tR2) and the speed of light (c0) in the empty measuring region (4), a first wall thickness (SR1) of the first wall region and a second wall thickness (SR2) of the second wall region of the measured object (6) introduced in the measuring region (4), where the controller and evaluating device (100) is adapted to emit the first THz transmission beam (20-1) emitted from the first measuring position and the second THz transmission beam (20-2) emitted from the first measuring position at different times and / or in different frequency ranges and / or in different polarity, so as to avoid mutual interference of the two THz transmission beams (20-1, 20-2) from the two opposite THz sensors (1, 2).

15. THz measuring device (3, 103) according to claim 14, characterized in that the THz sensor arrangement comprises: a first THz sensor (1) statically arranged at the first measuring position (MP1) for emitting the first THz transmission beams (20-1) along an optical axis (A) into the measuring region (4), and a second THz sensor (2) statically arranged at the second measuring position (MP2) for emitting the a second THz transmission beam (20-2) along the optical axis (A) into the measuring region (4).

16. THz measuring device (3, 103) according to claim 15, characterized in that the THz sensor arrangement comprises: one or more THz sensors (1, 2) and an adjusting means, e.g., a rotational guide of the at least one THz sensor (1, 2) for partially or continuously circling the measuring region (4) and for positioning into at least the first and second measuring position (MP1, MP2).

17. THz measuring device (103) according to one of the claims 14 through 16, characterized in that it comprises a plurality of THz sensors (1, 2) arranged around the measuring region (4), statically or rotating, preferably with alignment of their optical axes (A) onto a common center point, e.g., onto a transport axis (B).

18. THz measuring device according to one of the claims 14 through 17, characterized in that it further comprises a conveyor device (120) for continuously guiding and / or transporting the measured object (6) through the measuring region (4), in particular, along a transport axis (B) perpendicular to the at least one optical axis (A).

19. Arrangement for manufacturing an extrusion profile, in particular, a pipe profile (6) made of plastics or rubber, including an extruder (110) for putting out an extrusion profile (6), comprising at least one material feed (112), designed to feed at least one source material (111), e.g. as a granulate, powder or shredded goods, to the extruder (110), and a THz measuring device according to claim 25 including the conveyor device (120) for conveying the extrusion profile as measured object (6) through the measuring region (4), the controller and evaluation device (100) being configured to determine temporal changes in a material composition and / or material distribution of the pipe profile (6) and to put out an indicator signal and / or control signal for controlling the extruder (110) and / or its material feed (112).

20. Arrangement according to claim 19, the material feed (112) being adapted to feed to the extruder (110) several different source materials (111), and the controller and evaluation device (100) being adapted to determine a current material composition of the source materials (111) from a currently determined refraction index of the extrusion profile.